G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2002
11/20/2002	EP1258733A1 Prober and probe method
11/20/2002	EP1258068A1 Portable jump-starting battery pack with charge monitoring system
11/20/2002	EP1257839A2 Electromechanical apparatus for testing ic chips using first and second sets of substrates which are pressed together
11/20/2002	EP1257838A1 Automated testing equipment having a modular offset test head with split backplane
11/20/2002	EP1257837A1 Phase shifter with reduced linear dependency
11/20/2002	EP1257836A1 Electric arc monitoring systems
11/20/2002	EP1257834A1 Method for measuring electrical characteristics of a telecommunication cable
11/20/2002	EP1257833A1 Method and product palette for testing electronic products
11/20/2002	EP1018030B1 A method of controlling test probes in a testing apparatus for electronic printed circuit boards, and an apparatus for performing the method
11/20/2002	EP0930570B1 Interconnect testing through utilization of board topology data
11/20/2002	EP0901637B1 Method for testing electronic components
11/20/2002	EP0595379B1 A method and apparatus for analog test signal usage in a digital environment
11/20/2002	CN2521624Y Electrical leakage mechanical faults alarmer
11/20/2002	CN1380982A Data carrier module having indication means for indicating result of test operation
11/20/2002	CN1380981A Device and method for inspection of circuit basic board
11/20/2002	CN1380980A Device and method for inspection
11/20/2002	CN1380979A Probe card and method of producing the same
11/20/2002	CN1380689A Reliability testing device and its testing method
11/20/2002	CN1380659A Semiconductor memory device and method for selecting multi-word-line in said device
11/20/2002	CN1380622A Method for operating automatic trade information system
11/20/2002	CN1380553A Method for measuring real-time power-angle and power generator
11/20/2002	CN1380552A Break alarm device for communication cable
11/20/2002	CN1094597C Functional test process for mechanical switching element
11/20/2002	CA2386769A1 Synthetic making/breaking-capacity test circuit for high-voltage alternating current circuit-breakers
11/19/2002	US6484307 Method for fabricating and checking structures of electronic circuits in a semiconductor substrate
11/19/2002	US6484294 Semiconductor integrated circuit and method of designing the same
11/19/2002	US6484282 Test pattern generator, a memory testing device, and a method of generating a plurality of test patterns
11/19/2002	US6484281 Software-based simulation system capable of simulating the combined functionality of a north bridge test module and a south bridge test module
11/19/2002	US6484280 Scan path test support
11/19/2002	US6484279 Testing system for evaluating integrated circuits, a testing system, and a method for testing an integrated circuit
11/19/2002	US6484134 Property coverage in formal verification
11/19/2002	US6484116 Program executing system for semiconductor testing equipment
11/19/2002	US6484110 Method for displaying available time of battery in mobile station
11/19/2002	US6483803 Apparatus and method for restoring fiber optic communications network connections
11/19/2002	US6483759 Methods for testing a group of semiconductor devices simultaneously, and devices amenable to such methods of testing
11/19/2002	US6483758 Integrated circuit test systems that use direct current signals and impedance elements to improve test signal transmission speed and reduce test signal distortion
11/19/2002	US6483745 Non-volatile semiconductor memory device with defect detection
11/19/2002	US6483684 Current limiting apparatus
11/19/2002	US6483501 Load current compensated type voltage sampling circuit
11/19/2002	US6483435 Method and device of fault location for distribution networks
11/19/2002	US6483338 Method and system of testing a chip
11/19/2002	US6483337 Method for achieving synchronous non-destructive latchup characterization
11/19/2002	US6483336 Indexing rotatable chuck for a probe station
11/19/2002	US6483334 Method for reliability testing of semiconductor IC
11/19/2002	US6483333 Automated multi-chip module handler and testing system
11/19/2002	US6483332 Conductive bump array contactors having an ejector and methods of testing using same
11/19/2002	US6483331 Tester for semiconductor device
11/19/2002	US6483330 Method for selecting components for a matched set using wafer interposers
11/19/2002	US6483329 Test system, test contactor, and test method for electronic modules
11/19/2002	US6483328 Probe card for probing wafers with raised contact elements
