Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2003
06/04/2003EP1316966A2 Memory circuit having compressed testing function
06/04/2003EP1316808A1 Transition adjustment
06/04/2003EP1316807A2 Method and device for locating interruptions in a current path
06/04/2003EP1315976A1 Thermographic wiring inspection
06/04/2003EP1315975A2 Method and device for testing printed circuit boards with a parallel tester
06/04/2003EP1250744A4 Usage counter for portable jump-starting battery unit
06/04/2003EP1224481B1 Apparatus and method for programmable parametric toggle testing of digital cmos pads
06/04/2003EP1135693B1 Probe card for probing wafers with raised contact elements
06/04/2003EP1086381A4 System for digital measurement of breakdown voltage of high-voltage samples
06/04/2003EP1018026A4 Load circuit for integrated circuit tester
06/04/2003EP0889411B1 On-chip PLL phase and jitter self-test circuit
06/04/2003CN2554813Y Series battery monitoring protective module
06/04/2003CN2554636Y Portable earth leakage protective device testing instrument
06/04/2003CN1422486A Packet transmitter unit, packet receiver unit and packet transmission system
06/04/2003CN1422108A Printed circuit board with testing point formed at side
06/04/2003CN1421931A 半导体集成电路及其测试方法 Semiconductor integrated circuit and test methods
06/04/2003CN1421911A Improved structure of integrated circuit test bench
06/04/2003CN1421868A Storage circuit with test compression function
06/04/2003CN1421707A Switch equipment provided with integrated tester
06/04/2003CN1421706A Test method and test seat making process for high-power surface mounted integrated circuit
06/04/2003CN1421705A Test board separator for semiconductor device measurement
06/04/2003CN1421704A Sectional detection method of small current earthing fault of power system
06/04/2003CN1421688A Surface state examining method for curve and base plate examining apparatus
06/04/2003CN1110708C Integrated circuit tester
06/04/2003CN1110707C Diagnosis method of earth screen corrosion and breakpoint of electric substation and its measuring and diagnosis system
06/04/2003CN1110706C Combined tester probe
06/03/2003US6574764 Algorithmically programmable memory tester with history FIFO's that aid in error analysis and recovery
06/03/2003US6574763 Method and apparatus for semiconductor integrated circuit testing and burn-in
06/03/2003US6574762 Use of a scan chain for configuration of BIST unit operation
06/03/2003US6574761 On-line testing of the programmable interconnect network in field programmable gate arrays
06/03/2003US6574760 Testing method and apparatus assuring semiconductor device quality and reliability
06/03/2003US6574586 System for monitoring connection pattern of data ports
06/03/2003US6574579 Waveform generating device
06/03/2003US6574463 Failure detecting structure of emergency call terminal device
06/03/2003US6574169 Delay test system for normal circuit
06/03/2003US6574159 Semiconductor memory device and testing method therefor
06/03/2003US6573751 Semiconductor device and electronic apparatus using the same
06/03/2003US6573744 S-parameter microscopy for semiconductor devices
06/03/2003US6573743 Testing apparatus for test piece, testing method, contactor and method of manufacturing the same
06/03/2003US6573742 Semiconductor integrated circuit with test points inserted thereinto
06/03/2003US6573741 Apparatus of measuring temperature parameters of an ISFET that uses hydrogenated amorphous silicon as a sensing film, comprising: a semiconductor substrate where the ISFET is formed, wherein the comprises a pair of source and drain with
06/03/2003US6573740 Method of forming an apparatus configured to engage an electrically conductive pad on a semiconductive substrate and a method of engaging electrically conductive pads on a semiconductive substrate
06/03/2003US6573739 IC testing apparatus
06/03/2003US6573736 Primary ion or electron current adjustment to enhance voltage contrast effect
06/03/2003US6573735 Reliability of vias and diagnosis by e-beam probing
06/03/2003US6573728 Method and circuit for electrical testing of isolation resistance of large capacitance network
06/03/2003US6573727 Method and apparatus for evaluation of insulation in variable speed motors
06/03/2003US6573723 Current measuring apparatus for battery
06/03/2003US6573703 Semiconductor device
06/03/2003US6573701 Method and system for line current detection for power line cords
