Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2003
03/20/2003US20030052331 Analog-based mechanism for determining voltage
03/20/2003US20030052319 Fixture for multiple known good die processing
03/20/2003DE10159020C1 Power semiconductor circuit device incorporating function monitoring circuit within power semiconductor control circuit
03/19/2003EP1294017A2 Chip manufacturing method for cutting test pads from integrated circuits by sectioning circuit chips from circuit substrate
03/19/2003EP1293984A2 Synchronous semiconductor memory device
03/19/2003EP1293791A2 Semiconductor integrated circuit device and device for testing same
03/19/2003EP1293790A1 Scan test apparatus using oversampling for synchronisation
03/19/2003EP1293789A1 Method of testing and using an electric circuit and corresponding circuit units
03/19/2003EP1293788A2 Integrated semiconductor device
03/19/2003EP1293787A2 Testing system and method of non-invasive testing
03/19/2003EP1293786A2 Circuit for and method of testing continuity and indicating the state of a sensor
03/19/2003EP1293377A2 Battery control device
03/19/2003EP1292840A1 Method for demonstrating the dependence of a signal based on another signal
03/19/2003EP1292839A1 Tool for automatic testability analysis
03/19/2003EP1292838A2 Diagnosting reliability of vias by e-beam probing
03/19/2003EP1292834A2 Systems for testing integrated circuits during burn-in
03/19/2003EP1292429A1 Vacuum chuck with integrated electrical testing points
03/19/2003EP1125103A4 Vehicle diagnostics interface apparatus
03/19/2003EP1008124B1 An electrical insulation testing device and method for electrosurgical instruments
03/19/2003CN1404579A Device for monitoring and forecasting the probability of inductive proximity sensor failure
03/19/2003CN1404578A Circuit for detecting leakage in power supply
03/19/2003CN1404123A Semiconductor device and checkup apparatus thereof
03/19/2003CN1404122A Detection method of electric defect in inner conducting layer of tested area
03/19/2003CN1404121A Method for manufacturing a chip
03/19/2003CN1403830A Battery powering detection method and system
03/19/2003CN1403829A Auto asynchronous battery grading method
03/19/2003CN1403828A Measurer of high-speed memory bus
03/19/2003CN1403827A Digital board determining method and digital board capable of being determined in short-circuit
03/19/2003CN1403826A Method of detecting short circuit of inner layer in multilayer printed circuit board
03/19/2003CN1403824A Check terminal for testing electronic chip element, checking method and verifying attachment thereof
03/19/2003CN1103516C Radio communication equipment having selective functions of analog mode and digital mode
03/19/2003CN1103495C Testing apparatus for non-packaged semiconductor chip
03/19/2003CN1103453C Automatic handler for IC test system, test tray stepping mechanism and test tray transferring method thereof
03/19/2003CN1103451C High-voltage overhead line on-line failure distance finding method and instrument
03/18/2003US6536031 Method for generating behavior model description of circuit and apparatus for logic verification
03/18/2003US6536021 Method and system for representing hierarchical extracted resistance-capacitance files of a circuit model
03/18/2003US6536020 Efficient generation of optimum test data
03/18/2003US6536008 Fault insertion method, boundary scan cells, and integrated circuit for use therewith
03/18/2003US6536007 Models and technique for automated fault isolation of open defects in logic
03/18/2003US6536006 Event tester architecture for mixed signal testing
03/18/2003US6536005 High-speed failure capture apparatus and method for automatic test equipment
03/18/2003US6536003 Testable read-only memory for data memory redundant logic
03/18/2003US6535986 Optimizing performance of a clocked system by adjusting clock control settings and clock frequency
03/18/2003US6535831 Method for sourcing three level data from a two level tester pin faster than the maximum rate of a tester
03/18/2003US6535452 Semiconductor memory device having error correction function for data reading during refresh operation
03/18/2003US6535441 Static semiconductor memory device capable of accurately detecting failure in standby mode
03/18/2003US6535440 Apparatus and method for package level burn-in test in semiconductor device
03/18/2003US6535113 Electrical tell tale system for trailers
03/18/2003US6535049 Multipurpose test chip input/output circuit
