G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2002
11/07/2002	DE10121405A1 Connection testing apparatus for plug connections for road vehicle comprises internal wiring arrangement that facilitates internal testing to ensure there are no loose or incorrect connections
11/07/2002	DE10118569A1 Circuit arrangement for testing uninterruptible power supplies is connected to the UPS on its input side and connected to the power supply network on its output side via a swing transformer and an equalizing coil
11/07/2002	DE10118027A1 Battery measurement terminal with external start tie lug, monitors charging state of a vehicle battery by checking the total current drawn from the battery via all connections to the battery terminal
11/07/2002	DE10117249A1 Automatic testing system for flat coils, typically used in antennae or transponders, involves placing the coils in a magnetic field so that detected field changes caused can be related to coil properties
11/07/2002	CA2444881A1 Flow control system to reduce memory buffer requirements and to establish priority servicing between networks
11/06/2002	EP1255202A2 High performance sub-system design & assembly
11/06/2002	EP1254461A1 Testable rom chip for a data memory redundant logic
11/06/2002	EP1254377A2 Capacitively coupled electrical ground detection circuit
11/06/2002	EP1129432B1 Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chip
11/06/2002	CN2519994Y Residual current alarm circuit breaker
11/06/2002	CN1378649A Sensor for detecting high-frequency oscillations of voltage and arrangement of sensor
11/06/2002	CN1378286A Method for readable memory medium and circuit parts verification and integrated circuit device
11/06/2002	CN1378259A Multiple semiconductor die testing system with automatic identifying function
11/06/2002	CN1378258A Multiple semiconductor die testing system and method with expandible channels
11/06/2002	CN1378257A Testing structure device and method of semiconductor storage element
11/06/2002	CN1378088A Circuit board detection equipment and circuit board detection method
11/06/2002	CN1093950C Voltage reference apparatus, voltameter, battery voltage detection apparatus and wireless communication device
11/06/2002	CN1093939C Low cost CMOS tester
11/05/2002	US6477684 Automatic test pattern generation modeling for LSSD to interface with Muxscan
11/05/2002	US6477676 Intermediate stage of a multi-stage algorithmic pattern generator for testing IC chips
11/05/2002	US6477674 Method and apparatus for conducting input/output loop back tests using a local pattern generator and delay elements
11/05/2002	US6477672 Memory testing apparatus
11/05/2002	US6477668 Signal generation circuit of semiconductor testing apparatus
11/05/2002	US6477602 Method and circuit for detecting the presence of a connector in a socket
11/05/2002	US6477486 Automatic location determination of devices under test
11/05/2002	US6477475 Fault point location system
11/05/2002	US6477200 Multi-pair gigabit ethernet transceiver
11/05/2002	US6477199 Dynamic regulation of power consumption of a high-speed communication system
11/05/2002	US6477115 Semiconductor integrated circuit
11/05/2002	US6477024 Fault determination apparatus and fault determination method for a battery set
11/05/2002	US6476729 Power monitoring module with display unit for electrical power source device
11/05/2002	US6476667 Adjustable current limiting/sensing circuitry and method
11/05/2002	US6476633 Semiconductor integrated circuit and testing method thereof
11/05/2002	US6476632 Ring oscillator design for MOSFET device reliability investigations and its use for in-line monitoring
11/05/2002	US6476631 Defect screening using delta VDD
11/05/2002	US6476630 Method for testing signal paths between an integrated circuit wafer and a wafer tester
11/05/2002	US6476629 In-tray burn-in board for testing integrated circuit devices in situ on processing trays
11/05/2002	US6476628 Semiconductor parallel tester
11/05/2002	US6476627 Method and apparatus for temperature control of a device during testing
11/05/2002	US6476626 Probe contact system having planarity adjustment mechanism
11/05/2002	US6476625 Method for determining coplanarity of electrical contact of BGA type packages prior to electrical characterization
11/05/2002	US6476617 Method of sorting monolithic ceramic capacitors by measuring the insulation resistance thereof
11/05/2002	US6476616 Connector continuity checking device
11/05/2002	US6476615 Device for testing dynamic characteristics of components using serial transmissions
11/05/2002	US6476613 Method of fault location in parallel transmission lines with series compensation
11/05/2002	US6476598 Ringing preventive circuit, device under test board, pin electronics card, and semiconductor device
11/05/2002	US6476597 Ionizing dose hardness assurance technique for CMOS integrated circuits
11/05/2002	US6476333 Raised contact structures (solder columns)
11/05/2002	US6475818 Method for fabricating multi-channel array optical device
11/05/2002	US6475816 Method for measuring source and drain junction depth in silicon on insulator technology
