| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/17/2002 | US6496025 Method and apparatus for testing printed circuit board assemblies |
| 12/17/2002 | US6496024 Probe holder for testing of a test device |
| 12/17/2002 | US6496023 Semiconductor-device inspecting apparatus and a method for manufacturing the same |
| 12/17/2002 | US6496022 Method and apparatus for reverse engineering integrated circuits by monitoring optical emission |
| 12/17/2002 | US6496016 Semiconductor device for use in evaluating integrated circuit device |
| 12/17/2002 | US6496015 Method of performing a dielectric voltage-withstand test on a wire harness |
| 12/17/2002 | US6496014 Cable tester error compensation method and apparatus |
| 12/17/2002 | US6496013 Device for testing circuit boards |
| 12/17/2002 | US6496011 Monitoring method and monitoring device for a filter |
| 12/17/2002 | US6496010 Power system having pressed electrical contacts and which detects faults in the contacts |
| 12/17/2002 | US6496000 Apparatus and method for testing module devices |
| 12/17/2002 | US6495990 Method and apparatus for evaluating stored charge in an electrochemical cell or battery |
| 12/17/2002 | US6495989 Battery control apparatus and management method of battery |
| 12/17/2002 | US6495932 DC power source unit |
| 12/17/2002 | US6495930 Method and apparatus for checking an electric circuit, in particular an ignition circuit of a motor vehicle occupant protection system |
| 12/17/2002 | US6495856 Semiconductor device having a test pattern same as conductive pattern to be tested and method for testing semiconductor device for short-circuit |
| 12/17/2002 | US6495379 Semiconductor device manufacturing method |
| 12/17/2002 | US6494370 Electro-optic system controller and method of operation |
| 12/17/2002 | CA2180475C Battery capacity indicator |
| 12/12/2002 | WO2002099930A1 Socket connector and contact for use in a socket connector |
| 12/12/2002 | WO2002099888A2 Composite semiconductor structure and device with optical testing elements |
| 12/12/2002 | WO2002099814A1 Non-volatile semiconductor storage device and production method thereof |
| 12/12/2002 | WO2002099449A1 Apparatus and method for driving circuit pins in a circuit testing system |
| 12/12/2002 | WO2002099445A2 Integrated digital circuit and method for verifying a signal from an integrated digital circuit on an error |
| 12/12/2002 | WO2002099444A1 Method for monitoring a power supply of a control unit in a motor vehicle |
| 12/12/2002 | WO2002080046A3 Computer-aided design system to automate scan synthesis at register-transfer level |
| 12/12/2002 | WO2002058208A3 Microelectronic transient power generator for power system validation |
| 12/12/2002 | WO2002039629A9 Channel time calibration means |
| 12/12/2002 | US20020188904 Efficiency of fault simulation by logic backtracking |
| 12/12/2002 | US20020188903 Enhanced debug scheme for LBIST |
| 12/12/2002 | US20020188902 Test system algorithmic program generators |
| 12/12/2002 | US20020188901 Systems and methods for facilitating testing of pad drivers of integrated circuits |
| 12/12/2002 | US20020188900 Test method and test system for semiconductor device |
| 12/12/2002 | US20020188898 Tester built-in semiconductor integrated circuit device |
| 12/12/2002 | US20020188893 Series connected TC unit type ferroelectric RAM and test method thereof |
| 12/12/2002 | US20020188888 Method and apparatus for testing digital devices using transition timestamps |
| 12/12/2002 | US20020186907 Fan apparatus for chamber of handler |
| 12/12/2002 | US20020186877 Electronic assembly video inspection system |
| 12/12/2002 | US20020186602 Semiconductor device capable of adjusting internal potential |
| 12/12/2002 | US20020186600 Column repair circuit and method of using nonvolatile ferroelectric memory device |
| 12/12/2002 | US20020186589 Nonvolatile semiconductor memory device |
| 12/12/2002 | US20020186585 Semiconductor integrated circuit device and method for designing a semiconductor integrated circuit device |
| 12/12/2002 | US20020186550 Circuit board protection cover and circuit board having circuit board protection cover |
| 12/12/2002 | US20020186247 Method of displaying delay |
| 12/12/2002 | US20020186045 Cell architecture to reduce customization in a semiconductor device |
| 12/12/2002 | US20020186038 Circuit for the detection of short voltage glitches in a supply voltage |
| 12/12/2002 | US20020186037 Predictive, adaptive power supply for an integrated circuit under test |
| 12/12/2002 | US20020186035 Method for testing a semiconductor integrated circuit |
| 12/12/2002 | US20020186034 Apparatus for producing and testing electronic units |
| 12/12/2002 | US20020186033 Sensing apparatus having a cut-plane sensor and signal conditioner formed in a seamless monolithic substrate |
| 12/12/2002 | US20020186032 Burn-in apparatus and semiconductor wafer |
| 12/12/2002 | US20020186031 Method and apparatus for temperature control of a device during testing |
| 12/12/2002 | US20020186029 Circuit board test fixture with electrostatic discharge (ESD) protection |
| 12/12/2002 | US20020186028 Reliability of vias and diagnosis by E-beam probing |
