| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/03/2003 | US20030126508 Method and apparatus for efficiently implementing trace and/or logic analysis mechanisms on a processor chip |
| 07/03/2003 | US20030126502 Efficient word recognizer for a logic analyzer |
| 07/03/2003 | US20030126500 Method for determining an operating voltage of floating point error detection |
| 07/03/2003 | US20030126314 Method and apparatus for efficiently managing bandwidth of a debug data output port or buffer |
| 07/03/2003 | US20030125920 LSI design verification apparatus, LSI design verification method, and LSI design verification program |
| 07/03/2003 | US20030125919 Circuit modeling using topologically equivalent models |
| 07/03/2003 | US20030125903 Method and system for statistical comparison of a plurality of testers |
| 07/03/2003 | US20030125897 Semiconductor device testing apparatus having timing calibration function |
| 07/03/2003 | US20030125893 Frequency domain reflectometry system for testing wires and cables utilizing in-situ connectors, passive connectivity, cable fray detection, and live wire testing |
| 07/03/2003 | US20030124417 Battery test module |
| 07/03/2003 | US20030123520 Temperature detector |
| 07/03/2003 | US20030123309 Semiconductor integrated circuit |
| 07/03/2003 | US20030123241 Mount structure |
| 07/03/2003 | US20030123231 Dual interposer packaging for high density interconnect |
| 07/03/2003 | US20030123225 Electronic package with direct cooling of active electronic components |
| 07/03/2003 | US20030122589 Input buffer and method for voltage level detection |
| 07/03/2003 | US20030122568 Method and system for detecting an arc condition |
| 07/03/2003 | US20030122567 Probe card cooling assembly with direct cooling of active electronic components |
| 07/03/2003 | US20030122566 IC chip tester with heating element for preventing condensation |
| 07/03/2003 | US20030122561 Method and apparatus for evaluating electroluminescence properties of semiconductor materials and devices |
| 07/03/2003 | US20030122559 Method and system for conducting continuity testing on analog devices having sensitive input nodes |
| 07/03/2003 | US20030122558 System and method for measuring photovoltaic cell conductive layer quality and net resistance |
| 07/03/2003 | US20030122538 Coaxial cable for ATE with overvoltage protection |
| 07/03/2003 | US20030122536 Docking system and method for docking in automated testing systems |
| 07/03/2003 | US20030121977 Data collection system |
| 07/03/2003 | US20030121584 Process for manufacturing semiconductor device |
| 07/03/2003 | US20030121337 Environmental test chamber and a carrier for use therein |
| 07/03/2003 | DE19932849C2 Kontaktiereinrichtung zum Herstellen einer elektrisch leitfähigen Verbindung Contacting device for producing an electrically conductive connection |
| 07/03/2003 | CA2469949A1 Automated test sequence editor and engine for transformer testing |
| 07/02/2003 | EP1324232A2 Lsi design verification apparatus, method and program |
| 07/02/2003 | EP1324062A2 Method for determining the operating state of a storage battery |
| 07/02/2003 | EP1324061A2 Simulation-test procedure for an integrated circuit |
| 07/02/2003 | EP1324060A2 Test vector generation |
| 07/02/2003 | EP1324059A2 System and method for indentifying solder joint defects |
| 07/02/2003 | EP1322971A1 Re-locatable partial discharge transducer head |
| 07/02/2003 | EP1322967A1 Module for a testing device for testing printed circuit boards |
| 07/02/2003 | EP1322965A2 Manipulator for a test head with active compliance |
| 07/02/2003 | EP1322964A2 Electronic test head positioner |
| 07/02/2003 | EP1322963A2 High performance tester interface module |
| 07/02/2003 | EP1068104B1 Method for operating a restraint system connected by a bus line in case of a short circuit |
| 07/02/2003 | EP1053479A4 Electric arc monitoring systems |
| 07/02/2003 | EP0937312B1 Antenna adapter |
| 07/02/2003 | EP0890242B1 Process for determining potential shifts between electronic modules in a wire bus network |
| 07/02/2003 | EP0847139B1 Delay difference adjustment circuit and phase adjuster |
| 07/02/2003 | CN2558998Y Replaceable test casing of module |
| 07/02/2003 | CN1427954A Circuit arrangement for detecting malfunction |
| 07/02/2003 | CN1427783A Method for diagnosing switch points and switch diagnostic device |
| 07/02/2003 | CN1427660A Test seat interface circuit board |
| 07/02/2003 | CN1427523A Method for resetting battery charge state of hybrid power electric vehicle |
| 07/02/2003 | CN1427462A Correcting apparatus for use in semiconductor device testing processor |
| 07/02/2003 | CN1427461A Transfer device for semiconductor device in processor |