03/18/2003US6535015 Device and method for testing performance of silicon structures
03/18/2003US6535014 Electrical parameter tester having decoupling means
03/18/2003US6535013 Parameter variation probing technique
03/18/2003US6535012 Universal wafer carrier for wafer level die burn-in
03/18/2003US6535011 Testing device and testing method for a semiconductor integrated circuit and storage medium having the testing program stored therein
03/18/2003US6535010 Checker head and a method of manufacturing the same
03/18/2003US6535009 Configuration for carrying out burn-in processing operations of semiconductor devices at wafer level
03/18/2003US6535008 Dual stage in-circuit test fixture for circuit board testing
03/18/2003US6535007 Component holder for testing devices and component holder system microlithography
03/18/2003US6535005 Systems and methods for obtaining an electrical characteristics of a circuit board assembly process
03/18/2003US6535004 Testing of BGA and other CSP packages using probing techniques
03/18/2003US6535003 Contact structure having silicon finger contactor
03/18/2003US6535002 IC socket, a test method using the same and an IC socket mounting mechanism
03/18/2003US6534999 Cable sensor
03/18/2003US6534997 Apparatus and a method for locating a fault of a transmission line
03/18/2003US6534993 Electronic battery tester
03/18/2003US6534992 Method for determining the performance of a storage battery
03/18/2003US6534991 Connection tester for an electronic trip unit
03/18/2003US6534968 Integrated circuit test vehicle
03/18/2003US6534954 Method and apparatus for a battery state of charge estimator
03/18/2003US6534853 Semiconductor wafer designed to avoid probed marks while testing
03/18/2003US6534847 Semiconductor device
03/18/2003US6534785 Reduced terminal testing system
03/18/2003US6534710 Packaging and interconnection of contact structure
03/18/2003CA2275781C Semiconductor device evaluation apparatus and semiconductor device evaluation program product
03/17/2003CA2403360A1 Fault identification due to demagnetization for a motor in an electric or partially electric motor vehicle
03/13/2003WO2003021824A1 Portable radio terminal testing instrument using a single self-complementary antenna
03/13/2003WO2003021604A2 Method and device for testing semiconductor memory devices
03/13/2003WO2003021282A2 Module, error-tolerant system and diagnostic method
03/13/2003WO2003021281A2 Semiconductor wafer positioning system and method
03/13/2003WO2003021280A1 Method and device for the diagnosis of an electric system in a motor vehicle electric system
03/13/2003WO2003021277A2 Method and apparatus for calibration and validation of high performance dut power supplies
03/13/2003WO2003020467A1 Optical testing device
03/13/2003WO2002103378A3 Method and apparatus for leak-testing an electroluminescent device
03/13/2003WO2002095897A3 Circuit for monitoring cells of a multi-cell battery during charge
03/13/2003WO2002091182A3 Facilitating comparisons between simulated and actual behavior of electronic devices
03/13/2003WO2002009156A8 Temperature-controlled thermal platform for automated testing
03/13/2003US20030051198 Electronic circuit and method for testing
03/13/2003US20030051192 Circuits and methods for debugging an embedded processor and systems using the same
03/13/2003US20030050771 Element for carrying out a program or test sequence
03/13/2003US20030050770 Method and apparatus to emulate IO interconnection
03/13/2003US20030049874 Test element group, method of manufacturing a test element group, method of testing a semiconductor device, and semiconductor device
03/13/2003US20030049873 Method of assembling and testing an electronics module
03/13/2003US20030049871 Chip manufacturing method for cutting test pads from integrated circuits by sectioning circuit chips from circuit substrate
03/13/2003US20030048751 Dual mode service platform within network communication system
03/13/2003US20030048747 Transmission device
03/13/2003US20030048691 Semiconductor memory device that operates in synchronization with a clock signal
03/13/2003US20030048142 Controllable and testable oscillator apparatus for an integrated circuit
03/13/2003US20030048112 Tester for semiconductor integrated circuits
03/13/2003US20030048111 Test Fixture Comprising Drilled and Etched Pin holes and Related Methods.
03/13/2003US20030048110 Wafer probe station having environment control enclosure
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