G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2002
10/31/2002	DE10210744A1 Gerät zum Testen von integrierten Schaltkreisen Device for testing integrated circuits
10/31/2002	DE10209804A1 Eine abtastbasierte Mehrfachringoszillatorstruktur für eine Chip-interne Geschwindigkeitsmessung A abtastbasierte multiple ring oscillator structure for a chip-internal velocity measurement
10/31/2002	DE10120881A1 Control station for testing cabling under alternating loads moves weight-impacted on-load slide devices along a vertical guide device from a slide-down position to a slide-up position
10/31/2002	DE10120147A1 Circuit for detection of short voltage interruptions in supply voltage produces voltage reversal in comparator input to initiate voltage interruption signal
10/31/2002	DE10119227A1 Method for generating test programs for wiring testers, using computer-aided design wiring diagram data for a test program tuned into wiring tester, converter module fed with this data, test-program generator and output module.
10/30/2002	EP1253663A1 Battery pack
10/30/2002	EP1253600A2 Memory tester
10/30/2002	EP1253432A2 Power reduction in module-based scan testing
10/30/2002	EP1253431A2 A method of fault isolation of a digital electronic device
10/30/2002	EP1253430A1 Procedure and device for current monitoring in a power distribution network
10/30/2002	EP1253429A2 Electromagnetic emission source identification apparatus and associated method, computer device, and computer software program product
10/30/2002	EP1253428A2 Measuring bridge circuit in four or multiple wire technology with suppressing of line losses
10/30/2002	EP1252613A1 Time constrained sensor data retrieval system and method
10/30/2002	EP1252529A1 Partial discharge detection test link, partial discharge detection system and methods for detecting partial discharge on a power cable
10/30/2002	EP1252528A1 Capacitance monitoring systems
10/30/2002	EP1252527A2 Static charge warning device
10/30/2002	EP0843823B1 Detection and location of current leakage paths
10/30/2002	CN2519288Y Test instrument of power supply apparatus
10/30/2002	CN2519287Y DC high-speed switch state monitor
10/30/2002	CN2519281Y Probe measurment and test device
10/30/2002	CN1377503A Method and circuit for evaluating information content of memory cell
10/30/2002	CN1377305A Four electrical contact testing machine for miniature inductors and process of using
10/30/2002	CN1377218A Method for making short-circuit test tool of PCB and its short-circuit test method
10/30/2002	CN1377192A Method and device for detecting beam current of kinescope and its application
10/30/2002	CN1376932A Automatic test system, device and method for ICs and overall system
10/30/2002	CN1376931A Semiconductor test system based on event
10/30/2002	CN1376930A Method and equipment for positioning failure point of power transmission line
10/30/2002	CN1376929A Monitor of electric cable breaking and its method
10/30/2002	CN1376928A Liquid crystal substrate and check device
10/30/2002	CN1093641C Memory testing apparatus
10/29/2002	US6473877 ECC code mechanism to detect wire stuck-at faults
10/29/2002	US6473727 Processor development systems
10/29/2002	US6473722 Compact fault detecting system capable of detecting fault without omission
10/29/2002	US6473707 Test executive system and method including automatic result collection
10/29/2002	US6473700 Apparatus for use in a logic analyzer for compressing digital data for waveform viewing
10/29/2002	US6473556 Apparatus for inspecting integrated circuits
10/29/2002	US6473346 Self burn-in circuit for semiconductor memory
10/29/2002	US6473345 Semiconductor memory device which can be simultaneously tested even when the number of semiconductor memory devices is large and semiconductor wafer on which the semiconductor memory devices are formed
10/29/2002	US6473344 Semiconductor memory device capable of outputting a wordline voltage via an external pin
10/29/2002	US6472902 Semiconductor device
10/29/2002	US6472899 Method for determining a load line based variable voltage input for an integrated circuit product
10/29/2002	US6472898 Method and system for testing a semiconductor memory device
10/29/2002	US6472895 Method and system for adapting burn-in boards to multiple burn-in systems
10/29/2002	US6472894 Apparatus for testing bumped die
10/29/2002	US6472892 Configuration for testing chips using a printed circuit board
10/29/2002	US6472891 Method and apparatus for testing semiconductor packages without damage
10/29/2002	US6472889 Apparatus and method for producing an ion channel microprobe
10/29/2002	US6472883 Detection of surface anomalies in elongate conductive members by pulse propagation analysis
