Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2003
08/06/2003CN2565027Y On line anti-theft prewarning system for rural electric network distributing equipment
08/06/2003CN1435033A Method and system for communication of data via optimum data path in network
08/06/2003CN1434981A Semiconductor device inspection system
08/06/2003CN1434918A CAM reference for inspection of multi-color and contour images
08/06/2003CN1434303A Device for knowing charge state of accumulator connected to user
08/06/2003CN1434302A IC tester using optical driving type driver and optical output voltage sensor
08/06/2003CN1434301A Method for correcting test arm of pick and place machine and regulator thereof
08/06/2003CN1117391C Rotary assembly of module integrated circuit processor
08/05/2003US6604058 Semiconductor device testing apparatus and method for testing semiconductor device
08/05/2003US6603875 Pattern inspection with a simple mechanical apparatus following a simple procedure are provided. A recording medium which records a pattern inspection program for carrying out the pattern inspection is also provided.
08/05/2003US6603414 Method for digital compression of characters
08/05/2003US6603328 Semiconductor integrated circuit
08/05/2003US6603327 Test module
08/05/2003US6603326 Testing integrated circuits with integrated power transistors
08/05/2003US6603325 Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor
08/05/2003US6603322 Probe card for high speed testing
08/05/2003US6603321 Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring
08/05/2003US6603318 Method of determining when electrode pads are unsuitable for use by detecting relative humidity
08/05/2003US6603316 Semiconductor wafer test system
08/05/2003US6603303 Method and apparatus for testing integrated circuit
08/05/2003US6603302 Circuit testers
08/05/2003US6603287 Device for determining physical quantity of battery pack
08/05/2003US6602772 Method for non-contact stress evaluation of wafer gate dielectric reliability
08/05/2003US6602084 Open top IC socket
08/05/2003US6601365 Component handling apparatus and method of handling the same
08/05/2003CA2333619C Means for estimating charged state of battery and method for estimating degraded state of battery
08/05/2003CA2221404C A method and device for correcting misalignment between test needles and test points during electrical testing of printed circuit boards, particularly during multiple tests
08/01/2003CA2418430A1 Bit error rate tester
07/2003
07/31/2003WO2003063234A1 Static eliminating mechanism for table, and tester
07/31/2003WO2003063020A1 Systems and methods for multiple winding impulse frequency response analysis test
07/31/2003WO2003062845A2 An in-chip monitoring system to monitor input/output of functional blocks
07/31/2003WO2003062844A1 Method and device for optically testing semiconductor elements
07/31/2003WO2003062843A1 Tester
07/31/2003WO2003062836A1 Probe with trapezoidal contactor and device based on application thereof, and method of producing them
07/31/2003WO2003062813A1 Lithium-ion cell voltage telemetry circuit
07/31/2003WO2003062809A1 Infrared thermography for defect detection and analysis
07/31/2003WO2003046925A3 Built-in self-testing for double data rate input/output interface
07/31/2003WO2003040852A3 Concept for compensating external disturbance variables on physical functional parameters in integrated circuits
07/31/2003WO2003038455A3 Method and device for phase calculation from attenuation values using a hilbert transform for reflectometric measurements in the frequency domain
07/31/2003US20030145293 Analytical simulator and analytical simulation method and program
07/31/2003US20030145292 System and method for product yield prediction
07/31/2003US20030145290 System for controlling external models used for verification of system on a chip (SOC) interfaces
07/31/2003US20030145286 Self-contained embedded test design envoronment and environment setup utility
07/31/2003US20030145268 Test pattern generator and test pattern generation
07/31/2003US20030145265 Scanable R-S glitch latch for dynamic circuits
07/31/2003US20030145264 Method for scan testing and clocking dynamic domino circuits in VLSI systems using level sensitive latches and edge triggered flip floops
