G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/2002
12/24/2002	CA2309678C Apparatus for checking an electrical drive
12/19/2002	WO2002101926A2 Integrated circuit and method for testing the integrated circuit
12/19/2002	WO2002101816A1 Wafer prober
12/19/2002	WO2002101553A2 In-circuit testing optimization generator
12/19/2002	WO2002101404A1 Method for calibrating semiconductor test instrument
12/19/2002	WO2002101403A2 Low noise microwave synthesizer employing high frequency combs for tuning drift cancel loop
12/19/2002	WO2002101402A1 Method and apparatus for bringing laser chips to a measurement position
12/19/2002	WO2002101401A1 Fault detection system and method
12/19/2002	WO2002101399A1 Circuit pattern inspection device, circuit pattern inspection method, and recording medium
12/19/2002	WO2002101398A1 Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium
12/19/2002	WO2002101349A2 Device and method for converting a diagnostic interface to spi standard
12/19/2002	WO2002101326A1 Device and method for substrate displacement detection
12/19/2002	WO2002075327A3 Handheld tester for starting/charging systems
12/19/2002	WO2002071362A3 Remaining life prediction for field device electronics board
12/19/2002	WO2002045094A3 Method and apparatus for built-in self-repair of memory storage arrays
12/19/2002	US20020194565 Simultaneous built-in self-testing of multiple identical blocks of integrated circuitry
12/19/2002	US20020194564 Semiconductor integrated circuit having test circuit
12/19/2002	US20020194563 Accelerating scan test by re-using response data as stimulus data
12/19/2002	US20020194562 Method and system for partial-scan testing of integrated circuits
12/19/2002	US20020194561 Scan insertion testing of ASICs
12/19/2002	US20020194560 Method of and apparatus for testing a serial differential/mixed signal device
12/19/2002	US20020194558 Method and system to optimize test cost and disable defects for scan and BIST memories
12/19/2002	US20020194546 Synchronous semiconductor memory device capable of reducing test cost and method of testing the same
12/19/2002	US20020194543 Enhanced embedded logic analyzer
12/19/2002	US20020194542 Debugging system for semiconductor integrated circuit
12/19/2002	US20020194539 Automatic timing analyzer
12/19/2002	US20020193980 Semiconductor test program debugging apparatus
12/19/2002	US20020193960 Method for operating a TAP controller and corresponding TAP controller
12/19/2002	US20020193959 System and method of determining the noise sensitivity characterization for an unknown circuit
12/19/2002	US20020193955 Battery test module
12/19/2002	US20020193954 Method of detecting residual capacity of secondary battery
12/19/2002	US20020193953 Method and apparatus for predicting the available energy of a battery
12/19/2002	US20020192987 Semiconductor device-socket
12/19/2002	US20020192986 Probe card for tester head
12/19/2002	US20020192965 Apparatus and methods with resolution enhancement feature for improving accuracy of conversion of required chemical mechanical polishing pressure to force to be applied by polishing head to wafer
12/19/2002	US20020192846 Control signal transmitting method with package power pin and related integrated circuit package structure
12/19/2002	US20020191469 Semiconductor device and method of the semiconductor device
12/19/2002	US20020191140 Substrate assembly, method of testing the substrate assembly, electrooptical device, method of manufacturing the electrooptical device, and electronic equipment
12/19/2002	US20020190777 Current pulse receiving circuit
12/19/2002	US20020190757 Output control circuit and output control method
12/19/2002	US20020190744 Semiconductor integrated circuit and testing method thereof
12/19/2002	US20020190743 Method of testing semiconductor integrated circuits and testing board for use therein
12/19/2002	US20020190742 Semiconductor integrated circuit device capable of self-testing internal power supply currents provided to internal circuits integrated on chip
12/19/2002	US20020190741 Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor
12/19/2002	US20020190740 Probe apparatus applicable to a wafer level burn-in screening
12/19/2002	US20020190737 Member for removing foreign matter adhering to probe tip and method of manufacturing the probe tip, method of cleaning foreign matter adhering to probe tip, probe, and probing apparatus
12/19/2002	US20020190736 Substrate Testing apparatus and substrate testing method
12/19/2002	US20020190735 Optical voltage measurement circuit and method for monitoring voltage supplies utilizing imaging circuit analysis
12/19/2002	US20020190730 Capacitive load driving unit and method and apparatus for inspecting the same
