Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2003
06/26/2003US20030120988 Continuous application and decompression of test patterns to a circuit-under-test
06/26/2003US20030120987 Fault tolerant scan chain for a parallel processing system
06/26/2003US20030120986 Interconnections for plural and hierarchical P1500 test wrappers
06/26/2003US20030120985 Method and apparatus for memory self testing
06/26/2003US20030120457 System and method for estimating reliability of components for testing and quality optimization
06/26/2003US20030120456 Clock skew measurement circuit on a microprocessor die
06/26/2003US20030120451 Method and apparatus for discovery of operational boundaries for shmoo tests
06/26/2003US20030120449 Correction method of measurement errors, quality checking method for electronic components, and characteristic measuring system of electronic components
06/26/2003US20030120441 Component fault detection
06/26/2003US20030119191 Compositions and methods for helper-free production of recombinant adeno-associated viruses
06/26/2003US20030117960 DVI link with circuit and method for test
06/26/2003US20030117882 Semiconductor memory device
06/26/2003US20030117881 Multi-mode synchronouos memory device and method of operating and testing same
06/26/2003US20030117879 Semiconductor memory device and method for selecting multiple word lines in a semiconductor memory device
06/26/2003US20030117872 Semiconductor memory device
06/26/2003US20030117867 Semiconductor memory device
06/26/2003US20030117858 Semiconductor integrated circuit including a plurality of macros that can be operated although their operational voltages are different from each other
06/26/2003US20030117856 Memory devices with page buffer having dual registers and method of using the same
06/26/2003US20030117847 Nonvolatile semiconductor memory device
06/26/2003US20030117164 Inspection apparatus and inspection method
06/26/2003US20030117163 Testing apparatus and method of measuring operation timing of semiconductor device
06/26/2003US20030117162 Parallel integrated circuit test apparatus and test method
06/26/2003US20030117161 Parallel integrated circuit test apparatus and test method
06/26/2003US20030117160 Needle load measuring method, needle load setting method and needle load detecting mechanism
06/26/2003US20030117159 Impedance measuring device for printed wiring board
06/26/2003US20030117156 Method of construction for high density, adaptable burn-in tool
06/26/2003US20030117146 Alternator testing method and system using timed application of load
06/26/2003US20030117144 Method and apparatus for testing laminated cores of electrical machines
06/26/2003US20030117143 Method of computing remaining battery capacity and battery pack
06/26/2003US20030117129 Low-cost tester interface module
06/26/2003US20030117126 Optical electric field or voltage sensing system
06/26/2003US20030117125 Optical electric field or voltage sensing system
06/26/2003US20030117124 Digital clock detection
06/26/2003US20030116793 System and method for characterizing the quality of the interface between a silicon and a gate insulator in a MOS device
06/26/2003US20030116763 Semiconductor integrated circuit device
06/26/2003DE19936542C2 Verfahren zur Bestimmung eines Alterungszustandes einer Gebrauchs-Batterie A method for determining the aging condition of a household battery
06/25/2003EP1321978A2 Contact structure
06/25/2003EP1321773A1 Method of detecting residual capacity of secondary battery
06/25/2003EP1320761A2 Battery monitoring
06/25/2003EP1320760A2 Device for testing contacts
06/25/2003EP1112484B1 Device for measuring work pieces using an image processing system
06/25/2003EP1112195B1 Monitoring method and monitoring device for a filter
06/25/2003CN2557957Y Portable high-voltage ciramic insulator leakage detector
06/25/2003CN2557956Y Improved leakage current detector
06/25/2003CN1425900A Portable wave detector low frequency receiving voltage sensitivity performance measurer
06/25/2003CN1112767C Flip-flop device
06/25/2003CN1112590C Picking up and putting on device of mechanic finger system for testing semiconductor device
06/25/2003CN1112589C Method for determining position of failure in electric distribution network
06/24/2003US6584592 Semiconductor testing apparatus for testing semiconductor device including built in self test circuit
06/24/2003US6584591 Timing control for input/output testability