11/05/2002	US6475085 Numerical total high/low lottery game
11/05/2002	US6474997 Contact sheet
11/05/2002	US6474350 Cleaning device for probe needle of probe card and washing liquid used therefor
10/2002
10/31/2002	WO2002087050A1 Method and device for measuring the temperature of windings of a drive motor
10/31/2002	WO2002086838A1 Safety device
10/31/2002	WO2002086523A1 Sequence generation with high-time-precision by using general-purpose operating system in semiconductor test system
10/31/2002	WO2002086521A1 Trailer tether sensor circuit
10/31/2002	WO2002086520A1 Inspection apparatus and inspection method
10/31/2002	WO2002021149A3 Battery monitoring
10/31/2002	US20020162066 Test vector compression method
10/31/2002	US20020162065 Scan test circuit
10/31/2002	US20020162064 RAM functional test facilitation circuit with reduced scale
10/31/2002	US20020162063 Hierarchical access of test access ports in embedded core integrated circuits
10/31/2002	US20020162060 Integrated circuit facilitating its unit test
10/31/2002	US20020162055 Trace circuit
10/31/2002	US20020162046 Algorithmically programmable memory tester with history FIFO's that aid in ERROR analysis and recovery
10/31/2002	US20020161963 Single-chip microcomputer with dynamic burn-in test function and dynamic burn-in testing method therefor
10/31/2002	US20020161947 Route searching method, timing analyzing method, waveform analyzing method, electronic circuit simulation apparatus, and storage medium therefor
10/31/2002	US20020161568 Memory circuit for use in hardware emulation system
10/31/2002	US20020161542 Method and apparatus for transmission line analysis
10/31/2002	US20020161539 Optical sequence time domain reflectometry
10/31/2002	US20020161537 Method and apparatus for determining battery life
10/31/2002	US20020160768 Advanced production test method and apparatus for testing electronic devices
10/31/2002	US20020160717 Chamber for and a method of processing electronic devices and the use of such a chamber
10/31/2002	US20020159460 Flow control system to reduce memory buffer requirements and to establish priority servicing between networks
10/31/2002	US20020159310 System of performing a repair analysis for a semiconductor memory device having a redundant architecture
10/31/2002	US20020159308 Method and device for refreshing reference cells
10/31/2002	US20020158658 Method for automated measurement of the ohmic rotor resistance of an asynchronous mechine
10/31/2002	US20020158656 Apparatus and method for power continuity testing in a parallel testing system
10/31/2002	US20020158655 Method and apparatus for testing bumped die
10/31/2002	US20020158654 Apparatus and method for determining a current through a power semiconductor component
10/31/2002	US20020158653 Photosensors for testing an integrated circuit
10/31/2002	US20020158652 CMOS integrated circuit and timing signal generator using same
10/31/2002	US20020158651 Semiconductor device with a self-testing function and a method for testing the semiconductor device
10/31/2002	US20020158649 Test key layout for detecting via-open failure
10/31/2002	US20020158648 Gate dielectric breakdown test method
10/31/2002	US20020158647 Apparatus for manufacturing semiconductor device, method for manufacturing semiconductor device, inspection apparatus for semiconductor device, and inspection method for semiconductor device
10/31/2002	US20020158646 Spiral leaf spring contacts
10/31/2002	US20020158645 Method and apparatus for measuring temperature parameters of an ISFET using hydrogenated amorphous as a sensing film
10/31/2002	US20020158642 Surface passivation method and arrangement for measuring the lifetime of minority carriers in semiconductors
10/31/2002	US20020158639 Laminate with an inside layer circuit used for multilayer printed circuit board for a high frequency circuit ,and method and device for measuring circuit impedance of the laminate with inside layer circuit
10/31/2002	US20020158638 Method for compensating for measuring error in detecting current in an energy sroting means
10/31/2002	US20020158634 Voltage detection device for a battery package
10/31/2002	US20020158633 Method for operating an electronic overcurrent trip of a power circuit breaker
10/31/2002	US20020158625 Test apparatus for parallel testing a number of electronic components and a method for calibrating the test apparatus
10/31/2002	US20020158620 Method and circuit for testing high frequency mixed signal circuits with frequency signals
10/31/2002	US20020158608 Secondary battery device and method of protecting an overdischarge of the same
10/31/2002	US20020157487 Actuator assembly
10/31/2002	US20020157485 Mask for evaluating selective epitaxial growth process
10/31/2002	DE10217303A1 Algorithmisch programmierbarer Speichertester mit Unterbrechungspunktauslöser, Fehlerblockierung und Oszilloskop-Modus, der Zielsequenzen speichert Algorithmically programmable memory tester with breakpoint trigger fault blocking and oscilloscope mode, the target sequences stores

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