| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 01/29/2003 | CN1393697A Test line for circit boards |
| 01/29/2003 | CN1393696A Pressing contacting structure for detector |
| 01/29/2003 | CN1393695A Automatic tester for plug |
| 01/29/2003 | CN1100463C Antenna and feeder cable tester and testing method |
| 01/29/2003 | CN1100381C Oscillatory circuit having built-in test circuit for checking oscillating signal for tudy factor |
| 01/28/2003 | US6513144 Method and apparatus for random stimulus generation |
| 01/28/2003 | US6513138 Pattern generator for semiconductor test system |
| 01/28/2003 | US6513137 Test method and apparatus using energy consumption ratio |
| 01/28/2003 | US6512989 Generating and controlling analog and digital signals on a mixed signal test system |
| 01/28/2003 | US6512984 Battery pack, method for charging/discharging counting and method for setting residual capacity of the battery pack |
| 01/28/2003 | US6512709 Semiconductor integrated circuit |
| 01/28/2003 | US6512707 Semiconductor integrated circuit device allowing accurate evaluation of access time of memory core contained therein and access time evaluating method |
| 01/28/2003 | US6512692 Nonvolatile semiconductor storage device and test method therefor |
| 01/28/2003 | US6512688 Device for evaluating cell resistances in a magnetoresistive memory |
| 01/28/2003 | US6512686 Ferroelectric storage device and test method thereof |
| 01/28/2003 | US6512458 Method and apparatus for detecting failure in solar cell module, and solar cell module |
| 01/28/2003 | US6512392 Method for testing semiconductor devices |
| 01/28/2003 | US6512391 Probe station thermal chuck with shielding for capacitive current |
| 01/28/2003 | US6512390 Detecting device for a switch matrix |
| 01/28/2003 | US6512388 IC socket and spring means of IC socket |
| 01/28/2003 | US6512387 Pressure-sensitive system and method of testing electronic device interconnections |
| 01/28/2003 | US6512386 Device testing contactor, method of producing the same, and device testing carrier |
| 01/28/2003 | US6512385 Method for testing a device under test including the interference of two beams |
| 01/28/2003 | US6512384 Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages |
| 01/28/2003 | US6512377 Method and apparatus for extraction of via parasitics |
| 01/28/2003 | US6512362 Method and device for charging integrated circuits and structures with a pulsed heavy current |
| 01/28/2003 | US6512181 Multilayer type printed-wiring board and method of measuring impedance of multilayer type printed-wiring board |
| 01/28/2003 | US6511857 Process for manufacturing semiconductor device |
| 01/28/2003 | US6511574 Fixture for securing hard stops to a substrate |
| 01/28/2003 | US6510987 Automated monitoring of ESD (electro static discharge) of each of a plurality of operators in a production area |
| 01/28/2003 | US6510744 Modeling and analysis of an object comprised of more than one component |
| 01/28/2003 | CA2149149C Load analysis system for fault detection |
| 01/23/2003 | WO2003007431A1 Self-aligning socket connector |
| 01/23/2003 | WO2003007007A1 Electronic parts handling device, and electronic parts temperature control method |
| 01/23/2003 | WO2003007006A1 Heater-equipped pusher, electronic parts handling device, and electronic parts temperature control method |
| 01/23/2003 | WO2003007005A1 Virtual line switched ring (vlsr) connection state distribution scheme |
| 01/23/2003 | WO2003007004A1 Injection current test circuit |
| 01/23/2003 | WO2003007003A1 Method of manufacturing a probe card |
| 01/23/2003 | WO2003007002A2 Interface apparatus for integrated circuit testing |
| 01/23/2003 | US20030018944 Semiconductor integrated circuit including circuit for selecting embedded tap cores |
| 01/23/2003 | US20030018939 Test circuit capable of testing embedded memory with reliability |
| 01/23/2003 | US20030018938 Test pattern generation circuit and method for use with self-diagnostic circuit |
| 01/23/2003 | US20030018937 Method and apparatus for efficient self-test of voltage and current level testing |
| 01/23/2003 | US20030018463 Logical simulation method |
| 01/23/2003 | US20030017753 Battery clamp with integrated current sensor |
| 01/23/2003 | US20030017629 Apparatus and method for testing semiconductor devices |
| 01/23/2003 | US20030016738 Testing system and method of non-invasive testing |
| 01/23/2003 | US20030016582 Dynamic register with low clock rate testing capability |
| 01/23/2003 | US20030016570 Semiconductor integrated circuit |
| 01/23/2003 | US20030016562 Memory devices with page buffer having dual registers and methods of using the same |
