G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2002
12/04/2002	CN2524248Y Computer D.C. voltage and isolation monitor and wire selecting device
12/04/2002	CN1383491A Semiconductor testing appts. and its monitor device
12/04/2002	CN1383489A Inspection appts. and inspection method
12/04/2002	CN1383156A Single chip processor with dynamic ageing testing function and dynamic ageing testing method
12/03/2002	US6490717 Generation of sub-netlists for use in incremental compilation
12/03/2002	US6490715 Cell library database and design aiding system
12/03/2002	US6490710 Logic verification method and apparatus for logic verification
12/03/2002	US6490702 Scan structure for improving transition fault coverage and scan diagnostics
12/03/2002	US6490700 Memory device testing apparatus and data selection circuit
12/03/2002	US6490694 Electronic test system for microprocessor based boards
12/03/2002	US6490641 Addressable shadow port circuit
12/03/2002	US6490537 Data communication method and data communication system
12/03/2002	US6490368 Automatic X-ray determination of solder joint and view Delta Z values from a laser mapped reference surface for circuit board inspection using X-ray laminography
12/03/2002	US6490223 Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same
12/03/2002	US6490221 Semiconductor memory device with low power consumption
12/03/2002	US6490210 Semiconductor memory integrated circuit employing a redundant circuit system for compensating for defectiveness
12/03/2002	US6490198 Test methods for semiconductor non-volatile memories
12/03/2002	US6490192 Device for evaluating cell resistances in a magnetoresistive memory
12/03/2002	US6490143 Blocking circuit for high voltage spike testing
12/03/2002	US6489912 Analog-to-digital converter for monitoring VDDQ and dynamically updating programmable Vref when using high-frequency receiver and driver circuits for commercial memory
12/03/2002	US6489834 System and method utilizing on-chip voltage monitoring to manage power consumption
12/03/2002	US6489801 Apparatus and method for evaluating a semiconductor wafer
12/03/2002	US6489800 Method of testing an integrated circuit
12/03/2002	US6489799 Integrated circuit device having process parameter measuring circuit
12/03/2002	US6489797 Test system including a test head with integral device for generating and measuring output having variable current or voltage characteristics
12/03/2002	US6489793 Temperature control of electronic devices using power following feedback
12/03/2002	US6489791 Build off self-test (Bost) testing method
12/03/2002	US6489790 Socket including pressure conductive rubber and mesh for testing of ball grid array package
12/03/2002	US6489789 Probe station having multiple enclosures
12/03/2002	US6489786 Non-isolated type voltage sensor
12/03/2002	US6489783 Test device and method
12/03/2002	US6489782 Electrical system with a stand-off insulator-sensor for on-line partial discharge monitoring of the state of high-voltage insulation
12/03/2002	US6489780 Electrical continuity inspection unit for connector
12/03/2002	US6489779 System and method for terminal short detection
12/03/2002	US6489749 Battery state monitoring circuit having differentiating circuit
12/03/2002	US6489693 Method and device for current monitoring in a current supply system
12/03/2002	US6488522 Socket for electric part
12/03/2002	US6488405 Flip chip defect analysis using liquid crystal
12/03/2002	CA2322257C Battery voltage measuring device
11/2002
11/28/2002	WO2002096022A2 Dual mode service platform within network communication system
11/28/2002	WO2002095897A2 Circuit for monitoring cells of a multi-cell battery during charge
11/28/2002	WO2002095863A1 Voltage measuring circuit of battery pack
11/28/2002	WO2002095802A2 Methods and apparatus for semiconductor testing
11/28/2002	WO2002095798A2 Fibre optic wafer probe
11/28/2002	WO2002095763A1 Test method for testing a data memory
11/28/2002	WO2002095756A2 Dynamic memory and method for testing a dynamic memory
11/28/2002	WO2002095587A2 Method and apparatus for fault tolerant and flexible test signature generator
11/28/2002	WO2002095586A2 Hierarchical built-in self-test for system-on-chip design
11/28/2002	WO2002095567A1 Measuring apparatus with value editor and corresponding method
11/28/2002	WO2002095565A2 Measuring device with dialog control occurring via dialog windows and corresponding method
11/28/2002	WO2002095432A1 Verification system for verifying system lsi operation, etc.
