| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/02/2003 | US20030005389 Test circuit for testing a synchronous circuit |
| 01/02/2003 | US20030005381 Semiconductor test system having double data rate pin scrambling |
| 01/02/2003 | US20030005379 Comparison circuit and method for verification of scan data |
| 01/02/2003 | US20030005378 Body bias using scan chains |
| 01/02/2003 | US20030005377 Intelligent binning for electrically repairable semiconductor chips |
| 01/02/2003 | US20030005376 System and method for automatically analyzing and managing loss factors in test process of semiconductor integrated circuit devices |
| 01/02/2003 | US20030005375 Algorithmically programmable memory tester with test sites operating in a slave mode |
| 01/02/2003 | US20030005374 Method and apparatus for testing an I/O buffer |
| 01/02/2003 | US20030005366 On-die automatic selection of manipulated clock pulse |
| 01/02/2003 | US20030005363 Apparatus and method for hardware-assisted diagnosis of broken logic-test shift-registers |
| 01/02/2003 | US20030005361 Test circuit for testing a synchronous memory circuit |
| 01/02/2003 | US20030005360 Low-jitter clock for test system |
| 01/02/2003 | US20030005359 Apparatus having pattern scrambler for testing a semiconductor device and method for operating same |
| 01/02/2003 | US20030005353 Methods and apparatus for storing memory test information |
| 01/02/2003 | US20030005347 Flip-flop having multiple clock sources and method therefore |
| 01/02/2003 | US20030004700 Circuit configuration for simulating the input or output load of an analog circuit |
| 01/02/2003 | US20030004664 Apparatus and method for spectrum analysis-based serial data jitter measurement |
| 01/02/2003 | US20030004663 Facilitating comparisons between simulated and actual behavior of electronic devices |
| 01/02/2003 | US20030004662 Method and system for managing battery power for battery powered devices |
| 01/02/2003 | US20030004618 Control device for a motor vehicle with a remote control or transponder |
| 01/02/2003 | US20030003782 Contact pin assembly, contact pin assembly manufacturing method, contact pin assembling structure, contact pin assembling structure manufacturing method, and socket for electrical parts |
| 01/02/2003 | US20030003740 Contact structure production method |
| 01/02/2003 | US20030003622 Semiconductor device fabrication method and semiconductor device fabrication device |
| 01/02/2003 | US20030003611 Apparatus and methods for monitoring self-aligned contact arrays |
| 01/02/2003 | US20030003606 Reduced terminal testing system |
| 01/02/2003 | US20030002575 Multi-pair gigabit ethernet transceiver |
| 01/02/2003 | US20030002573 Testing method and apparatus of glitch noise and storage medium |
| 01/02/2003 | US20030002367 Semiconductor memory device, and method for testing the same |
| 01/02/2003 | US20030002365 Test apparatus for semiconductor device |
| 01/02/2003 | US20030002360 Device for and method of storing identification data in an integrated circuit |
| 01/02/2003 | US20030001630 Semiconductor device |
| 01/02/2003 | US20030001623 Conditional burn-in keeper for dynamic circuits |
| 01/02/2003 | US20030001608 Vddq integrated circuit testing system and method |
| 01/02/2003 | US20030001607 System and method for a device reliability and test circuit |
| 01/02/2003 | US20030001605 Temperature control of electronic devices using power following feedback |
| 01/02/2003 | US20030001604 Integrated circuit burn-in methods and apparatus |
| 01/02/2003 | US20030001603 Method for forming coaxial silicon interconnects |
| 01/02/2003 | US20030001598 Apparatus and methods for reliable and efficient detection of voltage contrast defects |
| 01/02/2003 | US20030001597 Method of testing radiation for a SDRAM |
| 01/02/2003 | US20030001596 Method and apparatus for determining a magnetic field |
| 01/02/2003 | US20030001588 Interface for cable testing |
| 01/02/2003 | US20030001587 Test structure apparatus and method |
| 01/02/2003 | US20030001585 Stress testing for semiconductor devices |
| 01/02/2003 | US20030001581 Method for predicting the loading capability of an electrochemical element |
| 01/02/2003 | US20030001580 Accurate battery current measurement system for a battery care unit |
| 01/02/2003 | US20030001579 Method and apparatus for auditing a battery test |
| 01/02/2003 | US20030001577 Method and apparatus for device-dependent calibration of relays for high accuracy operation at zero-crossing of input power signal |
