Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2003
06/11/2003EP1090302A4 System measuring partial discharge using digital peak detection
06/11/2003EP0715723B1 Measuring burst/sinusoidal waveform time span
06/11/2003CN2555508Y Power supply detection warner for radio scheduling locomotive platform
06/11/2003CN1423279A Semiconductor storage device reading data according to current passing through storage anit while accessing
06/11/2003CN1423195A Programme generation, changing system and method and semiconductor device development system
06/11/2003CN1423132A Small-current earth fault switch-selecting and sectioning method for power system
06/11/2003CN1111285C Expert diagnostic method for fault of dc motor
06/11/2003CN1111284C Comprehensive aging and screening equipment for electronic components and devices
06/10/2003US6578181 Device and method for analyzing a circuit, and a computer product
06/10/2003US6578180 Method and system for testing interconnected integrated circuits
06/10/2003US6578169 Data failure memory compaction for semiconductor test system
06/10/2003US6578168 Method for operating a boundary scan cell design for high performance I/O cells
06/10/2003US6578166 Restricting the damaging effects of software faults on test and configuration circuitry
06/10/2003US6578165 Internal guardband for semiconductor testing
06/10/2003US6578058 System and method for comparing values from target systems
06/10/2003US6577981 Test executive system and method including process models for improved configurability
06/10/2003US6577980 Systems and methods for facilitating testing of pad receivers of integrated circuits
06/10/2003US6577979 Semiconductor integrated circuit having an Intellectual property test circuit to be used for testing the operation of each Intellectual property core (hereinafter referred to as IP) such as logical blocks of USB and JPEG, and DRAM
06/10/2003US6577883 Method of detecting battery pack type and mobile electronic device
06/10/2003US6577547 Semiconductor memory device
06/10/2003US6577546 Semiconductor integrated circuit and operating method
06/10/2003US6577545 Integrated circuit memory devices having efficient multi-row address test capability and methods of operating same
06/10/2003US6577543 Semiconductor integrated circuit including a plurality of macros that can be operated although their operational voltages are different from each other
06/10/2003US6577243 Method and apparatus for tracing remote ends of networking cables
06/10/2003US6577151 Inspection device for wiring of an integrated circuit
06/10/2003US6577150 Testing apparatus and method of measuring operation timing of semiconductor device
06/10/2003US6577148 Apparatus, method, and wafer used for testing integrated circuits formed on a product wafer
06/10/2003US6577147 Method and apparatus for resisting probe burn using shape memory alloy probe during testing of an electronic device
06/10/2003US6577146 Method of burning in an integrated circuit chip package
06/10/2003US6577138 Apparatus for detecting arcing and overcurrents in dc electrical systems subject to cyclic disturbances
06/10/2003US6577137 Reverse inertial load test
06/10/2003US6577136 Modular self-diagnostic and test switch assembly for controlling inverter operations
06/10/2003US6577135 Battery pack with monitoring function utilizing association with a battery charging system
06/10/2003US6577133 Inductive measurement of armature travel within a solenoid valve
06/10/2003US6577131 Motor terminal fixture
06/10/2003US6577130 System and method for sensing and controlling potential differences between a space object and its space plasma environment using micro-fabricated field emission devices
06/10/2003US6577117 Rotation sensing device of fan apparatus adapted to chamber of handler
06/10/2003US6577116 Circuit test light
06/10/2003US6577107 Method of testing a lead battery for the purpose of charging it under optimal conditions
06/10/2003US6576485 Contact structure and production method thereof and probe contact assembly using same
06/10/2003US6576301 Micromachining tool over the first abrasive layer, irradiating a beam of electrothermal energy to form a deposition pattern thereon, depositing conductive material in the deposition pattern forming a horizontal portion of the contactor
06/10/2003US6575767 Contact pin assembly, contact pin assembly manufacturing method, contact pin assembling structure, contact pin assembling structure manufacturing method, and socket for electrical parts
06/07/2003CA2364564A1 Short-circuit locator for printed circuit boards using a visible camera and an ir camera
06/05/2003WO2003047084A1 Method for identifying parameters of asynchronous motor
06/05/2003WO2003047064A2 Remote battery monitoring systems and sensors
06/05/2003WO2003046976A1 Reliability evaluation tester, reliability evaluation test system, contactor, and reliability evaluation test method
06/05/2003WO2003046925A2 Built-in self-testing for double data rate input/output interface
06/05/2003WO2003046773A1 Method and circuitry for the functional testing and analysis of large digital circuits using hardware emulators
06/05/2003WO2003046724A2 Test circuit topology reconfiguration and utilization method
