Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
05/2003
05/29/2003US20030100201 Socket
05/29/2003US20030100139 Semiconductor-package measuring method, measuring socket, and semiconductor package
05/29/2003US20030099393 Method of inspecting curved surface and device for inspecting printed circuit board
05/29/2003US20030099143 Memory circuit having compressed testing function
05/29/2003US20030099141 Semiconductor device having PLL-circuit
05/29/2003US20030099097 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs
05/29/2003US20030099074 Electronic device with double-wire bonding, manufacturing method thereof, and method for checking intactness of bonding wires of this electronic device
05/29/2003US20030098859 Semiconductor device and liquid crystal panel driver device
05/29/2003US20030098709 Method and apparatus for determining an operating state of a motor which is connected to a rigid network
05/29/2003US20030098705 Electric circuit system
05/29/2003US20030098704 Method and apparatus for measuring stress in semiconductor wafers
05/29/2003US20030098703 Methods of testing integrated circuitry
05/29/2003US20030098702 Probe card and probe contact method
05/29/2003US20030098694 Insulation diagnosis device
05/29/2003US20030098693 Apparatus for identifying state-dependent, defect-related leakage currents in memory circuits
05/29/2003US20030098692 Time resolved non-invasive diagnostics system
05/29/2003US20030098684 Handler for tape carrier packages and method of traveling tape carrier package tape
05/29/2003US20030098457 Scan testing system, method, and apparatus
05/29/2003US20030098456 Semiconductor integrated circuit and a testing method thereof
05/29/2003US20030098178 Printed circuit board having test points formed on sides thereof
05/28/2003EP1315343A1 Switching device with integrated test means
05/28/2003EP1315264A1 Method for earth fault monitoring of a power converter drive
05/28/2003EP1314992A2 Method and device for controlling a capacity of a battery for vehicles
05/28/2003EP1314991A2 Method and system for fuel cell resistance test
05/28/2003EP1314990A1 Method for evaluating a battery and the device for the same
05/28/2003EP1314989A2 Electronic test system and method
05/28/2003EP1314988A1 Method for determining resistance and/or capacity values
05/28/2003EP1314974A1 Method of inspecting curved surface and device for inspecting printed circuit board
05/28/2003EP1314045A2 Method for providing bitwise constraints for test generation
05/28/2003EP0904636B1 Power device with a short-circuit detector
05/28/2003CN2553387Y Generator testing bench
05/28/2003CN2553386Y D.C. system earthing detector
05/28/2003CN1421047A Method and apparatus for measuring parameters of electronic device
05/28/2003CN1421013A Property coverage in formal verification
05/28/2003CN1420565A 半导体存储器件 A semiconductor memory device
05/28/2003CN1420561A Semiconductor IC and mfg. method thereof
05/28/2003CN1420556A Contactor for semiconductor device, and contacting method
05/28/2003CN1420430A Easy-to-measure design of logic circuit
05/28/2003CN1420428A Compression test plan generation of IC test, test sequence generation and testing
05/28/2003CN1420362A Cell voltage detecting circuit
05/28/2003CN1420361A Ceramic capacitance sensor for ultra-high frequency on-line monitoring local high-voltage discharge
05/28/2003CN1420360A Method for observing stator side resistance of asynchronous motor
05/28/2003CN1419995A Machine for pick-up of devcie in processor
05/28/2003CN1110183C Method and arrangement for automatically testing circuits on main distributing frame
05/28/2003CN1110095C Semiconductor device and internal function identification method of semiconductor device
05/28/2003CN1109945C Method of monitoring functional capability of tap selector
05/28/2003CN1109898C Automatically adapting biased photodiode detection and light monitoring circuit and method
05/28/2003CN1109897C 半导体测试系统 Semiconductor Test Systems
05/28/2003CN1109896C Method and device for measuring current by applying voltage
05/27/2003US6571373 Simulator-independent system-on-chip verification methodology
05/27/2003US6571372 Method and apparatus for measuring and designing electric circuit based on two-port network thereof, and computer-readable recording medium for recording the same
05/27/2003US6571365 Initial stage of a multi-stage algorithmic pattern generator for testing IC chips
