G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2002
11/14/2002	US20020167303 Non-contact voltage measurement method and device, and detection probe
11/14/2002	US20020167294 Rechargeable power supply system and method of protection against abnormal charging
11/14/2002	US20020167293 Battery capacity calibration
11/14/2002	US20020167055 Semiconductor device
11/14/2002	US20020167034 Semiconductor device evaluation method and apparatus, semiconductor device manufacturing control method, semiconductor device manufacturing method, and recording medium
11/14/2002	US20020166964 Detection of defects in patterned substrates
11/14/2002	US20020166801 System for integrated circuit (IC) transporting of IC test device and the method thereof
11/14/2002	US20020166397 Method and a device for detecting an internal arc in a metal-clad electrical link
11/14/2002	DE10160088A1 Chipträger und Verfahren zum Testen eines Chips, das den Chipträger verwendet Chip carrier and a method for testing chips using the chip carrier
11/14/2002	DE10124735C1 Semiconductor chip testing method has test mode status of initiated test mode read out via proof mode before execution of test mode
11/14/2002	DE10121309A1 Test circuit for synchronous integrated circuits, especially memory (DRAM) chips whereby test errors due to signal transfer time differences are minimized and the circuit is insensitive to signal voltage potential variations
11/14/2002	DE10120524A1 Vorrichtung und Verfahren zur Ermittlung des Stromes durch ein Leistungs-Halbleiterbauelement Apparatus and method for determination of the current through a power semiconductor device
11/14/2002	DE10120066A1 Recognition of different memory chips used with DRAM memory modules by insertion of an electronic module in the memory module with which it can be determined if different memory chip types have been used in the same module
11/14/2002	DE10025900C2 Sonde für ein elektro-optisch abtastendes Oszilloskop A probe for electro-optically scanning oscilloscope
11/14/2002	DE10008180C2 Elektronische Gebereinrichtung Electronic timer means
11/14/2002	CA2446240A1 Method for determining state of charge of a battery by measuring its open circuit voltage
11/13/2002	WO2001090767A1 Method and device for detecting accidental arcs
11/13/2002	EP1256009A1 Lssd interface
11/13/2002	EP1256008A1 Method and apparatus for selectively compacting test responses
11/13/2002	EP1256007A1 Decompressor/prpg for applying pseudo-random and deterministic test patterns
11/13/2002	EP1256006A1 Non-invasive electrical measurement of semiconductor wafers
11/13/2002	EP1256003A2 Semiconductor component test socket
11/13/2002	EP1015899A4 A method for application of weighted random patterns to partial scan designs
11/13/2002	CN2520513Y Device for detection of break of electric wire in wall
11/13/2002	CN2520512Y High voltage leakage detection tool
11/13/2002	CN2520511Y In-line detection terminal box
11/13/2002	CN1379513A Contactor device
11/13/2002	CN1379499A Method of monitoring operation reliability of rechargeable lithium cell
11/13/2002	CN1379457A Process for finding out unity coupling coefficient of flash memory by GIDL method
11/13/2002	CN1379249A Automatic inspecting device for semiconductor equipment
11/13/2002	CN1378820A 超声诊断仪 Ultrasound Scanner
11/12/2002	US6481000 Programmable logic device with circuitry for observing programmable logic circuit signals and for preloading programmable logic circuits
11/12/2002	US6480981 Output stage of a multi-stage algorithmic pattern generator for testing IC chips
11/12/2002	US6480980 Combinational test pattern generation method and apparatus
11/12/2002	US6480979 Semiconductor integrated circuits and efficient parallel test methods
11/12/2002	US6480978 Parallel testing of integrated circuit devices using cross-DUT and within-DUT comparisons
11/12/2002	US6480800 Method and system for generating self-testing and random input stimuli for testing digital systems
11/12/2002	US6480799 Method and system for testing RAMBUS memory modules
11/12/2002	US6480435 Semiconductor memory device with controllable operation timing of sense amplifier
11/12/2002	US6480432 Flash memory device having mask ROM cells for self-test
11/12/2002	US6480415 Nonvolatile semiconductor memory device
11/12/2002	US6480394 Method for the verification of the polarity, presence, alignment of components and short circuits on a printed circuits board
11/12/2002	US6480073 Method of evaluating quality of crystal unit
11/12/2002	US6480053 Semiconductor device having an internal power supply circuit
11/12/2002	US6480021 Transmitter circuit comprising timing deskewing means
11/12/2002	US6480019 Multiple voted logic cell testable by a scan chain and system and method of testing the same
11/12/2002	US6480017 Evaluating pattern for measuring an erosion of a semiconductor wafer polished by a chemical mechanical polishing