| 01/02/2003 | US20030001562 Inspecting apparatus and inspecting method for circuit board |
| 01/02/2003 | US20030001561 Inspecting apparatus and inspecting method for circuit board |
| 01/02/2003 | US20030001558 Method of characterizing free-space radiation using a chirped optical pulse |
| 01/02/2003 | US20030001544 Battery power source device |
| 01/02/2003 | US20030001542 Method for predicting the equilibrated open-circuit voltage of an electrochemical energy store |
| 01/02/2003 | US20030001119 Method and apparatus of diagnosing deterioration of an article |
| 01/02/2003 | US20030001117 Dimensional measurement apparatus for object features |
| 01/02/2003 | EP1271894A1 Packet transmitter unit, packet receiver unit and packet transmission system |
| 01/02/2003 | EP1271836A1 Bi-directional serial data transmission |
| 01/02/2003 | EP1271171A2 Method of detecting and resolving memory effect |
| 01/02/2003 | EP1271170A2 Device and method for determining the condition of batteries |
| 01/02/2003 | EP1271169A1 Method for testing integrated circuits |
| 01/02/2003 | EP1271168A1 Electrical system for testing the channels of a communication system |
| 01/02/2003 | EP1271167A1 Electrical System for testing the channels of a communication system |
| 01/02/2003 | EP1271166A1 Electrical system for testing the channels of a communication system |
| 01/02/2003 | EP1271165A2 Test of cable harnesses |
| 01/02/2003 | EP1271164A1 Crimping connection control on a flat cable and apparatus therefore |
| 01/02/2003 | EP1271163A1 Methods and systems for testing electronic devices |
| 01/02/2003 | EP1271162A2 Test system |
| 01/02/2003 | EP1271158A2 Press contact structure of probe unit |
| 01/02/2003 | EP1271156A2 Test/burn in socket assembly |
| 01/02/2003 | EP1269204A2 Test circuit configuration and method for testing a large number of transistors |
| 01/02/2003 | EP1269203A1 A method and an apparatus for measuring the performance of antennas, mobile phones and other wireless terminals |
| 01/02/2003 | EP1151312B1 Analog clock module |
| 01/02/2003 | EP1145433B1 Serial switch driver architecture for automatic test equipment |
| 01/02/2003 | EP1012849B1 Low cost, highly parallel memory tester |
| 01/01/2003 | CN2529266Y Testing and early warning device for vehicle power supply |
| 01/01/2003 | CN2529265Y Line break-point test instrument |
| 01/01/2003 | CN2529264Y Single electric wire connector |
| 01/01/2003 | CN1388987A Chip image display device for semiconductor testing system anel its method |
| 01/01/2003 | CN1388900A Inspection unit and method of manufacturing substrate |
| 01/01/2003 | CN1388899A Inspection device and inspection method |
| 01/01/2003 | CN1388383A Method and apparatus for testing stator coil and electrifing-heating to the same |
| 01/01/2003 | CN1388382A One-phase earthing failure searching method and monitor |
| 01/01/2003 | CN1388381A Energy shock measuring system and method for electronic elements |
| 01/01/2003 | CN1097733C Failure diagnosis device |
| 01/01/2003 | CN1097732C Method for testing and evaluating lightning strike and equipment thereof |
| 01/01/2003 | CN1097728C Method and apparatus for response analysis of optical excitation semiconductor material |
| 12/31/2002 | US6502232 Electronic circuit design environmentally constrained test generation system |
| 12/31/2002 | US6502216 Memory device testing apparatus |
| 12/31/2002 | US6502214 Memory test circuit |
| 12/31/2002 | US6502211 Semiconductor memory testing apparatus |
| 12/31/2002 | US6502201 Determination of frequency of timer ticks |
| 12/31/2002 | US6502046 Laplace transform impedance spectrometer and its measurement method |
| 12/31/2002 | US6502044 Self-diagnostic circuitry for emergency lighting fixtures |
| 12/31/2002 | US6502004 Method and apparatus for extracting bridges from an integrated circuit layout |
| 12/31/2002 | US6501968 Battery-powered communications apparatus |
| 12/31/2002 | US6501693 Semiconductor memory device allowing easy characteristics evaluation |
| 12/31/2002 | US6501691 Word-line deficiency detection method for semiconductor memory device |
| 12/31/2002 | US6501410 Signal analyzing apparatus |
| 12/31/2002 | US6501303 Semiconductor integrated circuit |
| 12/31/2002 | US6501290 Direct to chuck coolant delivery for integrated circuit testing |
| 12/31/2002 | US6501289 Inspection stage including a plurality of Z shafts, and inspection apparatus |