G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2002
10/24/2002	US20020153913 Probe for the probe card
10/24/2002	US20020153909 Nano-drive for high resolution positioning and for positioning of a multi-point probe
10/24/2002	US20020153903 Device and method for testing and calibrating multi-meters in a cathode ray tube production line
10/24/2002	US20020153902 Circuit arrangement
10/24/2002	US20020153901 Method and apparatus for in-circuit impedance measurement
10/24/2002	US20020153877 Indexing rotatable chuck for a probe station
10/24/2002	US20020153876 Integrated circuit with power supply test interface
10/24/2002	US20020153864 In-vehicle battery monitor
10/24/2002	US20020153525 Semiconductor device with process monitor circuit and test method thereof
10/24/2002	EP1145612A3 Method for mounting an electronic component
10/24/2002	DE10209606A1 Pseudozufallssignal-Erzeugerschaltkreis Pseudo random signal generating circuit
10/24/2002	DE10119463A1 Production of a chalcogenide halide of the ABC2 type comprises arranging metallic precursor layers, chalcogenizing with simultaneous optical process control, irradiating with light, and surface chalcogenizing to form the ABC2 phase
10/24/2002	DE10119201A1 Method for measuring the winding temperature of drive motor e.g. for washing machine, requires measuring current flow through at least one winding of motor
10/24/2002	DE10119122A1 Verfahren sowie Vorrichtung zum Messen, insbesondere Hochfrequenzmessen von elektrischen Bauelementen Method and apparatus for measuring, particularly high-frequency measurement of electrical components
10/24/2002	DE10118916A1 Verfahren und Anordnung zur Bestimmung des Zustandes einer Batterie Method and apparatus for determining the condition of a battery
10/24/2002	DE10053481C2 Verfahren zur Qualitätsprüfung eines elektrischen Bauteils Procedures for auditing an electrical component
10/23/2002	EP1251550A1 Method and apparatus for automatically positioning electronic die within component packages
10/23/2002	EP1251525A1 Semiconductor memory device, system, and method of controlling accessing to memory
10/23/2002	EP1251522A2 Semiconductor memory device
10/23/2002	EP1251360A1 Device for determining physical quantity of battery pack
10/23/2002	EP1251359A1 Method and device for the determination of the status of a battery
10/23/2002	EP1251358A2 Device for and method of manufacturing and testing electronic modules
10/23/2002	EP1250744A1 Usage counter for portable jump-starting battery unit
10/23/2002	EP1250730A1 An rf antenna detector circuit
10/23/2002	EP1250608A1 Load angle determination for electrical motors
10/23/2002	EP1250607A1 Method and device for controlling a telecommunication cable
10/23/2002	EP1002238B1 Instrument for measuring and sorting resistors and method therefor
10/23/2002	EP1000364B1 Low cost cmos tester with high channel density
10/23/2002	EP0776479B1 System for monitoring an ungrounded power distribution system
10/23/2002	CN2518217Y Testing & positioning appts. for electronic component
10/23/2002	CN2518114Y Dynamo operation state a.c/d.c contact converter
10/23/2002	CN2518113Y Combined mould for testing circuit board
10/23/2002	CN1375925A Electronic volume circuit
10/23/2002	CN1375830A Semiconductor storage apparatus
10/23/2002	CN1375704A Low-voltage leakage and electricity fraudulent-using preventing system
10/23/2002	CN1375703A Systemic method of diagnosing electric trouble
10/23/2002	CN1093261C Battery with condition tester and condition tester for said battery
10/22/2002	US6470485 Scalable and parallel processing methods and structures for testing configurable interconnect network in FPGA device
10/22/2002	US6470483 Method and apparatus for measuring internal clock skew
10/22/2002	US6470482 Method and system for creating, deriving and validating structural description of electronic system from higher level, behavior-oriented description, including interactive schematic design and simulation
10/22/2002	US6470479 Method of verifying semiconductor integrated circuit reliability and cell library database
10/22/2002	US6470478 Method and system for counting events within a simulation model
10/22/2002	US6470468 Test pattern generator, propagation path disconnecting method, and delay fault detecting method
10/22/2002	US6470466 Integration type input circuit and method of testing it
10/22/2002	US6470465 Parallel test circuit of semiconductor memory device
10/22/2002	US6469946 Semiconductor memory and its test method
10/22/2002	US6469573 Semiconductor integrated circuit
10/22/2002	US6469538 Current monitoring and latchup detection circuit and method of operation
10/22/2002	US6469537 System for testing semiconductor wafers having interconnect with pressure sensing mechanism
