| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/05/2003 | EP1097387B1 Device without set-up kit for the targeted moving of electronic components |
| 02/05/2003 | EP1031043B1 Method and system for monitoring the condition of a battery pack in a defibrillator |
| 02/05/2003 | EP0864168B1 Method and device for monitoring consumption of contact elements in a switching device |
| 02/05/2003 | CN2534588Y Antitheft alarmer for 10 KV and below 10 KV electric line |
| 02/05/2003 | CN1395756A Battery pack charging system |
| 02/05/2003 | CN1395688A Inspecting apparatus and inspecting method for circuit board |
| 02/05/2003 | CN1395687A Inspecting apparatus and inspecting method for circuit board |
| 02/05/2003 | CN1395305A LED epitaxial wafer electroluminescent nondestructive detection method |
| 02/05/2003 | CN1395112A Method and device for detecting semiconductor circuit |
| 02/05/2003 | CN1101065C Connector for display inspection of liquid crystal display panel and method for preparation thereof |
| 02/05/2003 | CN1100998C Sensor characteristic testing circuit |
| 02/05/2003 | CN1100997C Method and equipment for positioning failure point on electric power transmission line |
| 02/04/2003 | US6516432 AC scan diagnostic method |
| 02/04/2003 | US6516431 Semiconductor device |
| 02/04/2003 | US6516430 Test circuit for semiconductor device with multiple memory circuits |
| 02/04/2003 | US6516428 On-chip debug system |
| 02/04/2003 | US6516281 Scanning single electron transistor microscope for imaging ambient temperature objects |
| 02/04/2003 | US6516086 Method and apparatus for distinguishing regions where a material is present on a surface |
| 02/04/2003 | US6515933 Semiconductor device and semiconductor storage device testing method |
| 02/04/2003 | US6515920 Semiconductor data storing circuit device, method of checking the device and method of relieving the device from defective cell |
| 02/04/2003 | US6515665 Data filtering/suppression of data acquisitions/samples for multi-channel electronic display and analysis |
| 02/04/2003 | US6515549 Semiconductor device having critical path connected by feedback ring oscillator |
| 02/04/2003 | US6515500 Method and apparatus of testing and analyzing CMOS integrated circuit |
| 02/04/2003 | US6515499 Modular semiconductor tester interface assembly for high performance coaxial connections |
| 02/04/2003 | US6515498 Apparatus and method for pressing prober |
| 02/04/2003 | US6515497 Air pump operated test fixture and method for testing a circuit board |
| 02/04/2003 | US6515495 Test structure in an integrated semiconductor |
| 02/04/2003 | US6515494 Silicon wafer probe station using back-side imaging |
| 02/04/2003 | US6515486 Method and structure to determine low threshold voltage and high threshold voltage |
| 02/04/2003 | US6515484 Electrical test instrument having an improved operator interface |
| 02/04/2003 | US6515483 System for partial scan testing of integrated circuits |
| 02/04/2003 | US6515470 Method and apparatus for testing IC device |
| 02/04/2003 | US6515469 Testing apparatus for semiconductor integrated circuits and a method for managing the same |
| 02/04/2003 | US6515465 Method and apparatus for measuring harmonic load-pull for frequency multiplication |
| 02/04/2003 | US6515454 Method and system for determining the capacity of a battery |
| 02/04/2003 | US6515453 Method of predicting the state of charge as well as the use time left of a rechargeable battery |
| 02/04/2003 | US6515452 Remaining battery capacity corrector and controlling method therefor |
| 02/04/2003 | US6515282 Testing of interconnection circuitry using two modulated charged particle beams |
| 02/04/2003 | US6515215 Photovoltaic module, photovoltaic module array, photovoltaic system, and method of detecting failure of photovoltaic module |
| 02/04/2003 | US6514779 Large area silicon carbide devices and manufacturing methods therefor |
| 01/30/2003 | WO2003008998A1 Imaging sonar and a detection system using one such sonar |
| 01/30/2003 | WO2003008985A1 Input/output circuit and test apparatus |
| 01/30/2003 | WO2003008984A2 Test head docking system and method |
| 01/30/2003 | US20030023941 Computer-aided design system to automate scan synthesis at register-transfer level |
| 01/30/2003 | US20030023914 Built-in-self-test using embedded memory and processor in an application specific integrated circuit |
| 01/30/2003 | US20030023913 Testing device of semiconductor integrated circuit and test method therefor |
| 01/30/2003 | US20030023912 Integrated testing of serializer/deserializer in FPGA |
| 01/30/2003 | US20030023771 Method for accessing scan chains and updating EEPROM-resident FPGA code through a system mangement processor and JTAG bus |
| 01/30/2003 | US20030023407 Method and device for monitoring the functioning of a system |
| 01/30/2003 | US20030022546 CRT aging line load voltage socket |
| 01/30/2003 | US20030022405 Lead formation, assembly strip test and singulation method |
