| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/20/2003 | US20030034790 Tablet with short testing function and method of measuring |
| 02/20/2003 | US20030034789 Probe holder for testing of a test device |
| 02/20/2003 | US20030034788 Refocusing wavelengths to a common focal plane for electrical trace testing |
| 02/20/2003 | US20030034784 Method for determining the transit time of electrical signals on printed circuit boards using automatic standard test equipment |
| 02/20/2003 | US20030034782 Electric connection-inspection device |
| 02/20/2003 | US20030034780 Method for calculating the parameters of the power battery of an electric motor vehicle |
| 02/20/2003 | US20030034779 Battery life estimation |
| 02/20/2003 | US20030034771 Low-leakage automatic test equipment active load |
| 02/20/2003 | US20030034558 Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structure |
| 02/20/2003 | US20030034549 Semiconductor integrated circuit device |
| 02/20/2003 | US20030034280 Semiconductor device loading apparatus for test handlers |
| 02/20/2003 | US20030033711 Carrier for a module integrated circuit handler |
| 02/20/2003 | DE20212840U1 Linear integrated circuit matching unit has antiparallel drive |
| 02/19/2003 | EP1284498A2 System and method to screen defect related reliability failures in CMOS SRAMS |
| 02/19/2003 | EP1212770B1 Control system for an electromagnetic switching device and electromagnetic switching device corresponding thereto |
| 02/19/2003 | EP0904549B1 Method for testing differential protection relays or differential protection relay systems |
| 02/19/2003 | EP0747833B1 Fault-tolerant multiprocessor system |
| 02/19/2003 | CN2537015Y Double color diode inspector |
| 02/19/2003 | CN2536455Y Multifunctional inspector for vehicle circuits |
| 02/19/2003 | CN1398448A Contact structure and prodn. method thereof and probe contact assembly using same |
| 02/19/2003 | CN1398373A Packet display, packet data creating device and method, and recorded medium |
| 02/19/2003 | CN1398352A Inspection appts. and method adapted to scanning technique employing rolling wire probe |
| 02/19/2003 | CN1398351A Adapter for testing printed circuit boards and testing needle for such adapter |
| 02/19/2003 | CN1397996A Method for testing state settings of chip set |
| 02/19/2003 | CN1397807A Method for positioning grounding failure region of feed line in low-current grounding system |
| 02/19/2003 | CN1397806A Large-size magnetic core sensor and anti-interference method for discriminating directional coupling pulse |
| 02/19/2003 | CN1397805A Contact member and its mfg. method |
| 02/19/2003 | CN1397804A Contact structure having contact block |
| 02/19/2003 | CN1102019C Electronic device and detecting method thereof and detector of such electronic device |
| 02/19/2003 | CN1101961C Semiconductor integrated circuit with multiple flip-flop |
| 02/19/2003 | CN1101938C Continuous scan recording method capable of monitoring plurality of batteries simultaneously |
| 02/18/2003 | US6523144 Intelligent binning for electrically repairable semiconductor chips and method |
| 02/18/2003 | US6523135 Built-in self-test circuit for a memory device |
| 02/18/2003 | US6523075 Method and system for controlling internal busses to prevent busses contention during internal scan testing by using a centralized control resource |
| 02/18/2003 | US6522989 System and method for timing analysis of an integrated circuit clocked by mixed clock types |
| 02/18/2003 | US6522986 Apparatus and method for testing processing circuit for joystick buttons |
| 02/18/2003 | US6522900 Method for displaying battery voltage in TDMA radio terminal |
| 02/18/2003 | US6522591 Semiconductor memory circuit |
| 02/18/2003 | US6522546 Universal support frame |
| 02/18/2003 | US6522361 Electronic apparatus having the function of displaying the battery residual quantity and method for displaying the battery residual quantity |
| 02/18/2003 | US6522162 Test system and associated interface module |
| 02/18/2003 | US6522161 Method and apparatus for properly disabling high current parts in a parallel test environment |
| 02/18/2003 | US6522160 Input buffer with automatic switching point adjustment circuitry, and synchronous DRAM device including same |
| 02/18/2003 | US6522159 Short-circuit failure analyzing method and apparatus |
| 02/18/2003 | US6522158 Non-contact mobile charge measurement with leakage band-bending and dipole correction |
| 02/18/2003 | US6522157 Mechanism for connecting test head to handler |
| 02/18/2003 | US6522156 Planar subassembly for testing IC chips having faces with pressed electrical contacts that carry all power and signals for the chips |
| 02/18/2003 | US6522154 Oxide tracking voltage reference |
| 02/18/2003 | US6522152 Method and apparatus for adaptive cancellation of responses in cabling |
