| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/10/2003 | US20030131324 Method of and apparatus for, and program for verifying equivalence between behavioral description and register transfer level description |
| 07/10/2003 | US20030131298 Test pattern compression for an integrated circuit test environment |
| 07/10/2003 | US20030131296 Wrapped core linking module for accessing system on chip test |
| 07/10/2003 | US20030131295 AC LSSD/LBIST test coverage enhancement |
| 07/10/2003 | US20030131294 Stuck-at fault scan chain diagnostic method |
| 07/10/2003 | US20030131292 Method, apparatus and computer program product for contention testing |
| 07/10/2003 | US20030130831 Non-unique results in design verification by test programs |
| 07/10/2003 | US20030129776 Method of monitoring contact hole of integrated circuit using corona charges |
| 07/10/2003 | US20030129457 Battery power source device, method for controlling the same, and method for providing address |
| 07/10/2003 | US20030128613 Semiconductor memory device capable of measuring a period of an internally produced periodic signal |
| 07/10/2003 | US20030128141 Digitizer apparatus and semiconductor testing apparatus |
| 07/10/2003 | US20030128089 Transformer for gas insulated electric apparatus |
| 07/10/2003 | US20030128064 Variable delay circuit and a testing apparatus for a semiconductor circuit |
| 07/10/2003 | US20030128052 Programmable logic array integrated circuits |
| 07/10/2003 | US20030128045 Apparatus and method for testing semiconductor storage device |
| 07/10/2003 | US20030128038 Capacitance monitoring systems |
| 07/10/2003 | US20030128037 Device and method for directly injecting a test signal into a cable |
| 07/10/2003 | US20030128036 Microprocessor-based hand-held electrical-testing system and method |
| 07/10/2003 | US20030128024 Apparatus for recognizing working position of device transfer system in semiconductor device test handler and method thereof |
| 07/10/2003 | US20030128023 Deskew fixture |
| 07/10/2003 | US20030128022 Method of testing an integrated circuit by simulation |
| 07/10/2003 | US20030127601 Method and apparatus for determining two dimensional doping profiles with SIMS |
| 07/10/2003 | US20030126915 System for detecting abrasion of brush of direct current motor |
| 07/10/2003 | US20030126901 A fertilizer product comprising particles of a fertilizer in intimate contact with a copolymer of unsaturated dicarboxylic acids, salts, and anhydrides that facilitate nutrient absorption; biodegradable and water soluble |
| 07/10/2003 | US20030126735 Probe for a wire inserting detection jig |
| 07/09/2003 | EP1326286A1 Photovoltaic solar module and operating method |
| 07/09/2003 | EP1326085A2 Apparatus for inspecting electric component for inverter circuit |
| 07/09/2003 | EP1326084A2 Method for detecting the condition of batteries |
| 07/09/2003 | EP1326083A1 System for detecting abrasion of brush of direct current motor |
| 07/09/2003 | EP1326082A1 Integrated circuit with configurable scan path |
| 07/09/2003 | EP1326080A2 Voltage sensor for gas insulated electric apparatus |
| 07/09/2003 | EP1326079A2 Probe card |
| 07/09/2003 | EP1326078A2 Testing fixture |
| 07/09/2003 | EP1325481A1 Apparatus and circuit for use with capacitive presence detection systems |
| 07/09/2003 | EP1171776A4 Circuit with improved dynamic response for measuring current in pulse width modulated amplifiers |
| 07/09/2003 | EP1081499B1 Means for estimating charged state of battery and method for estimating degraded state of battery |
| 07/09/2003 | EP0848826B1 Condition tester for a battery |
| 07/09/2003 | EP0833348B1 Method and circuit for checking multilevel programming of floating-gate nonvolatile memory cells, particlarly flash cells |
| 07/09/2003 | CN2559988Y Iron leakage measuring meter |
| 07/09/2003 | CN1428888A Operation method of cell residual volume and combined cell |
| 07/09/2003 | CN1428833A Equipment for creating new reference horizontal plane of manufacturing tool plate of semiconductor |
| 07/09/2003 | CN1428788A Semiconductor memory |
| 07/09/2003 | CN1428611A Multifunctional integrated power virtual test analysis method and its test analysis apparatus |
| 07/09/2003 | CN1114227C Parameters analyzing system for semiconductor |
| 07/09/2003 | CN1114179C Circuit for monitoring light signal |
| 07/09/2003 | CN1114109C System and method for testing hard disk drive |
| 07/08/2003 | US6591389 Testing system for circuit board self-test |
| 07/08/2003 | US6591388 High speed sink/source register to reduce level sensitive scan design test time |
| 07/08/2003 | US6591387 Communication equipment with boundary scan elements |
