| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/30/2003 | CN1116613C Method and apparatus for probing, testing, burning, repairing and programming of integrated circuits in closed environment using single apparatus |
| 07/29/2003 | US6601232 Apparatus and method for creating and documenting procedures |
| 07/29/2003 | US6601229 Client/server behavioral modeling and testcase development using VHDL for improved logic verification |
| 07/29/2003 | US6601228 Method for modifying an integrated circuit |
| 07/29/2003 | US6601218 Semiconductor integrated circuit device |
| 07/29/2003 | US6601205 Method to descramble the data mapping in memory circuits |
| 07/29/2003 | US6601204 Pattern generating method, pattern generator using the method, and memory tester using the pattern generator |
| 07/29/2003 | US6601203 Test program generation system and test program generation method for semiconductor test apparatus |
| 07/29/2003 | US6601202 Circuit configuration with deactivatable scan path |
| 07/29/2003 | US6601201 Method and apparatus for displaying test results and recording medium |
| 07/29/2003 | US6601200 Integrated circuit with a VLSI chip control and monitor interface, and apparatus and method for performing operations on an integrated circuit using the same |
| 07/29/2003 | US6601199 Memory-embedded LSI |
| 07/29/2003 | US6601198 Semiconductor integrated circuit |
| 07/29/2003 | US6601189 System and method for communicating with an integrated circuit |
| 07/29/2003 | US6601003 Operating efficiency of a nonvolatile memory |
| 07/29/2003 | US6601001 Fault-detection for power lines |
| 07/29/2003 | US6600723 Process for testing and ensuring the availability of a networked system |
| 07/29/2003 | US6600685 Semiconductor memory device having test mode |
| 07/29/2003 | US6600684 Semiconductor storage device |
| 07/29/2003 | US6600362 Method and circuits for parallel sensing of current in a field effect transistor (FET) |
| 07/29/2003 | US6600359 Circuit having a long device configured for testing |
| 07/29/2003 | US6600334 Force applying probe card and test system for semiconductor wafers |
| 07/29/2003 | US6600333 Method and test structure for characterizing sidewall damage in a semiconductor device |
| 07/29/2003 | US6600332 Tablet with short testing function and method of measuring |
| 07/29/2003 | US6600329 Method for inspecting electrical properties of a wafer and apparatus therefor |
| 07/29/2003 | US6600325 Method and apparatus for probing an integrated circuit through capacitive coupling |
| 07/29/2003 | US6600293 Battery control system |
| 07/29/2003 | US6599835 Testing dielectric and barrier layers for integrated circuit interconnects |
| 07/29/2003 | US6599764 Isolation testing scheme for multi-die packages |
| 07/29/2003 | CA2013552C Portable device for the detection of partial discharges in energized cables and/or systems |
| 07/24/2003 | WO2003061166A1 Enable propagation controller |
| 07/24/2003 | WO2003061126A1 Delay circuit and test apparatus |
| 07/24/2003 | WO2003061055A1 Method and device for estimating remaining capacity of secondary cell, battery pack system, and electric vehicle |
| 07/24/2003 | WO2003061054A1 Method for estimating polarization voltage of secondary cell, method and device for estimating remaining capacity of secondary cell, battery pack system, and electric vehicle |
| 07/24/2003 | WO2003061052A1 Multiple plateau battery charging method and system to fully charge the first plateau |
| 07/24/2003 | WO2003060593A2 Multi-beam polygon scanning system |
| 07/24/2003 | WO2003060536A1 Electric motor monitoring system |
| 07/24/2003 | WO2003060535A1 Controller based hardware device and method for setting the same |
| 07/24/2003 | WO2003060534A2 Integrated circuit with self-testing circuit |
| 07/24/2003 | WO2003060533A1 Device for testing lsi to be measured, jitter analyzer, and phase difference detector |
| 07/24/2003 | WO2003060532A1 Leak detection apparatus and motor car |
| 07/24/2003 | WO2003033749A8 Matrix element precharge voltage adjusting apparatus and method |
| 07/24/2003 | WO2003021282A3 Module, error-tolerant system and diagnostic method |
| 07/24/2003 | WO2003021281A3 Semiconductor wafer positioning system and method |
| 07/24/2003 | WO2003017353A3 Providing photonic control over wafer borne semiconductor devices |
| 07/24/2003 | WO2002043463A3 Systems and methods for generating hardware description code |
| 07/24/2003 | US20030140295 Integrated circuit having electrically isolatable test circuitry |
| 07/24/2003 | US20030140294 Method and apparatus for determining fault sources for device failures |
