Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2003
06/19/2003US20030112027 Method and apparatus for on-die voltage fluctuation detection
06/19/2003US20030112025 Temperature control system for burn-in boards
06/19/2003US20030112015 Leakage current or resistance measurement method, and monitoring apparatus and monitoring system of the same
06/19/2003US20030112014 Alternative method for VOD testing of linear differential line drivers
06/19/2003US20030112011 Method and apparatus for determining the state of charge of a lithium-ion battery
06/19/2003US20030112010 Method for determining the operating state of an energy-storage battery
06/19/2003US20030112002 Probe system
06/19/2003US20030112001 Probe card covering system and method
06/19/2003US20030111970 Aligning apparatus in semiconductor device test handler
06/19/2003US20030111741 Semiconductor device capable of narrowing down failed point
06/19/2003US20030110658 Apparatus for monitoring a semiconductor wafer during a spin drying operation
06/19/2003US20030110614 Method for determining correct phasing of a three-phase brushless DC motor
06/18/2003EP1320105A2 Semiconductor memory device
06/18/2003EP1320084A2 Display unit and electronic device using the same
06/18/2003EP1319956A1 System for determining state of charge and voltage of an electrical storage battery, especially for a motor vehicle
06/18/2003EP1258068A4 Portable jump-starting battery pack with charge monitoring system
06/18/2003EP1036338A4 Boundary scan system with address dependent instructions
06/18/2003EP1000365B1 Timing generator with fast refire recovery time
06/18/2003CN2556653Y Universal test pencil
06/18/2003CN2556652Y Universal test pencil
06/18/2003CN1425138A Electrical test of interconnection of conductors on substrate
06/18/2003CN1424752A Signal test method for integrated circuit chips
06/18/2003CN1424588A Working insulator online real time monitoring systems
06/18/2003CN1111870C Semiconductor memory capable of testing regardless of spare unit configuration
06/18/2003CN1111868C Semiconductor integrated circuit device capable of externally monitoring internal voltage
06/18/2003CN1111813C Improved transistor model and method and device of electric circuit model therewith
06/18/2003CN1111745C Method for computer real time monitoring rotor current of brushless excited power generator
06/18/2003CN1111744C Short circuit detector
06/18/2003CN1111742C Method of cleaning probe tips of probe cards and apparatus for impelementing method
06/17/2003US6581191 Hardware debugging in a hardware description language
06/17/2003US6581190 Methodology for classifying an IC or CPU version type via JTAG scan chain
06/17/2003US6581172 On-board testing circuit and method for improving testing of integrated circuits
06/17/2003US6581171 Circuit configuration for the burn-in test of a semiconductor module
06/17/2003US6581028 Profile extraction method and profile extraction apparatus
06/17/2003US6581026 Method and configuration for comparing a first characteristic with predetermined characteristics of a technical system
06/17/2003US6581019 Computer-system-on-a-chip with test-mode addressing of normally off-bus input/output ports
06/17/2003US6581018 Multiplexer select line exclusivity check method and apparatus
06/17/2003US6580783 2nd level power fault testing apparatus for testing telecommunications equipment
06/17/2003US6580649 Semiconductor memory device
06/17/2003US6580289 Cell architecture to reduce customization in a semiconductor device
06/17/2003US6580284 Method and apparatus for determining an operating state of a motor which is connected to a rigid network
06/17/2003US6580283 Wafer level burn-in and test methods
06/17/2003US6580281 Externally induced voltage alterations for integrated circuit analysis
06/17/2003US6580279 Method and apparatus for checking the capacitance of a storage capacitor provided in an occupant protection system
06/17/2003US6580278 Technique for the measurement of reflection coefficients in stored energy systems
06/17/2003US6580276 Tap switch for frequency response and partial discharge measurement
06/17/2003US6580275 Single sensor control of power converters
06/17/2003US6580188 Moving apparatus with drive force assist mechanism and movement control method
06/17/2003US6580092 Semiconductor chip, semiconductor device, and process for producing a semiconductor device
06/17/2003US6580072 Method for performing failure analysis on copper metallization
06/17/2003US6579804 Contact structure and production method thereof and probe contact assembly using same
06/17/2003US6578264 Method for constructing a membrane probe using a depression
