| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/22/2003 | CA2411085A1 Electronic devices mounted on electronic equipment board test system and test method |
| 05/21/2003 | EP1313001A2 Electronic test system |
| 05/21/2003 | EP1312932A1 Method for measuring motor constant of induction motor |
| 05/21/2003 | EP1312931A2 Electronic test system |
| 05/21/2003 | EP1312930A2 Apparatus for scan testing printed circuit boards |
| 05/21/2003 | EP1312929A1 Method for monitoring the electrical isolation of a rotor in an electrical machine |
| 05/21/2003 | EP1312106A1 Temperature-controlled thermal platform for automated testing |
| 05/21/2003 | EP1311868A1 Circuit arrangement for monitoring the state of charge of an accumulator |
| 05/21/2003 | EP1311867A2 Test system for smart card and identification devices and the like |
| 05/21/2003 | EP1311825A1 Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages |
| 05/21/2003 | EP1216420B1 Integrated test cell |
| 05/21/2003 | EP1198715B1 Method and device for individually determining the ageing condition of a capacitor |
| 05/21/2003 | EP1153310B1 Method for determining a state of charge of a battery |
| 05/21/2003 | EP1149298B1 Automatic test equipment using sigma delta modulation to create reference levels |
| 05/21/2003 | EP1057263B1 High speed pin driver integrated circuit architecture for commercial automatic test equipment applications |
| 05/21/2003 | EP1007981B1 Robotic twin probe for measurement on printed circuit boards and electrical and electronic assemblies |
| 05/21/2003 | CN2552164Y Ball check array type IC element testing assembly |
| 05/21/2003 | CN2552010Y Safety device for testing thermoelectric and thermosensor elements |
| 05/21/2003 | CN2552009Y Network cable fault measurer |
| 05/21/2003 | CN2551525Y Microcomputerized tester for comprehensive parameter of thyristor |
| 05/21/2003 | CN1419653A Controllable and testable oscillator apparatus for an integrated circuit |
| 05/21/2003 | CN1419276A Contact spring installed on chip |
| 05/21/2003 | CN1419274A 半导体电路装置及半导体装置 The semiconductor circuit device and semiconductor device |
| 05/21/2003 | CN1419136A Method for measuring leakage current and resistance, its monitor device system |
| 05/21/2003 | CN1419135A Method for electrified testing high-voltage transmission line insulator |
| 05/21/2003 | CN1109390C Device and method for stabildizing electric power system |
| 05/21/2003 | CN1109249C Siongle-phase earthing-fault display method and instrument for power supply line |
| 05/20/2003 | US6567961 Method for detecting lack of synchronism in VLSI designs during high level simulation |
| 05/20/2003 | US6567946 Evaluation device of weighted fault coverage and evaluation method of the same |
| 05/20/2003 | US6567944 Boundary scan cell design for high performance I/O cells |
| 05/20/2003 | US6567943 D flip-flop structure with flush path for high-speed boundary scan applications |
| 05/20/2003 | US6567942 Method and apparatus to reduce the size of programmable array built-in self-test engines |
| 05/20/2003 | US6567941 Event based test system storing pin calibration data in non-volatile memory |
| 05/20/2003 | US6567760 Electro-optic sampling oscilloscope |
| 05/20/2003 | US6567752 General method for tracking the evolution of hidden damage or other unwanted changes in machinery components and predicting remaining useful life |
| 05/20/2003 | US6567007 Identifiable electric component, method of identification and evaluation device |
| 05/20/2003 | US6566905 Method and apparatus for a multi-state single program pin |
| 05/20/2003 | US6566901 Printed circuit board testing apparatus |
| 05/20/2003 | US6566900 Integrated on-chip process, temperature, and voltage sensor module |
| 05/20/2003 | US6566899 Tester for semiconductor device |
| 05/20/2003 | US6566898 Temperature compensated vertical pin probing device |
| 05/20/2003 | US6566897 Voltage contrast method and apparatus for semiconductor inspection using low voltage particle beam |
| 05/20/2003 | US6566896 Semiconductor testing apparatus |
| 05/20/2003 | US6566890 Circuit for improved test and calibration in automated test equipment |
| 05/20/2003 | US6566887 Method and device for detecting and locating insulation/isolation defects between conductors |
| 05/20/2003 | US6566885 Multiple directional scans of test structures on semiconductor integrated circuits |
| 05/20/2003 | US6566883 Electronic battery tester |
| 05/20/2003 | US6566882 Method and apparatus for device-dependent calibration of relays for high accuracy operation at zero-crossing of input power signal |
| 05/20/2003 | US6566859 Ergonomic test apparatus for the operator-assisted testing of electronic devices |
