| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 12/11/2002 | CN1095993C Integrated circuit conveying device |
| 12/10/2002 | US6493840 Testability architecture for modularized integrated circuits |
| 12/10/2002 | US6493829 Semiconductor device enable to output a counter value of an internal clock generation in a test mode |
| 12/10/2002 | US6493654 Fault distribution analyzing system |
| 12/10/2002 | US6493653 Tapped delay line high speed register |
| 12/10/2002 | US6493279 Semiconductor device capable of simple measurement of oscillation frequency |
| 12/10/2002 | US6492923 Test system and testing method using memory tester |
| 12/10/2002 | US6492832 Methods for testing a group of semiconductor devices simultaneously, and devices amenable to such methods of testing |
| 12/10/2002 | US6492831 Current measuring method and current measuring apparatus |
| 12/10/2002 | US6492830 Method and circuit for measuring charge dump of an individual transistor in an SOI device |
| 12/10/2002 | US6492828 System and method for detecting bonding status of bonding wire of semiconductor package |
| 12/10/2002 | US6492827 Non-invasive electrical measurement of semiconductor wafers |
| 12/10/2002 | US6492826 Conductive bump array contactors having an ejector and methods of testing using same |
| 12/10/2002 | US6492822 Wafer probe station for low-current measurements |
| 12/10/2002 | US6492819 High voltage switch and switching process for impulse measurement |
| 12/10/2002 | US6492803 Apparatus and method for enabling auto-insertion of production level devices |
| 12/10/2002 | US6492802 Apparatus and method for detecting defects in a multi-channel scan driver |
| 12/10/2002 | US6492800 Electro-optic voltage sensor with beam splitting |
| 12/10/2002 | US6492798 Method and circuit for testing high frequency mixed signal circuits with low frequency signals |
| 12/10/2002 | US6492797 Socket calibration method and apparatus |
| 12/10/2002 | US6492721 High-voltage signal detecting circuit |
| 12/10/2002 | US6492666 Semiconductor wafer with scribe lines having inspection pads formed thereon |
| 12/10/2002 | US6492599 Multilayer wiring board, manufacturing method thereof, and wafer block contact board |
| 12/10/2002 | US6492187 Method for automatically positioning electronic die within component packages |
| 12/10/2002 | US6491357 Method for communicating a wheel speed sensor fault in a vehicle anti-lock braking system |
| 12/10/2002 | CA2261551C Socket for integrated circuit chip |
| 12/10/2002 | CA2256601C Method for testing electronic components |
| 12/05/2002 | WO2002097946A2 Back-up power system |
| 12/05/2002 | WO2002097460A2 Fuel cell voltage monitoring |
| 12/05/2002 | WO2002097459A1 Ic analysis support method, ic analysis apparatus, ic analysis support program |
| 12/05/2002 | WO2002097457A2 A digital system and a method for error detection thereof |
| 12/05/2002 | WO2002097456A2 Self-diagnosis system for an energy storage device |
| 12/05/2002 | WO2002097448A1 Method for determining the frequency of the current ripple in the armature current of a commutated d.c motor |
| 12/05/2002 | WO2002097342A1 Apparatus and method for controlling the temperature of an electronic device under test |
| 12/05/2002 | WO2002096717A2 Method and device for determining the starting capability of a vehicle |
| 12/05/2002 | WO2002082505A3 A method to reduce leakage during a semi-conductor burn-in procedure |
| 12/05/2002 | WO2002052287A3 Method and device for testing of a transistor using a network analyzer |
| 12/05/2002 | WO2001040941A9 Hardware debugging in a hardware description language |
| 12/05/2002 | US20020184599 Data processing apparatus with circuit for confirming normality of serial transmission data |
| 12/05/2002 | US20020184588 Method and apparatus for the real time Manipulation of a test vector to access the microprocessor state machine information using the integrated debug trigger |
| 12/05/2002 | US20020184587 Apparatus and method for test-stimuli compaction |
| 12/05/2002 | US20020184585 Apparatus and method for multi-cycle memory access mapped to JTAG finite state machine with external flag for hardware emulation |
| 12/05/2002 | US20020184584 Scan flip-flop circuit, logic macro, scan test circuit, and method for laying out the same |
| 12/05/2002 | US20020184583 Cell having scan functions and a test circuit of a semiconductor integrated circuit |
| 12/05/2002 | US20020184582 Test access mechanism for supporting a configurable built-in self-test circuit and method thereof |
| 12/05/2002 | US20020184581 Method for testing semiconductor chips and semiconductor device |
| 12/05/2002 | US20020184578 Semiconductor integrated circuit |
| 12/05/2002 | US20020184565 Method for coexistence and cooperation between system firmware and debug code |
| 12/05/2002 | US20020184562 Method of designing circuit having multiple test access ports, circuit produced thereby and method of using same |
| 12/05/2002 | US20020184560 Multiple-capture DFT system for scan-based integrated circuits |
| 12/05/2002 | US20020184557 System and method for memory segment relocation |
| 12/05/2002 | US20020183954 Processing system for a wiring harness, a method for testing an electrical connection of a wiring harness, computer-readable storage medium and a wire connection assisting system |
