| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/09/2003 | WO2003003032A1 Method for charging a structure comprising an insulating body |
| 01/09/2003 | WO2003003030A1 Low leakage technique for determining power spectra of non-coherently sampled data |
| 01/09/2003 | WO2003003028A1 Accurate battery current measurement system for a battery care unit |
| 01/09/2003 | WO2003002957A2 Methods and systems for measuring display attributes of a fed |
| 01/09/2003 | WO2003001963A1 Method for checking electrical safety of a household appliance and corresponding household appliance |
| 01/09/2003 | WO2002090928A3 Apparatus for automatically measuring the resistivity of semiconductor boules using the method of four probes |
| 01/09/2003 | WO2002073661A9 Extraction method of defect density and size distributions |
| 01/09/2003 | US20030009716 Method of design for testability for integrated circuits |
| 01/09/2003 | US20030009715 Method and apparatus for optimized parallel testing and access of electronic circuits |
| 01/09/2003 | US20030009714 Test system |
| 01/09/2003 | US20030009713 Semiconductor device capable of easily setting test mode during test conducted by applying high voltage |
| 01/09/2003 | US20030009307 Digital data pattern detection methods and arrangements |
| 01/09/2003 | US20030009302 Method and apparatus for multi-function generator protective relay system |
| 01/09/2003 | US20030008620 Field test chamber arrangement |
| 01/09/2003 | US20030008449 Method for sorting integrated circuit devices |
| 01/09/2003 | US20030008424 Multichip module and method for testing connection of the module |
| 01/09/2003 | US20030008423 Method for fabrication of a silicon photosensor array on a wafer and testing the same |
| 01/09/2003 | US20030008202 System and method of battery capacity reporting |
| 01/09/2003 | US20030007581 Multi-pair gigabit ethernet transceiver |
| 01/09/2003 | US20030007413 Semiconductor memory and burn-in method for the same |
| 01/09/2003 | US20030007410 Semiconductor memory device having error correction function for data reading during refresh operation |
| 01/09/2003 | US20030006811 Semiconductor integrated circuit device |
| 01/09/2003 | US20030006798 Engagement probes |
| 01/09/2003 | US20030006797 Testing device for a semiconductor component |
| 01/09/2003 | US20030006796 Methods and apparatus for bi-directional signaling |
| 01/09/2003 | US20030006795 Semiconductor device, method of measuring the same, and method of manufacturing the same |
| 01/09/2003 | US20030006794 Tape carrier package testing method |
| 01/09/2003 | US20030006793 Automated multi-chip module handler and testing system |
| 01/09/2003 | US20030006789 Test system, test contactor, and test method for electronic modules |
| 01/09/2003 | US20030006787 Conductive contact |
| 01/09/2003 | US20030006786 Method and device for measuring intensity of electromagnetic field, method and device for measuring current-voltage distribution, and method for judging quality of electronic device, and electronic device therefor |
| 01/09/2003 | US20030006780 Method and device for testing a telecommunication cable |
| 01/09/2003 | US20030006779 Apparatus and method for validating wiring diagrams and creating wirelists |
| 01/09/2003 | US20030006776 Method and device for testing the ESD resistance of a semiconductor component |
| 01/09/2003 | US20030006757 Inspection apparatus and method adapted to a scanning technique employing a rolling wire probe |
| 01/09/2003 | US20030006735 Detecting method for detecting internal information of a rechargeable battery, detecting apparatus for detecting internal information of a rechargeable battery, apparatus in which said detecting method is applied, apparatus including said detecting apparatus, and storage medium in which a software program of said detecting method is stored |
| 01/09/2003 | US20030006413 Semiconductor test system and associated methods for wafer level acceptance testing |
| 01/09/2003 | US20030006372 Automatic focusing system for scanning electron microscope equipped with laser defect detection function |
| 01/09/2003 | US20030005783 Apparatus and method for automatically changing the probe head in a four-point probe system |
| 01/08/2003 | EP1273925A2 Test handler apparatus for SMD, BGA, and CSP |
| 01/08/2003 | EP1273924A2 Device for the detection of electrically conducting contamination of the contact side of an electric connector |
| 01/08/2003 | EP1273923A1 Testing a batch of electrical components |
| 01/08/2003 | EP1273010A2 Method and apparatus for improving the testing, yield and performance of very large scale integrated circuits |
| 01/08/2003 | EP1272861A1 A method and apparatus for testing digital circuitry |
| 01/08/2003 | EP1272860A1 Sensor array and method for detecting the condition of a transistor in a sensor array |