11/19/2002	US6483327 Quadrant avalanche photodiode time-resolved detection
11/19/2002	US6483326 Localized heating for defect isolation during die operation
11/19/2002	US6483319 Method of conducting broadband impedance response tests to predict stator winding failure
11/19/2002	US6483318 Electric circuit providing selectable short circuit for instrumentation applications
11/19/2002	US6483316 Method of diagnosing partial discharge in gas-insulated apparatus and partial discharge diagnosing system for carrying out the same
11/19/2002	US6483292 System for inspecting a replaceable part in an electronic device
11/19/2002	US6483290 Apparatus for metering electrical power that determines energy usage data based on downloaded information
11/19/2002	US6483275 Consumer battery having a built-in indicator
11/19/2002	US6482748 Poly gate silicide inspection by back end etching
11/19/2002	US6482048 Automated assembly methods for miniature circuit breakers with wire attachment clamps
11/19/2002	US6481280 Method and a device for detecting an internal arc in a metal-clad electrical link
11/19/2002	CA2306089C High-speed, adaptive iddq measurement
11/14/2002	WO2002091544A1 Method and apparatus for high-voltage battery array monitoring sensors network
11/14/2002	WO2002091182A2 Facilitating comparisons between simulated and actual behavior of electronic devices
11/14/2002	WO2002091007A1 Method for determining state of charge of a battery by measuring its open circuit voltage
11/14/2002	WO2002091006A1 Method for measuring fuse resistance in a fuse array
11/14/2002	WO2002091005A2 Differential receiver architecture
11/14/2002	WO2002091004A2 Test and on-board programming station
11/14/2002	WO2002091003A1 Contact control
11/14/2002	WO2002090928A2 Apparatus for automatically measuring the resistivity of semiconductor boules using the method of four probes
11/14/2002	WO2002090054A2 Contactor cleaning sheet, contactor cleaning sheet manufacturing method, and contactor cleaning method
11/14/2002	WO2002073661A3 Extraction method of defect density and size distributions
11/14/2002	WO2002057801A3 High speed and high accuracy dut power supply with active boost circuitry
11/14/2002	US20020170011 Method and apparatus of boundary scan testing for AC-coupled differential data paths
11/14/2002	US20020170010 Power reduction in module-based scan testing
11/14/2002	US20020170009 Testing regularly structured logic circuits in integrated circuit devices
11/14/2002	US20020170008 Integrated circuit and testing method for integrated circuit
11/14/2002	US20020170007 Method of evaluating core based system-on-a-chip (SoC) and structure of SoC incorporating same
11/14/2002	US20020170006 Differential receiver architecture
11/14/2002	US20020170003 Semiconductor memory
11/14/2002	US20020170000 Test and on-board programming station
11/14/2002	US20020169585 Adaptive method and apparatus for transmission line analysis
11/14/2002	US20020169581 Method and device for state sensing of technical systems such as energy stores
11/14/2002	US20020169580 Aging measuring device
11/14/2002	US20020169572 Battery pack, method for charging/discharging counting and method for setting residual capacity of the battery pack
11/14/2002	US20020168787 Irradiating circuit pattern; scattering radiation detects defects
11/14/2002	US20020168099 Image searching defect detector
11/14/2002	US20020168015 Plural circuit selection using role reversing control inputs
11/14/2002	US20020167859 Precharge control signal generator, and semiconductor memory device using the same
11/14/2002	US20020167849 Semiconductor memory device and testing method therefor
11/14/2002	US20020167847 Semiconductor memory device having test mode
11/14/2002	US20020167660 Illumination for integrated circuit board inspection
11/14/2002	US20020167373 Ultrafast sampler with non-parallel shockline
11/14/2002	US20020167334 Semiconductor integrated circuit
11/14/2002	US20020167330 Fixture-less bare board tester
11/14/2002	US20020167329 Probe station thermal chuck with shielding for capacitive current
11/14/2002	US20020167327 Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissions
11/14/2002	US20020167326 Use of coefficient of a power curve to evaluate a semiconductor wafer
11/14/2002	US20020167323 Method for measuring fuse resistance in a fuse array
11/14/2002	US20020167304 Test board de-embedding method to improve RF measurements accuracy on an automatic testing equipment for IC wafers

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