05/27/2003US6571364 Semiconductor integrated circuit device with fault analysis function
05/27/2003US6571353 Fail information obtaining device and semiconductor memory tester using the same
05/27/2003US6571204 Bus modeling language generator
05/27/2003US6571183 Imaging using spatial frequency filtering and masking
05/27/2003US6571091 Power control method and apparatus suitable for use in a radio communication device
05/27/2003US6570748 Method and apparatus for indicating an over-current condition
05/27/2003US6570592 System and method for specifying trigger conditions of a signal measurement system using graphical elements on a graphical user interface
05/27/2003US6570458 Low noise microwave synthesizer employing high frequency combs for tuning drift cancel loop
05/27/2003US6570407 Scannable latch for a dynamic circuit
05/27/2003US6570400 Method for disabling and re-enabling access to IC test functions
05/27/2003US6570397 Timing calibration and timing calibration verification of electronic circuit testers
05/27/2003US6570392 Arc fault circuit detector device detecting pulse width modulation of arc noise
05/27/2003US6570389 Prevention of arcing in power supplies
05/27/2003US6570388 Transmission line pulse method for measuring electrostatic discharge voltages
05/27/2003US6570387 Multiplex voltage measurement apparatus
05/27/2003US6570385 Handheld tester for starting/charging systems
05/27/2003US6570374 Vacuum chuck with integrated electrical testing points
05/27/2003US6570364 Circuit and method for monitoring the operational reliability of rechargeable lithium cells
05/27/2003US6570247 Integrated circuit device having an embedded heat slug
05/22/2003WO2003043087A1 Semiconductor device
05/22/2003WO2003042710A2 Clock architecture for a frequency-based tester
05/22/2003WO2003042709A1 Timing generator and tester
05/22/2003WO2002097456A3 Self-diagnosis system for an energy storage device
05/22/2003WO2002082532A3 Semiconductor test system and associated methods for wafer level acceptance testing
05/22/2003US20030097645 For use with internal bus; entire internal bus may be monitored in single test run at same time making diagnostic port available for tracing control signals, reducing amount of time required to determine cause of chip design problems
05/22/2003US20030097628 Error detection on programmable logic resources
05/22/2003US20030097622 Multi-purpose BER tester (MPBERT) for very high RZ and NRZ signals
05/22/2003US20030097620 Semiconductor integrated circuit
05/22/2003US20030097614 Method and apparatus for at-speed testing of digital circuits
05/22/2003US20030097347 Designing of logic circuit for testability
05/22/2003US20030097248 Method for logic checking to check operation of circuit to be connected to bus
05/22/2003US20030097233 Electronic test system and method
05/22/2003US20030097228 Apparatus and methods for managing reliability of semiconductor devices
05/22/2003US20030097225 State of charge calculation device and state of charge calculation method
05/22/2003US20030096523 Contactor for semiconductor device and contact method
05/22/2003US20030096436 Test structures and methods for inspection of semiconductor integrated circuits
05/22/2003US20030095438 Nonvolatile semiconductor memory device having function of determining good sector
05/22/2003US20030095430 Semiconductor memory device
05/22/2003US20030095141 Network-based system for selecting or purchasing products
05/22/2003US20030094966 Method for testing electrical characteristics of bumps
05/22/2003US20030094963 Device for testing electrical characteristics of chips
05/22/2003US20030094961 Apparatus for scan testing printed circuit boards
05/22/2003US20030094954 Battery voltage detecting circuit
05/22/2003US20030094939 Electronic devices mounted on electronic equipment board test system and test method
05/22/2003US20030094937 Clock skew measuring apparatus and method
05/22/2003US20030094934 Semiconductor integrated circuit device and method of design of semiconductor integrated circuit device
05/22/2003US20030094321 Capacity indicating device and method thereof
05/22/2003DE19900974C2 Verfahren und System zum Suchen kritischer Pfade in Halbleitervorrichtungen Method and system for searching critical paths in semiconductor devices
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