Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2003
03/06/2003US20030042919 Circuit trimming of packaged IC chip
03/06/2003US20030042913 Method for measuring the electrical characteristics of a telecommunication cable
03/06/2003US20030042912 Hybrid conductor-board for multi-conductor routing
03/06/2003US20030042910 Method and circuit for electrical testing of isolation resistance of large capacitance network
03/06/2003US20030042909 Short-circuit detector
03/06/2003US20030042906 Relay circuit test extender
03/06/2003US20030042889 Optical testing device
03/06/2003US20030042888 Semiconductor integrated circuit allowing proper detection of pin contact failure
03/06/2003US20030042887 Apparatus and method for continuity testing of pogo pins in a probe
03/06/2003US20030042866 Battery control device
03/06/2003US20030042485 Semiconductor integrated circuit device capable of tuning of internal power supply voltages generated by a plurality of internal power generating circuits
03/06/2003US20030042439 Method and apparatus to measure statistical variation of electrical signal phase in integrated circuits using time-correlated photon counting
03/06/2003US20030042381 Semiconductor wafer positioning system and method
03/06/2003US20030041445 Measuring the impedance spectrum of the individual unit cells in a predetermined frequency region, fitting to an equivalent circuit model composed of parameters, calculating total resistances and combining like ones
03/06/2003DE20214492U1 Car battery functional test unit also tests cable and charger
03/06/2003DE10154200C1 Random number sequence generation method for simulation of noise using computer program product and computer program
03/06/2003DE10119463C2 Verfahren zur Herstellung einer Chalkogenid-Halbleiterschicht des Typs ABC¶2¶ mit optischer Prozesskontrolle A process for producing a chalcogenide semiconductor layer of the type ABC¶2¶ with optical process control
03/06/2003CA2458568A1 Tap switch for frequency response and partial discharge measurement
03/06/2003CA2456296A1 Biometric quality control process
03/05/2003EP1289096A2 Battery apparatus for controlling plural batteries and control method of plural batteries
03/05/2003EP1289094A1 Short-circuit detector
03/05/2003EP1289091A2 Apparatus for detecting arcing and overcurrents in DC electrical systems subject to cyclic disturbances
03/05/2003EP1288668A2 System and method for testing electronic device interconnections
03/05/2003EP1288667A2 Method of test sequence generation
03/05/2003EP1287370A2 Ate timing measurement unit and method
03/05/2003EP1287369A2 System and method for diagnosing fault conditions associated with powering an electrical load
03/05/2003EP1287368A2 Process for the electromagnetic modelling of electronic components and systems
03/05/2003EP1131645B1 A skew calibration means and method of skew calibration
03/05/2003EP0822497B1 Boundary scan cell
03/05/2003EP0772947B1 Antenna and feeder cable tester
03/05/2003EP0640919B1 Processor circuit with a test device
03/05/2003CN2539187Y Tester for automobile battery
03/05/2003CN2538491Y Clamp tool with network line testing function
03/05/2003CN2538419Y Liquid drop device for electric leakage tester
03/05/2003CN1400558A System processing time calculating method and device and calculation program recording medium
03/05/2003CN1400470A Checking device for display unit, driving signal supplay device and checking system for display unit
03/05/2003CN1102740C Monitoring apparatus and method for accurately determining residual capacity of battery
03/04/2003US6530054 Method and apparatus for test generation during circuit design
03/04/2003US6530053 Semiconductor device
03/04/2003US6530052 Method and apparatus for looping back a current state to resume a memory built-in self-test
03/04/2003US6530050 Initializing and saving peripheral device configuration states of a microcontroller using a utility program
03/04/2003US6530049 On-line fault tolerant operation via incremental reconfiguration of field programmable gate arrays
03/04/2003US6530048 I2C test single chip
03/04/2003US6530047 System and method for communicating with an integrated circuit
03/04/2003US6530046 Circuit, semiconductor device and method for enhancing test efficiency of function modules
03/04/2003US6530045 Apparatus and method for testing rambus DRAMs
03/04/2003US6529961 Network transceiver having media independent interface operable in a general purpose serial interface mode
03/04/2003US6529840 Device for estimating the state of charge of a battery
03/04/2003US6529808 Method and system for analyzing an on-board vehicle computer system