06/17/2003US6578256 Sub-harness and a sub-harness manufacturing apparatus
06/12/2003WO2003049376A1 Policy-based forward error correction in packet networks
06/12/2003WO2003049211A2 Method and apparatus for soft-sensor characterization of batteries
06/12/2003WO2003049179A1 Probe device and probe method
06/12/2003WO2003048795A1 Testing method and tester for semiconducor integrated circuit device comprising high-speed input/output element
06/12/2003WO2003048794A1 Method and apparatus for embeded built-in self-test (bist) of electronic circuits and systems
06/12/2003WO2003048793A1 Method of construction for high density, adaptable burn-in tool
06/12/2003WO2003048788A1 Contact structure and production method thereof and probe contact assembly using same
06/12/2003WO2003048787A1 Test probe for a finger tester and corresponding finger tester
06/12/2003US20030110457 Method and program product for designing hierarchical circuit for quiescent current testing and circuit produced thereby
06/12/2003US20030110456 Method of testing integrated circuitry at system and module level
06/12/2003US20030110432 Power reduction in scannable D-flip-flop with synchronous preset or clear
06/12/2003US20030110431 Scanning an allowed value into a group of latches
06/12/2003US20030110430 Method and system for use of a field programmable gate array (FPGA) function within an application specific integrated circuit (ASIC) to enable creation of a debugger client within the ASIC
06/12/2003US20030110429 Method and system for use of a field programmable function within an application specific integrated circuit (ASIC) to access internal signals for external observation and control
06/12/2003US20030110428 Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit
06/12/2003US20030110427 Semiconductor test system storing pin calibration data in non-volatile memory
06/12/2003US20030110425 I/O compression circuit for a semiconductor memory device
06/12/2003US20030109224 Method and product palette for testing electronic products
06/12/2003US20030108780 Rechargeable battery equipped with battery protection circuit
06/12/2003US20030107951 Compact ate with time stamp system
06/12/2003US20030107931 Method of verifying a semiconductor integrated circuit apparatus, which can sufficiently evaluate a reliability of a non-destructive fuse module after it is assembled
06/12/2003US20030107928 Semiconductor device
06/12/2003US20030107926 Semiconductor device provided with memory chips
06/12/2003US20030107482 Computer system having network connector and method of checking connection state of network cable therefor
06/12/2003US20030107395 Testing apparatus
06/12/2003US20030107394 Wafer-level burn-in and test
06/12/2003US20030107393 Method and systems to measure propagation delay in semiconductor chips
06/12/2003US20030107392 Integrated test circuit
06/12/2003US20030107391 Semiconductor device test arrangement with reassignable probe pads
06/12/2003US20030107383 Cable continuity test system
06/12/2003US20030107382 Coaxial radio frequency adapter and method
06/12/2003US20030107380 Device and process for detecting an electrical short-circuit, and circuit breaker comprising such a device
06/12/2003US20030107365 Reversed memory module socket, motherboard and test system including same, and method of modifying motherboard
06/12/2003US20030107363 Low loss links between wafer probes and load pull tuner
06/12/2003US20030107035 Semiconductor chip
06/12/2003US20030107007 Electron exposure device and method and electronic characteristics evaluation device using scanning probe
06/12/2003US20030106209 Method and apparatus for manufacturing known good semiconductor die
06/11/2003EP1318586A1 Method and device for electrical short circuit detection, and circuit breaker comprising such a device
06/11/2003EP1318456A2 Electronic apparatus and debug authorization method
06/11/2003EP1318412A1 Device for monitoring motor vehicle's electric power and method therefor
06/11/2003EP1318411A2 A method and apparatus for testing laminated cores of electrical machines
06/11/2003EP1318410A1 Apparatus and procedure for testing flat cables
06/11/2003EP1317674A1 Method and device for testing the operativeness of printed circuit boards
06/11/2003EP1236052B1 Electrical test of the interconnection of conductors on a substrate
06/11/2003EP1190322B1 Semiconductor parallel tester
06/11/2003EP1153308A4 Partial discharge site location system for determining the position of faults in a high voltage cable
06/11/2003EP1090357A4 Functional verification of integrated circuit designs
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