Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2003
09/11/2003US20030171888 Method for testing characteristics of oscillators
09/11/2003US20030171881 Method for determining an effective voltage of a battery
09/11/2003US20030170921 Methods for forming semiconductor devices so as to stabilize the same when positioned face-down over test substrates
09/11/2003US20030169621 Nonvolatile multilevel cell memory
09/11/2003US20030169551 Semiconductor integrated circuit with voltage-detecting circuit and signal transmitting and receiving system
09/11/2003US20030169545 Low energy pulsing device and method for electrical system arc detection
09/11/2003US20030169107 Method and system for proportional plus integral loop compensation using a hybrid of switched capacitor and linear amplifiers
09/11/2003US20030169078 Charge/discharge current detection circuit and variable resistor
09/11/2003US20030169070 Method and apparatus for built-in self-test of logic circuits with multiple clock domains
09/11/2003US20030169063 Photosensors for testing an integrated circuit
09/11/2003US20030169062 Apparatus and method for positioning an integrated circuit for test
09/11/2003US20030169060 Method and apparatus for inspecting integrated circuit pattern
09/11/2003US20030169052 Faulty wiring detection device for air conditioner
09/11/2003US20030169051 Testing device for detecting and locating arc faults in an electrical system
09/11/2003US20030169050 Battery state monitoring circuit
09/11/2003US20030169049 Method and device for estimating open circuit voltage of battery
09/11/2003US20030169048 System for measuring battery current for electric vehicle
09/11/2003US20030169047 Battery capacity detection device and method
09/11/2003US20030167615 Method of using a replacement headplate to adapt a probe station
09/11/2003DE20310361U1 Power distribution network short circuit detector system counts faults with differential reset times
09/10/2003EP1343086A2 Abnormality Detection Apparatus of Comparator
09/10/2003EP1343017A1 Method and apparatus for determining the operability of a storage battery
09/10/2003EP1343016A2 Faulty wiring detection device for air conditioner
09/10/2003EP1343000A2 Diagnostic system for a motor vehicle
09/10/2003EP1342096A1 Method and device of fault location
09/10/2003EP1342095A1 Fault location method and device
09/10/2003EP1342094A1 Device for electromagnetic characterisation of a tested structure
09/10/2003EP1266236B1 System and method for testing signal interconnections using built-in self test
09/10/2003EP1264315B1 Reference cell trimming verification circuit
09/10/2003EP1257839B1 Electromechanical apparatus for testing ic chips using first and second sets of substrates which are pressed together
09/10/2003EP1159630B1 Distributed interface for parallel testing of multiple devices using a single tester channel
09/10/2003EP1048133A4 System and method for sharing a spare channel among two or more optical ring networks
09/10/2003EP0845788B1 A memory array test circuit with failure notification
09/10/2003CN2572415Y Device of work voltage monitoring and safety alarm of individual cell of fuel battery
09/10/2003CN2572414Y Universal plate shape battery test clamp
09/10/2003CN2572413Y Reliable electricity leakage alarm
09/10/2003CN2572412Y Safety electricity use tester
09/10/2003CN1441908A Method for measuring motor constant of induction motor
09/10/2003CN1441632A Electronic device
09/10/2003CN1441481A Design method and detection method for semiconductor integrated circuit
09/10/2003CN1441303A Liquid crystal plate, device for detecting liquid crystal plate and method for producing liquid crystal plate
09/10/2003CN1441257A In-situ fault diagnosing technology for turn-to-turn short-circuit of transformer windings based on change in loss
09/10/2003CN1441256A Circuit path detector of connector
09/10/2003CN1441254A Orbit detector
09/10/2003CN1120989C Synchronous transient-process recording method and device
09/09/2003US6618853 Program production system for semiconductor tester
09/09/2003US6618850 Inspection method and inspection system using charged particle beam
09/09/2003US6618839 Method and system for providing an electronic system design with enhanced debugging capabilities
