Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2003
03/26/2003EP1296152A1 Electronic circuit and method for measuring its characteristics
03/26/2003EP1296151A1 Collecting RF input and output and biasing signal data
03/26/2003EP1296149A1 Characterizing non-linear behavior
03/26/2003EP1296148A1 An apparatus for collecting signal measurement data at signal ports of an RF and microwave device-under-test
03/26/2003EP1296145A1 Conductive contact
03/26/2003EP1295142A2 Alternator testing method and system using timed application of load
03/26/2003EP1295141A2 Alternator testing method and system using ripple detection
03/26/2003EP1295139A2 System for calibrating timing of an integrated circuit wafer tester
03/26/2003EP1295138A2 Burn-in testing method and device with temperature control
03/26/2003EP1295137A1 Automated protection of ic devices from eos (electro over stress) damage due to an undesired dc transient
03/26/2003EP1295136A1 Detection of damage to the insulation of electric components
03/26/2003EP1295134A2 Method and apparatus for adjusting the phase of input/output circuitry
03/26/2003EP1214788B1 Integrated circuit comprising at least two clock systems
03/26/2003EP1181568B1 Analog test output switchably connected to pcmcia connector pin
03/26/2003EP1095285B1 Method and device for determining the dependence of a first measured quantity on a second measured quantity
03/26/2003EP1093645B1 Bus-operational sensor device and corresponding test method
03/26/2003EP0792519B1 Interconnection elements for microelectronic components
03/26/2003CN2541852Y Wafer testing tool
03/26/2003CN2541851Y Improved contact structure of semiconductor testing board
03/26/2003CN1405890A Nonvolatile semiconductor memory device and its imperfect repairing method
03/26/2003CN1405889A 同步型半导体存储装置 Synchronous type semiconductor memory device
03/26/2003CN1405879A Method for reducing expense of pin of non-scanning measurabl design
03/26/2003CN1405873A Electronic device measuring device and method
03/26/2003CN1405574A Circuit for detecting electricity quantity of accumulator by intensifying transient current
03/26/2003CN1405573A Testing method with increased testing density
03/26/2003CN1405571A Method and apparatus for detecting electric power assembly
03/25/2003US6539527 System and method of determining the noise sensitivity of an integrated circuit
03/25/2003US6539522 Method of developing re-usable software for efficient verification of system-on-chip integrated circuit designs
03/25/2003US6539520 Systems and methods for generating hardware description code
03/25/2003US6539511 Semiconductor integrated circuit devices with test circuit
03/25/2003US6539510 Interface board for receiving modular interface cards
03/25/2003US6539509 Clock skew insensitive scan chain reordering
03/25/2003US6539508 Methods and circuits for testing programmable logic
03/25/2003US6539507 Integrated circuit with alternately selectable state evaluation provisions
03/25/2003US6539505 Method of testing a semiconductor memory, and semiconductor memory with a test device
03/25/2003US6539503 Method and apparatus for testing error detection
03/25/2003US6539491 Method and apparatus for implementing IEEE 1149.1 compliant boundary scan
03/25/2003US6539341 Method and apparatus for log information management and reporting
03/25/2003US6539324 Semiconductor device and semiconductor device testing method
03/25/2003US6539287 Distribution control system capable of isolating fault section without using time limited sequential shift function
03/25/2003US6539106 Feature-based defect detection
03/25/2003US6538937 Nonvolatile semiconductor memory test circuit and method, nonvolatile semiconductor memory and method for fabricating nonvolatile semiconductor memory
03/25/2003US6538936 Semiconductor integrated circuit having test circuit
03/25/2003US6538935 Semiconductor memory device enabling reliable stress test after replacement with spare memory cell
03/25/2003US6538934 Semiconductor device
03/25/2003US6538469 Technique to test an integrated circuit using fewer pins
03/25/2003US6538463 Semiconductor die and retaining fixture
03/25/2003US6538462 Method for measuring stress induced leakage current and gate dielectric integrity using corona discharge
