Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2003
03/13/2003US20030048109 Test pin unit
03/13/2003US20030048108 Structural design and processes to control probe position accuracy in a wafer test probe assembly
03/13/2003US20030048106 Modular electronic battery tester
03/13/2003US20030048091 Cell voltage detector for fuel cell
03/13/2003US20030047731 Semiconductor device and test device for same
03/13/2003US20030047369 Moving apparatus with drive force assist mechanism and movement control method
03/13/2003US20030047305 Apparatus, method and system of liquid-based, wide range, fast response temperature control of electric devices
03/13/2003DE19880767C1 On-board or off-board diagnosis device for motor vehicle
03/12/2003EP1292045A2 Analyzer sensor
03/12/2003EP1291882A2 Memory chip and logic chip in same package
03/12/2003EP1291663A1 System and method for motor fault detection based on space vector angular fluctuation
03/12/2003EP1291662A2 Debugging system for semiconductor integrated circuit
03/12/2003EP1291661A1 Control method and device for electric functions on-board of vehicles
03/12/2003EP1290726A1 Semiconductor device inspection system
03/12/2003EP1290718A1 Process perturbation to measured-modeled method for semiconductor device technology modeling
03/12/2003EP1290520A2 System for regulating the temperature of ic-chips with a fluid whose temperature is controlled quickly by a slow response cooler and a fast response heater
03/12/2003EP1290460A2 Method and apparatus for testing source synchronous integrated circuits
03/12/2003EP1290459A2 Method and apparatus for maximizing test coverage
03/12/2003EP1290458A2 Method for measuring fault locations in high frequency cables and lines
03/12/2003EP1290456A1 Method for detecting resistive faults
03/12/2003EP1290455A2 Apparatus and method for producing an ion channel microprobe
03/12/2003EP1290453A2 Measurement method and device, in particular for the high-frequency measurement of electric components
03/12/2003EP1289818A1 Method for diagnosing switch points and a switch point diagnostic device
03/12/2003EP1116042B1 Circuit configuration with a scan path that can be deactivated
03/12/2003EP1066565B1 Integrated circuit architecture having an array of test cells providing full controllability for automatic circuit verification
03/12/2003EP0757315B1 Fail-fast, fail-functional, fault-tolerant multiprocessor system
03/12/2003CN1402907A Integrated circuti comprising at least two clock systems
03/12/2003CN1402835A Apparatus and method for programmable parametric toggle testing of digital CMOS pads
03/12/2003CN1402405A Pole transformer load monitoring system using wireless internet
03/12/2003CN1402375A Method and device for automatic equilization of charge-and-dischage based on cell dynamic electricity different compensation
03/12/2003CN1402323A Embedded internal storage test platform device and testing method
03/12/2003CN1402053A Pressurizing device for liquid crystal display and laser correction method with pressurizing process
03/12/2003CN1402015A Method and device for diagnosis of insulation ageing of electric machine based on small wave conversion
03/12/2003CN1402014A Ultrasonic reflection detecting device and mehtod for diagnosis of insulation state of stator for large electric generator
03/12/2003CN1402013A Method for pure electrical measuring no-load potential phasor of synchronous electric generator
03/11/2003US6532573 LSI verification method, LSI verification apparatus, and recording medium
03/11/2003US6532571 Method to improve a testability analysis of a hierarchical design
03/11/2003US6532570 Designing integrated circuits to reduce temperature induced electromigration effects
03/11/2003US6532561 Event based semiconductor test system
03/11/2003US6532560 Internal clock generating circuitry having testing function
03/11/2003US6532559 Method and apparatus for testing a circuit
03/11/2003US6532557 Method and apparatus for improving fault test coverage for an integrated circuit
03/11/2003US6532440 Multiple error and fault diagnosis based on Xlists
03/11/2003US6532438 Method and system for improving a transistor model
03/11/2003US6532431 Ratio testing
03/11/2003US6532425 Remote battery plant monitoring system
03/11/2003US6532215 Device and method for network communications and diagnostics
03/11/2003US6532184 Precharge control signal generator, and semiconductor memory device using the same
03/11/2003US6532183 Semiconductor device capable of adjusting internal potential
03/11/2003US6531972 Apparatus and method including an efficient data transfer for analog to digital converter testing