| 12/12/2002 | US20020186021 Connector inspection apparatus |
| 12/12/2002 | US20020186019 Method and device for measuring pure resistance of on-vehicle battery |
| 12/12/2002 | US20020186006 Rotation sensing device of fan apparatus adapted to chamber of handler |
| 12/12/2002 | US20020186005 Contact arm and electronic device testing apparatus using the same |
| 12/12/2002 | US20020186004 Method for manufacturing smart card and identification devices and the like |
| 12/12/2002 | US20020186003 Semiconductor device testing apparatus having timing hold function |
| 12/12/2002 | US20020186002 Method and apparatus of interconnecting with a system board |
| 12/12/2002 | US20020185301 Method and apparatus for testing bumped die |
| 12/12/2002 | DE10210678A1 Determining scan path for integrated circuit involves determining conflict matrix per macro, determining arrangement of scan path from relevant macro based on combined conflict matrix |
| 12/12/2002 | DE10200833A1 Gerät und Verfahren für eine Teststimuliverdichtung Apparatus and method for a compression test stimuli |
| 12/12/2002 | DE10158310A1 Schaltung und Verfahren zur Spaltenreparatur bei einem nichtflüchtigen ferroelektrischen Speicher Circuit and method for column repair in a non-volatile ferroelectric memory |
| 12/12/2002 | DE10128033A1 Predicting equilibrated quiescent voltage of electrochemical energy storage device involves using formal relationship between equilibrated quiescent voltage and decaying voltage |
| 12/12/2002 | DE10126800A1 Testing electrostatic discharge resistance of semiconducting component involves monitoring direct current characteristic and drawing conclusion regarding electrostatic discharge resistance |
| 12/12/2002 | DE10125022A1 Dynamischer Speicher und Verfahren zum Testen eines dynamischen Speichers Dynamic memory and method for testing a dynamic memory |
| 12/12/2002 | DE10124923A1 Testverfahren zum Testen eines Datenspeichers Test method for testing a data store |
| 12/12/2002 | DE10124109A1 Monitoring magnetic valve circuit drift, e.g. for vehicle ABS, involves applying PWM input pulse sequence to switch elements to initiate difference measurement at subtraction stage by pulse counting |
| 12/12/2002 | DE10123758A1 Integrierte Halbleiterschaltung und Multi-Chip-Modul mit mehreren integrierten Halbleiterschaltungen A semiconductor integrated circuit and multi-chip module having a plurality of semiconductor integrated circuits |
| 12/12/2002 | DE10122081A1 Verfahren und Vorrichtung zum Kalibrieren eines Testsystems für eine integrierte Halbleiterschaltung Method and apparatus for calibrating a test system for a semiconductor integrated circuit |
| 12/12/2002 | DE10122049A1 Vorrichtung zum Verriegeln von zwei miteinander zu koppelnden Einrichtungen, insbesondere eines Testkopfs und einer Prüfeinrichtung A device for interlocking two to be coupled with each other facilities, in particular a test head of a test device and |
| 12/12/2002 | DE10111816A1 Elektronischer Spannungswandler Electronic voltage converter |
| 12/11/2002 | EP1265335A2 Method and apparatus for controlling residual battery capacity of secondary battery |
| 12/11/2002 | EP1265077A1 System and method for testing harnesses |
| 12/11/2002 | EP1265076A1 Safety device for monitoring a DC bus insulation |
| 12/11/2002 | EP1264451A1 Method and system for controlling data traffic in a network |
| 12/11/2002 | EP1264443A1 Method and system for communication of data via an optimum data path in a network |
| 12/11/2002 | EP1264378A1 Apparatus for the detection and early warning of electrical arcing fault |
| 12/11/2002 | EP1264315A2 Reference cell trimming verification circuit |
| 12/11/2002 | EP1264191A2 Device and method for monitoring a capacitor bushing |
| 12/11/2002 | EP1264187A2 Integrated circuit test socket lid assembly |
| 12/11/2002 | EP1185874B1 Power consumption reporting by an accessory of an electronic device |
| 12/11/2002 | EP1166274B1 Device for weighting the cell resistances in a magnetoresistive memory |
| 12/11/2002 | EP1163680B1 Device and method for carrying out the built-in self-test of an electronic circuit |
| 12/11/2002 | EP0758113B1 Test mode matrix circuit for an embedded microprocessor core |
| 12/11/2002 | CN2525653Y Compression capacitor automatic measurer |
| 12/11/2002 | CN2525532Y Regulator of sampler test arm |
| 12/11/2002 | CN2525531Y Chip test foot seat using surface adhesive technology |
| 12/11/2002 | CN2525530Y Micro computer controlled wireless alarm device for electric power fault of distribution room |
| 12/11/2002 | CN2525529Y High voltage test device |
| 12/11/2002 | CN2525528Y Digital volume compensating instrument |
| 12/11/2002 | CN2525523Y Integrated circuit test socket with spring probe |
| 12/11/2002 | CN1384922A Wafer-level burn-in and test cartridge and methods |
| 12/11/2002 | CN1384538A Imperfection detecting method and device for semiconductor ICs |
| 12/11/2002 | CN1384366A Flexible modular semiconductor test system |
| 12/11/2002 | CN1384365A Circuit board design diagram debugging method and system |
| 12/11/2002 | CN1096111C Speciofic part searching method and device for memory LSIC |
| 12/11/2002 | CN1096083C Semi-conductor memory device |