12/19/2002	US20020190722 Prevention of arcing in power supplies
12/19/2002	US20020190707 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
12/19/2002	US20020190706 Semiconductor device testing apparatus having timing hold function
12/19/2002	US20020190693 Battery pack and its tester
12/19/2002	US20020189981 Method for sorting integrated circuit devices
12/19/2002	DE10223506A1 Pure resistance measurement method for on-vehicle battery involves measuring discharge current and terminal voltage of battery periodically, while rush current flows into predetermined constant load
12/19/2002	DE10223502A1 Sockel für ein IC-Gehäuse Socket for an IC package
12/19/2002	DE10136774C1 Heat source investigation method for electrically conductive probe uses image analysis of fluorescence of fluorescent material with temperature-dependent fluorescence characteristic
12/19/2002	DE10128753A1 Device for conversion of a diagnosis interface to a serial peripheral interface (SPI), especially for use with motor vehicle control devices, e.g. for detection of faults in the ignition controller during running
12/19/2002	DE10127054A1 Monitoring method for automobile control unit power supply incorporates testing of RESET line after restarting of control unit
12/19/2002	CA2450344A1 Fault detection system and method
12/18/2002	EP1267600A2 Circuit board protection cover and circuit board having circuit board protection cover
12/18/2002	EP1267232A2 Control unit for vehicle
12/18/2002	EP1267172A2 Apparatus and method for spectrum analysis-based serial data jitter measurement
12/18/2002	EP1266404A1 Test circuit arrangement and a method for testing a plurality of electric components
12/18/2002	EP1266237A2 Method and arrangement for determination of the state of charge of a battery
12/18/2002	EP1266235A2 Controllable and testable oscillator apparatus for an integrated circuit
12/18/2002	EP1266234A1 Testing device for printed boards
12/18/2002	EP1266230A2 Method and apparatus for planarizing a semiconductor contactor
12/18/2002	EP1266204A1 Beam delivery and imaging for optical probing of a device operating under electrical test
12/18/2002	EP1159628B1 Method for testing integrated circuits with memory element access
12/18/2002	EP1129407B1 Method and installation for fast fault localization in an integrated circuit
12/18/2002	EP0883816B1 Method of and circuit for testing an electrical actuator drive stage
12/18/2002	EP0818002B1 System and method for generating pseudo-random instructions for design verification
12/18/2002	CN2527019Y Charging device usable as emergent power
12/18/2002	CN2526858Y Dynamic source cell internal resistance measurer
12/18/2002	CN2526857Y Positioner for fault point of transmission line
12/18/2002	CN2526856Y Lightning arrestor impulse current recorder
12/18/2002	CN2526855Y Aid for measuring leak current of capacitor
12/18/2002	CN1386283A Integrated circuit containing SRAM memory and method of testing same
12/18/2002	CN1386197A Conductive contact
12/18/2002	CN1385888A Measurement, check, manufacturing method and check device for semiconductor device
12/18/2002	CN1385710A Event tester structure for mixed signal test
12/18/2002	CN1385709A Multiple virtual logic tester supported semiconductor test system
12/18/2002	CN1385708A Microcomputer based electric power digital dynamic realtime emulation method
12/18/2002	CN1385707A New method for detecting voltage-resistance of communication cable
12/18/2002	CA2351038A1 Simultaneous built-in self-testing of multiple identical blocks of integrated circuitry
12/17/2002	US6496961 Dynamic detection and removal of inactive clauses in SAT with application in image computation
12/17/2002	US6496953 Calibration method and apparatus for correcting pulse width timing errors in integrated circuit testing
12/17/2002	US6496940 Multiple processor system with standby sparing
12/17/2002	US6496790 Management of sensors in computer systems
12/17/2002	US6496487 Efficient full duplex simultaneous message transfer
12/17/2002	US6496476 System and method for restricted reuse of intact portions of failed paths
12/17/2002	US6496433 Semiconductor device and semiconductor device testing method
12/17/2002	US6496431 Semiconductor integrated circuit
12/17/2002	US6496429 Semiconductor memory device
12/17/2002	US6496261 Double-pulsed optical interferometer for waveform probing of integrated circuits
12/17/2002	US6496119 Protection circuit for an integrated circuit
12/17/2002	US6496030 Scan flip-flop providing both scan and propagation delay testing
12/17/2002	US6496028 Method and apparatus for testing electronic devices
12/17/2002	US6496027 System for testing integrated circuit devices

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