| 05/20/2003 | US6566751 Carrier module for holding a μ-BGU type device for testing |
| 05/20/2003 | US6565720 Determination dielectric end-point |
| 05/20/2003 | US6565364 Wafer formed with CSP device and test socket of BGA device |
| 05/20/2003 | US6564986 Testing solder joint for response to heat cycles |
| 05/20/2003 | CA2363171A1 Short-circuit locator for printed circuit boards using a visible-nir camera |
| 05/20/2003 | CA2292771C Communication system |
| 05/20/2003 | CA2291692C Communication equipment |
| 05/15/2003 | WO2003063986A1 Inductive sensory apparatus |
| 05/15/2003 | WO2003041212A2 Non-linear transmission line using varactors and non-parallel waveguide |
| 05/15/2003 | WO2003041210A1 Apparatus for judging state of assembled battery |
| 05/15/2003 | WO2003041209A2 Device and method for the temporally and spatially dependent measuring of an operating parameter of an electrochemical cell |
| 05/15/2003 | WO2003041158A2 Semiconductor package device and method of formation and testing |
| 05/15/2003 | WO2003041157A2 Large area silicon carbide devices and manufacturing methods therefor |
| 05/15/2003 | WO2003041122A2 Preconditioning integrated circuit for integrated circuit testing |
| 05/15/2003 | WO2003040852A2 Concept for compensating external disturbance variables on physical functional parameters in integrated circuits |
| 05/15/2003 | WO2003040741A1 Method and apparatus for testing electronic component and its trading method |
| 05/15/2003 | WO2003040740A2 Feedforward temperature control of device under test |
| 05/15/2003 | WO2003040739A1 Semiconductor device tester |
| 05/15/2003 | WO2003040738A1 Timing generator and test apparatus |
| 05/15/2003 | WO2003040737A1 Test apparatus |
| 05/15/2003 | WO2003040734A2 Method and system for compensating thermally induced motion of probe cards |
| 05/15/2003 | WO2003040732A2 Impedance stabilization network for determining the electromagnetic interfering radiation of a modem |
| 05/15/2003 | WO2003039904A2 Method and circuit for detecting a fault of semiconductor circuit elements and use thereof in electronic regulators of braking force and of dynamics movement of vehicles |
| 05/15/2003 | WO2003017326A3 Methods of conducting wafer level burn-in of electronic devices |
| 05/15/2003 | WO2003010550A3 Integrated testing of serializer/deserializer in fpga |
| 05/15/2003 | WO2002088763A3 Voltage acquisition with open-loop charged-particle-beam probe system |
| 05/15/2003 | WO2002048722A3 Data synchronization for a test access port |
| 05/15/2003 | US20030093773 Method and apparatus for rule-based random irritator for model stimulus |
| 05/15/2003 | US20030093738 Method and apparatus for performing error checking |
| 05/15/2003 | US20030093737 Event based test system having improved semiconductor characterization map |
| 05/15/2003 | US20030093735 Apparatus and method for random pattern built in self-test |
| 05/15/2003 | US20030093733 Modeling custom scan flops in level sensitive scan design |
| 05/15/2003 | US20030093732 Tristate buses |
| 05/15/2003 | US20030093731 Scan multiplication |
| 05/15/2003 | US20030093730 Systems and methods for testing integrated circuits |
| 05/15/2003 | US20030093729 Method of and apparatus for timing verification of LSI test data and computer product |
| 05/15/2003 | US20030093728 Test executive system with a tape recorder type control interface |
| 05/15/2003 | US20030093724 Electronic apparatus test circuit |
| 05/15/2003 | US20030093718 Electronic test program with selectable specifications |
| 05/15/2003 | US20030093713 Multilevel signal interface testing with binary test apparatus by emulation of multilevel signals |
| 05/15/2003 | US20030093238 Network-based computer testing system |
| 05/15/2003 | US20030093237 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same |
| 05/15/2003 | US20030093173 Stereolithographic method and apparatus for packaging electronic components |
| 05/15/2003 | US20030092301 KGD carrier and an IC mounting socket mounting it |
| 05/15/2003 | US20030092294 Connector structure for connecting electronic parts |
| 05/15/2003 | US20030092206 Method of manufacturing semiconductor apparatus |
| 05/15/2003 | US20030090938 Nonvolatile semiconductor memory device and method of retrieving faulty in the same |
| 05/15/2003 | US20030090301 Semiconductor circuit and semiconductor device |
| 05/15/2003 | US20030090295 Self test method and device for dynamic voltage screen functionality improvement |
| 05/15/2003 | US20030090288 Method of testing semiconductor integrated circuits and testing board for use therein |
| 05/15/2003 | US20030090287 Input buffer with automatic switching point adjustment circuitry, and synchronous DRAM device including same |