| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 05/15/2003 | US20030090285 System for testing integrated circuit devices |
| 05/15/2003 | US20030090282 Semiconductor test interconnect with variable flexure contacts |
| 05/15/2003 | US20030090281 Device testing contactor, method of producing the same, and device testing carrier |
| 05/15/2003 | US20030090273 Method and apparatus for finding a fault in a signal path on a printed circuit board |
| 05/15/2003 | US20030090272 In-vehicle battery monitor |
| 05/15/2003 | US20030090271 Portable circuit interrupter shutoff testing device and method |
| 05/15/2003 | US20030090259 Universal test interface between a device under test and a test head |
| 05/15/2003 | US20030090258 Electronic component sucking device and electronic component testing apparatus having the same |
| 05/15/2003 | US20030090257 Method and apparatus for load testing electrical systems |
| 05/15/2003 | US20030089936 Structure and method for embedding capacitors in Z-connected multi-chip modules |
| 05/15/2003 | US20030089635 Latch locking mechanism of a KGD carrier |
| 05/15/2003 | US20030089384 Base sheet with a foamed layer having dispersed abrading particles on it and a polishing layer on top of it |
| 05/15/2003 | US20030088973 Method and apparatus for automatically positioning electronic dice within component packages |
| 05/15/2003 | CA2464405A1 Large area silicon carbide devices and manufacturing methods therefor |
| 05/14/2003 | EP1310803A2 Method for detecting partial discharge |
| 05/14/2003 | EP1310802A2 Optical sensor for sensing of a magnetic field or a voltage |
| 05/14/2003 | EP1310127A1 Remote diagnosis and central fault evaluation method of decentralized electric devices, and decentralized electronic device |
| 05/14/2003 | EP1309995A2 Method and apparatus for measuring parameters of an electronic device |
| 05/14/2003 | EP1309986A2 Chuck with heat exchanger and temperature control fluid |
| 05/14/2003 | EP1309877A2 Method to descramble the data mapping in memory circuits |
| 05/14/2003 | EP1309876A1 Method for assessing security of operating conditions of an assembly of integrated electronic systems receiving and producing data |
| 05/14/2003 | EP1309842A1 Water monitoring system and water monitoring method for high voltage cables |
| 05/14/2003 | EP1166134B1 Method for monitoring a substantially direct current flow in a load |
| 05/14/2003 | EP1145024B1 Dynamic register with iddq testing capability |
| 05/14/2003 | EP1111508B1 Integrated circuit with calibration means for calibrating an electronic module, and method for calibrating an electronic module in an integrated circuit |
| 05/14/2003 | EP1038185B1 Wideband isolation system |
| 05/14/2003 | EP0808461B1 Jtag testing of buses using plug-in cards with jtag logic mounted thereon |
| 05/14/2003 | CN2550772Y Detection device for ball check array integrated circuit element |
| 05/14/2003 | CN2550771Y Switch tube detector |
| 05/14/2003 | CN2550770Y 便携式零值绝缘子地面检测仪 Portable insulator ground zero value detector |
| 05/14/2003 | CN2550769Y Automatic detection and sorting machine for switch and relay parameter |
| 05/14/2003 | CN2550768Y Live line detector for high voltage transmission line insulator |
| 05/14/2003 | CN1418365A Automated reference cell trimming verify |
| 05/14/2003 | CN1417590A Detection method and device for live insulator in high-voltage transmission line |
| 05/14/2003 | CN1417589A Probe card for LCD detection |
| 05/14/2003 | CN1108636C Method and device for checking IC device shell pin |
| 05/14/2003 | CN1108635C Process for manufacturing semiconductor device |
| 05/13/2003 | US6564362 Method of designing a layout of an LSI chip, and a computer product |
| 05/13/2003 | US6564356 Method and apparatus to analyze simulation and test coverage |
| 05/13/2003 | US6564351 Circuit and method for testing an integrated circuit |
| 05/13/2003 | US6564350 Testing frequency hopping devices |
| 05/13/2003 | US6564347 Method and apparatus for testing an integrated circuit using an on-chip logic analyzer unit |
| 05/13/2003 | US6564346 Advanced bit fail map compression with fail signature analysis |
| 05/13/2003 | US6564173 Remote multiplexed diagnostic circuitry and a method of detecting faults in sequentially driven loads |
| 05/13/2003 | US6564165 Apparatus and method for inline testing of electrical components |
| 05/13/2003 | US6564162 Method and apparatus for improving electrical verification throughput via comparison of operating-point differentiated test results |
| 05/13/2003 | US6563766 Voltage detecting device, battery remaining voltage detecting device, voltage detecting method, battery remaining voltage detecting method, electronic timepiece and electronic device |
| 05/13/2003 | US6563408 Diagnostic relay |
| 05/13/2003 | US6563352 Driver circuit employing high-speed tri-state for automatic test equipment |
