Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2003
09/04/2003US20030167142 Method and apparatus for reconstruction calibration of detector position and source motion based on a multi-pin phantom
09/04/2003US20030167139 Electromagnetic emission source identification apparatus and associated method, computer device,and computer software program product
09/04/2003US20030167138 Plausibility checking of voltage transformers in substations
09/04/2003US20030165077 Semiconductor memory device permitting early detection of defective test data
09/04/2003US20030164946 Apparatus and method for measuring a property of a layer in a multilayered structure
09/04/2003US20030164718 Using observability logic for real-time debugging of ASICs
09/04/2003US20030164717 Tooling plate adapted to facilitate rapid and precise attachment into a probing station
09/04/2003US20030164711 Sensor output processing device having self-diagnosis function
09/04/2003US20030164710 Method for measuring fault locations in high frequency cables and lines
09/04/2003US20030164510 Redundancy architecture for repairing semiconductor memories
09/03/2003EP1341325A1 Circuit arrangement for testing functions of a high-frequency circuit
09/03/2003EP1341284A1 Plausibility check for voltage transformers in power distribution substations
09/03/2003EP1340992A1 Method and apparatus for charge/discharge control of battery pack
09/03/2003EP1340991A2 System and method for testing a circuit
09/03/2003EP1340990A2 Method of creating a composite eye diagram
09/03/2003EP1340327A1 Component measures
09/03/2003EP1340091A2 Mechanism for clamping device interface board to peripheral
09/03/2003EP1166275B1 Device for weighting the cell resistances in a magnetoresistive memory
09/03/2003EP0752656B1 Fail-fast, fail-functional, fault-tolerant multiprocessor system
09/03/2003CN2570807Y Three electrode array system for closed type simulated battery
09/03/2003CN2570806Y Status-signal checkout apparatus for power-driven flexible gate
09/03/2003CN2570805Y Device for on-line monitoring transformer iron core earthing current
09/03/2003CN2570804Y Power vacuum switching tube micro-current detecting instrument
09/03/2003CN2570803Y Diamond heating hammer insulation monitoring device
09/03/2003CN2570802Y Device for monitoring dissolved gas in transformer oil online
09/03/2003CN2570801Y Network cable twisted-pair line tester with intercommunication apparatus
09/03/2003CN2570794Y Locating device for circuit base board
09/03/2003CN1440570A Automated determination and display of physical location of failed cell in array of memory cells
09/03/2003CN1440508A Load board feeder
09/03/2003CN1440086A Method for manufacturing primary battery
09/03/2003CN1440009A Checking marker and electronic machine
09/03/2003CN1439887A Accumulator status indicating method and device of mixed electric vehicle
09/03/2003CN1439886A Automatic sorting positioner for IC test
09/03/2003CN1439885A Phonetic alarm device of leakage circuit breaker
09/03/2003CN1120547C Socket for electrical components
09/03/2003CN1120500C Semiconductor memory device having selection circuit
09/03/2003CN1120375C Solar cell testing instrument with linear pulse light source
09/02/2003US6615402 Interchangeable FPGA-gate array
09/02/2003US6615392 Hierarchical design and test method and system, program product embodying the method and integrated circuit produced thereby
09/02/2003US6615380 Dynamic scan chains and test pattern generation methodologies therefor
09/02/2003US6615379 Method and apparatus for testing a logic device
09/02/2003US6615378 Method and apparatus for holding failing information of a memory built-in self-test
09/02/2003US6615377 Integrated circuit with signal-vector queue for normal and test modes of operation
09/02/2003US6615289 Semiconductor chip configuration and method of controlling a semiconductor chip
09/02/2003US6615152 Abnormality detecting method and device for position detecting device, and electric power steering device
09/02/2003US6615146 Failure detection of an isolation device with PFA signal generation in a redundant power supply system
09/02/2003US6614923 Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof
09/02/2003US6614922 Wire pattern test system
09/02/2003US6614713 Semiconductor memory device having a circuit for fast operation
09/02/2003US6614290 Integrated circuit
09/02/2003US6614263 Method and circuitry for controlling clocks of embedded blocks during logic bist test mode
09/02/2003US6614255 Digital method of measuring driver slew rates for reduced test time
09/02/2003US6614253 On-circuit board continuity tester
09/02/2003US6614252 Semiconductor test apparatus with reduced power consumption and heat generation
09/02/2003US6614251 Electromigration evaluation circuit
09/02/2003US6614250 Sensor probe for use in board inspection and manufacturing method thereof
09/02/2003US6614249 Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate
09/02/2003US6614247 Socket apparatus and method for removably mounting an electronic package
09/02/2003US6614245 Probe for bumps between printed wiring board and circuit component
09/02/2003US6614244 Semiconductor device inspecting apparatus
09/02/2003US6614243 Measurement probe for detecting electrical signals in an integrated semiconductor circuit
09/02/2003US6614236 Cable link integrity detector
09/02/2003US6614233 Apparatus for detecting battery pack abnormality and method of detecting battery pack abnormality
09/02/2003US6614231 High efficiency electronic load
09/02/2003US6614222 Semiconductor testing apparatus
09/02/2003US6614221 Deskew fixture
09/02/2003US6614220 Method and device for automatic adjustment of printed circuit board conveying means in a test machine
09/02/2003US6614216 System and method for intersample timing error reduction
09/02/2003US6614003 Method and process of contact to a heat softened solder ball array
09/02/2003US6613595 Test structure and method for flash memory tunnel oxide quality
09/02/2003US6613593 Method of fabricating a semiconductor device
09/02/2003US6612861 Forming reliable semiconductor testing device having high frequency bandwidth
09/02/2003US6612738 Method for determining the temperature of a semiconductor chip and semiconductor chip with temperature measuring configuration
09/02/2003US6612022 Printed circuit board including removable auxiliary area with test points
09/02/2003US6612021 Apparatus for a wire mount control
08/2003
08/28/2003WO2003071657A1 Device for a battery charger
08/28/2003WO2003071652A2 Battery monitoring method and apparatus
08/28/2003WO2003071298A1 Pica system detector calibration
08/28/2003WO2003071297A1 Signal paths providing multiple test configurations
08/28/2003WO2003071296A1 Radio frequency power generation and power measurement
08/28/2003WO2003071291A1 Method and circuit arrangement for determining the average current consumption of a battery-operated apparatus
08/28/2003WO2003071289A1 Contact structure having silicon finger contactor
08/28/2003WO2003071288A1 Contact actuator with contact force control
08/28/2003WO2003071249A1 Method and device for simulating a rpm signal
08/28/2003WO2003052434A3 Method and device for the detection of non-homogeneities in the shielding behavior of shielded electric conductors
08/28/2003WO2003027691A3 Method and device for localizing a line fault
08/28/2003WO2003027684A3 Method and device for monitoring a sensor unit
08/28/2003WO2003025595A3 Electronic device
08/28/2003WO2002095587A3 Method and apparatus for fault tolerant and flexible test signature generator
08/28/2003WO2002095429A3 Electrical component measuring instrument
08/28/2003US20030163788 Structured design documentation importer
08/28/2003US20030163775 Technique for programming clocks in automatic test system
08/28/2003US20030163774 Method, apparatus, and system for efficient testing
08/28/2003US20030163773 Multi-core controller
08/28/2003US20030163497 Algorithm for configuring clocking system
08/28/2003US20030163273 Hybrid tester architecture
08/28/2003US20030163272 Integrated adjustable short-haul/long-haul time domain reflectometry
08/28/2003US20030163271 Method and apparatus for reconstruction calibration of detector position and source motion based on a multi-pin phantom
08/28/2003US20030163267 Method for measuring PLL lock time
08/28/2003US20030162430 Continuity test unit for connector
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