| 12/05/2002 | US20020183953 Method of fault isolation of a digital electronic device |
| 12/05/2002 | US20020183946 Method of analyzing electromagnetic fields in rotary machine and electromagnetic field analyzer |
| 12/05/2002 | US20020183944 Direct current electrical system arc detection apparatus and method |
| 12/05/2002 | US20020182919 Socket for electrical parts |
| 12/05/2002 | US20020182916 IC socket |
| 12/05/2002 | US20020182915 Socket for electrical parts |
| 12/05/2002 | US20020182759 Semiconductor device manufacturing method and semiconductor device sorting system to be used with the same |
| 12/05/2002 | US20020181538 Semiconductor wirebond machine leadframe thermal map system |
| 12/05/2002 | US20020181176 Magnetic snapback sensor circuit and electrostatic discharge circuit using same |
| 12/05/2002 | US20020180630 Electronic volume circuit |
| 12/05/2002 | US20020180478 Device power supply and IC test apparatus |
| 12/05/2002 | US20020180477 Method for testing a semiconductor integrated circuit |
| 12/05/2002 | US20020180476 Method for testing a semiconductor integrated circuit |
| 12/05/2002 | US20020180474 Method of detecting carrier dose of a semiconductor wafer |
| 12/05/2002 | US20020180469 Reusable test jig |
| 12/05/2002 | US20020180468 Adaptive tolerance reference inspection system |
| 12/05/2002 | US20020180467 Inspection method and inspection apparatus for semiconductor circuit |
| 12/05/2002 | US20020180457 Apparatus, a method for testing an electrical wiring system, a computer program for testing an electrical wiring system and a computer-readable storage medium having stored thereon a computer program for testing an electrical wiring system |
| 12/05/2002 | US20020180456 Printed circuit board testing apparatus |
| 12/05/2002 | US20020180455 Inspection device and inspection method |
| 12/05/2002 | US20020180454 Inspection unit and method of manufacturing substrate |
| 12/05/2002 | US20020180447 Fuel cell voltage monitoring system and the method thereof |
| 12/05/2002 | US20020180445 Method and apparatus for testing cells and batteries embedded in series/parallel systems |
| 12/05/2002 | US20020180422 Method and apparatus of interconnecting with a system board |
| 12/05/2002 | US20020180414 Tester and testing method for differential data drivers |
| 12/05/2002 | US20020180026 Semiconductor wafer designed to avoid probed marks while testing |
| 12/05/2002 | US20020179930 Composite semiconductor structure and device with optical testing elements |
| 12/05/2002 | US20020179904 Contact structure production method |
| 12/05/2002 | US20020179903 Semiconductor device |
| 12/05/2002 | US20020179584 Method and process of contact to a heat softened solder ball array |
| 12/05/2002 | US20020178800 Apparatus for evaluating electrical characteristics |
| 12/05/2002 | DE10203761A1 System for automatic analysis and processing of loss factors in test process analyzes raw and processed data according to component lots, test units and loading/unloading arrangements |
| 12/05/2002 | DE10126891A1 Predicting electrochemical element load capacity involves correcting equivalent circuit input voltage w.r.t measured voltage using function with logarithmic current dependency as nonlinear term |
| 12/05/2002 | DE10126168A1 Verfahren zum Bestimmen der Frequenz der im Ankerstromsignal eines kommutierten Gleichstrommotors enthaltenen Stromrippel A method for determining the frequency of the current ripples contained in the armature current signal of a commutated direct current motor |
| 12/05/2002 | DE10125364A1 Method for simulation of a circuit unit that is to be verified using a test bench arrangement, whereby an operator can precisely control time delays in test pattern sequences |
| 12/05/2002 | DE10125029A1 Semiconducting device has contact devices externally contactable for making at least one temporary electrical signal connection between main and auxiliary integrated circuits |
| 12/05/2002 | DE10120104A1 Contact arrangement for accumulators, has base plate with several sockets arranged in base plate that can be connected to voltage source and two contact elements for insertion into sockets |
| 12/05/2002 | DE10106240A1 Charge state monitoring arrangement for vehicle starter battery comprises telemetry module with transmission unit to pass warning signal to service station |
| 12/04/2002 | EP1263111A2 Method, program and apparatus for detecting internal information of a rechargeable battery and apparatus including said detecting apparatus |
| 12/04/2002 | EP1262784A1 Battery voltage detection device |
| 12/04/2002 | EP1262783A1 An apparatus, a method for testing an electrical wiring system, a computer program for testing an electrical wiring system |
| 12/04/2002 | EP1262782A2 Mounting spring elements on semiconductor devices, and wafer-level testing methodology |
| 12/04/2002 | EP1261972A1 Apparatus for testing memories with redundant storage elements |
| 12/04/2002 | EP1261882A1 Device for monitoring and forecasting the probability of inductive proximity sensor failure |
| 12/04/2002 | EP1153305B1 Current measuring device and corresponding method |
| 12/04/2002 | EP0898714B1 Bus system and method of diagnosing subscribers interconnected via said bus-system |
| 12/04/2002 | EP0719418B1 Printed circuit board tester |
| 12/04/2002 | CN2524372Y Chip tester |