| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/29/2003 | US6556934 Timing calibration method and semiconductor device testing apparatus having timing calibration function |
| 04/29/2003 | US6556900 Method and device in vehicle control system, and system for error diagnostics in vehicle |
| 04/29/2003 | US6556589 Network transceiver for steering network data to selected paths based on determined link speeds |
| 04/29/2003 | US6556485 Output buffer capable of adjusting current drivability and semiconductor integrated circuit device having the same |
| 04/29/2003 | US6556479 Nonvolatile semiconductor memory device |
| 04/29/2003 | US6556293 Optical inspection of laser vias |
| 04/29/2003 | US6556037 Semiconductor integrated circuit and test board |
| 04/29/2003 | US6556036 Semiconductor integrated circuit device |
| 04/29/2003 | US6556035 Test key layout for detecting via-open failure |
| 04/29/2003 | US6556034 High speed and high accuracy DUT power supply with active boost circuitry |
| 04/29/2003 | US6556032 Wafer-burn-in and test employing detachable cartridge |
| 04/29/2003 | US6556031 Verticle probe card for attachment within a central corridor of a magnetic field generator |
| 04/29/2003 | US6556030 Method of forming an electrical contact |
| 04/29/2003 | US6556029 Pulsed single contact optical beam induced current analysis of integrated circuits |
| 04/29/2003 | US6556021 Device frequency measurement system |
| 04/29/2003 | US6556020 Battery state of charge indicator |
| 04/29/2003 | US6556019 Electronic battery tester |
| 04/29/2003 | US6556018 Method of locating defective sockets in a light strand |
| 04/29/2003 | US6556004 Supporting framework for display panel or probe block |
| 04/29/2003 | US6555991 Battery operating condition dependent method and apparatus for controlling energy transfer between an energy bus and a system of batteries |
| 04/29/2003 | US6555853 Semiconductor device having embedded array |
| 04/29/2003 | US6554452 Machine-vision ring-reflector illumination system and method |
| 04/29/2003 | CA2399670A1 Method and apparatus for modeling and simulating the effects of bridge defects in integrated circuits |
| 04/24/2003 | WO2003034626A1 Device for automatically detecting harmful electromagnetic wave |
| 04/24/2003 | WO2003034587A1 Method and system for proportional plus integral loop compensation using a hybrid of switched capacitor and linear amplifiers |
| 04/24/2003 | WO2003034576A2 Method and system for charge pump active gate drive |
| 04/24/2003 | WO2003034492A2 Apparatus and methods for semiconductor ic failure detection |
| 04/24/2003 | WO2003034440A2 Configurable asic memory bist controller employing multiple state machines |
| 04/24/2003 | WO2003034439A2 Memory bist employing a memory bist signature |
| 04/24/2003 | WO2003034391A2 Method and system for adjusting the voltage of a precharge circuit |
| 04/24/2003 | WO2003034388A2 Circuit for predictive control of boost current in a passive matrix oled display and method therefor |
| 04/24/2003 | WO2003034387A2 Method and clamping apparatus for securing a minimum reference voltage in a video display boost regulator |
| 04/24/2003 | WO2003034386A2 Method and system for ramp control of precharge voltage |
| 04/24/2003 | WO2003034385A2 System and method for illumination timing compensation in response to row resistance |
| 04/24/2003 | WO2003034384A2 Method and system for precharging oled/pled displays with a precharge latency |
| 04/24/2003 | WO2003034383A2 Drive circuit for adaptive control of precharge current and method therefor |
| 04/24/2003 | WO2003034199A2 Interface architecture for embedded field programmable gate array cores |
| 04/24/2003 | WO2003034084A1 Electronic battery tester with relative test output |
| 04/24/2003 | WO2003034083A2 Automatic scan-based testing of complex integrated circuits |
| 04/24/2003 | WO2003034082A1 Application specific event based semiconductor memory test system |
| 04/24/2003 | WO2003034081A1 Method and device for detecting a short circuit on signalling lines of a sensor, in particular a knock sensor on an internal combustion engine |
| 04/24/2003 | WO2003034079A1 Signal transfer cable and the surveillance system therefor |
| 04/24/2003 | WO2003034078A1 Probe pin, probe card, test apparatus, and method of manufacturing probe pin |
| 04/24/2003 | WO2003033749A1 Matrix element precharge voltage adjusting apparatus and method |
| 04/24/2003 | WO2003023358A3 Methods and apparatus for testing electronic circuits |
| 04/24/2003 | WO2003012828A3 Systems and methods for measuring properties of conductive layers |
| 04/24/2003 | WO2003005623A3 Protection path resources allocating method and system |
| 04/24/2003 | US20030079189 Method for generating transition delay fault test patterns |
| 04/24/2003 | US20030079167 Combinational test pattern generation method and apparatus |
| 04/24/2003 | US20030079166 Electronic device |