06/05/2003WO2003046593A1 Time resolved non-invasive diagnostics system
06/05/2003WO2003046592A1 Method for testing an electrical cable, modified electrical cable and process for producing it
06/05/2003WO2003046591A2 Multi-environment testing with a responder
06/05/2003WO2003046590A2 Test machine for testing an integrated circuit with a comparator
06/05/2003WO2003046588A1 Method for detecting the operability of a number of identical zener diodes that are connected in parallel to one another and to a solenoid
06/05/2003WO2003046474A1 Method and apparatus for measuring stress in semiconductor wafers
06/05/2003WO2003036312A3 Determining electrical faults on undergrounded power systems using directional element
06/05/2003WO2003005046A3 Apparatus with a test interface
06/05/2003WO2002091004A3 Test and on-board programming station
06/05/2003WO2002063321A3 Test circuitry of an integrated circuit comprising only one selection element for each signal path
06/05/2003WO2002061443A9 Nickel alloy probe card frame laminate
06/05/2003WO2002021241A3 Circuit arrangement and a method for detecting an undesired attack on an integrated circuit
06/05/2003US20030106047 Program conversion system and semiconductor device developing system
06/05/2003US20030106005 Programmable delay elements for source synchronous link function design verification through simulation
06/05/2003US20030106004 Method and apparatus for embedded built-in self-test (BIST) of electronic circuits and systems
06/05/2003US20030106003 Low power testing of very large circuits
06/05/2003US20030106002 Scan path circuit, integrated circuit, and integrated circuit checking method
06/05/2003US20030105991 Method for testing functional circuit block
06/05/2003US20030105799 Distributed processing architecture with scalable processing layers
06/05/2003US20030105607 Circuit testing with ring-connected test instrument modules
06/05/2003US20030105606 Testing a host's support for peripheral devices
06/05/2003US20030105601 Network system, managing server, electrical apparatus, battery status managing method, battery diagnosis method, and program thereof
06/05/2003US20030105598 Method for diagnosing degradation in aircraft wiring
06/05/2003US20030105564 Device for monitoring motor vehicle's electric power and method therefor
06/05/2003US20030104655 Semiconductor integrated circuit package, semiconductor apparatus provided with a plurality of semiconductor integrated circuit packages, method of inspecting semiconductor integrated circuit package and method of fabricating semiconductor integrated circuit package
06/05/2003US20030104642 Method of detecting protrusion of inspection object from palette and method of fabricating semiconductor device
06/05/2003US20030104641 Method of manufacturing a semicondutor device
06/05/2003US20030103465 Policy-based forward error correction in packet networks
06/05/2003US20030103455 Mechanism for implementing class redirection in a cluster
06/05/2003US20030103395 Semiconductor memory device reading data based on memory cell passing current during access
06/05/2003US20030103394 Semiconductor storage device and method for remedying defects of memory cells
06/05/2003US20030103306 Device for detecting failure of field effect transistor
06/05/2003US20030103137 Test configuration for a metrological examination of a test object, in particular an integrated circuit
06/05/2003US20030102968 Identification system
06/05/2003US20030102885 Semiconductor integrated circuit and method for testing the same
06/05/2003US20030102883 Integrated circuit testing system and method
06/05/2003US20030102882 Test apparatuses for semiconductor integrated circuits
06/05/2003US20030102881 Method and apparatus for reducing the current consumption of an electronic circuit
06/05/2003US20030102880 Semiconductor-device inspecting apparatus and a method for manufacturing the same
06/05/2003US20030102879 Device picker in handler
06/05/2003US20030102876 Wide-bandwidth coaxial probe
06/05/2003US20030102871 Battery power source device and current detection method therefor
06/05/2003US20030102870 Modular ATE power supply architecture
06/05/2003US20030102857 Measuring and/or calibrating a test head
06/05/2003US20030102568 Semiconductor device suitable for system in package
06/05/2003DE10201136C1 Assessing state of batteries in battery back up power supply systems involves repeating discharge cycle at fixed times to record current discharge characteristic for residual voltage
06/05/2003DE10138556C1 Verfahren zum Testen von Eingangs-/Ausgangstreibern einer Schaltung und entsprechende Testvorrichtung Method for testing input / output drivers of a circuit and corresponding test device
06/05/2003DE10136714C1 Integrated digital circuit has unit for checking signal in circuit for error during normal mode, changing to special mode with lower operating frequency and failure probability if error detected
06/05/2003CA2504006A1 Remote battery monitoring systems and sensors
06/05/2003CA2364421A1 Integrated circuit testing system and method
06/04/2003EP1317045A2 Battery power source device and current detection method therefor
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