03/04/2003US6529793 Method of sorting a group of integrated circuit devices for those devices requiring special testing
03/04/2003US6529480 Self-test for 10/100 Mbit ethernet physical layer devices
03/04/2003US6529438 Semiconductor memory device implemented with a test circuit
03/04/2003US6529135 Integrated electric motor monitor
03/04/2003US6529033 Area efficient clock inverting circuit for design for testability
03/04/2003US6529030 IC testing apparatus
03/04/2003US6529029 Magnetic resonance imaging of semiconductor devices
03/04/2003US6529020 Methods and systems for automated emissions measuring
03/04/2003US6529019 Multiple axis magnetic test for open integrated circuit pins
03/04/2003US6529018 Method for monitoring defects in polysilicon gates in semiconductor devices responsive to illumination by incident light
03/04/2003US6529012 Arrangement for determining the complex transmission function of a measuring device
03/04/2003US6529011 Method and apparatus for inspecting electronic components
03/04/2003US6529010 Location of fault on series-compensated power transmission lines
03/04/2003US6528985 Non-destructive testing of passive components
03/04/2003US6528971 Indicating method of battery life and electronic device
03/04/2003US6528818 Test structures and methods for inspection of semiconductor integrated circuits
03/04/2003US6528817 Semiconductor device and method for testing semiconductor device
03/04/2003US6528336 Method for fabrication of a silicon photosensor array on a wafer and testing the same
03/04/2003US6528330 Semiconductor device manufacturing method
03/04/2003US6528108 A reactant gas is introduced into a process chamber under a temperature which is lower than reactive temperature of the reactant gas so that voids in a porous amorphous insulation film on a sample is filled with the introduced reactant gas.
03/04/2003US6526841 Environmental test chamber and a carrier for use therein
02/2003
02/28/2003CA2400697A1 Short circuit detector
02/27/2003WO2003017460A1 Device and method for monitoring the connection of an electrical supply unit
02/27/2003WO2003017353A2 Providing photonic control over wafer borne semiconductor devices
02/27/2003WO2003017352A2 Providing current control over wafer borne semiconductor devices using overlayer patterns
02/27/2003WO2003017335A2 Systems for wafer level burn-in of electronic devices
02/27/2003WO2003017326A2 Methods of conducting wafer level burn-in of electronic devices
02/27/2003WO2003017325A2 Providing current control over wafer borne semiconductor devices using trenches
02/27/2003WO2003017090A2 Network-based system for configuring a measurement system using programs generated based on a user specification
02/27/2003WO2003016932A1 Built-in test system for aircraft indication switches
02/27/2003WO2003016931A1 Circuit testing with ring-connected test instrument modules
02/27/2003WO2003016929A2 Pin electronics interface circuit
02/27/2003WO2003016928A1 Method and device for determining sideband ratio of superconduction mixer using comb generator
02/27/2003WO2003016922A2 Electronic circuit and method for testing
02/27/2003WO2003016850A2 System and method for locating a fault on ungrounded and high-impedance grounded power systems
02/27/2003WO2003003036A3 Circuit and method for detecting transient voltages on a dc power supply rail
02/27/2003WO2003001331A3 Environmental monitoring system
02/27/2003WO2002101403A3 Low noise microwave synthesizer employing high frequency combs for tuning drift cancel loop
02/27/2003WO2002065146A3 APPARATUS AND METHOD FOR DRIVING CIRCUIT PINS IN A CIRCUIT testing system
02/27/2003WO2002063766A3 Method and apparatus for detecting valid signal information
02/27/2003WO2002063318A3 System and method for sampling timing error reduction
02/27/2003WO2002050927A3 Battery capacity calibration
02/27/2003US20030041296 Method for testing a testable electronic device
02/27/2003US20030040874 Test apparatus
02/27/2003US20030040873 Systems and methods for monitoring and storing performance and maintenace data related to an electrical component
02/27/2003US20030038723 Electrical circuit tracing device
02/27/2003US20030038673 Semiconductor device
02/27/2003US20030038652 Motor component test arrangement including multiple test stations
02/27/2003US20030038650 Method and apparatus for reduced pin count package connection verification
02/27/2003US20030038649 Post-package trimming of analog integrated circuits
02/27/2003US20030038647 Probe card for probing wafers with raised contact elements
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