| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/25/2003 | US20030182097 Electronic device design-aiding apparatus, electronic device design-aiding method, electronic device manufacturing method, and computer readable medium storing program |
| 09/25/2003 | US20030182096 Analog-digital converter cell, simulation apparatus, and simulation method |
| 09/25/2003 | US20030182079 System and method to provide measurement capabilities for both single-ended and differential signals with software switching |
| 09/25/2003 | US20030182075 Electronic test program with test triggered interactive displays |
| 09/25/2003 | US20030182073 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same |
| 09/25/2003 | US20030181614 For enhancing takeup of nutrient by plants or for mixture with conventional phosphate-based fertilizers; biodegradable |
| 09/25/2003 | US20030181336 Anionic polymers composed of dicarboxylic acids and uses thereof |
| 09/25/2003 | US20030179736 Programmable monitoring circuit |
| 09/25/2003 | US20030179010 Method and apparatus for placing an integrated circuit into a default mode of operation |
| 09/25/2003 | US20030179009 Compliant actuator for IC test fixtures |
| 09/25/2003 | US20030179008 Temperature test system with test rings concentric with a centrifugal fan |
| 09/25/2003 | US20030179007 Method of inspecting pattern and inspecting instrument |
| 09/25/2003 | US20030179006 Testing system in a circuit board manufacturing line for a automatic testing of circuit boards |
| 09/25/2003 | US20030179004 Motor abnormality detecting apparatus |
| 09/25/2003 | US20030178999 Method and system for monitoring winding insulation resistance |
| 09/25/2003 | US20030178988 Test probe alignment apparatus |
| 09/25/2003 | US20030178987 Probe card carrier and method of carrying probe card |
| 09/25/2003 | US20030178986 Electrical monitoring system |
| 09/25/2003 | US20030178970 Battery control device |
| 09/25/2003 | US20030178692 Reduced terminal testing system |
| 09/24/2003 | EP1347356A2 Instrument timing using synchronized clocks |
| 09/24/2003 | EP1347304A2 Method for testing high-voltage circuit breakers |
| 09/24/2003 | EP1347303A2 Automated EMC-driven layout and floor planning of electronic devices and systems |
| 09/24/2003 | EP1346689A2 Method and apparatus for controlling electron beam motion based on calibration information |
| 09/24/2003 | EP1346688A2 Method and apparatus for reconstruction calibration of detector position and source motion based on a multi-pin phantom |
| 09/24/2003 | EP1346232A1 Method of an apparatus for testing wiring |
| 09/24/2003 | EP1345652A1 Method and apparatus for determining depleted capacity of a battery |
| 09/24/2003 | EP1226446B1 System for testing ic chips selectively with stored or internally generated bit streams |
| 09/24/2003 | EP1200895B1 Extending synchronous busses by arbitrary lengths using native bus protocol |
| 09/24/2003 | EP1093586B1 Integrated circuit with improved synchronism for an external clock signal at a data output |
| 09/24/2003 | CN1444323A 电池状态监测电路 Battery status monitor circuit |
| 09/24/2003 | CN1444262A Equipment for identifying working height of device conveying system and its method |
| 09/24/2003 | CN1444182A Reconstruction correction method of detector position and source movement based on pultineedle model and its equipment |
| 09/24/2003 | CN1444048A Automatic test method of cable failure |
| 09/24/2003 | CN1444047A Error wiring detector for air conditioner |
| 09/24/2003 | CN1444035A Method for checking image |
| 09/24/2003 | CN1443512A Method and equipment for controlling electron beam motion based on correcting information |
| 09/24/2003 | CN1122426C Cathode pulse generator of kinescope |
| 09/24/2003 | CN1122280C Memory with stress circuitry for detecting defects |
| 09/24/2003 | CN1122279C Input buffer circuit for semiconductor IC circuit |
| 09/24/2003 | CN1122218C Logical check apparatus for semiconductor circuits |
| 09/24/2003 | CN1122183C Insulator detector and using method thereof |
| 09/24/2003 | CN1122182C Voltage distribution measurer of insulator string for DC transmission line |
| 09/23/2003 | US6625784 Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same |
| 09/23/2003 | US6625771 Tool to reconfigure pin connections between a DUT and a tester |
| 09/23/2003 | US6625770 Method of automatically generating schematic and waveform diagrams for relevant logic cells of a circuit using input signal predictors and transition times |
| 09/23/2003 | US6625769 Method for IC fault analysis using programmable built-in self test and optical emission |
| 09/23/2003 | US6625768 Test bus architecture |
| 09/23/2003 | US6625767 Method and device for collecting output logic values from a logic unit in an electronic circuit |