06/24/2003US6584590 JTAG port-sharing device
06/24/2003US6584589 Self-testing of magneto-resistive memory arrays
06/24/2003US6584431 Method for monitoring electromechanical, pneumatic or hydraulic actuators, and implementing device
06/24/2003US6584417 Method and directional element for fault direction determination in a capacitance-compensated line
06/24/2003US6583973 Electrical conditioning monitoring module for a vehicular electrical system
06/24/2003US6583642 Apparatus and method for automatic determination of operating frequency with built-in self-test
06/24/2003US6583641 Method of determining integrity of a gate dielectric
06/24/2003US6583639 Reduced cost, high speed circuit test arrangement
06/24/2003US6583637 Load-control-type actuator
06/24/2003US6583636 BGA on-board tester
06/24/2003US6583634 Method of inspecting circuit pattern and inspecting instrument
06/24/2003US6583626 Method for compensating for measuring error in detecting current in an energy storing means
06/24/2003US6583614 Inspection stage and inspection apparatus having a plurality of Z axes
06/24/2003US6583612 Static event detection/protection device
06/24/2003US6583603 Back-up battery management apparatus and method for charging and testing battery cells in a string of battery cells
06/24/2003US6583414 Method of inspecting pattern and inspecting instrument
06/24/2003US6583413 Method of inspecting a circuit pattern and inspecting instrument
06/24/2003US6581486 Integrated circuit tester having a fail-safe mechanism for moving IC-chips
06/24/2003US6581462 Method and a device for detecting an internal arc in a metal-clad electrical link
06/19/2003WO2003050866A1 Probe device
06/19/2003WO2003050551A1 Automated ecological measuring system for determining the stability of technical means to the effect of external electromagnetic fields
06/19/2003WO2003050547A2 Electric field sensor
06/19/2003US20030115555 A method and apparatus for integrating boundary-scan multiplexer functionality within a pad driver
06/19/2003US20030115528 Semiconductor memory device capable of failure analysis with system in operation
06/19/2003US20030115527 Test data generating system and method to test high-speed actual operation
06/19/2003US20030115526 Method of optimizing test development for digital circuits
06/19/2003US20030115525 Restartable logic bist controller
06/19/2003US20030115524 Scan clock circuit and method therefor
06/19/2003US20030115523 Apparatus and method for analysis and troubleshooting of electronic devices
06/19/2003US20030115522 Method and program product for designing hierarchical circuit for quiescent current testing
06/19/2003US20030115521 Method and apparatus for selectively compacting test responses
06/19/2003US20030115520 Method for outputting error signals via monitor connect port and the computer system thereof
06/19/2003US20030115519 Parallel testing system for semiconductor memory devices
06/19/2003US20030115517 Microprocessor-based probe for integrated circuit testing
06/19/2003US20030115425 Method of verifying a system in which a plurality of master devices share a storage region
06/19/2003US20030115396 Reconfigurable ieee 1149.1 bus interface
06/19/2003US20030115385 I/O stress test
06/19/2003US20030115033 Flow for vector capture
06/19/2003US20030114996 System and method for identifying solder joint defects
06/19/2003US20030113946 Characteristic evaluation apparatus for insulated gate type transistors
06/19/2003US20030113944 Semiconductor device and a manufacturing method thereof
06/19/2003US20030113197 Apparatus for transferring semiconductor device in handler
06/19/2003US20030113106 Apparatus for heating and cooling semiconductor device in handler for testing semiconductor device
06/19/2003US20030113010 Method for recognizing working position of a device transfer apparatus in semiconductor test handler
06/19/2003US20030113009 System and method for confirming electrical connection defects
06/19/2003US20030113007 Inspection device for liquid crystal driving substrate
06/19/2003US20030112758 Methods and systems for managing variable delays in packet transmission
06/19/2003US20030112747 Packet transmitter unit, packet receiver unit and packet transmission system
06/19/2003US20030112696 Semiconductor memory device
06/19/2003US20030112028 Test circuit arrangement and method for testing a multiplicity of transistors
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