Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2003
08/21/2003US20030156750 PICA system detector calibration
08/21/2003US20030156749 Pattern inspecting apparatus and pattern inspecting method
08/21/2003US20030156748 Adaptive threshold determination for ball grid array component modeling
08/21/2003US20030156545 Signal paths providing multiple test configurations
08/21/2003US20030156487 Semiconductor memory device including data bus pairs respectively dedicated to data writing and data reading
08/21/2003US20030156485 Semiconductor memory device having divided word line structure
08/21/2003US20030156393 Primary functional circuit board suitable for use in verifying chip function by alternative manner
08/21/2003US20030156280 Scanning with laser ligth source
08/21/2003US20030156101 Adaptive control boost current method and apparatus
08/21/2003US20030155944 Method and apparatus for debugging a chip
08/21/2003US20030155942 Sensor array and method for detecting the condition of a transistor in a sensor array
08/21/2003US20030155941 Systems and methods for testing a plurality of circuit devices
08/21/2003US20030155939 Hot/cold chuck system
08/21/2003US20030155929 Method for detecting line-to-ground fault location in power network
08/21/2003US20030155928 Ground fault detection system and method
08/21/2003US20030155927 Multiple directional scans of test structures on srmiconductor integrated circuits
08/21/2003US20030155908 Test mark and electronic device incorporating the same
08/21/2003US20030155891 Charge/discharge control method for battery pack and charge/discharge control apparatus for battery pack
08/21/2003US20030155810 Method and apparatus for indicating battery state of hybrid car
08/21/2003US20030155280 Semiconductor device inspection system
08/21/2003US20030154593 Method for manufacturing galvanic elements
08/21/2003DE20023302U1 Electromagnetic screening chamber for testing electronic device e.g. mobile telephone, with mechanical transmission of operating force for operating elements of device within screening chamber
08/20/2003EP1336857A1 System for determining the state of charge of a battery, especially for a motor vehicle
08/20/2003EP1336856A2 Method and apparatus for indicating battery state of hybrid car
08/20/2003EP1336855A2 Method and apparatus for detecting electromagnetic interference
08/20/2003EP1336853A1 Device that indicates failures in an electric circuit
08/20/2003EP1336528A2 Ground fault detection system and method
08/20/2003EP1336119A1 System for testing an electric high frequency signal and level measuring device provided with said system
08/20/2003EP1336113A2 Method and apparatus for determining the state of charge of a lithium-ion battery
08/20/2003EP1336112A2 Method and system for automated measuring of electromagnetic emissions
08/20/2003EP1117044B1 System model determination for failure detection and isolation in particular in computer systems
08/20/2003EP1019744B1 Method for detecting a motor vehicle battery failure
08/20/2003EP0864100B1 Fault warning in electronic sensors
08/20/2003EP0776481B1 Addressable serial test system
08/20/2003CN2567588Y Testing instrument for display performance of liquid crystal display
08/20/2003CN2567587Y Anti-theft alarm device for power cable
08/20/2003CN2567586Y 电路板测试机 Circuit board testing machine
08/20/2003CN2567585Y Hand circuit substrate testing machine
08/20/2003CN1437711A System for calibrating timing of an integrated circuit wafer tester
08/20/2003CN1437710A Diagnosting reliability of vias by E-beam probing
08/20/2003CN1437239A Test equipment for packed semiconductor elements
08/20/2003CN1437031A Battery capacity measuring method
08/20/2003CN1437030A Accumulator electric-quantity monitoring device and method
08/20/2003CN1437029A Systemic hierarchial test
08/20/2003CN1118882C Method and apparatus for testing connection between secondary cell and charger
08/20/2003CN1118708C Test method of integrated circuit device using double-side clock technique
08/20/2003CN1118707C Integrated circuit device test handler
08/19/2003US6609231 Apparatus and method for automatically verifying a designed circuit
08/19/2003US6609217 System and method for diagnosing and validating a machine over a network using waveform data
08/19/2003US6609077 ATE timing measurement unit and method
08/19/2003US6609072 Information terminal device, input/output control method and storing medium
08/19/2003US6608921 Inspection of solder bump lighted with rays of light intersecting at predetermined angle