03/11/2003US6531885 Method and apparatus for testing supply connections
03/11/2003US6531880 Non-invasive cable tester
03/11/2003US6531876 Apparatus for voltage measurement
03/11/2003US6531875 Vehicle battery's open circuit voltage estimating method and a system therefor
03/11/2003US6531874 Method and device for determining the charge status of a battery
03/11/2003US6531865 Method of and apparatus for testing an integrated circuit package
03/11/2003US6531858 Ion sensitive field effect transistor
03/11/2003US6531789 Electric energy source having safety control device
03/11/2003US6531769 Semiconductor integrated circuit package, semiconductor apparatus provided with a plurality of semiconductor integrated circuit packages, method of inspecting semiconductor integrated circuit package and method of fabricating semiconductor integrated circuit
03/11/2003US6531345 Method and apparatus for fabricating electronic device
03/11/2003US6531327 Method for manufacturing semiconductor device utilizing semiconductor testing equipment
03/11/2003CA2081402C Display of electronic self-test results using gauge dial pointers
03/06/2003WO2003019762A1 High efficiency electronic load
03/06/2003WO2003019504A1 Inspecting method, semiconductor device, and display
03/06/2003WO2003019456A1 Predicting chip yields through critical area matching
03/06/2003WO2003019213A1 Semiconductor test instrument
03/06/2003WO2003019212A1 Insert and electronic component handler comprising it
03/06/2003WO2003019211A1 Tap switch for frequency response and partial discharge measurement
03/06/2003WO2003019210A1 Sensor for inspection instrument and inspection instrument
03/06/2003WO2003019209A1 Circuit wiring inspetion instrument and circuit wiring inspecting method
03/06/2003WO2003019208A2 Check circuit
03/06/2003WO2003019184A1 Biometric quality control process
03/06/2003WO2003005050B1 Method and apparatus for optimized parallel testing and access of electronic circuits
03/06/2003US20030046643 Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same
03/06/2003US20030046625 Method and apparatus for efficient control of multiple tap controllers
03/06/2003US20030046624 Structural input levels testing using on-die levels generators
03/06/2003US20030046623 Bandwidth matching for scan architectures in an integrated circuit
03/06/2003US20030046622 Integrated circuits carrying intellectual property cores and test ports
03/06/2003US20030046619 Access control device and testing method
03/06/2003US20030046015 Test circuit and semiconductor integrated circuit effectively carrying out verification of connection of nodes
03/06/2003US20030045148 Socket for electrical parts
03/06/2003US20030045136 IC pocket
03/06/2003US20030045013 Method and structure for temporarily isolating a die from a common conductor to facilitate wafer level testing
03/06/2003US20030045010 Method and structure for temporarily isolating a die from a common conductor to facilitate wafer level testing
03/06/2003US20030043801 Packet display, packet data creating device and method, and recorded medium
03/06/2003US20030043748 Data capture circuit with self-test capability
03/06/2003US20030043664 Test circuit device capable of identifying error in stored data at memory cell level and semiconductor integrated circuit device including the same
03/06/2003US20030043663 Semiconductor test circuit for testing a semiconductor memory device having a write mask function
03/06/2003US20030043651 Semiconductor storage device and setting method thereof
03/06/2003US20030043648 Semiconductor memory device capable of testing data line redundancy replacement circuit
03/06/2003US20030043612 Semiconductor device whereon memory chip and logic chip are mounted, making testing of memory chip possible
03/06/2003US20030043520 Control arrangement and method for power electronic system
03/06/2003US20030042933 Detection of errors in dynamic circuits
03/06/2003US20030042928 S-parameter microscopy for semiconductor devices
03/06/2003US20030042927 Method for testing circuit units to be tested with increased data compression for burn-in
03/06/2003US20030042926 Method for measuring NBTI degradation effects on integrated circuits
03/06/2003US20030042925 Signal measurement apparatus and method
03/06/2003US20030042924 Inspection terminal for inspecting electronic chip component, and inspection method and inspection apparatus using the same
03/06/2003US20030042923 Method and apparatus for resisting probe burn during testing of an electronic device
03/06/2003US20030042921 High resolution analytical probe station
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