| 01/08/2003 | EP1272859A1 Testing arrangement and testing method |
| 01/08/2003 | EP1123514B1 Remote test module for automatic test equipment |
| 01/08/2003 | EP0996956B1 Overvoltage protector for high or medium voltage |
| 01/08/2003 | CN2530271Y Cut-off waner of low voltage power line |
| 01/08/2003 | CN2530243Y Circuit board checker |
| 01/08/2003 | CN1390305A Probe device, method of manufacture thereof, method of testing substrate using probe device |
| 01/08/2003 | CN1389964A Power controlling circuit |
| 01/08/2003 | CN1389950A Judging method of accumulator charging and discharging state |
| 01/08/2003 | CN1389915A Semiconductor device |
| 01/08/2003 | CN1389795A Dada processing apparatus with circuit for determining serial transmission data proper characteristic |
| 01/08/2003 | CN1389739A Voltage monitoring method and monitor |
| 01/08/2003 | CN1389738A Powering frame |
| 01/08/2003 | CN1098561C Temperature-compensated driver circuit |
| 01/08/2003 | CN1098463C Corrector |
| 01/07/2003 | USRE37961 Pin connector, pin connector holder and packaging board for mounting electronic component |
| 01/07/2003 | US6505317 System and method for testing signal interconnections using built-in self test |
| 01/07/2003 | US6505316 Peripheral partitioning and tree decomposition for partial scan |
| 01/07/2003 | US6505315 Semiconductor device testing apparatus and signal output apparatus for outputting a differential signal to a test semiconductor device |
| 01/07/2003 | US6505312 Integrated circuit tester |
| 01/07/2003 | US6505138 Function-based control interface for integrated circuit tester prober and handler devices |
| 01/07/2003 | US6505136 Method of testing an evaluation circuit |
| 01/07/2003 | US6504921 Apparatus and method for network-initiated real-time multi-party communications |
| 01/07/2003 | US6504773 Memory testing method and memory testing apparatus |
| 01/07/2003 | US6504772 Testing method and test apparatus in semiconductor apparatus |
| 01/07/2003 | US6504771 Semiconductor device, system, and method of controlling accessing to memory |
| 01/07/2003 | US6504741 Semiconductor device in which storage electrode of capacitor is connected to gate electrode of FET and inspection method thereof |
| 01/07/2003 | US6504696 Control arrangement and method for power electronic system |
| 01/07/2003 | US6504395 Method and apparatus for calibration and validation of high performance DUT power supplies |
| 01/07/2003 | US6504393 Methods and apparatus for testing semiconductor and integrated circuit structures |
| 01/07/2003 | US6504391 Conductive bump array contactors having an ejector and methods of testing using same |
| 01/07/2003 | US6504390 Conductive bump array contactors having an ejector and methods of testing using same |
| 01/07/2003 | US6504388 Electrical test tool having easily replaceable electrical probe |
| 01/07/2003 | US6504384 Apparatus of measuring capacitance and method thereof |
| 01/07/2003 | US6504382 Electrical system with a stress shield system for partial discharge on-line monitoring of the state of high-voltage insulation |
| 01/07/2003 | US6504381 Two-output voltage test system |
| 01/07/2003 | US6504378 Apparatus for evaluating contact pin integrity of electronic components having multiple contact pins |
| 01/07/2003 | US6504359 Method and device for testing electronic components |
| 01/07/2003 | US6504358 Method for detecting the operating temperature of a motor |
| 01/07/2003 | US6504357 Apparatus for metering electrical power and electronically communicating electrical power information |
| 01/07/2003 | US6504344 Monitoring battery packs |
| 01/07/2003 | US6504223 Contact structure and production method thereof and probe contact assembly using same |
| 01/07/2003 | US6504123 Process for sorting integrated circuit devices |
| 01/07/2003 | US6503774 Embedding parasitic model for pi-fet layouts |
| 01/07/2003 | US6503765 Testing vias and contacts in integrated circuit fabrication |
| 01/07/2003 | US6502881 Gripper for picking apparatus of a module IC handler |
| 01/05/2003 | CA2766337A1 System and method for battery capacity reporting |
| 01/03/2003 | WO2003001859A1 Method and device for testing electronic devices |
| 01/03/2003 | WO2003001649A1 Synchronous machine |
| 01/03/2003 | WO2003001643A1 Detecting a remaining battery capacity and a battery remaining capacity circuit |
| 01/03/2003 | WO2003001331A2 Environmental monitoring system |
| 01/03/2003 | WO2003001224A1 Battery characterization system |
| 01/03/2003 | WO2003001223A2 High density planar electrical interface |
| 01/03/2003 | WO2003001222A1 Detachable cartridge unit and auxiliary unit for function expansion of a data processing |
| 01/03/2003 | WO2002075340A3 Device for holding an electronic circuit in a pre-determined state |
| 01/02/2003 | US20030005393 Method for converting a logic circuit model |