| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/16/2003 | CN2545614Y Switching amplifier |
| 04/16/2003 | CN1411557A Electric arc monitoring systems |
| 04/16/2003 | CN1411071A Semiconductor storage and measuring method thereof |
| 04/16/2003 | CN1411065A 半导体集成电路 The semiconductor integrated circuit |
| 04/16/2003 | CN1411063A 半导体集成电路 The semiconductor integrated circuit |
| 04/16/2003 | CN1410779A Device for automatically calibrating displayed battery electric quantity of electronic equipment and its display method |
| 04/16/2003 | CN1410778A Joint connection state detecting circuit of integrated circuit |
| 04/16/2003 | CN1410317A Display for motor-assisted bicycle |
| 04/16/2003 | CN1106077C Universal input data sampling circuit and method thereof |
| 04/16/2003 | CN1105920C Passive-element testing circuit for printed circuit board |
| 04/15/2003 | US6550038 Semiconductor integrated circuitry |
| 04/15/2003 | US6550036 Pre-conditioner for measuring high-speed time intervals over a low-bandwidth path |
| 04/15/2003 | US6550033 Method and apparatus for exercising external memory with a memory built-in test |
| 04/15/2003 | US6550031 Transparently gathering a chips multiple internal states via scan path and a trigger |
| 04/15/2003 | US6550030 On-line testing of the programmable logic blocks in field programmable gate arrays |
| 04/15/2003 | US6550029 Testing system and methods with protocol pattern injection and external verification |
| 04/15/2003 | US6550026 High speed test system for a memory device |
| 04/15/2003 | US6550022 Hierarchical JTAG based checkstop architecture for computer systems |
| 04/15/2003 | US6549868 Semiconductor device test system and test method |
| 04/15/2003 | US6549863 Apparatus and method for generating map data |
| 04/15/2003 | US6549821 Stereolithographic method and apparatus for packaging electronic components and resulting structures |
| 04/15/2003 | US6549649 Apparatus and method for projecting an alignment image |
| 04/15/2003 | US6549573 Testing method and apparatus of glitch noise and storage medium |
| 04/15/2003 | US6549480 Semiconductor integrated circuit allowing internal voltage to be measured and controlled externally |
| 04/15/2003 | US6549478 Scan register circuit for scanning data for determining failure in a semiconductor device |
| 04/15/2003 | US6549063 Evaluation circuit for an anti-fuse |
| 04/15/2003 | US6549026 Apparatus and method for temperature control of IC device during test |
| 04/15/2003 | US6549025 System and method for thermal testing of circuit boards using thermal films |
| 04/15/2003 | US6549024 Method of interconnecting with a system board |
| 04/15/2003 | US6549022 Apparatus and method for analyzing functional failures in integrated circuits |
| 04/15/2003 | US6549019 Testing device for evaluating the immunity of an electronic device to electromagnetic noise |
| 04/15/2003 | US6549017 System and method for on-line impulse frequency response analysis |
| 04/15/2003 | US6549014 Battery monitoring method and apparatus |
| 04/15/2003 | US6549000 Semiconductor device testing apparatus having timing hold function |
| 04/15/2003 | US6548826 Apparatus for wafer-level burn-in and testing of integrated circuits |
| 04/15/2003 | US6548819 Infrared enhanced pulsed solar simulator |
| 04/15/2003 | US6548756 Packaging and interconnection of contact structure |
| 04/15/2003 | US6547837 IC socket |
| 04/15/2003 | US6547587 Connection interface system |
| 04/15/2003 | US6547571 Low cost, high performance flexible tester handler docking interface |
| 04/10/2003 | WO2003030604A1 Socket and contact of semiconductor package |
| 04/10/2003 | WO2003030214A2 Method of manufacturing an integrated circuit, integrated circuit obtained in accordance with said method, wafer provided with an integrated circuit obtained in accordance with the method, and system comprising an integrated circuit obtained by means of the method |
| 04/10/2003 | WO2003029833A2 Stackable semiconductor test system and method for operating same |
| 04/10/2003 | WO2003029832A1 Multi-test circuit breaker locator |
| 04/10/2003 | WO2002099445A3 Integrated digital circuit and method for verifying a signal from an integrated digital circuit on an error |
| 04/10/2003 | WO2002084729A3 Method for producing a chalcogenide-semiconductor layer of the abc2 type with optical process monitoring |
| 04/10/2003 | US20030070128 Scan path circuit for test of logic circuit |
| 04/10/2003 | US20030070127 Method and apparatus for facilitating random pattern testing of logic structures |
| 04/10/2003 | US20030070126 Built-in self-testing of multilevel signal interfaces |