11/28/2002	WO2002095430A2 Test circuit
11/28/2002	WO2002095429A2 Electrical component measuring instrument
11/28/2002	WO2002095426A1 Measuring device with functional units controlled by means of a block diagram
11/28/2002	WO2002095424A2 Apparatus with interchangeable modules for measuring characteristics of cables and networks
11/28/2002	WO2002094508A1 Contactor cleaning sheet, and contactor cleaning method
11/28/2002	WO2002073223A3 Device for testing coaxial connectors
11/28/2002	US20020178425 Formal verification method
11/28/2002	US20020178416 Hierarchical built-in self-test for system-on-chip design
11/28/2002	US20020178412 Memory testing method and apparatus, and computer-readable recording medium
11/28/2002	US20020178409 Method and apparatus for calibrating a test system for an integrated semiconductor circuit
11/28/2002	US20020178399 Methods for characterizing, generating test sequences for, and/or simulating integrated circuit faults using fault tuples and related systems and computer program products
11/28/2002	US20020177990 Distributed logic analyzer for use in a hardware logic emulation system
11/28/2002	US20020177970 Environmental condition sensor device and method
11/28/2002	US20020177969 Data Recovery through event based equivalent time sampling
11/28/2002	US20020177968 System for and method of performing device-oriented tests
11/28/2002	US20020177962 Apparatus for automatically measuring the resistivity of semiconductor boules by using the method of four probes
11/28/2002	US20020177347 Socket for IC package
11/28/2002	US20020177344 Semiconductor device-socket
11/28/2002	US20020177343 Contact pin and socket for electrical parts
11/28/2002	US20020177342 Contact pin and socket for electrical parts
11/28/2002	US20020176618 Method and apparatus for distinguishing regions where a material is present on a surface.
11/28/2002	US20020176525 Apparatus for and method of measuring clock skew
11/28/2002	US20020176306 Semiconductor memory and method of testing semiconductor memory
11/28/2002	US20020176295 Semiconductor memory device allowing easy characteristics evaluation
11/28/2002	US20020176288 Semiconductor integrated circuit device and test method thereof
11/28/2002	US20020176287 Redundancy circuit of semiconductor memory device
11/28/2002	US20020175744 Semiconductor integrated circuit device including a negative power supply circuit
11/28/2002	US20020175699 Semiconductor integrated circuit device and fault-detecting method of a semiconductor integrated circuit device
11/28/2002	US20020175698 Method and apparatus for switchably selecting an integrated circuit operating mode
11/28/2002	US20020175697 Efficient parallel testing of semiconductor devices using a known good device to generate expected responses
11/28/2002	US20020175696 Testing apparatus embedded in scribe line and a method thereof
11/28/2002	US20020175694 Method of burning in an integrated circuit chip package
11/28/2002	US20020175689 Apparatus with interchangeable modules for measuring characteristics of cables and networks
11/28/2002	US20020175687 Electronic Battery tester
11/28/2002	US20020175672 Circuit board coupon tester
11/28/2002	US20020175666 Method of locating defective sockets in a light strand
11/28/2002	US20020175655 Circuit for monitoring cells of a multi-cell battery during charge
11/28/2002	US20020175348 Integrated semiconductor circuit and multi-chip module with a plurality of integrated semiconductor circuits
11/28/2002	DE10125819A1 Motor vehicle starting ability monitor, detects if sufficient power is available by comparing the internal resistance of battery with reference resistance derived from maximum current and minimum voltage measured at starting
11/28/2002	DE10123362A1 Wafer for electronic chip manufacture has electronic chips and memory device with stored classification map with position and classification information for at least one part of chip
11/28/2002	DE10120983A1 Meßbrückenschaltung in Vier- oder Mehrleitertechnik mit Ausregelung der Leitungseinflüsse Measuring bridge circuit in four or more wire technology with SETTLING the line influences
11/28/2002	CA2448463A1 Circuit for monitoring cells of a multi-cell battery during charge
11/28/2002	CA2448460A1 Methods and apparatus for semiconductor testing
11/28/2002	CA2447951A1 Electrical component measuring instrument
11/27/2002	EP1261091A1 Gas insulated device and failure rating method
11/27/2002	EP1261064A1 Battery and maintenance service system for power supply device
11/27/2002	EP1261022A1 Apparatus for detecting defect in device and method of detecting defect
11/27/2002	EP1260824A1 Method for dynamically measuring the state of health and charge of a car battery and device for implementing said method
11/27/2002	EP1260823A1 Synthetic test circuit at the breaking capacity for high-voltage alternating current circuit breakers

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