03/25/2003US6538461 System and method for testing integrated passive components in a printed circuit board
03/25/2003US6538460 Method and apparatus for enhancing a system board
03/25/2003US6538452 Device for testing coaxial connectors
03/25/2003US6538450 Method and device for locating an insulation fault in an electric cable
03/25/2003US6538449 Battery life estimation
03/25/2003US6538420 Automated run test system having built-in high voltage switching matrix for interconnection to a safety compliance testing instrument
03/25/2003US6538264 Semiconductor reliability test chip
03/25/2003US6538214 Method for manufacturing raised electrical contact pattern of controlled geometry
03/25/2003US6537832 Measuring apparatus and film formation method
03/25/2003US6537469 Discharge counter and a nonlinear resistance material for a discharge counter
03/25/2003US6537093 Socket for a semiconductor device
03/20/2003WO2003024007A1 System and method for information object routing in computer networks
03/20/2003WO2003023639A1 System and method for directing clients to optimal servers in computer networks
03/20/2003WO2003023616A2 Method for debugging reconfigurable architectures
03/20/2003WO2003023607A1 System and method for information object routing in computer networks
03/20/2003WO2003023430A1 Component testing device
03/20/2003WO2003023428A1 Test fixture glass etch
03/20/2003WO2003023427A2 Method of assembling and testing an electronics module
03/20/2003WO2003023426A1 Crossover fault classification for power lines with parallel circuits
03/20/2003WO2003023358A2 Methods and apparatus for testing electronic circuits
03/20/2003WO2002078239A3 Method and apparatus for transmission line analysis
03/20/2003WO2002046730A3 System and method for measuring the dielectric strength of a fluid
03/20/2003US20030056183 Scan test circuit, and semiconductor integrated circuit including the circuit
03/20/2003US20030056165 IC test cell with memory output connected to input multiplexer
03/20/2003US20030056164 Circuit scan output arrangement
03/20/2003US20030056163 Method of evaluating core based system-on-a-chip
03/20/2003US20030056124 Digital-based mechanism for determining voltage
03/20/2003US20030055613 Semi-physical modeling of HEMT DC-to high frequency electrothermal characteristics
03/20/2003US20030055593 Method for user variation of a measurement process
03/20/2003US20030055584 Demagnetization for a motor in an electric or partially electric motor vehicle
03/20/2003US20030054676 Burn-in test socket
03/20/2003US20030054675 Socket for removably mounting electronic packages
03/20/2003US20030054592 Method and apparatus for fabricating electronic device
03/20/2003US20030054577 Method for evaluating property of integrated circuit and method for designing the same
03/20/2003US20030054229 Electrical apparatus, computer system, intelligent battery, battery diagnosis method, batter-state display method, and program
03/20/2003US20030053362 Synchronous semiconductor memory device
03/20/2003US20030053056 Mark for visual inspection upon assembling a display
03/20/2003US20030052924 User interface with simultaneous display of menu tree levels
03/20/2003US20030052704 Dynamically switched voltage screen
03/20/2003US20030052701 SiC photodiode detectors for radiation detection applications
03/20/2003US20030052700 Extraction of interconnect parasitics
03/20/2003US20030052697 Multifunction circuit continuity and sensor tester
03/20/2003US20030052694 Identification of a distribution of transformers and fault location in primary underground loop systems
03/20/2003US20030052690 Method and arrangment for determination of the state of charge of a battery
03/20/2003US20030052689 Method for grouping unit cells using pattern matching technology of impedance spectrum
03/20/2003US20030052688 Battery voltage detection device
03/20/2003US20030052666 Circuit testers
03/20/2003US20030052663 Device for monitoring and forecasting the probability of inductive proximity sensor failure
03/20/2003US20030052648 Remote commander battery low voltage alert system
03/20/2003US20030052647 Operation method for secondary battery and secondary battery device
03/20/2003US20030052646 Battery control device
03/20/2003US20030052619 Organic electroluminescent device
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