| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 02/13/2003 | US20030030329 Method and structure for measurement of a multiple-power-source device during a test mode |
| 02/13/2003 | US20030030293 Holding apparatus |
| 02/13/2003 | US20030030129 Semiconductor wafer |
| 02/13/2003 | US20030030075 Semiconductor device and method of arranging transistors for forming TEG |
| 02/13/2003 | US20030030071 Device for and method of examining the signal performance of semiconductor circuits |
| 02/13/2003 | US20030029901 System and method for detecting bonding status of bonding wire of semiconductor package |
| 02/13/2003 | DE10122619C1 Testschaltung zum Testen einer synchronen Schaltung Test circuit for testing a synchronous circuit |
| 02/13/2003 | CA2449865A1 Coil on plug inductive sampling method and apparatus |
| 02/12/2003 | EP1283593A1 Motor controller |
| 02/12/2003 | EP1283425A1 Method for estimating power battery parameters of an electric motor vehicle |
| 02/12/2003 | EP1283424A2 Procedure and device for determining the state of charge of a vehicle battery |
| 02/12/2003 | EP1283423A1 Timing calibration and timing calibration verification of electronic circuit testers |
| 02/12/2003 | EP1283422A1 Testbench for the validation of a device under test |
| 02/12/2003 | EP1282913A2 Wireless radio frequency testing method of integrated circuits and wafers |
| 02/12/2003 | EP1282828A2 System for regulating the temperature of ic-chips with a fluid which is heated and cooled as a function of the fluid temperatures to and from heat exchangers for the ic-chips |
| 02/12/2003 | EP1135979B1 Device for grasping and aligning an electronic component on a spindle |
| 02/12/2003 | EP1110158B1 Method and arrangement for testing the stability of a working point of a circuit |
| 02/12/2003 | CN1396599A Semiconductor memory device for reading data and error correction in refresh operating procedure |
| 02/12/2003 | CN1101606C Connector |
| 02/12/2003 | CN1101552C Semiconductor integrated circuit with testable unit block |
| 02/12/2003 | CN1101551C Device for sensing electric discharges in test object, preferably a cable joint |
| 02/11/2003 | US6519748 Signal delay time calculation method of semiconductor integrated circuit and computer program product for executing the method |
| 02/11/2003 | US6519744 Semiconductor die manufacture method to limit a voltage drop on a power plane thereof by noninvasively measuring voltages on a power plane |
| 02/11/2003 | US6519729 Reduced power testing with equally divided scan paths |
| 02/11/2003 | US6519728 Semiconductor integrated circuit having test circuit |
| 02/11/2003 | US6519727 System and method for applying flexible constraints |
| 02/11/2003 | US6519726 Semiconductor device and testing method of the same |
| 02/11/2003 | US6519724 Communication systems, circuits, circuit systems and methods of operating a circuit |
| 02/11/2003 | US6519556 Modeling method and simulation method |
| 02/11/2003 | US6519539 Measurement of fuel cell impedance |
| 02/11/2003 | US6519499 Method and apparatus for extracting bridges from an integrated circuit layout |
| 02/11/2003 | US6519321 2nd level power fault testing apparatus for testing telecommunications equipment |
| 02/11/2003 | US6519171 Semiconductor device and multichip module |
| 02/11/2003 | US6518879 Apparatus and method for monitoring line disconnection and a fire, and a fire alarm system having the same |
| 02/11/2003 | US6518793 Embedding of dynamic circuits in a static environment |
| 02/11/2003 | US6518788 Logic circuit design method and logic circuit |
| 02/11/2003 | US6518784 Test method using semiconductor test apparatus |
| 02/11/2003 | US6518783 Semiconductor die having a buried insulator layer between a circuit side and a back side is selectively thinned. During thinning, a selected portion of the bulk silicon layer on the back side is removed and a void created. A circuit is formed |
| 02/11/2003 | US6518777 Method and apparatus for measuring insulation resistance |
| 02/11/2003 | US6518774 Method and apparatus for testing frequency-dependent electrical circuits |
| 02/11/2003 | US6518772 Method and device for the detection of damage in the insulation of electrical components, particularly of lines and cable harnesses |
| 02/11/2003 | US6518769 Method and device for the electrical monitoring of an electrode lead of a bipolar high-voltage D.C. transmission system |
| 02/11/2003 | US6518768 Arrangement, method, and current measurement device for measuring a current in a conductor |
| 02/11/2003 | US6518766 Method of inspecting an electrical disconnection between circuits by calculating physical quantities thereof based on capacitances regarding the circuits measured twice |
| 02/11/2003 | US6518746 Integrated circuit device having a burn-in mode for which entry into and exit from can be controlled |
| 02/11/2003 | US6518745 Device test handler and method for operating the same |
| 02/11/2003 | US6518735 Method and apparatus for measuring pure resistance of in-vehicle battery |
