Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2003
10/02/2003US20030187599 Circuit for measuring rising or falling time of high-speed data and method thereof
10/02/2003US20030186592 Positionable inter-connect apparatus for electrically coupling selected electrical devices
10/02/2003US20030186566 Contactor, method for manufacturing such contactor, and testing method using such contactor
10/02/2003US20030186473 Electrical print resolution test die
10/02/2003US20030185325 Method and apparatus for testing serial connections
10/02/2003US20030185153 Method and system for controlling data traffic in a network
10/02/2003US20030185074 Semiconductor memory device, method for testing same and semiconductor device
10/02/2003US20030185041 Semiconductor memory device
10/02/2003US20030184936 Plausibility checking of current transformers in substations
10/02/2003US20030184835 Multi-beam polygon scanning system
10/02/2003US20030184568 Output circuit for gray scale control, testing apparatus thereof, and method for testing output circuit for gray scale control
10/02/2003US20030184417 Hybrid mode stirred and mode tuned chamber
10/02/2003US20030184356 Method and apparatus for precise signal interpolation
10/02/2003US20030184336 Semiconductor integrated circuit device and testing method thereof
10/02/2003US20030184335 Method of electrically testing semiconductor devices
10/02/2003US20030184334 Array substrate and method of inspecting the same
10/02/2003US20030184332 Probe driving method, and probe apparatus
10/02/2003US20030184331 Electrode and fixture for measuring electronic components
10/02/2003US20030184330 Probe card and method for manufacturing probe card
10/02/2003US20030184329 Method and apparatus for the management of forces in a wireless fixture
10/02/2003US20030184328 Near-field probe for use in scanning system
10/02/2003US20030184325 Device and method for monitoring a capacitor bushing
10/02/2003US20030184306 Battery tester with battery replacement output
10/02/2003US20030184281 Testing system in a circuit boardmanufacturing line for automatic testing of circuit boards
10/02/2003US20030184280 Power monitoring system
10/02/2003US20030184262 Method and apparatus for testing and charging a power source
10/02/2003US20030184170 Method and apparatus for measuring torque and flux current in a synchronous motor
10/02/2003US20030183949 Conductive material for integrated circuit fabrication
10/02/2003US20030183931 Semiconductor apparatus, fixture for measuring characteristics therefor, and semiconductor device characteristics measuring apparatus
10/02/2003US20030183764 Method for charging a structure comprising an insulating body
10/02/2003US20030183521 Conductive material for integrated circuit fabrication
10/02/2003US20030183510 Conductive material for integrated circuit fabrication
10/02/2003DE20308792U1 Battery charge measurement circuit, includes Zener diode and resistors selected to drop voltage representing percentage charge in battery
10/01/2003EP1349171A1 Data exchange device between scan chains
10/01/2003EP1349139A2 Output circuit for gray scale control, testing apparatus thereof, and method for testing output circuit for gray scale control
10/01/2003EP1348973A2 Identification of channels and associated signal information contributing to a portion of a composite eye diagram
10/01/2003EP1348972A2 Sequential test pattern generation using clock-control design for testability structures
10/01/2003EP1348971A1 Additional output circuit for differential signal transmission during boundary scan
10/01/2003EP1348970A1 Check for plausibility of current transformers in substations
10/01/2003EP1348969A2 Electronic test system
10/01/2003EP1348134A2 Weighted random pattern test using pre-stored weights
10/01/2003EP1282828B1 System for regulating the temperature of ic-chips with a fluid which is heated and cooled as a function of the fluid temperatures to and from heat exchangers for the ic-chips
10/01/2003CN1446318A Capturing and evaluating high speed data streams
10/01/2003CN1446317A Method and device for testing operativeness of printed circuit boards
10/01/2003CN1445847A 半导体装置及其制造方法 Semiconductor device and manufacturing method thereof
10/01/2003CN1445833A Detection device, testing device of semiconductor device and testing method
10/01/2003CN1445551A Probe connecting terminal cladded with conducting wire on testing tool of printed circuit distributing board
10/01/2003CN1123183C Testing device for GMSK communication device
10/01/2003CN1123094C Pin connector, pin connector holder and packaging board for mounting electronic component
