| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/31/2002 | US6501288 On-chip optically triggered latch for IC time measurements |
| 12/31/2002 | US6501283 Circuit configuration for measuring the capacitance of structures in an integrated circuit |
| 12/31/2002 | US6501278 Test structure apparatus and method |
| 12/31/2002 | US6501249 Battery management system |
| 12/31/2002 | US6501247 Method of displaying full-charge-state |
| 12/31/2002 | US6500699 Test fixture for future integration |
| 12/31/2002 | US6500685 Method for evaluating molding material with dams formed on a semiconductor substrate to define slits for capturing fillers contained in the molding material |
| 12/31/2002 | US6500682 Method for configuring a redundant bond pad for probing a semiconductor |
| 12/31/2002 | US6500317 Plating apparatus for detecting the conductivity between plating contacts on a substrate |
| 12/31/2002 | US6500017 Socket for electrical parts with guide wall section to keep lever members from coming off |
| 12/31/2002 | US6499811 Integrated circuit having power supply voltage monitor |
| 12/31/2002 | US6499334 Variable delay element test circuit |
| 12/31/2002 | CA2302304C Apparatus for measuring minority carrier lifetimes in semiconductor materials |
| 12/27/2002 | WO2002103705A1 Method for characterizing an active track and latch sense-amp (comparator) in a one time programmable (otp) salicided poly fuse array |
| 12/27/2002 | WO2002103519A1 Information processing method and information processing device |
| 12/27/2002 | WO2002103379A1 Semiconductor device testing instrument and semiconductor device testing method |
| 12/27/2002 | WO2002103378A2 Method and apparatus for leak-testing an electroluminescent device |
| 12/27/2002 | WO2002103377A1 Jitter measuring apparatus and jitter measuring method |
| 12/27/2002 | WO2002103373A1 Conductive contactor and electric probe unit |
| 12/27/2002 | WO2002103372A1 Socket for semiconductor package |
| 12/27/2002 | WO2002010785A3 Hierarchical design and test method and system, program product embodying the method and integrated circuit produced thereby |
| 12/27/2002 | WO2001069273A9 Apparatus and method for determining the operational state of a battery |
| 12/26/2002 | US20020199161 Method of designing logic circuit, and computer product |
| 12/26/2002 | US20020199160 Power supply network analyzing method, computer program for executing the method, storage medium and power supply network analyzing apparatus |
| 12/26/2002 | US20020199146 Test method and apparatus for semiconductor device and semiconductor device |
| 12/26/2002 | US20020199145 Semiconductor integrated circuits built therein scan paths |
| 12/26/2002 | US20020199144 Scan path test method |
| 12/26/2002 | US20020199143 Method and apparatus for testing circuit modules |
| 12/26/2002 | US20020199142 Semiconductor programming and testing method and apparatus |
| 12/26/2002 | US20020199141 Calibration apparatus and method for automatic test equipment |
| 12/26/2002 | US20020199136 System and method for chip testing |
| 12/26/2002 | US20020199134 Integrated circuit fault insertion system |
| 12/26/2002 | US20020199132 Systems and methods for a knowledge-based power assembly system component diagnostic tool |
| 12/26/2002 | US20020198674 Method for testing integrated circuits |
| 12/26/2002 | US20020198037 Numerical total keno game |
| 12/26/2002 | US20020197895 Electrical contractor, especially wafer level contactor, using fluid pressure |
| 12/26/2002 | US20020197892 Low cost, high performance flexible tester handler docking interface |
| 12/26/2002 | US20020197891 Socket for electrical parts |
| 12/26/2002 | US20020197750 Method and apparatus for inspecting a semiconductor device |
| 12/26/2002 | US20020196688 Test circuit for testing a circuit |
| 12/26/2002 | US20020196683 Semiconductor integrated circuit device provided with a self-testing circuit for carrying out an analysis for repair by using a redundant memory cell |
| 12/26/2002 | US20020196672 Semiconductor memory device |
| 12/26/2002 | US20020196338 Dome-shaped apparatus for inspecting a component or a printed circuit board device |
| 12/26/2002 | US20020196088 Low noise microwave synthesizer employing high frequency combs for tuning drift cancel loop |
| 12/26/2002 | US20020196074 Semiconductor integrated circuit |
| 12/26/2002 | US20020196048 Circuit and method for detecting transient voltages on a dc power supply rail |
| 12/26/2002 | US20020196047 Method and system having switching network for testing semiconductor components on a substrate |
| 12/26/2002 | US20020196045 Parallel scan distributors and collectors and process of testing integrated circuits |
| 12/26/2002 | US20020196043 Apparatus and method for testing semiconductor devices |
