Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
02/2003
02/27/2003US20030038646 Method and apparatus for testing circuit
02/27/2003US20030038645 Electron beam test system and electron beam test method
02/27/2003US20030038640 Apparatus for detecting arcing and overcurrents in dc electrical systems subject to cyclic disturbances
02/27/2003US20030038639 Data processing systems having mismatched impedance components
02/27/2003US20030038637 Automotive vehicle electrical system diagnostic device
02/27/2003US20030038636 High efficiency electronic load
02/27/2003US20030038635 Coil on plug inductive sampling method
02/27/2003US20030038622 Probe station having multiple enclosures
02/27/2003US20030038619 Device and method for testing phase-locked loops
02/27/2003US20030038545 Electric energy source having safety control device
02/27/2003US20030038016 Tap switch for frequency response and partial discharge measurement
02/27/2003US20030037870 Electrical connector
02/27/2003US20030037615 Non-destructive evaluation of wire insulation and coatings
02/27/2003DE10041720C2 Einbrennschaltung Einbrennschaltung
02/27/2003CA2457691A1 Systems for wafer level burn-in of electronic devices
02/27/2003CA2457690A1 Providing photonic control over wafer borne semiconductor devices
02/27/2003CA2457685A1 Providing current control over wafer borne semiconductor devices using overlayer patterns
02/27/2003CA2457680A1 Methods of conducting wafer level burn-in of electronic devices
02/27/2003CA2457675A1 Providing current control over wafer borne semiconductor devices using trenches
02/26/2003EP1286389A2 Method and apparatus for testing semiconductor wafers
02/26/2003EP1286170A1 Scan flip-flop with bypass of the memory cell of the flipflop
02/26/2003EP1286169A2 Device and method for testing phase-locked loops
02/26/2003EP1286168A1 Member exchanger, method of controlling member exchanger, ic inspection method, ic handler, and ic inspector
02/26/2003EP1285443A1 Integrated circuit containing sram memory and method of testing same
02/26/2003EP1285395A1 Semi-physical modeling of hemt dc-to-high frequency electrothermal characteristics
02/26/2003EP1285394A1 EMBEDDING PARASITIC MODEL FOR Pi-FET LAYOUTS
02/26/2003EP1285393A1 S-parameter microscopy for semiconductor devices
02/26/2003EP1285392A1 Hybrid, non linear, large signal microwave/millimeter wave model
02/26/2003EP1285366A1 Semi-physical modeling of hemt high frequency noise equivalent circuit models
02/26/2003EP1285283A1 A relay test device
02/26/2003EP1285282A1 Method and device for detecting accidental arcs
02/26/2003CN2538088Y Full autoamtic charger with three colour LED indication
02/26/2003CN2537984Y Probe with interference
02/26/2003CN2537983Y Displayer for short circuit and earthing fault
02/26/2003CN1399724A Reconfigurable integrated circuit with integrated debugging facilities for use in emulation system
02/26/2003CN1399323A High temperature reliability measuring device and method for integrated semiconductor module
02/26/2003CN1399279A Memory equipment having page buffer storage with double-register and its use thereof
02/26/2003CN1399140A BGA tester on circuit board
02/26/2003CN1399139A Printed circuit board characteristic test set
02/26/2003CN1399138A RF automatic changing batch testing method
02/26/2003CN1399129A Measuring and sorting unit for very thin quartz chip
02/26/2003CN1102242C Inspection unit of connector inspection apparatus
02/26/2003CN1102239C Automatic handler and method of measuring devices using the same
02/25/2003US6526546 Method for locating faulty elements in an integrated circuit
02/25/2003US6526545 Method for generating wafer testing program
02/25/2003US6526536 Apparatus within an integrated circuit for preventing the integrated circuit from erroneously entering a test mode operation
02/25/2003US6526535 Synchronous data adaptor
02/25/2003US6526534 Communication element and communication apparatus using the same
02/25/2003US6526533 Semiconductor memory implementing internally generated commands
02/25/2003US6526372 Method and device for determining the dependence of a first measuring quantity on a second measuring quantity
02/25/2003US6526362 Network diagnostic meter
02/25/2003US6526361 Battery testing and classification
02/25/2003US6525978 Circuit configuration for evaluating the information content of a memory cell
