Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2003
08/28/2003US20030162383 Semiconductor device and method for fabricating the same
08/28/2003US20030162310 Characteristics evaluation of intermediate layer circuit
08/28/2003US20030162309 For receiving a power value setting signal to set strength of power and a power on/off instruction to set on or off of outputting of the power interrupts the supply of the power
08/28/2003US20030161426 Bit error measuring apparatus and trigger signal generating circuit for the bit error measuring apparatus
08/28/2003US20030161204 Semiconductor memory device capable of performing burn-in test at high speed
08/28/2003US20030160907 Liquid crystal panel, apparatus for inspecting the same, and method of fabricating liquid crystal display thereof
08/28/2003US20030160826 Method, apparatus and computer product to organize data on a display and facilitate testing of an integrated circuit design
08/28/2003US20030160703 Fault diagnosis circuit for LED indicating light
08/28/2003US20030160629 Manual tester for testing device and method thereof
08/28/2003US20030160628 Semiconductor processing apparatus and wafer sensor module
08/28/2003US20030160626 Probe card and method of testing wafer having a plurality of semiconductor devices
08/28/2003US20030160625 Capturing both digital and analog forms of a signal through the same probing path
08/28/2003US20030160624 Probe card, and testing apparatus having the same
08/28/2003US20030160623 Migration measuring method and measuring apparatus
08/28/2003US20030160620 Addressable open connector test circuit
08/28/2003US20030160619 Electric arc synthesis for arc detector testing and method for arc testing
08/28/2003US20030160604 Rear-mounted gimbal for supporting test head
08/28/2003US20030160602 Power factor/tan delta testing of high voltage bushings on power transformers, current transformers, and circuit breakers
08/28/2003US20030160315 Encapsulated semiconductors with dielectric between units
08/28/2003US20030159880 Sound absorber, especially for motor vehicles, and a method for producing a sound absorber
08/28/2003US20030159852 Multilayer wiring board, manufacturing method therefor and test apparatus thereof
08/28/2003DE10021076C2 Fehlererfassungsanordnung eines Notrufendgeräts Error detection arrangement of an emergency call terminal
08/27/2003EP1339122A2 Process for manufacturing galvanic elements
08/27/2003EP1338899A1 Fault diagnosis circuit for LED indicating light
08/27/2003EP1338014A1 AT-SPEED BUILT-IN SELF TESTING OF MULTI-PORT COMPACT sRAMs
08/27/2003EP1337865A1 A method of predicting the state of charge as well as the use time left of a rechargeable battery
08/27/2003EP1337840A1 An improved consumer product kit, and a method of use therefor
08/27/2003EP1012612B1 Method and device for detecting and locating irregularities in a dielectric
08/27/2003EP0855038B1 Component network diagnosis, using modelling by bands
08/27/2003EP0800652B1 Cable partial discharge location pointer
08/27/2003EP0792450B1 Variable volume test chamber
08/27/2003EP0717851B1 A method of testing and an electronic circuit comprising a flipflop with a master and a slave
08/27/2003CN2569424Y On-line monitor of distribution net equipment
08/27/2003CN2569417Y Reset signal controller for portable device
08/27/2003CN2569165Y Electronic detector for time fuze quick exciting cell property
08/27/2003CN2569164Y Clamp for detecting square power battery
08/27/2003CN2569163Y Indicator for cell use
08/27/2003CN2569162Y Device for live detecting resistant current of three phase lighting arrestor
08/27/2003CN2569161Y Composite type detecting device
08/27/2003CN2569160Y On-line monitor for insulation property of transformer sleeve
08/27/2003CN2569159Y Large size magnetic chip sensor
08/27/2003CN2569158Y Micro short-circuit detector
08/27/2003CN2569157Y Detecting and reporting device for thunder and lightning breakdown of high voltage porcelain insulator
08/27/2003CN2569156Y On-line complex monitor for power transformer
08/27/2003CN2569146Y Clamp for detecting lithium ion cell
08/27/2003CN1439103A Alternator testing method and system using timed application of load
08/27/2003CN1439102A Alternator testing method and system using ripple detection
08/27/2003CN1439101A Device for measuring and analyzing electrical signals of an integrated circuit component
08/27/2003CN1438707A Semiconductor storage device
08/27/2003CN1438618A Active matrix base-board, its making method and picture displaying device
