Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
04/2003
04/01/2003US6543019 Method for built-in self test of an electronic circuit
04/01/2003US6543018 System and method to facilitate flexible control of bus drivers during scan test operations
04/01/2003US6543017 Semiconductor storage device
04/01/2003US6542948 Bus system and method of diagnosing subscribers interconnected via said bus-system
04/01/2003US6542844 Method and apparatus for tracing hardware states using dynamically reconfigurable test circuits
04/01/2003US6542630 Inspecting component placement relative to component pads
04/01/2003US6542431 Semiconductor memory device and method for selecting multiple word lines in a semiconductor memory device
04/01/2003US6542082 Remote and non-visual detection of illumination device operation
04/01/2003US6541994 Semiconductor device with a self-testing function and a method for testing the semiconductor device
04/01/2003US6541993 Transistor device testing employing virtual device fixturing
04/01/2003US6541992 Apparatus and method for continuity testing of pogo pins in a probe
04/01/2003US6541989 Testing device for semiconductor components and a method of using the device
04/01/2003US6541988 Circuit board test fixture with electrostatic discharge (ESD) protection
04/01/2003US6541987 Laser-excited detection of defective semiconductor device
04/01/2003US6541984 Method and system for measuring electromagnetic waves, and recording medium in which electromagnetic wave measurement control program is recorded
04/01/2003US6541983 Method for measuring fuse resistance in a fuse array
04/01/2003US6541981 Automation of transmission line pulse testing of electrostatic discharge devices
04/01/2003US6541980 Multiplex voltage measurement apparatus
04/01/2003US6541956 Carrier identification system, carrier identification method and storage media
04/01/2003US6541941 Controller controls a switch bank which can shunt a voltage source in parallel with one or more fuel cells in a stack; reducing catalyst poisoning
04/01/2003US6541791 Method and system for semiconductor die testing
04/01/2003US6541754 Method and apparatus for measuring photoelectric conversion characteristics of photoelectric conversion device
04/01/2003US6541289 Semiconductor-package measuring method, measuring socket, and semiconductor package
04/01/2003US6541286 Imaging of integrated circuit interconnects
04/01/2003US6541285 Method of estimating lifetime of semiconductor device, and method of reliability simulation
04/01/2003US6540537 IC socket with two point-contacts
04/01/2003US6540524 Contact structure and production method thereof
04/01/2003US6540065 Transferring apparatus for chips and method of use
04/01/2003CA2209817C Device for managing battery packs by monitoring and assessing the operating capacity of the battery modules in the pack
03/2003
03/27/2003WO2003025612A1 Electric component test system and electric component test method
03/27/2003WO2003025602A1 In-vehicle battery monitor and method
03/27/2003WO2003025600A1 Multilevel signal interface testing with binary test apparatus by emulation of multilevel signals
03/27/2003WO2003025599A1 Built-in self-testing of multilevel signal interfaces
03/27/2003WO2003025598A2 Intergrated circuit having a voltage sensor
03/27/2003WO2003025595A2 Electronic device
03/27/2003WO2003025594A1 Apparatus for measuring insulation resistance of motor
03/27/2003WO2003025589A1 Contact structure, method of manufacturing the structure, and contact assembly using the structure
03/27/2003WO2003025588A1 Contact structure, method of manufacturing the structure, and contact assembly using the structure
03/27/2003WO2003003033A3 Semiconductor programming and testing method and apparatus
03/27/2003WO2002096717A3 Method and device for determining the starting capability of a vehicle
03/27/2003WO2002095565A3 Measuring device with dialog control occurring via dialog windows and corresponding method
03/27/2003WO2002037130A3 Method for testing integrated circuits
03/27/2003US20030061581 Method of evaluating test cases in a simulation environment by harvesting
03/27/2003US20030061556 Semiconductor device and its design method
03/27/2003US20030061555 Semiconductor integrated circuit
03/27/2003US20030061182 Method and system to determine state-of-health of a fuel cell using an intelligent system
03/27/2003US20030061181 Method and system for determining state-of-health of a lead-acid defibrillator battery using an intelligent system
03/27/2003US20030061010 Multi-function data acquistion system and method
03/27/2003US20030060996 Semi-automated multi-site system tester
03/27/2003US20030060995 Test outputs using an idle bus