| 07/24/2003 | US20030140293 Pseudo random optimized built-in self-test |
| 07/24/2003 | US20030140291 Method and apparatus for providing JTAG functionality in a remote server management controller |
| 07/24/2003 | US20030140290 Synchronous semiconductor device, and inspection system and method for the same |
| 07/24/2003 | US20030140289 Dual port RAM |
| 07/24/2003 | US20030140287 N-squared algorithm for optimizing correlated events |
| 07/24/2003 | US20030140286 Pulse generation circuit and semiconductor tester that uses the pulse generation circuit |
| 07/24/2003 | US20030139906 Revising a test suite using diagnostic efficacy evaluation |
| 07/24/2003 | US20030139891 Systems and methods for multiple winding impulse frequency response analysis test |
| 07/24/2003 | US20030139839 Method of sorting a group of integrated circuit devices for those devices requiring special testing |
| 07/24/2003 | US20030138980 Method of temporarily securing a die to a burn-in carrier |
| 07/24/2003 | US20030137862 Reversed memory module socket, motherboard and test system including same, and method of modifying motherboard |
| 07/24/2003 | US20030137341 Method and system for charge pump active gate drive |
| 07/24/2003 | US20030137340 Semiconductor integrated circuit and a burn-in method thereof |
| 07/24/2003 | US20030137339 Switching device provided with integrated test means |
| 07/24/2003 | US20030137337 Semiconductor integrated circuit and a burn-in method thereof |
| 07/24/2003 | US20030137319 Circuit for detecting leak from power supply |
| 07/24/2003 | US20030137318 Methods and systems employing infrared thermography for defect detection and analysis |
| 07/24/2003 | US20030137317 Test systems for semiconductor devices |
| 07/24/2003 | US20030137309 Method for discriminating abnormal current including arc current in AC load circuit and apparatus for executing the same |
| 07/24/2003 | US20030137308 Method and system for multi-port synchronous high voltage testing |
| 07/24/2003 | US20030137305 Methods for evaluating and fabricating semiconductor device and apparatus and program for evaluating the same |
| 07/24/2003 | US20030137303 Device for determining charge condition of electric storage battery connected to a consumer |
| 07/24/2003 | US20030137289 Comparator circuit for differential swing comparison and common-mode voltage comparison |
| 07/24/2003 | US20030137277 Battery and maintenance service system for power supply device |
| 07/24/2003 | US20030136840 Method and system for managing integrated circuit test programs using bar codes |
| 07/24/2003 | US20030136813 Temporary device attach structure for test and burn in of microjoint interconnects and method for fabricating the same |
| 07/24/2003 | CA2369352A1 Partial discharge coupler |
| 07/23/2003 | EP1329734A1 Diagnostic test system |
| 07/23/2003 | EP1329733A2 Arcing fault detection system |
| 07/23/2003 | EP1329731A2 Driver circuit |
| 07/23/2003 | EP1328821A2 Measurement of fuel cell impedance |
| 07/23/2003 | EP1328820A1 Testing system in a circuit boardmanufacturing line for automatic testing of circuit boards |
| 07/23/2003 | EP1328819A1 Method of selecting electrolytes for high capacity electric energy accumulators |
| 07/23/2003 | EP1068660B1 Process and apparatus for modulating terminal voltage of battery |
| 07/23/2003 | EP1018023A4 Probe card and system for testing wafers |
| 07/23/2003 | EP0760954B1 Phase noise detector |
| 07/23/2003 | CN2562194Y Pivot device of display screen |
| 07/23/2003 | CN1431693A Wafer class probe card and its mfg. method |
| 07/23/2003 | CN1431521A Method for measuring electric quantity of lithium ion batteries and its device |
| 07/23/2003 | CN1431520A Automatic test system for laser diode |
| 07/23/2003 | CN1431519A Transformer for gas insulated electrical appts. |
| 07/23/2003 | CN1115721C Semiconductor device testing appts. |
| 07/23/2003 | CN1115567C parallel driver circuit for electronic load simulator |
| 07/23/2003 | CN1115566C Partial discharge detector of gas-insulated appts. |
| 07/23/2003 | CN1115565C Output resistance tester for driver integrated circuit and testing method thereof |
| 07/22/2003 | US6598212 Delay circuit, testing apparatus, and capacitor |
| 07/22/2003 | US6598194 Test limits based on position |
| 07/22/2003 | US6598193 System and method for testing component IC chips |
| 07/22/2003 | US6598192 Method and apparatus for testing an integrated circuit |
| 07/22/2003 | US6598191 Verification of asynchronous boundary behavior |
| 07/22/2003 | US6598187 Semiconductor integrated circuit device with test circuit |
| 07/22/2003 | US6598182 Electromigration and extrusion monitor and control system |