Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
05/2003
05/08/2003US20030085729 Methods and apparatus for testing electronic circuits
05/08/2003US20030085728 Device for making pass/fail judgement of semiconductor integrated circuit
05/08/2003US20030085726 Preconditioning integrated circuit for integrated circuit testing
05/08/2003US20030085725 Integrated circuit having a test circuit, and method of decoupling a test circuit in an integrated circuit
05/08/2003US20030085724 Method and system for compensating thermally induced motion of probe cards
05/08/2003US20030085723 Method and system for compensating thermally induced motion of probe cards
05/08/2003US20030085722 Chip-mounted contact springs
05/08/2003US20030085721 Method and system for compensating thermally induced motion of probe cards
05/08/2003US20030085715 System and method for locating a fault on ungrounded and high-impedance grounded power systems
05/08/2003US20030085713 Apparatus and method for diagnostic interfacing with a power source
05/08/2003US20030085711 Electrical load disconnection detecting apparatus
05/08/2003US20030085710 Light degradation sensing led signal with visible fault mode
05/08/2003US20030085688 Method for determining the state of charge of rechargeable batteries by integration of the amounts of current flowing during charging and discharging
05/08/2003US20030085621 Power supply methods and configurations
05/08/2003US20030085463 Semiconductor package device for use with multiple integrated circuits in a stacked configuration and method fo formation and testing
05/08/2003US20030085461 Multi-chip module, semiconductor chip, and interchip connection test method for multi-chip module
05/08/2003US20030085160 Test handler
05/08/2003DE19536226C2 Testbare Schaltungsanordnung mit mehreren identischen Schaltungsblöcken Testable circuit with several identical circuit blocks
05/08/2003DE10154614C1 Integrierte Schaltung mit einer Testschaltung und Verfahren zum Entkoppeln einer Testschaltung An integrated circuit comprising a test circuit and method for isolating a test circuit
05/08/2003CA2465608A1 Electronic component with output buffer control
05/07/2003EP1309086A1 Digital clock detection
05/07/2003EP1308998A2 Wafer including an In-Containing-compound semiconductor surface layer, and method for profiling its carrier concentration
05/07/2003EP1308975A1 Apparatus for detecting abnormality of relay
05/07/2003EP1308965A2 Test array
05/07/2003EP1308740A1 Device for diagnosing the operability of a storage battery
05/07/2003EP1308739A2 Method and apparatus for detecting abnormality in a battery pack
05/07/2003EP1308738A2 Procedure for determining the state of charge of accumulators by integration of the current amounts flowing during charge and discharge
05/07/2003EP1308737A2 Electronic test system
05/07/2003EP1308736A2 Test circuit and semiconductor integrated circuit effectively carrying out verification of connection of nodes
05/07/2003EP1308735A1 Electronic component with output buffer control
05/07/2003EP1308734A2 Electric circuit
05/07/2003EP1308733A1 RF enclosure with a testing fixture
05/07/2003EP1307912A2 Automated determination and display of the physical location of a failed cell in an array of memory cells
05/07/2003EP1307755A2 Capturing and evaluating high speed data streams
05/07/2003EP1307754A2 Method and circuit for testing dc parameters of circuit input and output nodes
05/07/2003EP1307753A2 Method and device for identifying and localising high-ohm, single-pole earth faults
05/07/2003EP1307752A2 System, method, and apparatus for electromagnetic compatibility-driven product design
05/07/2003EP1307751A2 Test systems for wireless-communications devices
05/07/2003EP1141733B1 Test chamber
05/07/2003EP1039389B1 Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time
05/07/2003EP0926597B1 Method and apparatus for performing fully visible tracing of an emulation
05/07/2003EP0868667B1 High impedance test mode for jtag
05/07/2003EP0852353B1 Methods of analyzing logic circuit test points and apparatuses for analyzing logic circuit test points
05/07/2003CN2549589Y Brace and seat cover assembly
05/07/2003CN2549477Y DC system ground fault tester
05/07/2003CN2549476Y Power transmission circuit ground lead monitor
05/07/2003CN2549475Y Table of testing apparatus
05/07/2003CN2549474Y Universal test box
05/07/2003CN2549473Y Device for testing heating device on electric appliance production line
05/07/2003CN1416164A System, equipment and method for automatic testing IC complete device
05/07/2003CN1416163A System, equipment and method for automatic testing IC complete device
05/07/2003CN1416162A Control method for automatic testing IC complete device