11/12/2002	US6480016 Tester, a test system, and a testing method for a semiconductor integrated circuit
11/12/2002	US6480013 Method for the calibration of an RF integrated circuit probe
11/12/2002	US6480012 Probe card device
11/12/2002	US6480011 Screening of semiconductor integrated circuit devices
11/12/2002	US6480005 Electrical connection testing device and an electrical connection testing method for terminal fittings accommodated in a connector
11/12/2002	US6480004 Method of testing continuity using an auto-lock continuity check unit
11/12/2002	US6479985 Compare path bandwidth control for high performance automatic test systems
11/12/2002	US6479984 Fixed guide for singulator arm of semiconductor handler
11/12/2002	US6479983 Semiconductor device testing apparatus having timing hold function
11/12/2002	US6479982 Rotator for a module integrated circuit (IC) handler
11/12/2002	US6479981 Remote light indication fault indicator with a timed reset circuit and a manual reset circuit
11/12/2002	US6479978 High-resolution measurement of phase shifts in high frequency phase modulators
11/12/2002	US6479977 Automatic electronic load pull circuit for oscillators
11/12/2002	US6479967 Method of controlling the discharging of a secondary storage cell battery
11/12/2002	US6479777 Electronic parts conveying apparatus and method
11/12/2002	US6479363 Semiconductor integrated circuit and method for testing the same
11/12/2002	US6479310 Method for testing a semiconductor integrated circuit device
11/12/2002	US6478677 Numerical total keno game
11/07/2002	WO2002089147A2 Circuit and method for memory test and repair
11/07/2002	WO2002088984A1 Flow control system to reduce memory buffer requirements and to establish priority servicing between networks
11/07/2002	WO2002088945A1 Method of designing circuit having multiple test access ports, circuit produced thereby and method of using same
11/07/2002	WO2002088763A2 Voltage acquisition with open-loop charged-particle-beam probe system
11/07/2002	WO2002088759A1 Method and circuit for testing high frequency mixed signal circuits with low frequency signals
11/07/2002	WO2002054447A3 System and method for prototyping and fabricating complex microwave circuits
11/07/2002	WO2002052672A3 Storage battery with integrated detecton and indicating means
11/07/2002	US20020166089 System and method for test generation with dynamic constraints using static analysis
11/07/2002	US20020165692 Semiconductor test system monitor apparatus thereof
11/07/2002	US20020165097 Biodegradable; enhance nutrient uptake
11/07/2002	US20020164829 Measuring apparatus and film formation method
11/07/2002	US20020164145 Fiber optic wafer probe
11/07/2002	US20020164008 Apparatus and method for network - initiated real - time multi - party communications
11/07/2002	US20020163885 Queue control method and system
11/07/2002	US20020163881 Communications bus with redundant signal paths and method for compensating for signal path errors in a communications bus
11/07/2002	US20020163353 Dynamic register with IDDQ testing capability
11/07/2002	US20020163352 Externally induced voltage alterations for integrated circuit analysis
11/07/2002	US20020163351 Method for producing test patterns for testing an integrated circuit
11/07/2002	US20020163349 Probe card and method of producing the same
11/07/2002	US20020163348 Scanning laser beam electrical circuit inspection system
11/07/2002	US20020163344 Insulated device diagnosing system and partial discharge detecting method
11/07/2002	US20020163343 Apparatus and method for testing fuses
11/07/2002	US20020163342 Device and method for inspection
11/07/2002	US20020163341 Device and method for inspecting circuit board
11/07/2002	US20020163340 Method for diagnosing performance problems in cabling
11/07/2002	US20020163339 Method and apparatus for high-voltage battery array monitoring sensors network
11/07/2002	US20020163338 Electronic battery tester
11/07/2002	US20020163327 System and method for testing integrated passive components in a printed circuit board
11/07/2002	US20020163065 Chip carrier, and method of testing a chip using the chip carrier
11/07/2002	US20020163019 Interconnect substrate with circuits for field-programmability and testing of multichip modules and hybrid circuits
11/07/2002	US20020162997 Semiconductor chip
11/07/2002	US20020162539 Actuator configuration and method, in particular, for actuating an injection valve of an internal combustion engine
11/07/2002	DE10217609A1 Ein-Chip-Mikrocomputer mit dynamischer Einbrenn-Testfunktion und dynamisches Einbrenn-Testverfahren dafür A one-chip microcomputer with a dynamic burn-in test function and dynamic burn-in test method therefor
11/07/2002	DE10162507A1 Überwachungsschaltung Monitoring circuit
11/07/2002	DE10153892A1 Halbleiterspeichervorrichtung zur gleichzeitigen Eingabe von N Datensignalen Semiconductor memory device for simultaneous input of N data signals

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