| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/21/2003 | US6509718 Battery pack diagnostic method and battery pack diagnostic apparatus |
| 01/21/2003 | US6509202 Method and system for qualifying an ONO layer in a semiconductor device |
| 01/21/2003 | US6509197 Inspectable buried test structures and methods for inspecting the same |
| 01/21/2003 | US6508845 Preparation of a chip scale package; heatable pressing plate movable to press against the solder balls to planarize |
| 01/16/2003 | WO2003005623A2 Protection path resources allocating method and system |
| 01/16/2003 | WO2003005442A2 Device and method for measuring operating temperatures of an electrical component |
| 01/16/2003 | WO2003005052A1 Methods for determining the charge state and/or the power capacity of a charge store |
| 01/16/2003 | WO2003005051A1 Improved integrated circuit burn-in methods and apparatus |
| 01/16/2003 | WO2003005050A1 Method and apparatus for optimized parallel testing and access of electronic circuits |
| 01/16/2003 | WO2003005049A1 Apparatus and method for testing insulation of power cables in multiple manners |
| 01/16/2003 | WO2003005048A1 Establishing condition of connector and malfunction of couplings |
| 01/16/2003 | WO2003005047A1 Testing a batch of electrical components |
| 01/16/2003 | WO2003005046A2 Apparatus with a test interface |
| 01/16/2003 | WO2003005045A1 Handling device, especially for positioning a test head on a testing device |
| 01/16/2003 | WO2003005043A1 Conductive contact |
| 01/16/2003 | WO2003005041A2 A test handling apparatus and method |
| 01/16/2003 | WO2002093187A3 Method and apparatus for predicting the available energy of a battery |
| 01/16/2003 | WO2002058137A3 Composite microelectronic spring structure and method for making same |
| 01/16/2003 | WO2002025296A3 Method and system for wafer and device-level testing of an integrated circuit |
| 01/16/2003 | US20030014704 Test apparatus for semiconductor devices having bult-in self-test function |
| 01/16/2003 | US20030014703 Using pseudo-pins in generating scan test vectors for testing an embedded core while maintaining the IP contained therein |
| 01/16/2003 | US20030014643 Electronic apparatus and debug authorization method |
| 01/16/2003 | US20030014206 In-circuit testing optimization generator |
| 01/16/2003 | US20030014205 Methods and apparatus for semiconductor testing |
| 01/16/2003 | US20030014203 Low leakage technique for determining power spectra of non-coherently sampled data |
| 01/16/2003 | US20030013249 Semiconductor wafer, semiconductor chip, semiconductor device and method for manufacturing semiconductor device |
| 01/16/2003 | US20030012633 Ic handler |
| 01/16/2003 | US20030012068 Semiconductor storage device |
| 01/16/2003 | US20030011761 Cam reference for inspection of multi-color and contour images |
| 01/16/2003 | US20030011537 Methods and systems for compensating row-to-row brightness variations of a field emission display |
| 01/16/2003 | US20030011430 Differential difference amplifier for amplifying small signals close to zero volts |
| 01/16/2003 | US20030011425 Injection current test circuit |
| 01/16/2003 | US20030011409 Method for switching from a first operating condition of an integrated circuit to a second operating condition of the integrated circuit |
| 01/16/2003 | US20030011396 Semiconductor device and test system therefor |
| 01/16/2003 | US20030011394 Self-aligning wafer burn-in probe |
| 01/16/2003 | US20030011391 Reversed memory module socket, motherboard and test system including same, and method of modifying motherboard |
| 01/16/2003 | US20030011390 Interface apparatus for integrated circuit testing |
| 01/16/2003 | US20030011380 System and method for non-contact electrical testing employing a CAM derived reference |
| 01/16/2003 | US20030011379 Method for characterizing an active track and latch sense-amp (comparator) in a one time programmable (OTP) salicided poly fuse array |
| 01/16/2003 | US20030011376 Equipment for and method of detecting faults in semiconductor integrated circuits |
| 01/16/2003 | US20030011372 Method and device for checking the charge state of a battery, in particular a rechargeable battery for a cellular mobile telephone |
| 01/16/2003 | US20030011060 Semiconductor die adapter and method of using |
| 01/16/2003 | US20030010977 Method and apparatus for wafer-level burn-in and testing of integrated circuits |
| 01/16/2003 | US20030010976 Method of manufacturing a probe card |
| 01/16/2003 | DE20114177U1 Apparatus for testing resistance to conduction and insulating integrity of intermediate insulating layers in base material for manufacturing printed circuit boards |
| 01/16/2003 | DE10135582C1 IC with adjustment circuit for internal clock signal has equalization device supplied with setting data from read-only and read/write memories for initial and fine adjustment |