| 09/23/2003 | US6625764 Testing using test packets containing random data |
| 09/23/2003 | US6625688 Method and circuit for analysis of the operation of a microcontroller using signature analysis of memory |
| 09/23/2003 | US6625684 Application specific integrated circuit with dual-mode system for externally accessible data buses and visibility buses |
| 09/23/2003 | US6625560 Method of testing serial interface |
| 09/23/2003 | US6625559 System and method for maintaining lock of a phase locked loop feedback during clock halt |
| 09/23/2003 | US6625557 Mixed signal device under test board interface |
| 09/23/2003 | US6625554 Method and apparatus for determining a magnetic field |
| 09/23/2003 | US6625076 Circuit configuration fir evaluating the information content of a memory cell |
| 09/23/2003 | US6625072 Semiconductor integrated circuit device provided with a self-testing circuit for carrying out an analysis for repair by using a redundant memory cell |
| 09/23/2003 | US6625051 Semiconductor integrated circuit |
| 09/23/2003 | US6624653 Method and system for wafer level testing and burning-in semiconductor components |
| 09/23/2003 | US6624652 Circuit board and system for testing the same |
| 09/23/2003 | US6624651 Kerf circuit for modeling of BEOL capacitances |
| 09/23/2003 | US6624650 Impedance measuring device for printed wiring board |
| 09/23/2003 | US6624649 Prober and low-temperature test equipment having same incorporated therein |
| 09/23/2003 | US6624648 Probe card assembly |
| 09/23/2003 | US6624646 Modular interface between test and application equipment |
| 09/23/2003 | US6624645 Semiconductor device testing method, using a spring-biased transformable conductive member electrode connection |
| 09/23/2003 | US6624643 Apparatus and method to read output information from a backside of a silicon device |
| 09/23/2003 | US6624636 Method and apparatus for estimating terminal voltage of battery, method and apparatus for computing open circuit voltage of battery, and method and apparatus for computing battery capacity |
| 09/23/2003 | US6624635 Uninterruptable power supply |
| 09/23/2003 | US6624625 Test equipment |
| 09/23/2003 | US6624614 Charge and discharge controller |
| 09/23/2003 | US6624405 BIST for testing a current-voltage conversion amplifier |
| 09/23/2003 | US6623997 Method for burn-in processing of optical transmitter arrays using a submount substrate |
| 09/23/2003 | US6623996 Method of measuring contact alignment in a semiconductor device including an integrated circuit |
| 09/23/2003 | US6623992 System and method for determining a subthreshold leakage test limit of an integrated circuit |
| 09/23/2003 | CA2273038C Antenna adapter |
| 09/23/2003 | CA2168838C Electrical switches with current protection interfaced with a remote station and a portable local unit |
| 09/22/2003 | CA2423147A1 Synthetic test circuit for circuit breaker testing |
| 09/18/2003 | WO2003077078A2 Hub array system and method |
| 09/18/2003 | WO2003076960A1 Electronic battery tester with network communication |
| 09/18/2003 | WO2003076959A1 Semiconductor test device and timing measurement method thereof |
| 09/18/2003 | WO2003076958A1 Semiconductor test device |
| 09/18/2003 | WO2003076957A1 Apparatus for interfacing electronic packages and test equipment |
| 09/18/2003 | WO2003076953A2 An electrical condition monitoring method for polymers |
| 09/18/2003 | WO2003075632A2 Rf amplifier system with interface to provide a computer readable spectral depiction of the re output |
| 09/18/2003 | WO2003049211A3 Method and apparatus for soft-sensor characterization of batteries |
| 09/18/2003 | WO2002101553A3 In-circuit testing optimization generator |
| 09/18/2003 | WO2002095424A3 Apparatus with interchangeable modules for measuring characteristics of cables and networks |
| 09/18/2003 | WO2002075335A3 Test system formatters |
| 09/18/2003 | WO2002071082A3 Method for testing a testable electronic device |
| 09/18/2003 | US20030177428 Simulation method and apparatus for verifying logic circuit including processor |
| 09/18/2003 | US20030177427 Circuit modeling |
| 09/18/2003 | US20030177426 Method and device generating integrated circuit test programs |
| 09/18/2003 | US20030177425 System architecture providing redundant components to improve die yields and system reliability |
| 09/18/2003 | US20030177424 Semiconductor memory improved for testing |
| 09/18/2003 | US20030177423 Tranmission device, reception device, test circuit, and test method |
| 09/18/2003 | US20030177415 Self-testing circuit in semiconductor memory device |
| 09/18/2003 | US20030177373 Integrated circuit security and method therefor |
| 09/18/2003 | US20030176000 Measuring apparatus and film formation method |