| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/02/2003 | EP1306742A2 A graphical interface |
| 05/02/2003 | EP1306686A2 Method for determining poor performing cells |
| 05/02/2003 | EP1306685A2 Method and apparatus for performing fully visible tracing of an emulation |
| 05/02/2003 | EP1306684A2 Method of test sequence generation |
| 05/02/2003 | EP1306683A2 Test system with progress window |
| 05/02/2003 | EP1306681A2 Method and system to determine the high frequency rate of active circuit elements |
| 05/02/2003 | EP1306680A1 Circuit for load current monitoring |
| 05/02/2003 | EP1306679A1 Method and apparatus for remotely testing semiconductors |
| 05/02/2003 | EP1306678A1 On-board microelectromechanical system (MEMS) sensing device for power semiconductor |
| 05/02/2003 | EP1306287A2 Electric power steering apparatus |
| 05/02/2003 | EP1305861A1 Circuit breaker remote service system |
| 05/02/2003 | EP1305647A2 Method and apparatus for testing high performance circuits |
| 05/02/2003 | EP1305646A1 Calibration method and device |
| 05/02/2003 | EP1181565A4 Device for electrically contacting a floating semiconductor wafer having an insulating film |
| 05/02/2003 | EP1070297B1 Method and apparatus for automatically testing the design of a simulated integrated circuit |
| 05/02/2003 | EP1023710A4 Detection of subsidence current in the determination of circuit breaker status in a power system |
| 05/02/2003 | EP1012615B1 System for storing and searching named device parameter data in a test system for testing an integrated circuit |
| 05/02/2003 | EP1010012A4 Apparatus for measuring minority carrier lifetimes in semiconductor materials |
| 05/02/2003 | EP1007986B1 Fault detection apparatus and method of detecting faults in an electrical distribution network |
| 05/02/2003 | EP0797099B1 Counter and a revolution stop detection apparatus using the counter |
| 05/02/2003 | EP0747821B1 Method for detecting divergence between a pair of duplexed, synchronized processor elements |
| 05/02/2003 | EP0747820B1 Method of synchronizing a pair of central processor units for duplex, lock-step operation |
| 05/02/2003 | EP0649576B1 Method and apparatus for monitoring battery capacity under fast discharge conditions |
| 05/01/2003 | WO2003036687A2 Non-contacting capacitive diagnostic device |
| 05/01/2003 | WO2003036582A1 Method and apparatus for end of discharge indication based on critical energy requirement |
| 05/01/2003 | WO2003036549A1 Apparatus and methods for managing reliability of semiconductor devices |
| 05/01/2003 | WO2003036315A1 Loop impedance meter |
| 05/01/2003 | WO2003036314A1 Timing generator, semiconductor testing device, and timing generating method |
| 05/01/2003 | WO2003036313A1 Clock/skew measurement apparatus and clock/skew measurement method |
| 05/01/2003 | WO2003036312A2 Determining electrical faults on undergrounded power systems using directional element |
| 05/01/2003 | WO2003036311A2 I/o test methodology |
| 05/01/2003 | WO2003036308A1 Apparatus and method for handling and testing of wafers |
| 05/01/2003 | WO2003036307A2 Testing circuits on substrates |
| 05/01/2003 | WO2003036306A2 Testing circuits on substrates |
| 05/01/2003 | WO2003036287A1 Method and device for controlling laminated steel sheet stacks of electrical machines in a view to detect steel sheet short-circuits |
| 05/01/2003 | WO2003036272A1 Refocusing wavelengths for electrical trace testing |
| 05/01/2003 | WO2003035541A2 Probe needle for testing semiconductor chips and method for producing said probe needle |
| 05/01/2003 | WO2003002957A3 Methods and systems for measuring display attributes of a fed |
| 05/01/2003 | WO2002089147A3 Circuit and method for memory test and repair |
| 05/01/2003 | WO2002052288A3 Weighted random pattern test using pre-stored weights |
| 05/01/2003 | WO2002042783A3 Vddq INTEGRATED CIRCUIT TESTING SYSTEM AND METHOD |
| 05/01/2003 | WO2002039801A3 Device for the targeted displacement of electronic components, using a pivoting mirror |
| 05/01/2003 | WO2002029824A3 System and method for testing integrated circuit devices |
| 05/01/2003 | US20030084413 Scan diagnosis system and method |
| 05/01/2003 | US20030084390 At-speed test using on-chip controller |
| 05/01/2003 | US20030084388 System and method for testing circuits and programming integrated circuit devices |
| 05/01/2003 | US20030084385 Method and apparatus for evaluating and optimizing a signaling system |
| 05/01/2003 | US20030083841 Method and apparatus for enabling extests to be performed in AC-coupled systems |
| 05/01/2003 | US20030083840 Apparatus and method for determining effect of on-chip noise on signal propagation |
| 05/01/2003 | US20030083839 RF fixture electronics for testing RF devices |