08/27/2003CN1438492A Detection method and apparatus for high-speed interconnected circuit
08/27/2003CN1438491A Apparatus for scanning-testing printed circuit poard
08/27/2003CN1438490A Programme changing system and clamp designing system
08/27/2003CN1119862C Method of measuring delay time and random pulse string generating circuit used in such method
08/27/2003CN1119816C Synchronous semiconductor storage device having timed circuit of controlling activation/non-activation of word line
08/27/2003CN1119667C High impedance test mode for JTAG standard
08/27/2003CN1119666C Detection instrument of ceramic quality of insulator string for AC transmission line
08/26/2003US6611936 Programmable delay elements for source synchronous link function design verification through simulation
08/26/2003US6611935 Method and system for efficiently testing circuitry
08/26/2003US6611934 Boundary scan test cell circuit
08/26/2003US6611933 Real-time decoder for scan test patterns
08/26/2003US6611932 Method and apparatus for controlling and observing data in a logic block-based ASIC
08/26/2003US6611853 VXI test instrument and method of using same
08/26/2003US6611779 Automatic test vector generation method, test method making use of the test vectors as automatically generated, chip manufacturing method and automatic test vector generation program
08/26/2003US6611774 Method and apparatus for the continuous performance monitoring of a lead acid battery system
08/26/2003US6611773 Apparatus and method for measuring and reporting the reliability of a power distribution system with improved accuracy
08/26/2003US6611771 Method and apparatus to detect a stator turn fault in an AC motor
08/26/2003US6611579 Method for predicting and diagnosing trouble in a connection having a plurality of components
08/26/2003US6611477 Built-in self test using pulse generators
08/26/2003US6611150 Leakage detector for use in combination with a signal level meter
08/26/2003US6611148 Apparatus for the high voltage testing of insulated conductors and oscillator circuit for use with same
08/26/2003US6611147 Apparatus with interchangeable modules for measuring characteristics of cables and networks
08/26/2003US6611146 Stress testing for semiconductor devices
08/26/2003US6611136 Device for determining the primary current of a current transformer comprising saturation correction means
08/26/2003US6611128 Device for detecting a battery condition
08/26/2003US6610918 Noncontact; detects short circuit defects; does not require bonding pads
08/21/2003WO2003069787A2 System and method for fault tolerant multimedia communication
08/21/2003WO2003069487A2 Data bus for electrically controlling the installation of modules
08/21/2003WO2003069362A1 Method and device for detecting a breakdown of a bipolar transistor
08/21/2003WO2003069357A1 Smart adapter for wiring analyzer
08/21/2003WO2003034383A3 Drive circuit for adaptive control of precharge current and method therefor
08/21/2003WO2003031994B1 Socket and contact of semiconductor package
08/21/2003WO2003023616A8 Method for debugging reconfigurable architectures
08/21/2003WO2003016850A3 System and method for locating a fault on ungrounded and high-impedance grounded power systems
08/21/2003WO2003014750A3 Application-specific testing methods for programmable logic devices
08/21/2003WO2003003375A3 Apparatus and methods for monitoring self-aligned contact arrays
08/21/2003US20030159124 System and method for generating integrated circuit boundary register description data
08/21/2003US20030159098 Method for generating test signals for an integrated circuit and test logic unit
08/21/2003US20030159096 Boundary scan with ground bounce recovery
08/21/2003US20030159094 IBIST identification loopback scheme
08/21/2003US20030159093 Diagnosis of data transfer faults using constraints
08/21/2003US20030158706 Instrument timing using synchronized clocks
08/21/2003US20030158691 Systems and methods for facilitating testing of pad receivers of integrated circuits
08/21/2003US20030158690 Systems and methods for facilitating automated test equipment functionality within integrated circuits
08/21/2003US20030158689 Method for extracting parasitic capacitances of field-effect transistors
08/21/2003US20030158688 Method and apparatus for testing a system-on-a-chip
08/21/2003US20030158687 Composite eye diagrams
08/21/2003US20030158679 Anomaly detection system
08/21/2003US20030158616 Program conversion system
08/21/2003US20030157845 Terminal connector
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