| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/23/2003 | CN1106648C Semiconductor integrated circuit having test circuit |
| 04/23/2003 | CN1106578C Method of monitoring electrical wear on selector switch disconnectors in high voltage station |
| 04/23/2003 | CN1106576C Top load socket for ball grid array devices |
| 04/23/2003 | CN1106575C Multilayer moisture barrier for electrochemical cell tester |
| 04/23/2003 | CA2409375A1 Method for determining poor performing cells |
| 04/22/2003 | US6553547 Method and system for generating charge sharing test vectors |
| 04/22/2003 | US6553546 Failure analyzing apparatus and failure analyzing method for semiconductor integrated circuit |
| 04/22/2003 | US6553531 Method and apparatus for random stimulus generation |
| 04/22/2003 | US6553530 Integrated circuit devices that include self-test apparatus for testing a plurality of functional blocks and methods of testing same |
| 04/22/2003 | US6553529 Low cost timing system for highly accurate multi-modal semiconductor testing |
| 04/22/2003 | US6553528 Test circuit for semiconductor integrated circuit |
| 04/22/2003 | US6553527 Programmable array built-in self test method and controller with programmable expect generator |
| 04/22/2003 | US6553526 Programmable array built-in self test method and system for arrays with imbedded logic |
| 04/22/2003 | US6553525 Method and apparatus for selectively enabling and disabling functions on a per array basis |
| 04/22/2003 | US6553524 Method for automating validation of integrated circuit test logic |
| 04/22/2003 | US6553523 System and method for verifying configuration of a programmable logic device |
| 04/22/2003 | US6553522 Valuation of tester accuracy |
| 04/22/2003 | US6553520 Integrated circuit devices with mode-selective external signal routing capabilities and methods of operation therefor |
| 04/22/2003 | US6553514 Digital circuit verification |
| 04/22/2003 | US6553329 System for mapping logical functional test data of logical integrated circuits to physical representation using pruned diagnostic list |
| 04/22/2003 | US6552561 Apparatus and method for controlling temperature in a device under test using integrated temperature sensitive diode |
| 04/22/2003 | US6552560 Wafer-level burn-in oven |
| 04/22/2003 | US6552559 IC tester adjusting unit |
| 04/22/2003 | US6552558 Testing fastenings of printed circuit board |
| 04/22/2003 | US6552556 Prober for electrical measurement of potentials in the interior of ultra-fine semiconductor devices, and method of measuring electrical characteristics with said prober |
| 04/22/2003 | US6552555 Integrated circuit testing apparatus |
| 04/22/2003 | US6552551 Method of producing load for delay time calculation and recording medium |
| 04/22/2003 | US6552529 Testing high temperature attachments prior to permanent joining of low temperature attachments |
| 04/22/2003 | US6552528 Modular interface between a device under test and a test head |
| 04/22/2003 | US6552527 Wafer map display apparatus and method for semiconductor test system |
| 04/22/2003 | US6552526 Method of increasing AC testing accuracy through linear interpolation |
| 04/22/2003 | US6552525 System and method for scheduling and monitoring electrical device usage |
| 04/22/2003 | US6552359 Drive circuit and method of testing the same |
| 04/22/2003 | US6552341 Installation and method for microscopic observation of a semiconductor electronic circuit |
| 04/22/2003 | US6551847 Inspection analyzing apparatus and semiconductor device |
| 04/22/2003 | US6551845 Method of temporarily securing a die to a burn-in carrier |
| 04/22/2003 | US6551844 Test assembly including a test die for testing a semiconductor product die |
| 04/22/2003 | US6551408 Removal deposits with air vibration |
| 04/22/2003 | US6551147 Battery terminal provided with a current sensor |
| 04/22/2003 | US6551122 Low profile pneumatically actuated docking module with power fault release |
| 04/22/2003 | US6550911 Testing dies on a semiconductor wafer in a sequential and overlapping manner |
| 04/22/2003 | CA2409439A1 Method, apparatus and article to test fuel cells |
| 04/17/2003 | WO2003032652A2 Method and apparatus for evaluating and optimizing a signaling system |
| 04/17/2003 | WO2003032286A2 Method and apparatus for luminance compensation for emissive displays |
| 04/17/2003 | WO2003032159A2 Error detection on programmable logic resources |
| 04/17/2003 | WO2003032000A1 Lsi inspection method and apparatus, and lsi tester |
| 04/17/2003 | WO2003031997A2 Remote-programming of pld modules via a boundary scan in the system |
| 04/17/2003 | WO2003031995A1 Coaxial tilt pin fixture for testing high frequency circuit boards |
| 04/17/2003 | WO2003031994A1 Socket and contact of semiconductor package |
| 04/17/2003 | WO2003031686A2 Cathodic protection remote monitoring method and apparatus |