| 04/24/2003 | US20030079165 Effective use of parallel scan for identically instantiated sequential blocks |
| 04/24/2003 | US20030079162 Test executive system with progress window |
| 04/24/2003 | US20030078752 System and method for testing a circuit implemented on a programmable logic device |
| 04/24/2003 | US20030078748 Graphical user interface for testing integrated circuits |
| 04/24/2003 | US20030078747 Electronic test system with test results view filter |
| 04/24/2003 | US20030078745 Directional element to determine faults on ungrounded power systems |
| 04/24/2003 | US20030078743 Battery test module |
| 04/24/2003 | US20030078679 Test executive system with tree structure for summarizing results |
| 04/24/2003 | US20030077486 Rechargeable battery equipped with battery protection circuit |
| 04/24/2003 | US20030076728 Semiconductor device having test mode |
| 04/24/2003 | US20030076724 Semiconductor memory device and test method therof |
| 04/24/2003 | US20030076418 Testing apparatus and encoder |
| 04/24/2003 | US20030076231 Method and apparatus for end of discharge indication based on critical energy requirement |
| 04/24/2003 | US20030076128 Semiconductor device test method |
| 04/24/2003 | US20030076126 Method for testing wafers to be tested and calibration apparatus |
| 04/24/2003 | US20030076125 Method and system for wafer and device level testing of an integrated circuit |
| 04/24/2003 | US20030076124 Modular interface between test and application equipment |
| 04/24/2003 | US20030076123 Socket apparatus and method for removably mounting an electronic package |
| 04/24/2003 | US20030076121 Peizoelectric microactuator and sensor failure detection in disk drives |
| 04/24/2003 | US20030076114 Test system for a gas turbine engine control programming plug |
| 04/24/2003 | US20030076110 Method, apparatus and article to test fuel cells |
| 04/24/2003 | US20030076109 State of charge method and apparatus |
| 04/24/2003 | US20030076108 Eletronic unit for identifying the charged state and/or the wear of a motor vehicle battery |
| 04/24/2003 | US20030076092 Electric and magnetic field detection device and electric and magnetic field measurement apparatus |
| 04/24/2003 | US20030076072 Battery pack |
| 04/24/2003 | US20030076068 Load angle determination for electrical motors |
| 04/24/2003 | US20030075741 Method of manufacturing an integrated circuit, integrated circuit obtained in accordance with said method, wafer provided with an integrated circuit obtained in accordance with the method, and system comprising an integrated circuit obtained by means of the method |
| 04/24/2003 | US20030075716 Semiconductor device with high speed switching of test modes |
| 04/24/2003 | DE10143595C1 Determining distance of single-pole earth connection on stub line involves measuring phase voltages, conductor currents, computing symmetrical components for different null impedances |
| 04/23/2003 | EP1304854A1 Method and system for providing multi-channel functionality with a telecommunication device comprising a single channel |
| 04/23/2003 | EP1304580A2 Method for calculating the fault point distance to a single-pole earth fault within an electric power network |
| 04/23/2003 | EP1304579A2 Apparatus for testing electrical conductors |
| 04/23/2003 | EP1303815A2 System initialization of microcode-based memory built-in self-test |
| 04/23/2003 | EP1303765A1 Electronic unit for identifying the charged state and/or the wear and tear of a motor vehicle battery |
| 04/23/2003 | EP1303764A2 Hierarchical design and test method and system, program product embodying the method and integrated circuit produced thereby |
| 04/23/2003 | EP1208568B1 A memory module test system with reduced driver output impedance |
| 04/23/2003 | EP1204876B1 Low cost timing system for highly accurate multi-modal semiconductor testing |
| 04/23/2003 | EP1153309B1 Method for the verification of the polarity, presence, alignment of components and short circuits on a printed circuit board |
| 04/23/2003 | EP1012611B1 Arcing fault detection system |
| 04/23/2003 | EP1007980B1 Printed circuit board testing device |
| 04/23/2003 | EP0859960B1 Device and method to monitor sensors in vehicles |
| 04/23/2003 | EP0768532B1 Acceleration sensor and method for producing the same, and shock detecting device using the same |
| 04/23/2003 | CN2546884Y Antitheft monitoring alarmer of power supply equipment and line fault |
| 04/23/2003 | CN2546883Y Mobile capacitor tester |
| 04/23/2003 | CN1413408A 非接触信号分析器 Non-contact signal analyzer |
| 04/23/2003 | CN1412908A Electronic equipment capable of automatically identifying types of cells |
| 04/23/2003 | CN1412829A Semiconductor testing device, testing and mfg. method for semiconductor device |
| 04/23/2003 | CN1412795A Method for deciding condensor good or not |
| 04/23/2003 | CN1412571A Method for precise estimated secondary battery significant fully discharge capacity |
| 04/23/2003 | CN1412570A CGROM detection device and method |