| 07/08/2003 | US6591386 Method to prevent inadvertent test mode entry |
| 07/08/2003 | US6591380 Means for comparing sent data on the transmission side of a network in a highly reliable distributed system |
| 07/08/2003 | US6591369 System and method for communicating with an integrated circuit |
| 07/08/2003 | US6591213 Systems for providing zero latency, non-modulo looping and branching of test pattern data for automatic test equipment |
| 07/08/2003 | US6591211 Testing unit and self-evaluating device |
| 07/08/2003 | US6591207 Semiconductor production system |
| 07/08/2003 | US6591205 Pseudo arbitrary waveform generator |
| 07/08/2003 | US6591203 Fault locator for radial sub-transmission and distribution systems |
| 07/08/2003 | US6591200 Method and system for performance testing of rotating machines |
| 07/08/2003 | US6591167 Control unit for vehicle and total control system therefor |
| 07/08/2003 | US6590929 Method and system for run-time logic verification of operations in digital systems |
| 07/08/2003 | US6590815 Semiconductor memory device and method for its test |
| 07/08/2003 | US6590799 On-chip charge distribution measurement circuit |
| 07/08/2003 | US6590703 Optical system for scanning microscope |
| 07/08/2003 | US6590509 Data recovery through event based equivalent time sampling |
| 07/08/2003 | US6590479 Integrated microcontact pin and method for manufacturing the same |
| 07/08/2003 | US6590412 Circuit and method for detecting transient voltages on a dc power supply rail |
| 07/08/2003 | US6590410 Photosensors for testing an intergrated circuit |
| 07/08/2003 | US6590409 Charged particle imaging system may be used to perform package- level failure analysis by providing a Capacitive Coupling Voltage Contrast image of a portion of the semiconductor package |
| 07/08/2003 | US6590407 Apparatus for disabling and re-enabling access to IC test functions |
| 07/08/2003 | US6590406 Apparatus for inspecting display board or circuit board |
| 07/08/2003 | US6590405 CMOS integrated circuit and timing signal generator using same |
| 07/08/2003 | US6590398 Fixture-less bare board tester |
| 07/08/2003 | US6590383 Contact arm and electronic device testing apparatus using the same |
| 07/08/2003 | US6590382 Signal pin tester for AC defects in integrated circuits |
| 07/08/2003 | US6590381 Contactor holding mechanism and automatic change mechanism for contactor |
| 07/08/2003 | US6590377 Narrow band frequency detection circuit |
| 07/08/2003 | US6590374 Terminator unit for wiring networks |
| 07/08/2003 | US6590373 Regenerative load apparatus and load test method |
| 07/08/2003 | US6589860 System and method for calibrating electron beam defect inspection tool |
| 07/08/2003 | US6589063 Electric contact device for establishing an improved contact with contactors of other device |
| 07/08/2003 | US6588274 Self-diagnosing circuit for vibrating gyroscope |
| 07/08/2003 | CA2310092C Method and system for testing a transmission line in a non-addressable network for continuity |
| 07/03/2003 | WO2003054565A1 Compact ate with timestamp system |
| 07/03/2003 | WO2003054564A2 Probe card covering system and method |
| 07/03/2003 | WO2003054563A1 Scan vector support for event based test system |
| 07/03/2003 | WO2003054562A2 Method for checking the electrical safety of a household appliance, and corresponding household appliance |
| 07/03/2003 | WO2003054561A1 Automated test sequence editor and engine for transformer testing |
| 07/03/2003 | WO2003054560A1 Input buffer and method for voltage level detection |
| 07/03/2003 | WO2003036306A3 Testing circuits on substrates |
| 07/03/2003 | WO2003014751A3 Method and apparatus for evaluating a set of electronic components |
| 07/03/2003 | WO2002075329A3 Support member assembly for electroconductive contact members |
| 07/03/2003 | US20030126567 Apparatus, method and pattern for evaluating semiconductor device characteristics |
| 07/03/2003 | US20030126534 Distributed interface for parallel testing of multiple devices using a single tester channel |
| 07/03/2003 | US20030126533 Testing of circuit modules embedded in an integrated circuit |
| 07/03/2003 | US20030126532 Integrated circuit |
| 07/03/2003 | US20030126531 Deterministic hardware reset for FRC machine |
| 07/03/2003 | US20030126530 Time shift circuit for functional and AC parametric test |
| 07/03/2003 | US20030126526 On-board testing circuit and method for improving testing of integrated circuits |
| 07/03/2003 | US20030126525 Semiconductor device, method of testing the same and electronic instrument |
| 07/03/2003 | US20030126524 Semiconductor storage unit |