| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/18/2003 | US20030175098 In-circuit test fixture loader |
| 09/18/2003 | US20030174877 Method for inspecting patterns |
| 09/18/2003 | US20030174567 Integrated circuit memory devices having efficient multi-row address test capability and methods of operating same |
| 09/18/2003 | US20030174480 Electronic device |
| 09/18/2003 | US20030174171 Method for customizing an integrated circuit element |
| 09/18/2003 | US20030173991 Display device and scanning circuit testing method |
| 09/18/2003 | US20030173989 Method and apparatus for testing current sinking/sourcing capability of a driver circuit |
| 09/18/2003 | US20030173988 High speed threshold voltage and average surface doping measurements |
| 09/18/2003 | US20030173987 Semiconductor wafer testing system and method |
| 09/18/2003 | US20030173971 Electronic battery tester with battery failure temperature determination |
| 09/18/2003 | US20030173951 Apparatus for measuring properties of probe card and probing method |
| 09/18/2003 | US20030173950 Method and magazine device for testing semiconductor devices |
| 09/18/2003 | US20030173949 Apparatus for recognizing working height of device transfer system in semiconductor device test handler and method thereof |
| 09/18/2003 | US20030173948 Measurement method and device, in particular for the high-frequency measurement of electric components |
| 09/18/2003 | US20030173947 Printed circuit board test fixture |
| 09/18/2003 | US20030173904 Matrix element precharge voltage adjusting apparatus and method |
| 09/18/2003 | US20030173661 Contact structure and production method thereof and probe contact assembly using same |
| 09/18/2003 | US20030173645 Delay circuit, testing apparatus, and capacitor |
| 09/18/2003 | US20030173607 Semiconductor memory device |
| 09/18/2003 | US20030173131 Automotive passenger restraint and protection apparatus |
| 09/18/2003 | US20030172726 Scanning probe microscope for ultra sensitive electro-magnetic field detection and probe thereof |
| 09/18/2003 | DE10153090C1 Frequency domain measurements for use in network analyzers, etc., whereby Hilbert transformations are carried out on attenuation values to provide more accurate phase calculations from reflectometric measurements |
| 09/17/2003 | EP1345304A1 Battery pack charging system |
| 09/17/2003 | EP1345035A2 Continuity test unit for connector |
| 09/17/2003 | EP1345034A2 Measuring table |
| 09/17/2003 | EP1345032A2 High speed method of measuring the threshold voltage and surface doping |
| 09/17/2003 | EP1344074A2 Battery capacity calibration |
| 09/17/2003 | EP1344073A2 Calibrating single ended channels for obtaining differential performance level |
| 09/17/2003 | EP1344072A2 System and method for pre-programming an electronic device's memory |
| 09/17/2003 | EP1344071A1 Asynchronous reset circuit testing |
| 09/17/2003 | EP1344070A2 Method and device for monitoring the function of an output stage with pulse width modulation |
| 09/17/2003 | EP1277112B1 Capturing of a register value to another clock domain |
| 09/17/2003 | EP1236111A4 Test pattern compression for an integrated circuit test environment |
| 09/17/2003 | EP1105876A4 Method and apparatus for built-in self test of integrated circuits |
| 09/17/2003 | EP0990165A4 Virtual channel data distribution system for integrated circuit tester |
| 09/17/2003 | EP0855102B1 Compensated delay locked loop timing vernier |
| 09/17/2003 | CN2574064Y On-line dirt monitor for transformer substation |
| 09/17/2003 | CN1443310A 异步复位电路测试 Asynchronous reset circuit test |
| 09/17/2003 | CN1442950A Oscillator characteristics testing method |
| 09/17/2003 | CN1442941A Truelike detection of transformer station transformer |
| 09/17/2003 | CN1442702A Method of determining effective voltage of battery |
| 09/17/2003 | CN1442701A Electric machine operation state sensor and sensing method |
| 09/17/2003 | CN1442696A Battery current measuring system of electric motor car |
| 09/17/2003 | CN1121768C Self checking circuit in microwave equipment |
| 09/16/2003 | US6622289 Methods for making contact device for making connection to an electronic circuit device and methods of using the same |
| 09/16/2003 | US6622274 Method of micro-architectural implementation on bist fronted state machine utilizing ‘death logic’ state transition for area minimization |
| 09/16/2003 | US6622273 Scan latch circuit |
| 09/16/2003 | US6622272 Automatic test equipment methods and apparatus for interfacing with an external device |
| 09/16/2003 | US6622271 Method and apparatus for operating a system to test integrated circuits |
| 09/16/2003 | US6622270 System for optimizing anti-fuse repair time using fuse ID |
| 09/16/2003 | US6622108 Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuit |
| 09/16/2003 | US6622107 Edge placement and jitter measurement for electronic elements |
| 09/16/2003 | US6622106 Device for testing and calibrating the oscillation frequency of an integrated oscillator |
| 09/16/2003 | US6622103 System for calibrating timing of an integrated circuit wafer tester |
| 09/16/2003 | US6622070 Diagnostic device for monitoring a sub-system in a motor vehicle |
| 09/16/2003 | US6621741 System for programming verification |
| 09/16/2003 | US6621572 Optical inspection of laser vias |
| 09/16/2003 | US6621566 Optical inspection system having integrated component learning |
| 09/16/2003 | US6621562 Time domain reflectometer with wideband dual balanced duplexer line coupling circuit |
| 09/16/2003 | US6621352 Semiconductor integrated circuit device |
| 09/16/2003 | US6621328 Semiconductor device |
| 09/16/2003 | US6621321 Circuit for conditioning output waveform |
| 09/16/2003 | US6621291 Device and method for estimating the resistance of a stator winding for an AC induction motor |
| 09/16/2003 | US6621290 Test structure and method for testing a semiconductor material is provided with a semiconductor wafer having an electrical ground and a source of electrical potential |
| 09/16/2003 | US6621288 Timing margin alteration via the insulator of a SOI die |
| 09/16/2003 | US6621286 System and method for inspecting a semiconductor device with contact sections that slide over the terminals of the semiconductor device |
| 09/16/2003 | US6621285 Semiconductor chip having a pad arrangement that allows for simultaneous testing of a plurality of semiconductor chips |
| 09/16/2003 | US6621284 Post-package trimming of analog integrated circuits |
| 09/16/2003 | US6621283 Semiconductor device, method of testing the semiconductor device, and semiconductor integrated circuit |
| 09/16/2003 | US6621282 High resolution analytical probe station |
| 09/16/2003 | US6621281 SOI die analysis of circuitry logic states via coupling through the insulator |
| 09/16/2003 | US6621280 Method of testing an integrated circuit |
| 09/16/2003 | US6621276 Termination assembly for power cable testing and methods for its use |
| 09/16/2003 | US6621275 Time resolved non-invasive diagnostics system |
| 09/16/2003 | US6621273 Voltage measurement apparatus |
| 09/16/2003 | US6621272 Programmable current exciter for measuring AC immittance of cells and batteries |
| 09/16/2003 | US6621270 Method and apparatus for automated relay testing |
| 09/16/2003 | US6621262 Method for optimizing probe card analysis and scrub mark analysis data |
| 09/16/2003 | US6621250 Battery capacity measuring and remaining capacity calculating system |
| 09/16/2003 | US6621247 Electronic monitoring device for a multipart electrical energy storage unit |
| 09/16/2003 | US6621082 Automatic focusing system for scanning electron microscope equipped with laser defect detection function |
| 09/16/2003 | US6620639 Apparatus to evaluate hot carrier injection performance degradation and method therefor |
| 09/12/2003 | WO2003075344A2 Method for processing multiple semiconductor devices for test |
| 09/12/2003 | WO2003075321A2 An apparatus and method for measuring a property of a layer in a multilayered structure |
| 09/12/2003 | WO2003075029A1 Method and apparatus for built-in self-test of logic circuits with multiple clock domains |
| 09/12/2003 | WO2003075028A1 Integrated circuit with test circuit |
| 09/12/2003 | WO2003075027A1 Electronic part inspection device |
| 09/12/2003 | WO2003075026A1 Device with board abnormality detecting circuit |
| 09/12/2003 | WO2003075025A1 Electronic component testing apparatus |
| 09/12/2003 | WO2003075024A1 Insert and electronic component handler comprising it |
| 09/12/2003 | WO2003075023A1 Electronic part test apparatus |
| 09/12/2003 | WO2003075020A1 Device for the detection of electromagnetic pulses with short rise times and high voltage amplitudes |
| 09/12/2003 | WO2003074974A2 Evaluating a multi-layered structure for voids |
| 09/12/2003 | WO2002041167A3 Method and apparatus for dynamically testing electrical interconnect |
| 09/11/2003 | US20030172334 Technique for debugging an integrated circuit having a parallel scan-chain architecture |
| 09/11/2003 | US20030172333 Built-in self test parallel JTAG serial chain architecture for reduced test vector size |
| 09/11/2003 | US20030172332 Systems and methods for facilitating testing of pad drivers of integrated circuits |
| 09/11/2003 | US20030172327 Circuit and method for testing embedded phase-locked loop circuit |
| 09/11/2003 | US20030171906 Method for transforming stand-alone verification tests for an embedded block into serial scan test patterns for detecting manufacturing defects |
| 09/11/2003 | US20030171896 Method and system for graphical evaluation of IDDQ measurements |