| 01/23/2003 | US20030016361 Method and apparatus for leak-testing an electroluminescent device |
| 01/23/2003 | US20030016153 Open-loop for waveform acquisition |
| 01/23/2003 | US20030016128 Environmental monitoring system |
| 01/23/2003 | US20030016048 Short circuit generator for testing power supplies |
| 01/23/2003 | US20030016047 Method and apparatus for measuring parameters of an electronic device |
| 01/23/2003 | US20030016045 Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same |
| 01/23/2003 | US20030016044 Method for analyzing failure of semiconductor integrated circuit and failure |
| 01/23/2003 | US20030016043 Method and system for automatically locating a component on a planar |
| 01/23/2003 | US20030016042 Methods and apparatus for minimizing current surges during integrated circuit testing |
| 01/23/2003 | US20030016041 Method and apparatus for testing semiconductor integrated circuit, and semiconductor integrated circuit manufactured thereby |
| 01/23/2003 | US20030016038 Programmable test socket |
| 01/23/2003 | US20030016036 Full wafer silicon probe card for burn-in and testing, method of fabrication and test system including same |
| 01/23/2003 | US20030016035 Direct detection of dielectric etch system magnet driver and coil malfunctions |
| 01/23/2003 | US20030016031 Test equipment |
| 01/23/2003 | US20030016026 Method and apparatus for inspecting printed circuit boards |
| 01/23/2003 | US20030016025 Method and device for testing electronic devices |
| 01/23/2003 | US20030016023 Method for determining the state of charge of rechargeable batteries |
| 01/23/2003 | US20030015995 Set battery charging condition detecting apparatus |
| 01/23/2003 | US20030015779 Packaging device for holding a plurality of semiconductor devices to be inspected |
| 01/22/2003 | EP1278407A1 Laminate with inside layer circuit used for multilayer printed circuit board for high frequency circuit, and method and device for measuring circuit impedance of the laminate with inside layer circuit |
| 01/22/2003 | EP1278072A1 Device for judging life of auxiliary battery |
| 01/22/2003 | EP1277112A2 Capturing of a register value to another clock domain |
| 01/22/2003 | EP1092983B1 Integrated circuit tester with multi-port testing functionality |
| 01/22/2003 | EP0957429B1 Detecting communication errors across a chip boundary |
| 01/22/2003 | CN2532494Y Residul electricity detection and measuring indication system for rechargeable battery |
| 01/22/2003 | CN2532493Y Electromagnetic wave interfernce-resistant tester |
| 01/22/2003 | CN2532492Y Tester for electronic type circuit breaker |
| 01/22/2003 | CN2532487Y metallized film tester |
| 01/22/2003 | CN1392697A Serial shaking measuring device and method based on frequency spectrum analysis |
| 01/22/2003 | CN1392569A Semiconductor storage and its ageing sieving method |
| 01/22/2003 | CN1392419A Portable electronic device for counting cell charging times |
| 01/22/2003 | CN1392418A Detection method for missing curcuit board wire |
| 01/22/2003 | CN1099677C 半导体集成电路器件 The semiconductor integrated circuit device |
| 01/22/2003 | CN1099640C 半导体集成电路 The semiconductor integrated circuit |
| 01/22/2003 | CN1099597C On-line detection method for function of operational amplifier |
| 01/21/2003 | US6510535 Method of design for testability for integrated circuits |
| 01/21/2003 | US6510534 Method and apparatus for testing high performance circuits |
| 01/21/2003 | US6510403 Time constrained sensor data retrieval system and method |
| 01/21/2003 | US6510398 Constrained signature-based test |
| 01/21/2003 | US6510392 In-situ test for embedded passives |
| 01/21/2003 | US6510072 Nonvolatile ferroelectric memory device and method for detecting weak cell using the same |
| 01/21/2003 | US6509778 BIST circuit for variable impedance system |
| 01/21/2003 | US6509754 CPU adapter for a motherboard test machine |
| 01/21/2003 | US6509752 Testing apparatus with mechanism for preventing damage to unit under test |
| 01/21/2003 | US6509750 Apparatus for detecting defects in patterned substrates |
| 01/21/2003 | US6509745 Method and apparatus for measuring liquid dielectric behavior |
| 01/21/2003 | US6509743 Active load or source impedance synthesis apparatus for measurement test set of microwave components and systems |
| 01/21/2003 | US6509741 Method for screening multi-layer ceramic electronic component |
| 01/21/2003 | US6509740 Methods and apparatus for time domain reflectometry |
| 01/21/2003 | US6509739 Method for locating defects and measuring resistance in a test structure |