| 12/26/2002 | US20020196042 Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester |
| 12/26/2002 | US20020196041 Method and apparatus for testing bumped die |
| 12/26/2002 | US20020196040 Device carrier and autohandler |
| 12/26/2002 | US20020196038 Press contact structure of probe unit |
| 12/26/2002 | US20020196031 Parallel insulation fault detection system |
| 12/26/2002 | US20020196027 State-of-charge detection device for a battery |
| 12/26/2002 | US20020196026 Method and apparatus for controlling residual battery capacity of secondary battery |
| 12/26/2002 | US20020196025 System and method for measuring fuel cell voltage and high frequency resistance |
| 12/26/2002 | US20020196013 Circuit for conditioning output waveform |
| 12/26/2002 | US20020196012 Memory sorting method and apparatus |
| 12/26/2002 | US20020195999 Method of detecting and resolving memory effect |
| 12/26/2002 | US20020195996 Battery pack and battery pack checking method |
| 12/26/2002 | US20020195574 Method and apparatus for inspecting a semiconductor device |
| 12/26/2002 | US20020195313 Part transfer apparatus, control method for part transfer apparatus, IC test method, IC handler, and IC test apparatus |
| 12/26/2002 | US20020195265 High density planar electrical interface |
| 12/25/2002 | CN2528108Y Testing device for semiconductor potted element |
| 12/25/2002 | CN2528025Y Bulb service life testing circuit |
| 12/25/2002 | CN1387691A Apparatus for battery capacity measurement and for remaining capacity calculation |
| 12/25/2002 | CN1387279A Charge-discharge energy indicator and measuring method |
| 12/25/2002 | CN1387247A System for debugging semiconductor IC |
| 12/25/2002 | CN1387246A Voltage metering method, electric test method and device, and method for mfg. semiconductor device and device substrate |
| 12/25/2002 | CN1387202A Pulse impact tester for voltage-dependent resistor |
| 12/25/2002 | CN1387049A Data buffer method for real-time closed-loop test of relay protector in electric power system |
| 12/24/2002 | US6499127 Method and apparatus for random stimulus generation |
| 12/24/2002 | US6499126 Pattern generator and electric part testing apparatus |
| 12/24/2002 | US6499125 Method for inserting test circuit and method for converting test data |
| 12/24/2002 | US6499124 Intest security circuit for boundary-scan architecture |
| 12/24/2002 | US6499122 Adjustable voltage boundary scan adapter for emulation and test |
| 12/24/2002 | US6499121 Distributed interface for parallel testing of multiple devices using a single tester channel |
| 12/24/2002 | US6499119 Data inspection method and apparatus |
| 12/24/2002 | US6498998 Method and apparatus for testing a semiconductor device |
| 12/24/2002 | US6498997 Method and apparatus for producing a solid actuator and medium storing a program for controlling the same |
| 12/24/2002 | US6498995 Method for inspecting wireharness |
| 12/24/2002 | US6498899 Apparatus, method and system of liquid-based, wide range, fast response temperature control of electric devices |
| 12/24/2002 | US6498760 Semiconductor device having test mode |
| 12/24/2002 | US6498709 Digital distance relay |
| 12/24/2002 | US6498508 Semiconductor integrated circuit device and testing method therefor |
| 12/24/2002 | US6498507 Circuit for testing an integrated circuit |
| 12/24/2002 | US6498504 Wafer inspection device and wafer inspection method |
| 12/24/2002 | US6498503 Semiconductor test interconnect with variable flexure contacts |
| 12/24/2002 | US6498502 Apparatus and method for evaluating semiconductor structures and devices |
| 12/24/2002 | US6498499 Device for measuring the capacitance of electrical wires |
| 12/24/2002 | US6498494 Diagnostic circuit for measuring the resistance and the leakage current of at least one firing cap of a motor vehicle occupant protection system, and a motor vehicle occupant protection system including the diagnostic circuit |
| 12/24/2002 | US6498493 Electric potential detector, device tester and method of detecting electric potential |
| 12/24/2002 | US6498473 Pin electronics having current measuring unit and testing apparatus having pin electronics thereof |
| 12/24/2002 | US6498472 Method for handling a module IC and a carrier of a module IC handler |
| 12/24/2002 | US6498322 Portable heating tent and method for testing telecommunications equipment |
| 12/24/2002 | US6498299 Connection structure of coaxial cable to electric circuit substrate |
| 12/24/2002 | US6497659 System for identifying a cable transmitting a signal from a sensor to an electronic instrument |
| 12/24/2002 | US6497581 Robust, small scale electrical contactor |
| 12/24/2002 | US6497222 Actuator configuration and method, in particular, for actuating an injection valve of an internal combustion engine |