09/09/2003US6618836 Configuration and method for producing test signals for testing a multiplicity of semiconductor chips
09/09/2003US6618830 System and method for pruning a bridging diagnostic list
09/09/2003US6618828 Boundary scan testing involving shared enable latches
09/09/2003US6618827 System and method for parallel testing of IEEE 1149.1 compliant integrated circuits
09/09/2003US6618686 System and method for testing a circuit implemented on a programmable logic device
09/09/2003US6618685 Non-invasive testing of smart cards
09/09/2003US6618681 Method and apparatus for predicting the available energy of a battery
09/09/2003US6618649 Methods and apparatus for characterizing a circuit breaker device
09/09/2003US6618648 Control system method of protectively controlling electric power system and storage medium storing program code
09/09/2003US6618354 Credit initialization in systems with proactive flow control
09/09/2003US6618305 Test circuit for testing a circuit
09/09/2003US6618303 Integrated circuit, test structure and method for testing integrated circuits
09/09/2003US6618298 Semiconductor memory device
09/09/2003US6618228 Current detecting apparatus and electric motor control apparatus
09/09/2003US6617922 Differential difference amplifier for amplifying small signals close to zero volts
09/09/2003US6617873 Semiconductor integrated circuit and testing method thereof
09/09/2003US6617872 Reduced cost, high speed integrated circuit test arrangement
09/09/2003US6617871 Methods and apparatus for bi-directional signaling
09/09/2003US6617870 Semiconductor probe station
09/09/2003US6617869 Electrical circuit with a testing device for testing the quality of electronic connections in the electrical circuit
09/09/2003US6617868 Method and apparatus for controlling the power and heat output in a device testing system
09/09/2003US6617867 Mechanism for clamping device interface board to peripheral
09/09/2003US6617866 Apparatus and method of protecting a probe card during a sort sequence
09/09/2003US6617864 High frequency probe for examining electric characteristics of devices
09/09/2003US6617863 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof
09/09/2003US6617862 Laser intrusive technique for locating specific integrated circuit current paths
09/09/2003US6617859 Method for diagnosing insulation degradation in underground cable
09/09/2003US6617844 Compare path bandwith control for high performance automatic test systems
09/09/2003US6617843 Contactor of the device for testing semiconductor device
09/09/2003US6617842 Semiconductor device testing method and system employing trace data
09/09/2003US6617610 Semiconductor integrated circuit
09/09/2003US6616256 Serial integrated scan-based testing of ink jet print head
09/09/2003US6615485 Probe card assembly and kit, and methods of making same
09/09/2003US6615465 Method for producing an acceleration sensor
09/09/2003CA2329410C Rechargeable battery electrode testing device
09/05/2003CA2420926A1 Low energy pulsing device and method for electrical system arc detention
09/05/2003CA2420807A1 Testing device for detecting and locating arc faults in an electrical system
09/04/2003WO2003073680A2 Jitter measuring apparatus and method
09/04/2003WO2003073577A1 Testing arrangement for a power circuit breaker provided with an electronic trip element
09/04/2003WO2003073493A1 Probe area setting method and probe device
09/04/2003WO2003073280A1 Measuring apparatus and measuring method
09/04/2003WO2003073116A1 Technique for programming clocks in automatic test system
09/04/2003WO2003073115A1 Measurement instrument and measurement method
09/04/2003WO2003073114A1 Method and system for graphical evaluation of iddq measurements
09/04/2003WO2003073113A1 Time domain reflectometry
09/04/2003WO2003065443A3 Probe station
09/04/2003US20030167450 Method and apparatus to facilitate generating simulation modules for testing system designs
09/04/2003US20030167430 System and method for testing a circuit
09/04/2003US20030167429 Boundary scan with mode control cells
09/04/2003US20030167424 Microcomputer capable of identifying instruction executed at abnormal event
09/04/2003US20030167145 Test apparatus
09/04/2003US20030167144 Re-configurable embedded core test protocol for system-on-chips (SOC) and circuit boards
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