02/25/2003US6525916 Electronic device with double-wire bonding, manufacturing method thereof, and method for checking intactness of bonding wires of this electronic device
02/25/2003US6525665 Electrical circuit tracing device
02/25/2003US6525654 Vehicle electrical circuit failure monitor
02/25/2003US6525555 Wafer-level burn-in and test
02/25/2003US6525554 Method and apparatus for measuring temperature parameters of an ISFET using hydrogenated amorphous silicon as a sensing film
02/25/2003US6525553 Ground pin concept for singulated ball grid array
02/25/2003US6525548 Check pattern for a semiconductor device
02/25/2003US6525544 Method for predicting lifetime of insulating film and method for reliability testing of semiconductor device
02/25/2003US6525527 Cooling system for a module IC handler
02/25/2003US6525526 Method and device for testing printed circuit boards
02/25/2003US6525484 Organic electroluminescent device
02/25/2003US6524873 Continuous movement scans of test structures on semiconductor integrated circuits
02/25/2003US6524732 Rechargeable battery with protective circuit
02/24/2003CA2399637A1 Apparatus for detecting arcing and overcurrents in dc electrical systems subject to cyclic disturbances
02/20/2003WO2003015276A2 Logic state transition sensor circuit
02/20/2003WO2003015154A1 Probe card carrier and method of carrying probe card
02/20/2003WO2003014756A1 Delay fault test circuitry and related method
02/20/2003WO2003014755A1 Device for measuring characteristics of probe cards and probing method
02/20/2003WO2003014754A1 Apparatus and methods for testing bare circuit boards
02/20/2003WO2003014753A2 Methods and apparatus for testing a semiconductor with temperature desoak
02/20/2003WO2003014752A1 Systems and methods for monitoring and storing performance and maintenance data related to an electrical component
02/20/2003WO2003014751A2 Method and apparatus for evaluating a set of electronic components
02/20/2003WO2003014750A2 Application-specific testing methods for programmable logic devices
02/20/2003WO2002101926A3 Integrated circuit and method for testing the integrated circuit
02/20/2003WO2002097460A3 Fuel cell voltage monitoring
02/20/2003WO2002025292B1 Manipulator for a test head with active compliance
02/20/2003WO2002005325A3 Chuck with heat exchanger and temperature control fluid
02/20/2003US20030037296 Method of acquiring scan chain reorder information, and computer product
02/20/2003US20030037277 Semiconductor device
02/20/2003US20030037193 Method and apparatus for controlling fans and power supplies to provide accelerated run-in testing
02/20/2003US20030036876 Network-based system for configuring a measurement system using configuration information generated based on a user specification
02/20/2003US20030036875 Network-based system for configuring a programmable hardware element in a measurement system using hardware configuration programs generated based on a user specification
02/20/2003US20030036874 Network-based system for configuring a measurement system using configuration information generated based on a user specification
02/20/2003US20030036872 Data acquisition instrument architecture with flexible data acquisition, processing and display
02/20/2003US20030036871 System and method for online specification of measurement hardware
02/20/2003US20030036869 Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection
02/20/2003US20030036862 Measuring skew using on-chip sampling
02/20/2003US20030036421 High/low number game
02/20/2003US20030036231 System and method to screen defect related reliability failures in CMOS SRAMS
02/20/2003US20030035376 Derivation of composite step-function response
02/20/2003US20030035333 Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same
02/20/2003US20030035328 Semiconductor memory device shiftable to test mode in module as well as semiconductor memory module using the same
02/20/2003US20030034925 Diagnostic device for an antenna
02/20/2003US20030034818 Logic state transition Sensor Circuit
02/20/2003US20030034795 Delayed flash clear scan flip-flop to be implemented in complex integrated circuit designs
02/20/2003US20030034793 Device and method for estimating the resistance of a stator winding for an AC induction motor
02/20/2003US20030034791 Apparatus and method for automatic determination of operating frequency with built-in self-test
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