| 05/01/2003 | US20030083831 System and method for evaluating electromagnetic emanation vulnerabilities of computing systems |
| 05/01/2003 | US20030082936 Connection box, system, and method for evaluating a DUT board |
| 05/01/2003 | US20030082934 IC socket |
| 05/01/2003 | US20030082031 Wafer handling device and method for testing wafers |
| 05/01/2003 | US20030081480 Semiconductor memory device and its data writing method |
| 05/01/2003 | US20030081479 Semiconductor memory device |
| 05/01/2003 | US20030081477 Test array and method for testing memory arrays |
| 05/01/2003 | US20030081475 Circuit configuration fir evaluating the information content of a memory cell |
| 05/01/2003 | US20030080812 Circuit configuration for detecting a functional disturbance |
| 05/01/2003 | US20030080770 Method for universal wafer carrier for wafer level die burn-in |
| 05/01/2003 | US20030080769 I/O test methodology |
| 05/01/2003 | US20030080768 Test method of semiconductor device |
| 05/01/2003 | US20030080766 Integrated circuit having stress migration test structure and method therefor |
| 05/01/2003 | US20030080765 Probe station thermal chuck with shielding for capacitive current |
| 05/01/2003 | US20030080761 Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring |
| 05/01/2003 | US20030080759 Method and apparatus for optimizing the accuracy of an electronic circuit |
| 05/01/2003 | US20030080754 On-board microelectromechanical system (MEMS) sensing device for power semiconductors |
| 05/01/2003 | US20030080752 Method and apparatus for filtering unwanted noise while amplifying a desired signal |
| 05/01/2003 | US20030080750 Boundary-scan testing of opto-electronic devices |
| 05/01/2003 | US20030080746 Apparatus for detecting abnormality of relay |
| 05/01/2003 | US20030080726 Mechanical interface for rapid replacement of RF fixture components |
| 05/01/2003 | US20030080425 Compliant relief wafer level packaging |
| 05/01/2003 | US20030080335 Semiconductor device, and verification method for semiconductor testing apparatus and method using the semiconductor device |
| 05/01/2003 | US20030080334 Semiconductor device having test element and method of testing using same |
| 05/01/2003 | US20030080278 Testing circuit for charge detection circuit, LSI, image sensor, and testing method for the charge detection circuit |
| 05/01/2003 | US20030079934 Power steering apparatus |
| 04/30/2003 | DE10145021C1 Integrierte Schaltung mit einer Strommesseinheit und ein Verfahren zum Messen eines Stromes Integrated circuit comprising a current measuring unit and a method for measuring a current |
| 04/30/2003 | DE10016853C2 Verzögerungstakt-Erzeugungsvorrichtung Delay clock generating apparatus |
| 04/30/2003 | CN2548165Y Portable power source detector |
| 04/30/2003 | CN2548164Y Univeral loading clamp for printed circuit board |
| 04/30/2003 | CN1414823A Substrate detecting device |
| 04/30/2003 | CN1414619A Testing array and method for testing storage array |
| 04/30/2003 | CN1414394A Probe cladding device of probe measuring and testing card |
| 04/30/2003 | CN1107393C 剩余电池容量显示设备 The remaining battery capacity display device |
| 04/30/2003 | CN1107375C 半导体器件 Semiconductor devices |
| 04/30/2003 | CN1107232C Reusable chip carrier for pre-analog running and pre-analog running process |
| 04/30/2003 | CN1107231C Method and apparatus for automated docking of test head to device handler |
| 04/30/2003 | CA2360291A1 Method and program product for designing hierarchical circuit for quiescent current testing and circuit produced thereby |
| 04/29/2003 | US6557157 Method for designing complex digital and integrated circuits as well as a circuit structure |
| 04/29/2003 | US6557149 Algorithm for finding vectors to stimulate all paths and arcs through an LVS gate |
| 04/29/2003 | US6557148 Circuit analysis tool and recording medium having recorded program for making the circuit analysis tool function |
| 04/29/2003 | US6557147 Method and apparatus for evaluating a circuit |
| 04/29/2003 | US6557133 Scaling logic for event based test system |
| 04/29/2003 | US6557132 Method and system for determining common failure modes for integrated circuits |
| 04/29/2003 | US6557129 Method and apparatus for selectively compacting test responses |
| 04/29/2003 | US6557128 Semiconductor test system supporting multiple virtual logic testers |
| 04/29/2003 | US6557127 Method and apparatus for testing multi-port memories |
| 04/29/2003 | US6557117 Built-in self test for PLL module with on-chip loop filter |
| 04/29/2003 | US6557115 Real-time test controller |
| 04/29/2003 | US6556938 Systems and methods for facilitating automated test equipment functionality within integrated circuits |