Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2003
08/14/2003US20030151962 Semiconductor integrated circuit device
08/14/2003US20030151961 Semiconductor memory device having internal circuit screening function
08/14/2003US20030151934 Disconnection detecting circuit detecting disconnection based on a change in detection signal
08/14/2003US20030151883 Printed circuit board assembly for automatic test equipment
08/14/2003US20030151587 Active matrix substrate
08/14/2003US20030151427 Programmable driver for an I/O pin of an integrated circuit
08/14/2003US20030151421 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
08/14/2003US20030151418 Low voltage circuit tester
08/14/2003US20030151413 Diagnostic wiring verification tester
08/14/2003US20030151412 Partial discharge detection test link, partial discharge detection system and methods for detecting partial discharge on a power cable
08/14/2003US20030151047 Semiconductor reliability test chip
08/14/2003DE19581540C2 Hochgeschwindigkeits- Testmusterübertragungsvorrichtung für eine Halbleitertestvorrichtung Speed ​​test pattern transfer apparatus for a semiconductor test apparatus
08/14/2003CA2474504A1 Method and apparatus for testing assisted position location capable devices
08/13/2003EP1335484A2 Method for inspecting relay contacts for contact weld in battery power source device
08/13/2003EP1335474A2 Device for protection of electric and electronic components of a vehicle from overvoltages
08/13/2003EP1335210A2 High speed interconnect circuit test method and apparatus
08/13/2003EP1335209A1 Probe driving method, and probe apparatus
08/13/2003EP1335208A2 Method and apparatus for the digital and analog triggering
08/13/2003EP1335207A2 Method and device for capturing a signal
08/13/2003EP1334416A2 Circuit arrangement and a method for detecting an undesired attack on an integrated circuit
08/13/2003EP1334370A2 Method for locating defects and measuring resistance in a test structure
08/13/2003EP1183545B1 Circuit with built-in self-tester
08/13/2003CN2566451Y Crystal chip tester
08/13/2003CN2566279Y Cell property testing fixed clip
08/13/2003CN2566278Y Improved testing device structure
08/13/2003CN2566277Y Box lid type electronic experiment car
08/13/2003CN2566273Y 探针构造 Probe structure
08/13/2003CN1436307A Method and apparatus for testing signal paths between integrated circuit wafer and wafer tester
08/13/2003CN1436301A Optical inspection system
08/13/2003CN1435921A Continuity testing unit and system
08/13/2003CN1435890A Semiconductor storage apparatus
08/13/2003CN1435889A Screen read-only memory testing element and method
08/13/2003CN1435843A Synchronous semiconductor memory apparatus with plurality of memory sets and method for controlling same
08/13/2003CN1435695A Method for testing circuit board interconnction line based on boundary scanning device
08/13/2003CN1435694A Current measuring method and arrangement
08/13/2003CN1118112C Socket for electric component
08/13/2003CN1118100C Monobrid semiconductor IC device and checking method thereof
08/13/2003CN1118099C Method for mounting intermediate connecting element to terminal of electronic module
08/13/2003CN1118072C 半导体装置 Semiconductor device
08/13/2003CN1118071C Test method of high speed memory devices in whick limit conditions for clock signals are difined
08/13/2003CN1118024C Processor with built-in self-checking function
08/13/2003CN1117989C Method of generating test mode for integrated circuit
08/13/2003CN1117972C Method and device for testing color purity drift of color kinescope
08/12/2003US6606720 Scan structure for CMOS storage elements
08/12/2003US6606583 Real-time error-suppression method and apparatus therefor
08/12/2003US6606575 Cross-correlation timing calibration for wafer-level IC tester interconnect systems
08/12/2003US6605966 Apparatus and method for testing crossover voltage of differential signals
08/12/2003US6605956 Device and method for testing integrated circuit dice in an integrated circuit module
08/12/2003US6605953 Method and apparatus of interconnecting with a system board
08/12/2003US6605948 Test system for a gas turbine engine control programming plug
08/12/2003US6604953 Anisotropically conductive sheet and connector