| 01/30/2003 | US20030022404 System processing time computation method, system processing time computation device, and recording medium with system processing time computation program recorded thereon |
| 01/30/2003 | US20030021464 Semiconductor integrated circuit and testing method for the same |
| 01/30/2003 | US20030020620 Oscillator activated continuity testing switch |
| 01/30/2003 | US20030020510 Evaluating pattern for measuring an erosion of a semiconductor wafer polished by a chemical mechanical polishing |
| 01/30/2003 | US20030020508 Apparatus and method for disabling and re-enabling access to IC test functions |
| 01/30/2003 | US20030020507 Apparatus for testing reliability of interconnection in integrated circuit |
| 01/30/2003 | US20030020506 Testing device for printed circuit boards |
| 01/30/2003 | US20030020504 Universal flying probe fixture |
| 01/30/2003 | US20030020502 Contact probe member and manufacturing method of the same |
| 01/30/2003 | US20030020501 Three-dimensional photonic crystal and process for production thereof as well as probe used therefor |
| 01/30/2003 | US20030020498 Noise evaluation circuit for IC tester |
| 01/30/2003 | US20030020497 Apparatus for testing reliability of interconnection in integrated circuit |
| 01/30/2003 | US20030020488 Electronic component, tester device and method for calibrating a tester device |
| 01/30/2003 | US20030020487 Method and system for sensor fault detection |
| 01/30/2003 | US20030020486 Method of measuring insulation resistance of capacitor and insulation resistance measuring apparatus of the same |
| 01/30/2003 | US20030020485 Rotor analyzer for an induction motor |
| 01/30/2003 | US20030020484 Apparatus for the high voltage testing of insulated conductors and oscillator circuit for use with same |
| 01/30/2003 | US20030020483 Method and system for partial-scan testing of integrated circuits |
| 01/30/2003 | US20030020479 Electrical rechargeable battery with an electronic circuit integrated in the rechargeable battery container |
| 01/30/2003 | US20030020478 Electro-chemical deterioration test method and apparatus |
| 01/30/2003 | US20030020459 Compare path bandwidth control for high performance automatic test systems |
| 01/30/2003 | US20030020458 Compare path bandwidth control for high performance automatic test systems |
| 01/30/2003 | US20030020457 Test handler apparatus for SMD (surface mount devices), BGA (ball grid arrays) and CSP (chip scale packages) |
| 01/30/2003 | US20030020451 Semiconductor integrated circuit device and device for testing same |
| 01/30/2003 | US20030020449 Acceleration of automatic test |
| 01/30/2003 | US20030020448 Voltage modulator circuit to control light emission for non-invasive timing measurements |
| 01/30/2003 | US20030020434 Device and method for charging a secondary battery |
| 01/30/2003 | US20030020131 Device and method for detecting a reliability of integrated semiconductor components at high temperatures |
| 01/30/2003 | US20030020095 Semiconductor integrated circuit with voltage down converter adaptable for burn-in testing |
| 01/30/2003 | US20030020026 Method of detecting pattern defects of a conductive layer in a test key area |
| 01/30/2003 | DE10109558C1 Empfängerseitige Zusatzschaltung für den Boundary Scan bei der Datenübertragung mit differentiellen Signalen Receiver-side auxiliary circuit for the Boundary Scan in data transmission with differential signals |
| 01/30/2003 | DE10034706C2 Elektrooptik-Meßfühler Electro-optic probe |
| 01/29/2003 | EP1280161A1 Memory devices with page buffer having dual registers and methods of using the same |
| 01/29/2003 | EP1279966A2 Apparatus and method for determining the reliability of integrated semiconductor circuits at high temperatures |
| 01/29/2003 | EP1279965A2 Oscillator activated continuity testing switch |
| 01/29/2003 | EP1279042A2 Electronic circuit device with a short circuit switch and method of testing such a device |
| 01/29/2003 | EP1279041A1 Insulation tester for squirrel cage rotors |
| 01/29/2003 | EP1218946B1 Apparatus for localizing production errors in a photovoltaic element |
| 01/29/2003 | EP1031026B1 device for detecting the location of components, light deflection body and insertion head with a device for detecting the location of components |
| 01/29/2003 | EP0704106B1 Method and apparatus for automatically positioning electronic die within component packages |
| 01/29/2003 | CN2533475Y Accumulator state tester for vehicle |
| 01/29/2003 | CN2533474Y Accumulator parameter tester selfpowered by accumulator |
| 01/29/2003 | CN2533473Y Automatic circuit board PCI interface tester |
| 01/29/2003 | CN1394374A System and method accommodating more than one battery within electronic device |
| 01/29/2003 | CN1394361A Battery pack and its tester |
| 01/29/2003 | CN1394360A Semiconductor device fabrication method and device thereof |
| 01/29/2003 | CN1393971A Monitoring circuit for battery state and battery equipment |
| 01/29/2003 | CN1393921A Semiconductor detector |
| 01/29/2003 | CN1393698A In-line monitor system and method for dirt sparkle of transformer station |