| 04/17/2003 | WO2002080183A3 Memory cell structural test |
| 04/17/2003 | WO2002048727A3 Calibrating single ended channels for obtaining differential performance level |
| 04/17/2003 | WO2002031520A8 Stress-test information database structure and method of use |
| 04/17/2003 | US20030074623 Algorithmic test pattern generator |
| 04/17/2003 | US20030074622 CGROM testing device |
| 04/17/2003 | US20030074621 ASIC logic BIST employing registers seeded with differing primitive polynomials |
| 04/17/2003 | US20030074620 Configurable asic memory bist controller employing multiple state machines |
| 04/17/2003 | US20030074619 Memory bist employing a memory bist signature |
| 04/17/2003 | US20030074618 Dual mode ASIC BIST controller |
| 04/17/2003 | US20030074617 ASIC BIST employing stored indications of completion |
| 04/17/2003 | US20030074616 ASIC BIST controller employing multiple clock domains |
| 04/17/2003 | US20030074615 Weighted random pattern test using pre-stored weights |
| 04/17/2003 | US20030074614 Utilizing slow ASIC logic BIST to preserve timing integrity across timing domains |
| 04/17/2003 | US20030074613 Apparatus for testing semiconductor device |
| 04/17/2003 | US20030074335 Method and system for determining state-of-health of a nickel-metal hydride battery using an intelligent system |
| 04/17/2003 | US20030074178 Emulation system with time-multiplexed interconnect |
| 04/17/2003 | US20030074173 Technique for defining probabilistic reliability test requirements |
| 04/17/2003 | US20030074162 Cathodic protection remote monitoring method and apparatus |
| 04/17/2003 | US20030074153 Application specific event based semiconductor memory test system |
| 04/17/2003 | US20030074146 Crossover fault classification for power lines with parallel circuits |
| 04/17/2003 | US20030073355 Ic socket with two point-contacts |
| 04/17/2003 | US20030073256 Semiconductor device, method of manufacturing semiconductor device, and system for evaluating electrical characteristics of semiconductor device |
| 04/17/2003 | US20030072204 Semiconductor device |
| 04/17/2003 | US20030071821 Luminance compensation for emissive displays |
| 04/17/2003 | US20030071647 Method and arrangement for determining the high-frequency behavior of active circuit elements |
| 04/17/2003 | US20030071646 Inspection method of semiconductor device and inspection system |
| 04/17/2003 | US20030071645 Method of generating transistor AC scattering parameters simultaneously with DC characteristics using a single circuit simulation with a self-correction scheme for the artificial DC voltage dropped across the 50-Ohm resistor representing transmission line impedance |
| 04/17/2003 | US20030071644 Low-current probe card |
| 04/17/2003 | US20030071643 High-density PCB test jack |
| 04/17/2003 | US20030071641 Apparatus for measuring parasitic capacitances on an integrated circuit |
| 04/17/2003 | US20030071632 Method for determining location of a short by inferring labels from schematic connectivity |
| 04/17/2003 | US20030071631 A sample chuck for wafers |
| 04/17/2003 | US20030071630 Laminated core contact detection method and system |
| 04/17/2003 | US20030071628 Aircraft electrostatic discharge test system |
| 04/17/2003 | US20030071627 Programmable current exciter for measuring ac immittance of cells and batteries |
| 04/17/2003 | US20030071610 Method and apparatus for monitoring an electrical current consumming device |
| 04/17/2003 | US20030071606 Method and circuit for testing high frequency mixed signal circuits with low frequency signals |
| 04/17/2003 | US20030071599 Method of precisely estimating effective full-charge capacity of secondary battery |
| 04/17/2003 | US20030071361 Structure and method for charge sensitive electrical devices |
| 04/17/2003 | US20030071262 Apparatus and methods for semiconductor IC failure detection |
| 04/17/2003 | US20030071261 Apparatus and methods for semiconductor IC failure detection |
| 04/17/2003 | US20030071195 Sequential read-out method and system that employs a single amplifier for multiple columns |
| 04/17/2003 | DE10136703C1 Logikvorrichtung zum Testen einer integrierten Schaltung A logic device for testing an integrated circuit |
| 04/16/2003 | EP1303134A1 Sequential read-out method and system that employs a single amplifier for multiple columns |
| 04/16/2003 | EP1302777A2 Dual mode ASIC BIST Controller |
| 04/16/2003 | EP1302776A1 Automatic scan-based testing of complex integrated circuits |
| 04/16/2003 | EP1301838A2 Apparatus and method for controlling temperature in a wafer and a device under test using integrated temperature sensitive diode |
| 04/16/2003 | CN2545617Y Interchangeable test model |
| 04/16/2003 | CN2545616Y 简易式测试模 Simple style test mode |
| 04/16/2003 | CN2545615Y Full-electronic buzzer cable contrasting device |