08/12/2003US6604431 Apparatus and method for fixing and checking connections of piezoelectric sensor, actuator, and disk unit
08/08/2003CA2417695A1 Diagnostic wiring verification tester
08/07/2003WO2003065443A2 Probe station
08/07/2003WO2003065442A1 Arrangement structure of inspection devices
08/07/2003WO2003065441A1 Prober
08/07/2003WO2003065147A2 Method and program product for creating and maintaining self-contained design environment
08/07/2003WO2003065065A1 Testing of circuit with plural clock domains
08/07/2003WO2003065064A2 Predictive, adaptive power supply for an integrated circuit under test
08/07/2003WO2003065063A2 Picosecond imaging circuit analysis(pica)timing system measurement and calibration
08/07/2003WO2003019208A3 Check circuit
08/07/2003US20030149949 Verification of embedded test structures in circuit designs
08/07/2003US20030149948 Circuit configuration of a chip with a graphic controller integrated and method for testing the same
08/07/2003US20030149927 Low hardware overhead scan based 3-weight weighted random BIST architectures
08/07/2003US20030149926 Single scan chain in hierarchiacally bisted designs
08/07/2003US20030149925 Method and apparatus for implementing enhanced LBIST diagnostics of intermittent failures
08/07/2003US20030149924 Method and apparatus for detecting faults on integrated circuits
08/07/2003US20030149923 Semiconductor device testing method and test system
08/07/2003US20030149922 Embedded testing capability for integrated serializer/deserializers
08/07/2003US20030149921 Bit error rate tester
08/07/2003US20030149916 Fault verification apparatus
08/07/2003US20030149915 Testability analysis system and method, and design for testability system and method
08/07/2003US20030149913 Method and apparatus for efficient burn-in of electronic circuits
08/07/2003US20030149455 Method and apparatus for determining depleted capacity of a battery
08/07/2003US20030148761 Method and apparatus for testing assisted position location capable devices
08/07/2003US20030148650 Socket for electrical parts
08/07/2003US20030148547 Method for fault analysis in wafer production
08/07/2003US20030147276 Semiconductor storage device
08/07/2003US20030146784 Method and clamping apparatus for securing a minimum reference voltage in a video display boost regulator
08/07/2003US20030146777 Method and circuitry for controlling clocks of embedded blocks during logic bist test mode
08/07/2003US20030146771 Wireless radio frequency technique design and method for testing of integrated circuits and wafers
08/07/2003US20030146768 Noninvasive optical method and system for inspecting or testing CMOS circuits
08/07/2003US20030146764 Protector for blade module of information processing apparatus
08/07/2003US20030146763 Circuit and method for determining the location of defect in a circuit
08/07/2003US20030146761 Apparatus and method for dynamic diagnostic testing of integrated circuits
08/07/2003US20030146757 System and method of micro-fluidic handling and dispensing using micro-nozzle structures
08/07/2003US20030146756 Method and device for detecting a current
08/07/2003DE20210025U1 Flat flexible multi-conductor device, e.g. ribbon cable, has additional condition diagnosis facility built in to indicate possible damage
08/06/2003EP1333493A2 Interconnect structure
08/06/2003EP1333294A2 Discharge control method for a battery
08/06/2003EP1333293A2 Method for failure analysis in the wafer fabrication
08/06/2003EP1333291A1 Method and device for detecting a current
08/06/2003EP1332502A2 Method for testing integrated circuits
08/06/2003EP1332376A2 Test head actuation system with positioning and compliant modes
08/06/2003EP1242998B1 Method and apparatus for exercising external memory with a memory built-in self-test
08/06/2003EP1129415A4 Automatic generation of user definable memory bist circuitry
08/06/2003EP0980520B1 Process and circuitry for inspecting welding points
08/06/2003EP0898712B1 Wafer-level burn-in and test
08/06/2003CN2565029Y IC tester with pattern generator based on high-grade microprocessor
08/06/2003CN2565028Y Module for detecting insulation resistance of DC system
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