06/03/2003US6573700 Method of characterizing free-space radiation using a chirped optical pulse
06/03/2003US6573688 Battery power source device
06/03/2003US6573685 Method of replacing secondary battery
06/03/2003US6573497 Calibration of CD-SEM by e-beam induced current measurement
06/03/2003US6573113 Integrated circuit having dedicated probe pads for use in testing densely patterned bonding pads
06/03/2003CA2248760C Method for monitoring of tap changers by acoustic analysis
05/2003
05/30/2003WO2003045003A1 Phase adjustment apparatus and semiconductor test apparatus
05/30/2003WO2003044923A2 Method and system for monitoring electrical appliances
05/30/2003WO2003044852A2 Estimating reliability of components for testing and quality optimization
05/30/2003WO2003044551A1 Device and method for measuring parameters of periodic oscillatory signals
05/30/2003WO2003044550A1 Semiconductor tester
05/30/2003WO2003044549A1 Semiconductor tester
05/30/2003WO2003044547A1 Fault location using measurements from two ends of a line
05/30/2003WO2003044546A1 Short-to-ground detector for windings
05/30/2003WO2003044545A1 Method for the detection of an earth connection occurring in the vicinity of a neutral point in an electrical device, device for carrying out and application of said method
05/30/2003WO2003034199A3 Interface architecture for embedded field programmable gate array cores
05/30/2003WO2003017352A3 Providing current control over wafer borne semiconductor devices using overlayer patterns
05/30/2003WO2003016922A3 Electronic circuit and method for testing
05/30/2003WO2003001223A3 High density planar electrical interface
05/30/2003WO2002095798A3 Fibre optic wafer probe
05/30/2003WO2002075334A3 Apparatus and method for measuring and probability estimating for clock skews
05/30/2003CA2467106A1 Method for dectection of a ground fault, which occurs in the vicinity of a neutral point in an electrical device, as well as an apparatus for carrying out the method
05/30/2003CA2366734A1 Identification system
05/30/2003CA2366731A1 Power monitoring system
05/30/2003CA2366640A1 Electrical monitoring system
05/29/2003US20030101398 Hierarchical creation of vectors for quiescent current (IDDQ) tests for system-on-chip circuits
05/29/2003US20030101397 IC test cell with memory output connected to input multiplexer
05/29/2003US20030101396 Delay fault test circuitry and related method
05/29/2003US20030101395 System for testing devices and method thereof
05/29/2003US20030101393 Fast sampling test bench
05/29/2003US20030101391 System for testing multiple devices on a single system and method thereof
05/29/2003US20030101382 Fail thresholding in a batch simulation farm network
05/29/2003US20030101376 Built-in self-testing for double data rate input/output
05/29/2003US20030101374 Semiconductor device with reduced terminal input capacitance
05/29/2003US20030101144 System and method for detecting repetitions in a multimedia stream
05/29/2003US20030101041 Annealing harvest event testcase collection within a batch simulation farm
05/29/2003US20030101040 Hardware simulation using a test scenario manager
05/29/2003US20030101039 Maintaining data integrity within a distributed simulation environment
05/29/2003US20030101038 Centralized disablement of instrumentation events within a batch simulation farm network
05/29/2003US20030101037 Simulation apparatus and simulation method
05/29/2003US20030101035 Non-redundant collection of harvest events within a batch simulation farm network
05/29/2003US20030101031 Method for generating at least one sequence of random numbers approximated to sequences of numbers of a 1/f noise
05/29/2003US20030101025 Generating a configuration diagram based on user specification of a task
05/29/2003US20030101023 Network based system which provides a database of measurement solutions
05/29/2003US20030101022 Network based system for analyzing a client system and generating a configuration diagram which describes the client system
05/29/2003US20030101021 Animation of a configuration diagram to visually indicate deployment of programs
05/29/2003US20030101016 Electrical over stress (EOS) monitor
05/29/2003US20030101015 Method and apparatus for testing, characterizing and tuning a chip interface
05/29/2003US20030101012 Biometric quality control process
05/29/2003US20030100202 Interconnect device for electrically coupling a test system to a circuit board adapted for use with a ball-grid array connector
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