05/07/2003CN1416133A 半导体存储器 Semiconductor memory
05/07/2003CN1415973A Bottery capacity control method and its device and capacity controller for battery of vehicle power
05/07/2003CN1415972A Circuit for testing voltage using four-wire method in security protection mode
05/07/2003CN1415971A Functional test method for measuring fault at single end of difference serial circuit
05/07/2003CN1107974C Equivalent circuit for simulating ferroelectric capacitance
05/07/2003CN1107958C Synchronous semiconductor storage device having circuit capable of reliably resetting detection means
05/07/2003CN1107875C Device for testing remained volume of electricity of cell
05/06/2003US6560764 Dynamic pulse width programming of programmable logic devices
05/06/2003US6560756 Method and apparatus for distributed test pattern decompression
05/06/2003US6560743 Cyclic redundancy checking of a field programmable gate array having a SRAM memory architecture
05/06/2003US6560740 Apparatus and method for programmable built-in self-test and self-repair of embedded memory
05/06/2003US6560739 Mechanism for enabling compliance with the IEEE standard 1149.1 for boundary-scan designs and tests
05/06/2003US6560738 Fault propagation path estimating method, fault propagation path estimating apparatus and recording media
05/06/2003US6560737 Method for adding scan controllability and observability to domino CMOS with low area and delay overhead
05/06/2003US6560736 Method for diagnosing bridging faults in integrated circuits
05/06/2003US6560735 Methods and apparatus for testing integrated circuits
05/06/2003US6560734 IC with addressable test port
05/06/2003US6560731 Method for checking the functioning of memory cells of an integrated semiconductor memory
05/06/2003US6560729 Automated determination and display of the physical location of a failed cell in an array of memory cells
05/06/2003US6560727 Bit error rate tester using fast parallel generation of linear recurring sequences
05/06/2003US6560663 Method and system for controlling internal busses to prevent bus contention during internal scan testing
05/06/2003US6560567 Method and apparatus for measuring on-wafer lumped capacitances in integrated circuits
05/06/2003US6560556 Non-invasive process for circuit defect isolation using thermal expansion property of thermodynamics
05/06/2003US6560554 Automatic testing
05/06/2003US6560552 Dynamically configurable process for diagnosing faults in rotating machines
05/06/2003US6560200 Serial bus experimental apparatus
05/06/2003US6560147 Semiconductor device having scan test circuit that switches clock signal between shift mode and capture mode, and method of testing the semiconductor device
05/06/2003US6560141 Semiconductor integrated circuit with memory redundancy circuit
05/06/2003US6559818 Method of testing addressable emissive cathodes
05/06/2003US6559673 Apparatus and method for power continuity testing in a parallel testing system
05/06/2003US6559672 Characteristic evaluation apparatus for insulated gate type transistors
05/06/2003US6559671 Efficient parallel testing of semiconductor devices using a known good device to generate expected responses
05/06/2003US6559670 Backside liquid crystal analysis technique for flip-chip packages
05/06/2003US6559669 Synchronous semiconductor device, and inspection system and method for the same
05/06/2003US6559667 Programming thermal test chip arrays
05/06/2003US6559666 Method and device for semiconductor testing using electrically conductive adhesives
05/06/2003US6559665 Test socket for an IC device
05/06/2003US6559664 Probe plate assembly for a circuit board test fixture
05/06/2003US6559663 Method and apparatus for inspecting integrated circuit pattern
05/06/2003US6559662 Semiconductor device tester and semiconductor device test method
05/06/2003US6559660 Monitoring circuit detects shorted diodes and capacitor function
05/06/2003US6559651 Method for locating an open in a conductive line of an insulated conductor
05/06/2003US6559648 Method for operating an electronic overcurrent trip of a power circuit breaker
05/06/2003US6558964 Method and apparatus for monitoring a semiconductor wafer during a spin drying operation
05/06/2003CA2321868C Method for controlling ic handler and control system using the same
05/06/2003CA2252208C Method and apparatus for determining the moisture level in a buried splice
05/06/2003CA2205263C Variable volume test chamber
05/02/2003EP1306957A1 Charging/discharging apparatus and method, power supplying apparatus and method, power supplying system and method, program storage medium, and program
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