| 07/02/2003 | CN1427420A RAM high speed test control circuit and its testing method |
| 07/02/2003 | CN1427265A Electron product circuit signal position detecting system and its method |
| 07/02/2003 | CN1113405C Checking system |
| 07/02/2003 | CN1113404C Apparatus for automatic test equipment |
| 07/02/2003 | CN1113247C System for storing and searching named device parameter data in test system for testing semiconductor |
| 07/02/2003 | CN1113234C Process and device for detecting location of components and/or for checking position of component connections and mounting head with said device |
| 07/01/2003 | US6588004 Graphic editor for block diagram level design of circuits |
| 07/01/2003 | US6587996 Device and method for increased fault coverage using scan insertion techniques around synchronous memory |
| 07/01/2003 | US6587983 Apparatus and method of testing a semiconductor device |
| 07/01/2003 | US6587982 Method of micro-architectural implementation of interface between bist state machine and tester interface to enable bist cycling |
| 07/01/2003 | US6587981 Integrated circuit with scan test structure |
| 07/01/2003 | US6587980 Intelligent binning for electrically repairable semiconductor chips |
| 07/01/2003 | US6587976 Semiconductor device tester for measuring skew between output pins of a semiconductor device |
| 07/01/2003 | US6587975 Semiconductor test apparatus and method |
| 07/01/2003 | US6587965 System and method for single point observability of a dual-mode control interface |
| 07/01/2003 | US6587960 System model determination for failure detection and isolation, in particular in computer systems |
| 07/01/2003 | US6587811 System and method for delay line testing |
| 07/01/2003 | US6587807 Environmental condition sensor device and method |
| 07/01/2003 | US6587800 Reference timer for frequency measurement in a microprocessor |
| 07/01/2003 | US6587799 Battery pack, method for charging/discharging counting and method for setting residual capacity of the battery pack |
| 07/01/2003 | US6587258 Electro-optic electric field probe |
| 07/01/2003 | US6587050 Oscillator activated continuity testing switch |
| 07/01/2003 | US6586962 Semiconductor device |
| 07/01/2003 | US6586959 Method and apparatus for testing circuitry |
| 07/01/2003 | US6586956 Probe contract system having planarity adjustment mechanism |
| 07/01/2003 | US6586954 Probe tile for probing semiconductor wafer |
| 07/01/2003 | US6586953 Optically driven driver, optical output type voltage sensor, and IC testing equipment using these devices |
| 07/01/2003 | US6586952 Method of inspecting pattern and inspecting instrument |
| 07/01/2003 | US6586951 Displacement detecting device |
| 07/01/2003 | US6586947 Method and device for inspecting a microactuator |
| 07/01/2003 | US6586944 Apparatus for creating static in a telephone line |
| 07/01/2003 | US6586941 Battery tester with databus |
| 07/01/2003 | US6586940 Capacity estimation method, degradation estimation method and degradation estimation apparatus for lithium-ion cells, and lithium-ion batteries |
| 07/01/2003 | US6586924 Method for correcting timing for IC tester and IC tester having correcting function using the correcting method |
| 07/01/2003 | US6586921 Method and circuit for testing DC parameters of circuit input and output nodes |
| 07/01/2003 | US6586266 High performance sub-system design and assembly |
| 07/01/2003 | US6586130 Method and apparatus for determining the state of charge of a lithium-ion battery |
| 06/26/2003 | WO2003052859A1 Multiple plateau battery charging method and system to charge to the second plateau |
| 06/26/2003 | WO2003052767A1 Semiconductor testing apparatus |
| 06/26/2003 | WO2003052641A1 Method and program product for designing hierarchical circuit for quiescent current testing |
| 06/26/2003 | WO2003052437A2 Microprocessor-based probe for integrated circuit testing |
| 06/26/2003 | WO2003052436A2 Flexible interface for a test head |
| 06/26/2003 | WO2003052434A2 Method and device for the detection of non-homogeneities in the shielding behavior of shielded electric conductors |
| 06/26/2003 | WO2003052429A2 Method and apparatus for in-circuit impedance measurement |
| 06/26/2003 | WO2003017090A3 Network-based system for configuring a measurement system using programs generated based on a user specification |
| 06/26/2003 | WO2002010783A8 Test systems for wireless-communications devices |
| 06/26/2003 | US20030121012 Crosstalk verifying device |
| 06/26/2003 | US20030121011 Functional coverage analysis systems and methods for verification test suites |
| 06/26/2003 | US20030120989 Method and circuit to implement double data rate testing |