10/29/2002	US6472882 Fail-safe electronic circuit breaker
10/29/2002	US6472880 Accurate voltage measurement system using relay isolated circuits
10/29/2002	US6472879 Method for diagnosing a battery of a vehicle and a system thereof
10/29/2002	US6472877 Method and apparatus for measuring the opening time of a medium voltage air circuit breaker
10/29/2002	US6472875 Method for detecting a motor vehicle battery failure
10/29/2002	US6472862 Programmable voltage divider and method for testing the impedance of a programmable element
10/29/2002	US6472859 Capacitively coupled electrical ground detection circuit
10/29/2002	US6472847 Battery operable device with battery state-of-charge indicator
10/29/2002	US6472234 Failure analysis method for chip of ball grid array type semiconductor device
10/29/2002	US6472233 MOSFET test structure for capacitance-voltage measurements
10/29/2002	US6471538 Contact structure and production method thereof and probe contact assembly using same
10/29/2002	US6471531 Socket for electric part
10/29/2002	US6471524 IC socket
10/29/2002	US6471462 Carrier handling apparatus of an IC module handler
10/29/2002	US6470583 Examination of insulation displacement connection
10/24/2002	WO2002084786A2 Ultrafast sampler with coaxial transition
10/24/2002	WO2002084729A2 Method for producing a chalcogenide-semiconductor layer of the abc2 type with optical process monitoring
10/24/2002	WO2002084668A1 Method and system to optimize test cost and disable defects for scan and bist memories
10/24/2002	WO2002084487A2 Method and apparatus for performing failure recovery in a java platform
10/24/2002	WO2002084314A1 Apparatus and method for managing automatic transitions between multiple feedback paths
10/24/2002	WO2002084313A1 Measuring probe and device
10/24/2002	WO2002084312A2 Measuring back-side voltage of an integrated circuit
10/24/2002	WO2002084311A1 Method of measuring electromagnetic field intensity and device therefor, method of measuring electromagnetic field intensity distribution and device thereof, method of measuring current/voltage distribution and device thereof
10/24/2002	WO2002083364A1 Implement for cleaning tip and lateral surface of contactor
10/24/2002	WO2002068975A8 Ic testing device with a heating apparatus
10/24/2002	WO2002042786A3 Method and apparatus for determining the state of charge of a lithium-ion battery
10/24/2002	WO2002035248A8 Power transformer transfer function testing
10/24/2002	WO2001059443A9 Storage battery with integral battery tester
10/24/2002	WO2000035262A3 Method for mounting an electronic component
10/24/2002	US20020157082 Inter-dice wafer level signal transfer methods for integrated circuits
10/24/2002	US20020157078 Programming mode selection with JTAG circuits
10/24/2002	US20020157074 Method for layout design and timing adjustment of logically designed integrated circuit
10/24/2002	US20020157065 Clock synchronizing circuit and method of designing the same
10/24/2002	US20020157053 Semiconductor test system with time critical sequence generation using general purpose operating system
10/24/2002	US20020157052 Test data generator
10/24/2002	US20020157051 Method and apparatus for ABIST diagnostics
10/24/2002	US20020157050 Position independent testing of circuits
10/24/2002	US20020157049 Method for testing semiconductor memory modules
10/24/2002	US20020157047 Logical verification apparatus and method for memory control circuit
10/24/2002	US20020157042 Algorithmically programmable memory tester with breakpoint trigger, error jamming and 'scope mode that memorizes target sequences
10/24/2002	US20020156967 Semiconductor memory device
10/24/2002	US20020156550 Robust windowing method using the poisson yield model for determining the systematic and random yield of failing circuits on semiconductor wafers
10/24/2002	US20020156540 Tool for automatic testability analysis
10/24/2002	US20020155736 Probe pin assembly
10/24/2002	US20020155735 Contact structure and production method thereof and probe contact assembly using same
10/24/2002	US20020154559 Semiconductor device, system, and method of controlling accessing to memory
10/24/2002	US20020154534 Method and circuit for determining sense amplifier sensitivity
10/24/2002	US20020154296 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool
10/24/2002	US20020153919 Potential sensor for detecting voltage of inspection target at non-contact condition to attain higher speed of inspection
10/24/2002	US20020153917 Semiconductor integrated circuit and a method of testing the same
10/24/2002	US20020153915 Method and system for line current detection for power line cords
10/24/2002	US20020153914 AC testing of leakage current

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