10/22/2002	US6469536 Method and device for providing symetrical monitoring of ESD testing an integrated circuit
10/22/2002	US6469535 Based on the resulting variation in current (flowing between an electrode forming a schottky barrier and a semiconductor) with the voltage applied, the surface state of the semiconductor substrate is evaluated
10/22/2002	US6469534 Semiconductor integrated circuit apparatus and electronic device
10/22/2002	US6469533 Measuring a characteristic of an integrated circuit
10/22/2002	US6469532 Apparatus for forming coaxial silicon interconnects
10/22/2002	US6469531 Loaded-board, guided-probe test fixture
10/22/2002	US6469529 Time-resolved emission microscopy system
10/22/2002	US6469528 Electro-optic sampling probe and measuring method using the same
10/22/2002	US6469520 Testing electrical circuits
10/22/2002	US6469517 Sorting method of monolithic ceramic capacitors based on insulation resistance
10/22/2002	US6469516 Method for inspecting capacitors
10/22/2002	US6469515 Method for determining sources of interference
10/22/2002	US6469514 Timing calibration apparatus and method in a semiconductor integrated circuit tester
10/22/2002	US6469512 System and method for determining battery state-of-health
10/22/2002	US6469496 Electronic memory module handler with direct socket insertion and related output stacker
10/22/2002	US6469495 RF isolation test device accommodating multiple nest plates for testing different devices and providing variable testing options
10/22/2002	US6469494 Programmable connector
10/22/2002	US6469493 Low cost CMOS tester with edge rate compensation
10/22/2002	US6469475 Method and apparatus for detecting a disconnection in the charge line between a generator and an electric battery in a motor vehicle
10/22/2002	US6469471 Battery charge measurement and discharge reserve time prediction technique and apparatus
10/22/2002	US6469257 Integrated circuit packages
10/22/2002	US6468098 Electrical contactor especially wafer level contactor using fluid pressure
10/22/2002	US6468023 Apparatus and method for inverting an IC device
10/22/2002	US6467951 Probe apparatus and method for measuring thermoelectric properties of materials
10/22/2002	CA2262046C Optical layer quasi-centralized restoration
10/17/2002	WO2002082532A2 Semiconductor test system and associated methods for wafer level acceptance testing
10/17/2002	WO2002082528A1 Contactor device for semiconductor device and method of testing semiconductor device
10/17/2002	WO2002082505A2 A method to reduce leakage during a semi-conductor burn-in procedure
10/17/2002	WO2002082448A1 Identification of an integrated circuit from its physical manufacture parameters
10/17/2002	WO2002082330A2 Method and system an algorithm for finding vectors to stimulate all paths and arcs through an lvs gate
10/17/2002	WO2002082110A1 System and method for intelligent wire testing
10/17/2002	WO2002082109A1 Integrated circuit with power supply test interface
10/17/2002	WO2002082107A1 Circuit for detecting leak from power supply
10/17/2002	WO2002022726A3 Polymer composition and method and apparatus for testing electrical stress degradation of same
10/17/2002	WO2001097340A9 Apparatus and method for producing an ion channel microprobe
10/17/2002	WO2001054001A9 Adaptable circuit blocks for use in multi-block chip design
10/17/2002	US20020152439 Method of outputting internal information through test pin of semiconductor memory and output circuit thereof
10/17/2002	US20020152438 Parallel scan test software
10/17/2002	US20020152437 Circuitry for and system and substrate with circuitry for aligning output signals in massively parallel testers and other electronic devices
10/17/2002	US20020152351 Memory control circuit
10/17/2002	US20020152046 Concurrent control of semiconductor parametric testing
10/17/2002	US20020151203 Open top IC socket
10/17/2002	US20020151092 Evaluating sidewall coverage in a semiconductor wafer
10/17/2002	US20020151091 Measuring back-side voltage of an integrated circuit
10/17/2002	US20020149985 Semiconductor memory device having refreshing function
10/17/2002	US20020149983 Methods for testing a group of semiconductor devices simultaneously, and devices amenable to such methods of testing
10/17/2002	US20020149975 Testing device for testing a memory
10/17/2002	US20020149972 Analog-to-digital converter for monitoring vddq and dynamically updating programmable vref when using high-frequency receiver and driver circuits for commercial memory
10/17/2002	US20020149893 Protection relay
10/17/2002	US20020149389 In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays
10/17/2002	US20020149388 Method for the accurate electrical testing of semiconductor devices

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