| 04/10/2003 | US20030070125 Testable up down counter for use in a logic analyzer |
| 04/10/2003 | US20030070124 Serial communication apparatus having software function to correct error |
| 04/10/2003 | US20030070121 Semiconductor test apparatus and method |
| 04/10/2003 | US20030070118 Semiconductor integrated circuit with built-in test function |
| 04/10/2003 | US20030070116 Programmatic time-gap defect detection apparatus and method |
| 04/10/2003 | US20030069724 Method and system for debugging an electronic system using instrumentation circuitry and a logic analyzer |
| 04/10/2003 | US20030069704 Use-adaptive fuel gauging for battery powered electronic devices |
| 04/10/2003 | US20030069657 Portable protective air gap tool and method |
| 04/10/2003 | US20030068917 Ball grid array connector |
| 04/10/2003 | US20030068908 Electrical contact for improved wiping action |
| 04/10/2003 | US20030068000 System and method for connecting a host and a target |
| 04/10/2003 | US20030067815 Semiconductor integrated circuit device allowing accurate evaluation of access time of memory core contained therein and access time evaluating method |
| 04/10/2003 | US20030067723 Apparatus and method of detecting ground fault in power conversion system |
| 04/10/2003 | US20030067319 On-chip ADC test for image sensors |
| 04/10/2003 | US20030067318 Semiconductor integrated circuit |
| 04/10/2003 | US20030067315 Probe device |
| 04/10/2003 | US20030067314 Testing arrangement and testing method |
| 04/10/2003 | US20030067312 Voltage testing and measurement |
| 04/10/2003 | US20030067306 Apparatus for high voltage testing of insulated conductors and oscillator circuit for use with same |
| 04/10/2003 | US20030067305 Motor terminal fixture |
| 04/10/2003 | US20030067303 Method for monitoring the ground potential of a rectifier drive |
| 04/10/2003 | US20030067298 Eddy current loss measuring sensor, thickness measuring system, thickness measuring method, and recorded medium |
| 04/10/2003 | US20030067296 Method for evaluating contact pin integrity of electronic components having multiple contact pins |
| 04/10/2003 | US20030067282 Method and unit for computing charging efficiency and charged electrical quantity of battery |
| 04/10/2003 | US20030067281 Electric circuits; calibration |
| 04/10/2003 | US20030067016 Semiconductor device and method for testing semiconductor device |
| 04/10/2003 | US20030067002 Wafer with additional circuit parts in the kerf area for testing integrated circuits on the wafer |
| 04/10/2003 | DE10139636C1 Electrical resistance measuring device for detonator for passenger restraint gas generator uses spring-loaded contacts for measuring short-circuit, detonator and insulation resistances |
| 04/09/2003 | EP1300920A1 Device and method for electrical battery type recognition |
| 04/09/2003 | EP1300685A2 Chemically etched microcontact |
| 04/09/2003 | EP1299826A1 Circuit component interface |
| 04/09/2003 | EP1299739A2 System and method for testing integrated circuits |
| 04/09/2003 | EP1299737A2 Circuit test light |
| 04/09/2003 | EP1299734A2 Load board feeder |
| 04/09/2003 | EP1190420B1 Method and apparatus for testing an impedance-controlled input/output (i/o) buffer in a highly efficient manner |
| 04/09/2003 | EP1149295B1 Control device for controlling applications which are crucial to safety |
| 04/09/2003 | EP0749069B1 Synchronized data transmission between elements of a processing system |
| 04/09/2003 | CN2544289Y Flashover indicator for isolator of high-voltage power line |
| 04/09/2003 | CN1409885A Household electric user having electronic contorl, and contorl and programming system thereof |
| 04/09/2003 | CN1409816A Inspection method utilizing vertical slice image |
| 04/09/2003 | CN1409448A Bead lattice array connector |
| 04/09/2003 | CN1409384A Synchronous test method and circuit of interal memory segments |
| 04/09/2003 | CN1409323A Method and device for detecting information of memory |
| 04/09/2003 | CN1409283A Mark for visual detection and electronic instrument |
| 04/09/2003 | CN1409123A Detection method and its detection structure for array electronic contact reliability |
| 04/09/2003 | CN1409122A Fault arc current detection circuit |
| 04/08/2003 | US6546530 Linear delay element providing linear delay steps |
| 04/08/2003 | US6546525 LSI testing apparatus |
| 04/08/2003 | US6546524 Component-based method and apparatus for structured use of a plurality of software tools |
| 04/08/2003 | US6546514 Integrated circuit analysis and design involving defective circuit element replacement on a netlist |
| 04/08/2003 | US6546513 Data processing device test apparatus and method therefor |