Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
04/2003
04/08/2003US6546512 Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit
04/08/2003US6546511 Apparatus and method for parallel testing of multiple functional blocks of an integrated circuit
04/08/2003US6546505 Processor condition sensing circuits, systems and methods
04/08/2003US6546503 Synchronous semiconductor memory device capable of reducing test cost and method of testing the same
04/08/2003US6545910 Non-volatile semiconductor memory device having word line defect check circuit
04/08/2003US6545510 Input buffer and method for voltage level detection
04/08/2003US6545508 Detection of clock signal period abnormalities
04/08/2003US6545499 Semiconductor manufacturing-and-inspection system, and semiconductor device
04/08/2003US6545494 Apparatus and method for controlling temperature in a wafer using integrated temperature sensitive diode
04/08/2003US6545493 High-speed probing apparatus
04/08/2003US6545491 Apparatus for detecting defects in semiconductor devices and methods of using the same
04/08/2003US6545490 Trench-filled probe point for a semiconductor device
04/08/2003US6545485 Ultrasonic pinpointer for power system sources of interference
04/08/2003US6545484 Board inspection apparatus and board inspection method
04/08/2003US6545480 Method for carrying out the electrical breakdown of a gaseous dielectric in a highly non-uniform field
04/08/2003US6545479 Portable tester for electronic circuit breaker
04/08/2003US6545460 Power source current measurement unit for semiconductor test system
04/08/2003US6545459 RF isolation test device accommodating multiple nest plates for testing different devices and providing variable testing options
04/08/2003US6545458 Low-temperature test equipment
04/08/2003US6545454 System and method for testing an integrated circuit device using FFT analysis based on a non-iterative FFT coherency analysis algorithm
04/08/2003US6545448 Detection of the end-of-life for a rechargeable battery
04/08/2003US6545363 Contactor having conductive particles in a hole as a contact electrode
04/08/2003US6545211 Solar cell module, building material with solar cell module, solar cell module framing structure, and solar power generation apparatus
04/08/2003US6544802 Wafer inspection system and method for selectively inspecting conductive pattern defects
04/08/2003US6544078 Battery clamp with integrated current sensor
04/08/2003US6544077 Battery-connecting plate, method of producing same and wire protector
04/08/2003CA2245549C Assembly and method for testing integrated circuit devices
04/03/2003WO2003028057A1 Smart awa
04/03/2003WO2003027697A2 Electronic component
04/03/2003WO2003027696A2 Electronic component and method for measuring its qualification
04/03/2003WO2003027695A1 Thermal head for maintaining a constant temperature of a dut
04/03/2003WO2003027693A1 Measurement control apparatus
04/03/2003WO2003027691A2 Method and device for localizing a line fault
04/03/2003WO2003027688A1 Tester and testing method
04/03/2003WO2003027687A1 Tester and testing method
04/03/2003WO2003027685A2 Method for transmitting messages between stations
04/03/2003WO2003027684A2 Method and device for monitoring a sensor unit
04/03/2003WO2003027683A2 Aircraft electrostatic discharge test system
04/03/2003WO2002080184A3 On-chip circuits for high speed memory testing with a slow memory tester
04/03/2003WO2002073220A3 Method and apparatus for retaining a spring probe
04/03/2003US20030066040 Built off self test (BOST) in the kerf
04/03/2003US20030066039 Design verification by symbolic simulation using a native hardware description language
04/03/2003US20030066006 ECC code mechanism to detect wire stuck-at faults
04/03/2003US20030066003 Functional random instruction testing (FRIT) method for complex devices such as microprocessors
04/03/2003US20030066002 Scan flip-flop and semiconductor integrated circuit device
04/03/2003US20030066001 Flip-flop and scan path circuit
04/03/2003US20030066000 Failure propagation path estimate system
04/03/2003US20030065996 Test circuit for semiconductor memory and semiconductor memory device
04/03/2003US20030065994 Semiconductor device with malfunction control circuit and controlling method thereof