10/01/2003CN1123082C Assembly consists of electrochemical cell and label with integrated tester
10/01/2003CN1122853C Method and device for rapidly and precisely measuring secondary pick-up voltage of relay
10/01/2003CN1122852C Method for determining position of faults an conductive body and partial discharge site location system
10/01/2003CN1122851C Apparatus and method for monitoring electrical cables for presence of moisture along
10/01/2003CN1122850C Apparatus for testing variable resistors
10/01/2003CA2385432A1 Monitoring and control for power electronic system
09/2003
09/30/2003US6629296 Functional verification of integrated circuit designs
09/30/2003US6629282 Module based flexible semiconductor test system
09/30/2003US6629281 Method and system for at speed diagnostics and bit fail mapping
09/30/2003US6629278 Compressed data restoration apparatus, semiconductor tester equipped with same, and data compression/restoration method
09/30/2003US6629277 LSSD interface
09/30/2003US6629276 Method and apparatus for a scannable hybrid flip flop
09/30/2003US6629274 Method and apparatus to structurally detect random defects that impact AC I/O timings in an input/output buffer
09/30/2003US6629272 Method and apparatus for displaying eye diagram on an error performance analyzer
09/30/2003US6629052 Adjustment method for reducing channel skew of test system
09/30/2003US6629045 System and method for detecting slave power supply failure
09/30/2003US6628573 Sound apparatus for vehicle
09/30/2003US6628559 Semiconductor memory device having refreshing function
09/30/2003US6628554 MIS semiconductor device having improved gate insulating film reliability
09/30/2003US6628162 Semiconductor integrated circuit
09/30/2003US6628152 Method for monitoring a proper functioning of an integrated circuit
09/30/2003US6628141 Integrated circuit having a scan register chain
09/30/2003US6628137 Apparatus and method for testing semiconductor integrated circuit
09/30/2003US6628136 Method and apparatus for testing a semiconductor package
09/30/2003US6628135 Analog-based on-chip voltage sensor
09/30/2003US6628134 DC stress supply circuit
09/30/2003US6628133 Methods of testing integrated circuitry
09/30/2003US6628132 Methods and apparatus for testing a semiconductor structure using improved temperature desoak techniques
09/30/2003US6628131 Test unit and enclosure for testing integrated circuits
09/30/2003US6628126 Optical voltage measurement circuit and method for monitoring voltage supplies utilizing imaging circuit analysis
09/30/2003US6628125 Method and apparatus for detecting slow and small changes of electrical signals including the sign of the changes, and circuit arrangement for the exact detection of the peak value of an alternating voltage
09/30/2003US6628120 Voltage measuring circuit and voltage supply circuit of an integrated fuel cell system
09/30/2003US6627917 Method and apparatus for wafer-level burn-in
09/30/2003US6627483 Method for mounting an electronic component
09/30/2003US6626702 Connector with movable locking retainer and test method using the same
09/28/2003CA2411147A1 Identification of channels and associated signal information contributing to a portion of a composite eye diagram
09/25/2003WO2003079033A1 Electronic battery tester with battery failure temperature determination
09/25/2003WO2003079032A1 Method and apparatus for auditing a battery test
09/25/2003WO2003079031A1 Isolator test device
09/25/2003WO2003044923A3 Method and system for monitoring electrical appliances
09/25/2003WO2003036307A3 Testing circuits on substrates
09/25/2003WO2003016929A3 Pin electronics interface circuit
09/25/2003WO2003010547A3 Programmable test socket
09/25/2003US20030182642 Hardware debugging in a hardware description language
09/25/2003US20030182641 Rapid input/output probing apparatus and input/output probing method using the same, and mixed emulation/simulation method based on it
09/25/2003US20030182609 Pass gate multiplexer
09/25/2003US20030182607 Semiconductor memory device and method of testing same
09/25/2003US20030182604 Method for reducing switching activity during a scan operation with limited impact on the test coverage of an integrated circuit
09/25/2003US20030182603 Hamming distance comparison
09/25/2003US20030182601 System and method for integrating hardware switching operations into test executive software
09/25/2003US20030182485 Detachable cartridge unit and auxiliary unit for function expansion of a data processing system
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