| 02/11/2003 | US6518730 Power supply unit, battery electrical apparatus, and memory effect detection method |
| 02/11/2003 | US6518728 Secondary battery device and method of protecting an overdischarge of the same |
| 02/11/2003 | US6518606 Semiconductor device permitting electrical measurement of contact alignment error |
| 02/11/2003 | US6518592 Apparatus, method and pattern for evaluating semiconductor device characteristics |
| 02/11/2003 | US6518181 Conductive material for integrated circuit fabrication |
| 02/11/2003 | US6518074 Backside IC device preparation process |
| 02/11/2003 | US6517689 Plating device |
| 02/11/2003 | US6517666 Automatic decapsulation system utilizing an integrated spacer/protection plate |
| 02/11/2003 | US6517362 Spiral contactor, semiconductor device inspecting apparatus and electronic part using same, and method of manufacturing the same |
| 02/06/2003 | WO2003010550A2 Integrated testing of serializer/deserializer in fpga |
| 02/06/2003 | WO2003010549A1 Timing generator and semiconductor test apparatus |
| 02/06/2003 | WO2003010547A2 Programmable test socket |
| 02/06/2003 | WO2003010546A1 Capacitor insulation resistance measuring method and insulation resistance measuring instrument |
| 02/06/2003 | WO2002045277A9 A method and system for infrared detection of electrical short defects |
| 02/06/2003 | US20030028836 Inspection apparatus |
| 02/06/2003 | US20030028835 Semiconductor integrated circuit |
| 02/06/2003 | US20030028832 Driver for integrated circuit chip tester |
| 02/06/2003 | US20030028824 System for testing an integrated circuit |
| 02/06/2003 | US20030028352 Determining the failure rate of an integrated circuit |
| 02/06/2003 | US20030028343 Intelligent measurement modular semiconductor parametric test system |
| 02/06/2003 | US20030028342 Method for the defect analysis of memory modules |
| 02/06/2003 | US20030027479 Panel inspection apparatus |
| 02/06/2003 | US20030027438 Test/burn in socket assembly with improved resistance to thermally induced mechanical stress |
| 02/06/2003 | US20030027423 Contact structure and production method thereof and probe contact assembly using same |
| 02/06/2003 | US20030026499 Apparatus and method for monitoring a cable |
| 02/06/2003 | US20030026355 Adjustment circuit and method for tuning of a clock signal |
| 02/06/2003 | US20030026139 Semiconductor module including semiconductor memory device shiftable to test mode as well as semiconductor memory device used therein |
| 02/06/2003 | US20030026136 Semiconductor memory device and method for testing the same |
| 02/06/2003 | US20030026119 Semiconductor integrated circuit device having internal synchronizing circuit responsive to test mode signal |
| 02/06/2003 | US20030025907 Optical inspection of laser vias |
| 02/06/2003 | US20030025522 Method and a device for testing a power module |
| 02/06/2003 | US20030025521 Method and system for partial-scan testing of integrated ciruits |
| 02/06/2003 | US20030025520 Computer controlled curve tracer for extracting small and large signal parameters of semiconductor devices |
| 02/06/2003 | US20030025519 Inspection apparatus and method for test ambient and test mode circuit on integrated circuit chip |
| 02/06/2003 | US20030025518 On-circuit board continuity tester |
| 02/06/2003 | US20030025516 Testing vias and contacts in integrated circuit fabrication |
| 02/06/2003 | US20030025515 Built-in test system for aircraft indication switches |
| 02/06/2003 | US20030025511 Analog signal test circuit and method |
| 02/06/2003 | US20030025508 Apparatus and related methods for detecting insulation breakdown in insulated through-bolts in power generator |
| 02/06/2003 | US20030025507 Method and unit for computing voltage drop divided along factors for battery |
| 02/06/2003 | US20030025506 Degradation degree computing method and unit for battery |
| 02/06/2003 | US20030025495 Probing method |
| 02/06/2003 | US20030025494 Pressure-sensitive system and method of testing electronic device interconnections |
| 02/06/2003 | US20030025492 Circuit testers |
| 02/06/2003 | US20030025481 Energy management system for automotive vehicle |
| 02/06/2003 | US20030025479 Battery control system |
| 02/06/2003 | US20030025191 Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device |
| 02/06/2003 | US20030025172 Method of manufacturing a probe card |
| 02/06/2003 | DE20216650U1 High resolution magnetic field sensor is made on semiconductor chip |
| 02/06/2003 | DE10150930C1 Scan path for designing sequential circuits with duplicate storage cells integrated in the scan path with or without inversion uses dependent storage cells |
| 02/05/2003 | EP1282041A2 Built-in-self-test using embedded memory and processor in an application specific integrated circuit |
| 02/05/2003 | EP1281978A1 Method and device for testing a power module |
| 02/05/2003 | EP1131643B1 Method for correcting frequency- and length-dependent line attenuation for fdr-measurements carried out on high-frequency cables |