07/31/2003US20030145263 VLSI chip test power reduction
07/31/2003US20030145261 Test-facilitating circuit using built-in self test circuit
07/31/2003US20030144828 Hub array system and method
07/31/2003US20030144817 Smart module and adapter apparatus
07/31/2003US20030144810 Methods and apparatus for data analysis
07/31/2003US20030144806 Network diagnostic apparatus
07/31/2003US20030144805 Thrust ripple measuring apparatus and method in linear motor
07/31/2003US20030143763 System and method for split package power and rotational burn-in of a microelectronic device
07/31/2003US20030143762 Interconnect structure
07/31/2003US20030142861 Apparatus and method for projecting an alignment image
07/31/2003US20030142737 Fast bit-error-rate (BER) test
07/31/2003US20030142577 Synchronous semiconductor memory device with a plurality of memory banks and method of controlling the same
07/31/2003US20030142566 Semiconductor memory device capable of performing high-frequency wafer test operation
07/31/2003US20030142546 System for programming verification
07/31/2003US20030142088 Method and system for precharging OLED/PLED displays with a precharge latency
07/31/2003US20030141892 Digital method of measuring driver slew rates for reduced test time
07/31/2003US20030141891 Digital method of measuring driver slew rates for reduced test time
07/31/2003US20030141890 Apparatus and method for the parallel and independent testing of voltage-supplied semiconductor devices
07/31/2003US20030141887 Integrated circuit testing device with improved reliability
07/31/2003US20030141886 Semiconductor test board for fine ball pitch ball grid array package
07/31/2003US20030141884 Contactor having conductive particles in a hole as a contact electrode
07/31/2003US20030141879 PICA system timing measurement & calibration
07/31/2003US20030141878 Continuity test unit and system
07/31/2003US20030141877 Broadside compare with retest on fail
07/31/2003US20030141875 Method and apparatus for testing cables
07/31/2003US20030141873 Driver circuit
07/31/2003US20030141861 Probe station
07/31/2003US20030141860 Automatic integrated circuit testing system and device using an integrative computer and method for the same
07/31/2003US20030141848 Charge/discharge protection circuit with latch circuit for protecting a charge control FET from overheating
07/31/2003US20030141588 Semiconductor device
07/31/2003US20030141572 Apparatus and method for investigating semiconductors wafer
07/31/2003DE19549647C2 High-density packaging multi-chip semiconductor module
07/31/2003CA2393717A1 Composite eye diagrams
07/30/2003EP1331521A2 A method and system for ordering a consumable for a device
07/30/2003EP1331487A1 Method and device generating integrated circuit test programs
07/30/2003EP1331486A1 Testing system for a domestic appliance
07/30/2003EP1330333A1 Method of retrofitting a probe station
07/30/2003EP1188062B1 System for wireless testing of integrated circuits
07/30/2003EP1145355B1 Method and arrangement for measuring current on a storage battery cell
07/30/2003CN2563588Y Megameter casing
07/30/2003CN2563587Y Earthquake underwell explosion test instrument
07/30/2003CN2563586Y Remote transfer automatic alarm device for accient cut-off
07/30/2003CN1433585A Circuit breaker remote service system
07/30/2003CN1433059A Semiconductor device test system
07/30/2003CN1433057A Directly connected interface unit for memory test machine and integrated circuit sorter
07/30/2003CN1432819A Charge state display for accumulator connected in electric appliance
07/30/2003CN1432818A Dual in-line package type double-contact text fixture
07/30/2003CN1432817A Circuit board detection method
07/30/2003CN1432816A PDA mainboard producing and testing process
07/30/2003CN1432815A Electronic load simulator with tested current loop impedance
07/30/2003CN1116709C Assembling device for semiconductor components
07/30/2003CN1116621C Liquid-crystal display panel and method of inspecting liquid-crystal display panel
07/30/2003CN1116615C Device and method for estimating remaining life of battery
07/30/2003CN1116614C Sunlight simulator with pulsive xenon lampand three freedom paraboloid for scattered reflection
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