G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/2002
11/27/2002	EP1260822A2 Automatic test equipment for semiconductor device
11/27/2002	EP1260010A2 System and method accommodating more than one battery within an electronic device
11/27/2002	EP1259831A1 Control system simulation, testing, and operator training
11/27/2002	EP1259829A2 Vertical counter balanced test head manipulator
11/27/2002	EP1259828A2 Electric test connector, equipment and system using same
11/27/2002	EP1259165A2 Modelling and testing of an integrated circuit
11/27/2002	EP0909390A3 Statistical pattern analysis methods of partial discharge measurments in high voltage insulation
11/27/2002	EP0766829B1 Method of cleaning probe tips of probe cards
11/27/2002	CN2522871Y Cell tray
11/27/2002	CN2522870Y Breakdown current detection device of puncture tester
11/27/2002	CN2522869Y Electric-circuit short fault indicator
11/27/2002	CN2522868Y Electronic element detection apparatus
11/27/2002	CN2522867Y Thyristor breakdown optical-fiber detection circuit
11/27/2002	CN1382289A Time constrained sensor data retrieval system and method
11/27/2002	CN1382271A Automatic measuring apapratus, automatic measurement data processing and control apparatus, network system and record medium of automatic measurement processing and control program
11/27/2002	CN1382260A Environmental test chamber and carrier for use therein
11/27/2002	CN1381847A 半导体存储器装置 The semiconductor memory device
11/27/2002	CN1381733A Testing system for piezoelectric oscillator and testing method thereof
11/27/2002	CN1381712A Method and device for measuring mechanical characteristics of motor
11/27/2002	CN1095290C Single board test apparatus for conference TV system
11/27/2002	CN1095246C Power-out reset system
11/27/2002	CN1095149C Electric appliances inspecting system
11/26/2002	US6487704 System and method for identifying finite state machines and verifying circuit designs
11/26/2002	US6487701 System and method for AC performance tuning by thereshold voltage shifting in tubbed semiconductor technology
11/26/2002	US6487700 Semiconductor device simulating apparatus and semiconductor test program debugging apparatus using it
11/26/2002	US6487688 Method for testing circuits with tri-state drivers and circuit for use therewith
11/26/2002	US6487682 Semiconductor integrated circuit
11/26/2002	US6487681 In-sheet transceiver testing
11/26/2002	US6487514 System and method for computer controlled interaction with integrated circuits
11/26/2002	US6487137 Semiconductor memory device having a second voltage supplier supplying transfer gates with a second voltage higher than a first voltage
11/26/2002	US6486952 Semiconductor test apparatus
11/26/2002	US6486927 Liquid crystal display test system
11/26/2002	US6486731 Semiconductor integrated circuit device capable of externally monitoring internal voltage
11/26/2002	US6486693 Method and apparatus for testing integrated circuit chips that output clocks for timing
11/26/2002	US6486691 Tester for a semiconductor IC circuit having multiple pins
11/26/2002	US6486690 Device under test board and testing method
11/26/2002	US6486688 Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristics
11/26/2002	US6486687 Wafer probe station having environment control enclosure
11/26/2002	US6486686 Apparatus for testing a bare-chip LSI mounting on a printed board
11/26/2002	US6486685 Remote resistivity measurement
11/26/2002	US6486677 Conductivity testing method for a sub-harness and a sub-harness manufacturing apparatus
11/26/2002	US6486676 Reflection measurement method and apparatus for devices that are accessed through dispersive elements
11/26/2002	US6486674 Method for detecting faults on safety oriented sensors
11/26/2002	US6486649 Built-in frequency test circuit for testing the frequency of the output of a frequency generating circuit
11/26/2002	US6486635 Monitor signal output circuit, battery pack, battery voltage monitor circuit, battery system, apparatus, battery voltage monitor method, and battery voltage monitor program storage medium
11/26/2002	US6486552 Method and apparatus for testing bumped die
11/26/2002	US6486493 Semiconductor integrated circuit device having hierarchical test interface circuit
11/26/2002	US6486472 Inspecting system using electron beam and inspecting method using same
11/26/2002	US6486450 Method and apparatus for inducing locally elevated temperatures in an application specific integrated circuit
11/26/2002	US6485991 System and method for output track unit detection and safe storage tube removal
11/26/2002	US6485966 Hybrid microorganism for use in gene therapy
11/26/2002	US6485009 Holding apparatus
11/26/2002	US6484557 Slide-typed switch durability testing apparatus for automobile
11/25/2002	CA2348586A1 Power management system
11/21/2002	WO2002093821A1 Device for testing the conformity of an electronic connection
11/21/2002	WO2002093640A1 Method for evaluating system-on-chip (soc) having core as its base and soc structure using the evaluation method
11/21/2002	WO2002093187A2 Method and apparatus for predicting the available energy of a battery
11/21/2002	WO2002093186A1 Display device comprising a plurality of leds
11/21/2002	WO2002093185A1 Wafer map display apparatus and method for semiconductor test system