03/27/2003US20030060092 Systems and methods for measuring properties of conductive layers
03/27/2003US20030060064 Spiral contactor and manufacturing method for this apparatus, and a semiconductor inspecting equipment and electronical parts using this apparatus
03/27/2003US20030059967 Semiconductor device, test method for semiconductor device, and tester for semiconductor device
03/27/2003US20030059966 Non- contacting capacitive diagnostic device
03/27/2003US20030059965 Method for screening semiconductor devices for contact coplanarity
03/27/2003US20030059962 Method for testing semiconductor chips
03/27/2003US20030059103 Surface inspection of object using image processing
03/27/2003US20030059102 Device and method for investigating predetermined areas of printed circuit boards
03/27/2003US20030058797 Path provisioning for service level agreements in differentiated service networks
03/27/2003US20030058730 Semiconductor memory device and its testing method
03/27/2003US20030058719 Semiconductor memory device including clock-independent sense amplifier
03/27/2003US20030058717 Word-line deficiency detection method for semiconductor memory device
03/27/2003US20030058715 Nonvolatile semiconductor memory device and method for testing the same
03/27/2003US20030058604 Method and apparatus to emulate external IO interconnection
03/27/2003US20030058431 Time domain reflectometer with wideband dual balanced duplexer line coupling circuit
03/27/2003US20030058243 Delivery and display of measurement instrument data via a network
03/27/2003US20030058058 Apparatus for collecting signal measurement data at signal ports of an RF and microwave device-under-test, under different impedance load conditions
03/27/2003US20030057992 Method for the testing and commissioning of an electrical circuit unit as well as such circuit units
03/27/2003US20030057991 LSI diagnostic system and method of diagnosing LSI
03/27/2003US20030057990 Pin electronics interface circuit
03/27/2003US20030057989 Method of diagnosing discrete output stages via digital inputs
03/27/2003US20030057988 Semiconductor device inspecting method using conducting AFM
03/27/2003US20030057987 Integrated circuit having a current measuring unit
03/27/2003US20030057986 Integrated on-chip process, temperature, and voltage sensor module
03/27/2003US20030057984 Testing system for evaluating integrated circuits, a testing system, and a method for testing an integrated circuit
03/27/2003US20030057982 Detecting structure formed on a PCB to detect unavailability of the lines
03/27/2003US20030057979 Wafer probe station for low-current measurements
03/27/2003US20030057978 Substrate for a probe card having conductive layers for supplying power to IC devices
03/27/2003US20030057976 Probe card
03/27/2003US20030057975 Segmented contactor
03/27/2003US20030057972 Voltage testing and measurement
03/27/2003US20030057971 Inspection method using a charged particle beam and inspection device based thereon
03/27/2003US20030057967 Circuit for measuring changes in capacitor gap using a switched capacitor technique
03/27/2003US20030057966 Electromagnetic interference analysis method and apparatus
03/27/2003US20030057964 Method of and an apparatus for collecting RF input and output and biasing signal data of a device under test
03/27/2003US20030057963 Method of and an arrangement for characterizing non-linear behavior of RF and microwave devices in a near matched environment
03/27/2003US20030057961 Method and device for inspecting laminated iron cores of electrical machines for interlamination shorts
03/27/2003US20030057960 Conductivity testing method for a sub-harness and a sub-harness manufacturing apparatus
03/27/2003US20030057959 Smart AWA
03/27/2003US20030057957 Method for chemically etching photo-defined micro electrical contacts
03/27/2003US20030057956 Portable diagnostic device
03/27/2003US20030057955 Vehicle lamp inspection system
03/27/2003US20030057940 Testing apparatus including testing board having wirings connected to common point and method of testing semiconductor device by composing signals
03/27/2003US20030057936 Narrow band frequency detection circuit
03/27/2003US20030057918 Electric device with intelligent battery system therein
03/27/2003US20030057770 Battery sensor device
03/27/2003DE19830571C2 Integrierte Schaltung Integrated circuit
03/27/2003DE10200782C1 Testing circuit for plug-in cable connection between radio and audio amplifier uses evaluation of DC voltage received at radio end of cable connection from virtual earth point at amplifier end
03/26/2003EP1296154A2 Semiconductor integrated circuit
03/26/2003EP1296153A1 Electronic component
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