08/19/2003US6608498 Method for characterizing an active track and latch sense-amp (comparator) in a one time programmable (OTP) salicided poly fuse array
08/19/2003US6608497 Apparatus and method for allowing testing of semiconductor devices at different temperatures
08/19/2003US6608496 Reference transmission line junction for probing device
08/19/2003US6608494 Single point high resolution time resolved photoemission microscopy system and method
08/19/2003US6608493 Portable testing device
08/19/2003US6608488 Apparatus for high voltage testing of insulated conductors and oscillator circuit for use with same
08/19/2003US6608486 Automotive test device for detecting a short circuit in automotive wiring
08/19/2003US6608482 Battery control method for hybrid vehicle
08/19/2003US6608469 Device and method for charging a secondary battery
08/19/2003US6608468 Battery pack compensating a cell voltage, a charge and discharge current and temperature data, by using a built-in CPU for the battery pack
08/19/2003US6608398 Vehicle mounted electrical component
08/19/2003US6608385 Contact structure and production method thereof and probe contact assembly using same
08/19/2003US6607929 Device and method for testing sensitive elements on an electronic chip
08/19/2003US6607928 Integrated circuit device having an embedded heat slug
08/19/2003US6607071 Sealed test chamber for module IC handler
08/14/2003WO2003067941A2 Circuit and method for determining the location of defect in a circuit
08/14/2003WO2003067760A1 Method and circuitry for controlling clocks of embedded blocks during logic bist test mode
08/14/2003WO2003067735A1 Method and apparatus using a circuit model to evaluate cell/battery parameters
08/14/2003WO2003067733A1 Method and apparatus for controlling energy transfer between an energy bus and a battery system based upon battery operating condition
08/14/2003WO2003067478A1 Verification of embedded test structures in circuit designs
08/14/2003WO2003067477A1 Method and program product for completing a circuit design having embedded test structures
08/14/2003WO2003067277A2 Method and apparatus for testing assisted position location capable devices
08/14/2003WO2003067274A2 Method and device for detecting faults on integrated circuits
08/14/2003WO2003067273A1 Jitter tolerance diagnosing method, and jitter tolerance diagnosing device
08/14/2003WO2003067272A1 Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
08/14/2003WO2003067271A2 Apparatus and method for dynamic diagnostic testing of integrated circuits
08/14/2003WO2003050547A3 Electric field sensor
08/14/2003WO2003035541A3 Probe needle for testing semiconductor chips and method for producing said probe needle
08/14/2003WO2003027683A3 Aircraft electrostatic discharge test system
08/14/2003WO2003025598A3 Intergrated circuit having a voltage sensor
08/14/2003WO2003023428B1 Test fixture glass etch
08/14/2003WO2003021604A3 Method and device for testing semiconductor memory devices
08/14/2003WO2002052637A3 Method and apparatus for monitoring a semiconductor wafer during a spin drying operation
08/14/2003WO2002039642A3 Apparatus and method for detecting and calculating ground fault resistance
08/14/2003WO2002009155A3 Wafer chuck having with interleaved heating and cooling elements
08/14/2003US20030154455 Method for designing semiconductor integrated circuit and method for testing the same
08/14/2003US20030154452 Method and apparatus for the digital and analog triggering of a signal analysis device
08/14/2003US20030154433 Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
08/14/2003US20030154432 Method for identifying test points to optimize the testing of integrated circuits using a genetic algorithm
08/14/2003US20030154426 Method and apparatus for programmable BIST and an optional error counter
08/14/2003US20030154047 Tester for mixed signal semiconductor device and method of testing semiconductor device using the same
08/14/2003US20030154043 Resolution in measuring the pulse width of digital signals
08/14/2003US20030154040 Process to determine battery storage capacity
08/14/2003US20030154008 In-vehicle button-stuck malfunction notice system
08/14/2003US20030153199 IC socket module
08/14/2003US20030153105 Integrated circuit testing with a visual indicator
08/14/2003US20030152111 System for verifying operations of system LSI
08/14/2003US20030152080 System and method for fault tolerant multimedia communication
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