| 02/18/2003 | US6522148 State of charge measuring apparatus for battery device |
| 02/18/2003 | US6522147 LED test switch and mounting assembly |
| 02/18/2003 | US6522127 Device for measuring a physical quantity associated with the rotation of a member |
| 02/18/2003 | US6522126 Semiconductor tester, and method of testing semiconductor using the same |
| 02/18/2003 | US6522125 Tray transfer arm, electronic component testing apparatus and tray transfer method |
| 02/18/2003 | US6522122 Jitter measuring device and method |
| 02/18/2003 | US6522104 Method and apparatus for measurement of charge in a battery |
| 02/18/2003 | US6522102 Multiple plateau battery charging method and system to charge to the second plateau |
| 02/18/2003 | US6521841 Test coupon in printed wiring board |
| 02/18/2003 | US6521479 Repackaging semiconductor IC devices for failure analysis |
| 02/18/2003 | US6521468 Lead formation, assembly strip test and singulation method |
| 02/18/2003 | US6521467 Characterizing semiconductor wafers with enhanced S parameter contour mapping |
| 02/18/2003 | US6520778 Microelectronic contact structures, and methods of making same |
| 02/18/2003 | CA2275799C Seimiconductor device evaluation apparatus |
| 02/13/2003 | WO2003013015A1 Loop diagnostic mode for adsl modems |
| 02/13/2003 | WO2003012857A1 Testing vias and contacts in integrated circuit fabrication |
| 02/13/2003 | WO2003012828A2 Systems and methods for measuring properties of conductive layers |
| 02/13/2003 | WO2003012468A1 Method and device for examining heat sources within a sample that comprises an electroconductive material |
| 02/13/2003 | WO2003012467A1 System and method for delay line testing |
| 02/13/2003 | WO2003012466A2 Method and error location in branched low voltage and medium voltage networks and evaluation circuit used thereof |
| 02/13/2003 | WO2003012464A1 System and method for waveform processing |
| 02/13/2003 | WO2003012286A1 Coil on plug inductive sampling method and apparatus |
| 02/13/2003 | WO2002096022A3 Dual mode service platform within network communication system |
| 02/13/2003 | WO2002063313A3 Method for scan testing of digital circuit, digital circuit and program product |
| 02/13/2003 | WO2002045124A3 Measurement device with remote adjustment of electron beam stigmation by using mosfet ohmic properties and isolation devices |
| 02/13/2003 | US20030033584 Programmable logic device with circuitry for observing programmable logic circuit signals and for preloading programmable logic circuits |
| 02/13/2003 | US20030033558 Tool for generating a re-generative functional test |
| 02/13/2003 | US20030033556 Test system formatters |
| 02/13/2003 | US20030033119 Pole transformer load monitoring system using wireless internet network |
| 02/13/2003 | US20030033101 Sequential unique marking |
| 02/13/2003 | US20030032326 IC socket |
| 02/13/2003 | US20030032308 Electrical connection system for vehicle |
| 02/13/2003 | US20030032291 Poly gate silicide inspection by back end etching and by enhanced gas etching |
| 02/13/2003 | US20030031284 Probability estimating apparatus and method for peak-to-peak clock skews |
| 02/13/2003 | US20030030464 Testing method for array substrate |
| 02/13/2003 | US20030030462 Tester for semiconductor device |
| 02/13/2003 | US20030030461 Method and apparatus for the testing of input/output drivers of a circuit |
| 02/13/2003 | US20030030460 Integrated circuit phase partitioned power distribution for stress power reduction |
| 02/13/2003 | US20030030459 Apparatus and methods for testing circuit boards |
| 02/13/2003 | US20030030456 Method of measuring contact alignment in a semiconductor device including an integrated circuit |
| 02/13/2003 | US20030030454 Probe plate assembly for a circuit board test fixture |
| 02/13/2003 | US20030030453 Timing calibration and timing calibration verification of electronic circuit testers |
| 02/13/2003 | US20030030448 Apparatus for the detection and early warning of electrical arcing fault |
| 02/13/2003 | US20030030447 Disconnection detection apparatus |
| 02/13/2003 | US20030030446 Method for providing compensation current and test device using the same |
| 02/13/2003 | US20030030442 Apparatus for detecting battery pack abnormality and method of detecting battery pack abnormality |
| 02/13/2003 | US20030030440 Circuit for detecting leakage in power supply |
| 02/13/2003 | US20030030430 Methods and apparatus for testing a semiconductor structure using improved temperature desoak techniques |
| 02/13/2003 | US20030030429 Method and apparatus for evaluating a set of electronic components |
| 02/13/2003 | US20030030427 Test apparatus for testing devices under test and method for transmitting a test signal |
| 02/13/2003 | US20030030414 Apparatus for and method of calculating output deterioration in secondary battery |