| 05/13/2003 | US6563335 Semiconductor device and test method therefor |
| 05/13/2003 | US6563334 Insulating film method and apparatus therefor |
| 05/13/2003 | US6563333 Dynamic register with IDDQ testing capability |
| 05/13/2003 | US6563331 Test and burn-in apparatus, in-line system using the test and burn-in apparatus, and test method using the in-line system |
| 05/13/2003 | US6563330 Probe card and method of testing wafer having a plurality of semiconductor devices |
| 05/13/2003 | US6563327 Test chamber |
| 05/13/2003 | US6563326 Bus-driveable sensor apparatus with direction-dependent current/voltage characteristic curve and method for testing the apparatus |
| 05/13/2003 | US6563323 Method for testing a semiconductor integrated circuit |
| 05/13/2003 | US6563321 Method and apparatus for detecting line-shorts by potential and temperature distribution |
| 05/13/2003 | US6563319 Electrostatic discharges and transient signals monitoring system and method |
| 05/13/2003 | US6563318 Detecting method for detecting internal state of a rechargeable battery, detecting device for practicing said detecting method, and instrument provided with said detecting device |
| 05/13/2003 | US6563313 Electronic device and manufacturing method thereof |
| 05/13/2003 | US6563308 Eddy current loss measuring sensor, thickness measuring system, thickness measuring method, and recorded medium |
| 05/13/2003 | US6563301 Advanced production test method and apparatus for testing electronic devices |
| 05/13/2003 | US6563300 Method and apparatus for fault detection using multiple tool error signals |
| 05/13/2003 | US6563298 Separating device response signals from composite signals |
| 05/13/2003 | US6563297 RF isolation test device having ease of accessibility |
| 05/13/2003 | US6563296 Closely-coupled multiple-winding magnetic induction-type sensor |
| 05/13/2003 | US6563292 Charge/discharge protection circuit with latch circuit for protecting a charge control FET from overheating |
| 05/13/2003 | US6563291 Set battery charging condition detecting apparatus |
| 05/13/2003 | US6563114 Substrate inspecting system using electron beam and substrate inspecting method using electron beam |
| 05/13/2003 | US6562636 Wafer level burn-in and electrical test system and method |
| 05/13/2003 | US6561299 Automotive passenger restraint and protection apparatus |
| 05/08/2003 | WO2003038641A1 Admission control system for home video servers |
| 05/08/2003 | WO2003038617A2 Electronic component with output buffer control |
| 05/08/2003 | WO2003038459A1 Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring |
| 05/08/2003 | WO2003038455A2 Method and device for phase calculation from attenuation values using a hilbert transform for reflectometric measurements in the frequency domain |
| 05/08/2003 | WO2003038450A2 Method and program product for designing hierarchical circuit for quiescent current testing |
| 05/08/2003 | WO2002095756A3 Dynamic memory and method for testing a dynamic memory |
| 05/08/2003 | WO2002091005A3 Differential receiver architecture |
| 05/08/2003 | WO2002068968A3 Low-cost, compact, frequency domain reflectometry system for testing wires and cables |
| 05/08/2003 | WO2002044742A3 Mechanism for clamping device interface board to peripheral |
| 05/08/2003 | US20030088836 Low power test circuit and a semiconductor integrated circuit with the low power test circuit |
| 05/08/2003 | US20030088817 Design for test of analog module systems |
| 05/08/2003 | US20030088380 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same |
| 05/08/2003 | US20030088379 Electron beam test system and electron beam test method |
| 05/08/2003 | US20030088378 Method for determining poor performing cells |
| 05/08/2003 | US20030088376 Apparatus and method for testing remaining capacity of a battery |
| 05/08/2003 | US20030088375 Electronic battery tester with relative test output |
| 05/08/2003 | US20030087527 Method for estimating capacitance of deep trench capacitors |
| 05/08/2003 | US20030087466 Phototransistor device |
| 05/08/2003 | US20030087453 Method and device for producing and screening composite arrangements |
| 05/08/2003 | US20030087147 Method and apparatus for detecting abnormality in battery pack system |
| 05/08/2003 | US20030087111 Encapsulation, isolation tissues, cells |
| 05/08/2003 | US20030086537 Device for tracing electrical cable |
| 05/08/2003 | US20030086376 High-speed digital multiplexer |
| 05/08/2003 | US20030086304 Semiconductor memory device |
| 05/08/2003 | US20030086292 Nonvolatile semiconductor storage device and test method therefor |
| 05/08/2003 | US20030085771 Methods for transmitting a waveform having a controllable attenuation and propagation velocity |
| 05/08/2003 | US20030085731 Semiconductor device having test mode entry circuit |
| 05/08/2003 | US20030085730 Apparatus and method for evaluating a wafer of semiconductor material |