| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/22/2003 | US6598177 Monitoring error conditions in an integrated circuit |
| 07/22/2003 | US6598004 Jitter measurement apparatus and its method |
| 07/22/2003 | US6598002 Method and device for testing electronic equipment |
| 07/22/2003 | US6597805 Visual inspection method for electronic device, visual inspecting apparatus for electronic device, and record medium for recording program which causes computer to perform visual inspecting method for electronic device |
| 07/22/2003 | US6597753 Delay clock generating apparatus and delay time measuring apparatus |
| 07/22/2003 | US6597657 Unit and method for duplex call control for SVC connection |
| 07/22/2003 | US6597608 Coding cell of nonvolatile ferroelectric memory device and operating method thereof, and column repair circuit of nonvolatile ferroelectric memory device having the coding cell and method for repairing column |
| 07/22/2003 | US6597193 Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current |
| 07/22/2003 | US6597192 Test method of semiconductor device |
| 07/22/2003 | US6597191 Semiconductor integrated circuit device |
| 07/22/2003 | US6597188 Ground land for singulated ball grid array |
| 07/22/2003 | US6597184 Method and apparatus for electromagnetic emissions testing |
| 07/22/2003 | US6597180 Fault point location system |
| 07/22/2003 | US6597165 Compare path bandwidth control for high performance automatic test systems |
| 07/22/2003 | US6597164 Test bus circuit and associated method |
| 07/22/2003 | US6597162 PLL semiconductor device with testability, and method and apparatus for testing same |
| 07/22/2003 | US6596980 Method and apparatus to measure statistical variation of electrical signal phase in integrated circuits using time-correlated photon counting |
| 07/22/2003 | US6595798 Test fixture for testing a multi-port voice processing card and the like |
| 07/22/2003 | US6595794 Electrical contact method and apparatus in semiconductor device inspection equipment |
| 07/17/2003 | WO2003058768A1 Socket for inspection |
| 07/17/2003 | WO2003058705A1 Evaluation circuit for an anti-fuse |
| 07/17/2003 | WO2003058630A1 Multi-mode synchronous memory device and method of operating and testing same |
| 07/17/2003 | WO2003058516A2 Verification test method for programmable logic devices |
| 07/17/2003 | WO2003058264A1 Cooling assembly with direct cooling of active electronic components |
| 07/17/2003 | WO2003058263A1 Event processing apparatus and method for high speed event based test system |
| 07/17/2003 | WO2003012466A3 Method and error location in branched low voltage and medium voltage networks and evaluation circuit used thereof |
| 07/17/2003 | WO2001048471A3 Electro-optic system controller and method of operation |
| 07/17/2003 | US20030135804 In-chip monitoring system to monitor input/output of functional blocks |
| 07/17/2003 | US20030135803 Scan cell circuit and scan chain consisting of same for test purpose |
| 07/17/2003 | US20030135802 Verification test method for programmable logic devices |
| 07/17/2003 | US20030135777 Enable propagation controller |
| 07/17/2003 | US20030135343 Methods and apparatus for testing electronic devices |
| 07/17/2003 | US20030134442 Test structure and method for flash memory tunnel oxide quality |
| 07/17/2003 | US20030134441 Micro probing tip made by micro machine method |
| 07/17/2003 | US20030133778 Picking apparatus for semiconductor device test handler |
| 07/17/2003 | US20030133555 Apparatus and method for network-initiated real-time multi-party communications |
| 07/17/2003 | US20030133491 LED junction temperature tester |
| 07/17/2003 | US20030133350 Semiconductor memory device |
| 07/17/2003 | US20030132780 Reception line break detection apparatus |
| 07/17/2003 | US20030132775 Test apparatus for an oscillation circuit incorporated in IC |
| 07/17/2003 | US20030132774 Analogue signal testing system for integrated circuit |
| 07/17/2003 | US20030132772 Piercer combined prober for CU interconnect wafer-level preliminary electrical test |
| 07/17/2003 | US20030132771 IC socket and spring means of IC socket |
| 07/17/2003 | US20030132769 Probe card for high speed testing |
| 07/17/2003 | US20030132767 Membrane probing system |
| 07/17/2003 | US20030132757 Cable-testing adapter |
| 07/17/2003 | US20030132754 Test circuit arrangement and a method for testing a plurality of electric components |
| 07/17/2003 | US20030132753 Circuit breaker with integral testing unit |
| 07/17/2003 | US20030132752 Method and apparatus for automated relay testing |
| 07/17/2003 | US20030132489 Determination of whether integrated circuit is acceptable or not in wafer-level burn-in test |
| 07/17/2003 | DE10224447C1 Identification and marshaling unit for coaxial cables used for e.g. pay or satellite TV, sends coded pulse signals between isolated transmitter and receiver |