11/21/2002	WO2002012909A3 Capturing and evaluating high speed data streams
11/21/2002	US20020174408 System and method of determining the noise sensitivity of an integrated circuit
11/21/2002	US20020174394 External control of algorithm execution in a built-in self-test circuit and method therefor
11/21/2002	US20020174393 Method and apparatus for fault tolerant and flexible test signature generator
11/21/2002	US20020174391 Method of testing semiconductor storage device
11/21/2002	US20020173942 Method and apparatus for design validation of complex IC without using logic simulation
11/21/2002	US20020173927 System for testing of intelligent electronic devices with digital communications
11/21/2002	US20020173926 Method and system for wafer and device-level testing of an integrated circuit
11/21/2002	US20020173869 Vxi test instrument and method of using same
11/21/2002	US20020173179 IC socket and method of mounting IC package
11/21/2002	US20020173060 Measuring method, inspection method, inspection device, semiconductor device, method of manufacturing a semiconductor device, and method of manufacturing an element substrate
11/21/2002	US20020172857 Capable of monitoring a state of a secondary battery; safe battery, prevents oscillation of an external terminal during adischarge limiting state entered due to an instruction from a microcomputer
11/21/2002	US20020172579 Docking device, more particularly for a probe and a tester
11/21/2002	US20020172243 Device for and method of testing semiconductor laser module
11/21/2002	US20020172159 Receiver-end supplementary circuit for boundary scan in data transmission with differential signals
11/21/2002	US20020171570 AD converter evaluation apparatus
11/21/2002	US20020171449 Test system and manufacturing of semiconductor device
11/21/2002	US20020171448 Dc testing apparatus and semiconductor testing apparatus
11/21/2002	US20020171446 Driver circuit integrated with load current output circuit, pin electronics and IC tester having thereof
11/21/2002	US20020171444 Floating and self-aligning suspension system to automatically align and attach a connector to an assembly
11/21/2002	US20020171441 Method and apparatus for accelerated life testing of a solar cell
11/21/2002	US20020171434 Method of performing a dielectric voltage-withstand test on a wire harness
11/21/2002	US20020171431 Transmission line pulse method for measuring electrostatic discharge voltages
11/21/2002	US20020171429 State of charge measuring apparatus for battery device
11/21/2002	US20020171428 Electronic battery tester with network communication
11/21/2002	US20020171414 Method for optimizing probe card analysis and scrub mark analysis data
11/21/2002	US20020171328 A method for producing an acceleration sensor
11/21/2002	US20020171133 Systems for testing and packaging integrated circuits
11/21/2002	US20020170589 Thermopile infrared sensor and method for inspecting the same
11/21/2002	US20020170162 Method and device for testing and energization-heating a stator coil
11/21/2002	DE19807237C2 Halbleiterbauelement-Testgerät The semiconductor device testing apparatus
11/21/2002	DE10220970A1 Halbleiterspeichervorrichtung A semiconductor memory device
11/21/2002	DE10139495A1 Multifunctional measurement instrument has a value editor for adjusting the values of settings by selection of an operation block and editing its values in one of two editing modes so that input of setting values is simplified
11/21/2002	DE10139491A1 Multifunctional measurement instrument has a display with multiple software controlled windows that can be used for setting parameters for different instrument functions, thus simplifying instrument operation
11/21/2002	DE10130943A1 Signal generator has baseband unit, in-quadrature modulator and optical display device that displays digital baseband signal stored in memory in predefined display format
11/21/2002	DE10124371A1 Measurement unit, especially a signal generator has a number of function units that can be connected in different manners and a control unit that determines their connections and represents them on a graphical display
11/21/2002	DE10122252A1 Testing and simulation of integrated circuits in a test bench environment using hardware and software units with a time delay shell so that any chosen time delay can be applied to data streams
11/21/2002	DE10121291A1 Verfahren zum Kalibrieren einer Testvorrichtung zum parallelen Testen einer Mehrzahl von elektronischen Bauteilen A method for calibrating a test device for the parallel testing a plurality of electronic components
11/21/2002	DE10120967A1 Monitoring of battery capacity, by measurement and recording of battery voltage at regular intervals with a device connected to the battery, after the vehicle leaves the factory so that guarantee disputes can be resolved
11/21/2002	DE10119697A1 Electrical measurement and testing device for three phase electrical equipment, especially for measuring earth conductor and insulation resistance and earth current under operating conditions using the differential current method
11/21/2002	DE10118724A1 Positioning arrangement for test heads of systems for testing electronic components, regulates fluid chamber pressure to bring test head into variable floating position

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