| 01/15/2003 | EP1276166A2 Electric accumulator with electronic circuit integrated in its container |
| 01/15/2003 | EP1275971A2 Regenerative load apparatus and load test method |
| 01/15/2003 | EP1275970A1 Test circuit for fault current protection device |
| 01/15/2003 | EP1275969A1 Circuit for detecting leakage in power supply |
| 01/15/2003 | EP1275183A1 Method and apparatus for providing optimized access to circuits for debug, programming, and test |
| 01/15/2003 | EP1275145A2 Electromigration early failure distribution in submicron interconnects |
| 01/15/2003 | EP1275010A2 Method and apparatus for testing signal paths between an integrated circuit wafer and a wafer tester |
| 01/15/2003 | EP1274991A1 Current measuring apparatus for battery |
| 01/15/2003 | EP1214768A4 System and method for providing surge, short and reverse polarity connection protection |
| 01/15/2003 | EP1024985B1 Circuit configuration to monitor a regulated output voltage in a motor vehicle |
| 01/15/2003 | CN2531400Y Cable fault testing apparatus |
| 01/15/2003 | CN2531398Y Electronic element parameter measuring fixing equipment |
| 01/15/2003 | CN1391351A Semiconductor integrated circuit device and its design |
| 01/15/2003 | CN1391305A Method, apparatus and application for detecting data of chargable cell |
| 01/15/2003 | CN1391132A Substrate devices, its test methods, photoelectric devices and manufacturing methods thereof |
| 01/15/2003 | CN1391108A Current and voltage equalizing test method for SCR set and its device |
| 01/15/2003 | CN1099149C Device for determining service life and volume of secondary battery |
| 01/15/2003 | CN1099140C Battery pack |
| 01/15/2003 | CN1099038C Battery capacity measuring device |
| 01/15/2003 | CN1099037C Method of detecting and locating high-resistance earth fault in electric power network |
| 01/14/2003 | US6507936 Timing verifying method |
| 01/14/2003 | US6507934 Apparatus and method for source synchronous link testing of an integrated circuit |
| 01/14/2003 | US6507925 Spatial and temporal alignment of a scan dump for debug of scan-based designs |
| 01/14/2003 | US6507923 Integrated multi-channel fiber channel analyzer |
| 01/14/2003 | US6507920 Extending synchronous busses by arbitrary lengths using native bus protocol |
| 01/14/2003 | US6507801 Semiconductor device testing system |
| 01/14/2003 | US6507797 Direct current machine monitoring system and method |
| 01/14/2003 | US6507512 Circuit configuration and method for accelerating aging in an MRAM |
| 01/14/2003 | US6507215 Programmable driver for an I/O pin of an integrated circuit |
| 01/14/2003 | US6507210 System and method for power testing a chassis |
| 01/14/2003 | US6507209 Tester accuracy using multiple passes |
| 01/14/2003 | US6507208 Low-current probe card |
| 01/14/2003 | US6507204 Semiconductor testing equipment with probe formed on a cantilever of a substrate |
| 01/14/2003 | US6507203 Test head assembly |
| 01/14/2003 | US6507196 Battery having discharge state indication |
| 01/14/2003 | US6507195 Electronic apparatus using removable batteries as drive source |
| 01/14/2003 | US6507194 Method of calculating remaining battery capacity |
| 01/14/2003 | US6507185 Device, assembly and method for testing electronic components, and calibrating method therefor |
| 01/14/2003 | US6507182 Voltage modulator circuit to control light emission for non-invasive timing measurements |
| 01/14/2003 | US6507181 Arrangement and method for finding out the number of sources of partial discharges |
| 01/14/2003 | US6507171 Method and apparatus for measuring battery charge and discharge current using a direct analog-to-digital conversion of a charge/discharge replica current |
| 01/14/2003 | US6507076 Microwave transistor subjected to burn-in testing |
| 01/14/2003 | US6505478 Heat exchanger having sloped deflection surface for directing refrigerant |
| 01/14/2003 | CA2281365C Wiring harness diagnostic system |
| 01/14/2003 | CA2089917C Method and apparatus for inspecting a printed circuit board (shutter system) |
| 01/09/2003 | WO2003003626A1 Measuring system with a reference signal between a signal generator and a signal analyser |
| 01/09/2003 | WO2003003536A1 Electric circuit providing selectable short circuit for instrumentation applications |
| 01/09/2003 | WO2003003375A2 Apparatus and methods for monitoring self-aligned contact arrays |
| 01/09/2003 | WO2003003326A1 Arcing source position detector |
| 01/09/2003 | WO2003003208A1 Device for and method of storing identification data in an integrated circuit |
| 01/09/2003 | WO2003003036A2 Circuit and method for detecting transient voltages on a dc power supply rail |
| 01/09/2003 | WO2003003035A1 Accurate voltage measurement system using relay isolated circuits |
| 01/09/2003 | WO2003003034A1 Apparatus and methods reliable and efficient detection of voltage contrast defects |
| 01/09/2003 | WO2003003033A2 Semiconductor programming and testing method and apparatus |