04/03/2003US20030065991 Method of and system for constructing valid data for memory-based tests
04/03/2003US20030065990 Method and system for minimal -time bit-error-rate testing
04/03/2003US20030065988 Circuit and method for adjusting the clock skew in a communications system
04/03/2003US20030065932 Chip card circuit with monitored access to a test mode
04/03/2003US20030065500 Reloadable word recognizer for logic analyzer
04/03/2003US20030065461 Laplace transform impedance spectrometer and its measurement method
04/03/2003US20030063711 Loop diagnostic mode for ADSL modems
04/03/2003US20030063693 Time correlation of data acquisition samples from independent systems in a logic analyzer
04/03/2003US20030063566 Identifying and synchronizing permuted channels in a parallel channel bit error rate tester
04/03/2003US20030063509 Semiconductor memory device capable of imposing large stress on transistor
04/03/2003US20030063495 Semiconductor integrated circuit having latching means capable of scanning
04/03/2003US20030063008 Method and apparatus for detecting failure in solar cell module, and solar cell module
04/03/2003US20030062923 Method of using partially defective programmable logic devices
04/03/2003US20030062918 Burn-in apparatus having average voltage calculating circuit
04/03/2003US20030062917 Semiconductor inspection device
04/03/2003US20030062916 Method and apparatus for testing electronic devices
04/03/2003US20030062913 Testing a batch of electrical components
04/03/2003US20030062903 Voltage detection circuit for storage devices
04/03/2003US20030062888 Stackable semiconductor test system and method for operating same
04/03/2003US20030062884 Regenerative load apparatus and load test method
04/03/2003US20030062875 Method and device for judging the condition of secondary batteries and method for regenerating secondary batteries
04/03/2003US20030062632 Semiconductor device having embedded array
04/03/2003US20030062398 Method for manufacturing raised electrical contact pattern of controlled geometry
04/03/2003US20030062078 Photovoltaic module, photovoltaic module array, photovoltaic system, and method of detecting failure of photovoltaic module
04/03/2003US20030061701 Printed board inspecting apparatus
04/02/2003EP1298830A2 Identifying and synchronizing permuted channels in a parallel bit error rate tester
04/02/2003EP1298668A2 Semiconductor memory device including clock-independent sense amplifier
04/02/2003EP1298444A1 Procedure for determining state variables of an accumulator
04/02/2003EP1298443A2 Circuit and method for adjusting the clock skew in a communications system
04/02/2003EP1298050A1 Indicator of a motor-assisted bicycle
04/02/2003EP1297425A2 Method and device for optimising a test programme
04/02/2003EP1212628B1 Variable length pattern generator for chip tester system
04/02/2003EP1203434B1 Method and apparatus for detecting a failed thyristor
04/02/2003EP1141736B1 Pattern generator for a packet-based memory tester
04/02/2003EP1101287B1 Low charge injection mosfet switch
04/02/2003EP1076832B1 Integrated circuit with scan register chain
04/02/2003EP0950285B1 Timing signal generator
04/02/2003EP0746772B1 Reusable die carrier for burn-in and burn-in process
04/02/2003CN2543152Y Automatic detector for state of alarm sensor cable
04/02/2003CN2543072Y Wire breakage monitor
04/02/2003CN1408129A Battery and maintenance service system for power supply device
04/02/2003CN1408065A Vertical counter balanced test head manipulator
04/02/2003CN1407814A Image quality tester of electronic display device
04/02/2003CN1407612A 探测器装置 Detector device
04/02/2003CN1407560A Semiconductor device equiped with memory and logical chips for testing memory ships
04/02/2003CN1407345A Device for inspection electric arc and overcurrent in DC system interfered repeatedly
04/02/2003CN1104771C 电源装置 Power supply unit
04/02/2003CN1104768C Battery leasing system
04/02/2003CN1104647C Method for testing electronic devices attached to leadframe
04/01/2003US6543034 Multi-environment testing with a responder
04/01/2003US6543020 Test pattern compression for an integrated circuit test environment
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