| 07/16/2003 | EP1328052A2 Battery power source device, method for controlling the same, and method for providing address |
| 07/16/2003 | EP1328016A2 Wafer-level test of integrated circuits |
| 07/16/2003 | EP1327890A2 Integrated circuit defect detection system |
| 07/16/2003 | EP1327249A2 Method to descramble the data mapping in memory circuits |
| 07/16/2003 | EP1327156A1 Method for customizing an integrated circuit element |
| 07/16/2003 | EP1327155A1 Device for testing an electromechanical apparatus and method for determining means constituting such a device |
| 07/16/2003 | EP1327154A1 Testing system in a circuit board manufacturing line for automatic testing of circuit boards |
| 07/16/2003 | EP1118938B1 A field programmable gate array with integrated debugging facilities |
| 07/16/2003 | EP0870218B1 Method and system for assessing a measurement procedure and measurement-induced uncertainties on a batchwise manufacturing process of discrete products |
| 07/16/2003 | CN2561096Y Semiconductor material electric signal measuring apparatus |
| 07/16/2003 | CN2560954Y Crystal plate measuring carrying-frame |
| 07/16/2003 | CN2560953Y Capacitance withstand voltage testing cassette |
| 07/16/2003 | CN2560952Y Flash line-failure indicator |
| 07/16/2003 | CN1430768A Method and device for examining pre-determined area of printed circuit board |
| 07/16/2003 | CN1430318A Power distibution circuit fault location and isolation method and device |
| 07/16/2003 | CN1430256A Device and method for identifying working position of device conveying system in semiconductor device testing treatment machine |
| 07/16/2003 | CN1430066A Method and device for detecting circuit board signal transmission quality |
| 07/16/2003 | CN1115035C Emergency telephone with automatic low-battery signaling |
| 07/15/2003 | US6594804 Determining verification coverage using circuit properties |
| 07/15/2003 | US6594802 Method and apparatus for providing optimized access to circuits for debug, programming, and test |
| 07/15/2003 | US6594797 Methods and circuits for precise edge placement of test signals |
| 07/15/2003 | US6594789 Input data capture boundary cell connected to target circuit output |
| 07/15/2003 | US6594788 Method of analyzing a relief of failure cell in a memory and memory testing apparatus having a failure relief analyzer using the method |
| 07/15/2003 | US6594611 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture |
| 07/15/2003 | US6594610 Fault emulation testing of programmable logic devices |
| 07/15/2003 | US6594609 Scan vector support for event based test system |
| 07/15/2003 | US6594604 S-parameter measurement system for wideband non-linear networks |
| 07/15/2003 | US6594599 System, work station and method for testing a product and generating a statistical model that predicts the processibility of making like products |
| 07/15/2003 | US6594594 Method for unique determination of FET equivalent circuit model parameters |
| 07/15/2003 | US6594186 Semiconductor memory and burn-in method for the same |
| 07/15/2003 | US6593921 System and method for adjusting image quality of liquid crystal display |
| 07/15/2003 | US6593767 Leak detection method for electrical equipment |
| 07/15/2003 | US6593765 Testing apparatus and testing method for semiconductor integrated circuit |
| 07/15/2003 | US6593762 Apparatus for testing electronic components |
| 07/15/2003 | US6593761 Test handler for semiconductor device |
| 07/15/2003 | US6593758 Built-in test system for aircraft indication switches |
| 07/15/2003 | US6593751 Motor insulation fault detection by sensing ground leak current |
| 07/15/2003 | US6593750 Interface for cable testing |
| 07/15/2003 | US6593156 Non-destructive inspection method |
| 07/15/2003 | US6591482 Assembly methods for miniature circuit breakers with electronics |
| 07/15/2003 | CA2204195C An adaptive, on line, statistical method and apparatus for motor bearing fault detection by passive motor current monitoring |
| 07/10/2003 | WO2003056623A1 Method and apparatus for inspecting and packing chips |
| 07/10/2003 | WO2003056566A1 Semiconductor storage device, test method therefor, and test circuit therefor |
| 07/10/2003 | WO2003056350A1 A method for on-line calibration of low accuracy voltage sensor through communication bus |
| 07/10/2003 | WO2003034492A3 Apparatus and methods for semiconductor ic failure detection |
| 07/10/2003 | WO2003021277A3 Method and apparatus for calibration and validation of high performance dut power supplies |
| 07/10/2003 | WO2002097946A3 Back-up power system |
| 07/10/2003 | WO2002052635A3 Characterizing semiconductor wafers with enhanced s parameter contour mapping |
| 07/10/2003 | US20030131327 Hierarchical test circuit structure for chips with multiple circuit blocks |